CN210724789U - PLC product testing device and system - Google Patents
PLC product testing device and system Download PDFInfo
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- CN210724789U CN210724789U CN201922162391.8U CN201922162391U CN210724789U CN 210724789 U CN210724789 U CN 210724789U CN 201922162391 U CN201922162391 U CN 201922162391U CN 210724789 U CN210724789 U CN 210724789U
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Abstract
The application discloses a PLC product testing device and a system, wherein the device comprises a power supply, a testing end, a matching attenuation module consisting of a plurality of resistors and a base for connecting tested equipment, wherein the testing end is used for sending a testing signal to test the tested equipment; the power supply is respectively connected with the test end and the matched attenuation module to provide electric energy for the test end and the tested equipment; the matched attenuation module is respectively connected with the test end and the base and used for attenuating a test signal sent by the test end, and when the base is connected with a device to be tested, the test end is in communication connection with the device to be tested through the matched attenuation module and the base. The scheme provided by the embodiment of the application can avoid the interference of the power line, thereby improving the accuracy of the test result.
Description
Technical Field
The application relates to the technical field of power line carrier product testing, in particular to a PLC product testing device and system.
Background
In the process of power line carrier communication, power line carrier communication equipment is needed. The performance of the power line carrier communication device is crucial to the result of the carrier communication, and therefore, in order to ensure the quality of the power line carrier communication device, the power line carrier communication device is tested after being produced.
A common solution for testing power line carrier communication devices is to directly use a power line for carrier communication testing. That is, the power line is used as both a power supply line of the carrier communication device and a signal line between the carrier communication devices communicating with each other. When testing different products, it is necessary to select attenuators for the specific type of device under test. In addition, this test method is affected by the power line because of the uncertain disturbances on the power line.
SUMMERY OF THE UTILITY MODEL
In order to overcome at least the above-mentioned deficiencies in the prior art, an object of the present application is to provide a PLC product testing apparatus, which includes a power supply, a testing terminal, a matching attenuation module composed of a plurality of resistors, and a base for connecting a device under test, wherein the testing terminal is used for sending a testing signal to test the device under test;
the power supply is respectively connected with the test end and the matched attenuation module to provide electric energy for the test end and the tested equipment;
the matched attenuation module is respectively connected with the test end and the base and used for attenuating a test signal sent by the test end, and when the base is connected with a device to be tested, the test end is in communication connection with the device to be tested through the matched attenuation module and the base.
Optionally, the matching attenuation module includes a first resistor, a second resistor and a third resistor connected in series between a first sending end of the testing end and a first receiving end of the base in sequence, a second sending end of the testing end is connected to a first end of a fourth resistor, a second end of the fourth resistor is connected between the first resistor and the second resistor, a second receiving end of the base is connected to a first end of a fifth resistor, and a second end of the fifth resistor is connected between the second resistor and the third resistor.
Optionally, the apparatus further includes a first coupling transformer, a primary coil of the first coupling transformer is connected between a first transmitting end of the testing end and a second transmitting end of the testing end, and a secondary coil of the first coupling transformer is connected between a first resistor of the matched attenuation module and a first end of the fourth resistor.
Optionally, the apparatus further includes a second coupling transformer, a primary coil of the second coupling transformer is connected between the second ends of the third resistor and the fifth resistor, and a secondary coil of the second coupling transformer is connected between the first receiving end of the base and the second receiving end of the base.
Optionally, the primary coil of the first coupling transformer and the secondary coil of the first coupling transformer have the same winding direction, and the primary coil of the second coupling transformer and the secondary coil of the second coupling transformer have the same winding direction.
Optionally, the transformation ratio of the first coupling transformer is 1:1, and the transformation ratio of the second coupling transformer is 1: 1.
Optionally, the power supply includes a first energy storage power source and a second energy storage power source, the first energy storage power source is a dc power source, the second energy storage power source is a dc power source, and the first energy storage power source and the second energy storage power source are respectively connected to one of the test terminal or the device to be tested.
Optionally, there are a plurality of the bases, each of the bases is connected to the matched attenuation module, and the bases are connected in parallel.
Another object of this application is to provide a PLC product testing system, which includes the PLC product testing device according to any of the above applications, wherein the base is provided with a device under test.
Optionally, the system further includes a user input terminal for inputting a user instruction, where the user input terminal is connected to the test terminal and sends a test signal to the device under test through the test terminal.
Compared with the prior art, the method has the following beneficial effects:
according to the PLC product testing device and the system, the testing end and the tested device are connected with the power supply respectively, then the testing end is attenuated by the matching attenuation module formed by the resistors according to the testing signal sent to the tested device, and the matching attenuation module formed by the resistors has the linear characteristic, so that the testing signal with different frequencies can be linearly attenuated. In addition, the scheme can also avoid the interference of the power line to the test process and improve the accuracy of the test result.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained from the drawings without inventive effort.
Fig. 1 is a schematic structural diagram of a test apparatus for a PLC product provided in the present application;
fig. 2 is a first schematic structural diagram of a test apparatus of a PLC product according to an embodiment of the present application;
FIG. 3 is a schematic structural diagram of an attenuation module provided in an embodiment of the present application;
fig. 4 is a schematic structural diagram ii of a test apparatus for a PLC product according to an embodiment of the present application;
FIG. 5 is a graph illustrating the variation of the decay rate at different fourth resistances according to an embodiment of the present disclosure;
fig. 6 is a schematic diagram of the insertion loss of a coupler versus signal frequency.
Icon: 110-power lines; 120-a grid isolator; 130-a test end; 140-grid attenuator; 150-a device under test; 160-user input terminal; 210-a power supply; 220-matched attenuation module.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present application, it is further noted that, unless expressly stated or limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood in a specific case by those of ordinary skill in the art.
Power line carrier communication is a technology for performing communication using a power line 110 as a medium for signal transmission. In power line carrier communication, a power line carrier product is required to perform signal transceiving and signal processing. In order to ensure the quality of these power line carrier products, after the power line carrier products are produced, it is necessary to test these power line carrier products so as to detect the operating state of the products. In the process of testing products, one performance test which is particularly important is to test the response condition of the power line carrier products to signals with different intensities.
Referring to fig. 1, in testing the response of a Power Line Carrier Communication (PLC) product to signal strength, one embodiment directly uses a Power Line 110 on a Power grid to simultaneously supply Power to a test terminal 130 and a device under test 150, and the Power Line 110 serves as a signal transmission medium between the test terminal 130 and the device under test 150.
Specifically, the grid isolator 120 is disposed between the power line 110 and the test terminal 130, and then the grid attenuator 140 is disposed between the test terminal 130 and the device under test 150, and the test terminal 130 is further connected to a user input terminal 160, such as a Personal Computer (PC) for user input instructions. In this communication method, common mode conduction exists, which may cause interference to signals on the power line 110, and thus may cause inaccurate test results for the power line carrier product.
In addition, in this test mode, only devices such as an inductor and a capacitor can be used to implement the signal attenuation function, and since the capacitor and the inductor are nonlinear devices, the attenuation rates of the same grid attenuator 140 for signals of different frequencies are different, that is, the grid attenuator 140 is not linear, and cannot linearly attenuate signals of different frequencies. Therefore, the matched attenuation module 220 is often required to be replaced for different types of devices under test 150. For example, narrowband PLC, G3-PLC, broadband PLC, each device-under-test 150 needs to be configured with a different grid attenuator 140.
In addition, when testing the power line carrier communication product, the person performing the test needs to perform a live operation on the power line carrier communication product, and the voltage on the power line 110 is high, so that such an operation also has problems of poor safety and low production efficiency.
In order to solve at least one of the above problems, the present application provides a PLC product test scheme.
Referring to fig. 2, fig. 2 is a PLC product testing apparatus provided in an embodiment of the present application, and the PLC product testing apparatus includes a power supply 210, a testing terminal 130, a matching attenuation module 220 formed by a plurality of resistors, and a base for connecting to a device under test 150.
The matched attenuation modules 220 are respectively connected to provide power to the test terminal 130 and the device under test 150.
The test terminal 130 is configured to send a test signal to test the device under test 150; the base is used to connect to the device-under-test 150. The matched attenuation module 220 is connected to the test terminal 130 and the base, respectively, and is configured to attenuate a test signal sent by the test terminal 130, and when the base is connected to a device 150 to be tested, the test terminal 130 and the device 150 to be tested are communicatively connected through the matched attenuation module 220 and the base.
In this embodiment, the power supply 210 is an independent dc power supply. The test terminal 130 may employ a device for transmitting a test signal in the prior art. The test terminal 130 is used for sending a test signal for testing the device under test 150, so as to implement the test of the device under test 150. The base in this embodiment is a device having a structure for electrical connection, and at least one first connection terminal (a first receiving terminal and a second receiving terminal of the base) corresponding to a signal input terminal on the device under test 150 is disposed on the base, and a second connection terminal connected to a power supply terminal on the device under test 150 is further disposed on the base. When the device under test 150 is connected to the base, the signal input terminal of the device under test 150 corresponds to the first connection terminal on the base one by one, the power supply terminal of the device under test 150 is connected to the second connection terminal, and the power supply 210 is connected to the second connection terminal, so that the power supply 210 is connected to the power supply terminal of the device under test 150.
In short, the base is equivalent to a connector through which the signal output by the matched attenuation module 220 can be conducted to the device-under-test 150. In a specific arrangement, the method can be realized by adopting a mode similar to a socket or a plug.
In this embodiment, the signal sent by the test terminal 130 is attenuated by the matching attenuation module 220 formed by resistors, and since the resistors are linear elements, the matching attenuation module 220 formed by the resistors can linearly attenuate the electrical signal sent by the test terminal 130, and one matching attenuation module 220 can adapt to the attenuation of signals with various frequencies, so that the test efficiency can be improved, and the test cost can be saved. In addition, in order to cooperate with the matched attenuation module 220, in the embodiment, the separate power supply 210 is adopted to supply power to the testing terminal 130 and the device under test 150, so that the power line 110 is prevented from being accessed during testing, and therefore, the interference caused by the power line 110 can be eliminated.
In this embodiment, one matching attenuation module 220 can adapt to the attenuation of signals with various frequencies, so that it is not necessary to operate under strong current conditions, thereby improving safety and production efficiency.
To facilitate understanding, the PLC product testing apparatus described above is further described below in conjunction with specific principles.
In the use of the PLC product testing apparatus in this embodiment, the power supply 210 first supplies power to the testing terminal 130 and the terminal 130 to be tested, and then the testing terminal 130 sends a testing signal, after the testing signal passes through the matching attenuation module 220, the amplitude of the testing signal is attenuated, the attenuated testing signal is transmitted to the device 150 to be tested through the base, and after the device 150 to be tested receives the testing signal, the testing signal is responded under the condition that the testing signal is analyzed.
In this embodiment, the power supply 210 may be a dc power supply, the dc power supply may be a low voltage power supply, and the output of the dc power supply may be 12V, for example.
Further, in this embodiment, the power supply 210 may include a first energy storage power source and a second energy storage power source, the first energy storage power source is a dc power source, the second energy storage power source is a dc power source, and the first energy storage power source and the second energy storage power source are respectively connected to one of the test terminal 130 or the device under test 150.
The output voltage of the first energy storage power supply may be the same as or different from the output voltage of the second energy storage power supply, for example, the first energy storage power supply may be a 12V dc power supply, and the second energy storage power supply may also be a 12V dc power supply.
In this embodiment, the test terminal 130 and the device under test 150 are powered by independent dc power supplies, so that the test terminal 130 and the device under test 150 can be conveniently powered by dedicated power supplies, thereby avoiding the power conversion circuit from converting the voltage of the power supply, and simplifying the circuit structure of the whole device. Meanwhile, in this embodiment, independent power supplies are used to respectively supply power to the testing terminal 130 and the device-under-test 150, so that the working states of the testing terminal 130 and the device-under-test 150 can be prevented from being influenced by each other.
Referring to fig. 3 and 4, in the present embodiment, the resistors in the matched attenuation module 220 are distributed in a pi shape. For example, in an alternative embodiment, the matched attenuation module 220 includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, and a fifth resistor R5.
The specific connection mode of the first resistor R1, the second resistor R2, the third resistor R3, the fourth resistor R4 and the fifth resistor R5 is as follows: first resistance R1, second resistance R2 and third resistance R3 are connected in series in proper order between the first send end of test end 130 and the first receiving terminal of base, the first end of fourth resistance R4 is connected to the second send end of test end 130, the second end of fourth resistance R4 is connected between first resistance R1 and second resistance R2, the first end of fifth resistance R5 is connected to the second receiving terminal of base, the second end of fifth resistance R5 is connected between second resistance R2 and third resistance R3.
In the embodiment, the resistors distributed in a shape like a Chinese character pi are adopted, so that the signal attenuation effect is better, and the setting is easy.
For the above-mentioned matching attenuation module 220 with the distributed resistance "pi", the overall parameters of the matching attenuation module 220 can be set as the characteristic impedance: 50 omega, and the attenuation value is 60dB to 80dB when the signal frequency is 0 MHz to 12 MHz. At this time, the resistances of the first resistor R1, the second resistor R2, the third resistor R3, the fourth resistor R4 and the fifth resistor R5 may be set to: the resistance measuring circuit comprises a first resistor R1 fifty ohms, a second resistor R2 one hundred ohms, a third resistor R3 fifty ohms, a fourth resistor R4R ohms and a fifth resistor R5 fifty ohms, wherein R is a parameter representing resistance. Specifically, the resistance configuration of the fourth resistor R4 can be seen in fig. 5, wherein the abscissa represents the frequency of the signal in MHz, the ordinate represents the attenuation rate in dB, and each curve represents a different value of the fourth resistor R4.
In another alternative embodiment, the resistors in the matched attenuation module 220 may also be distributed in a T shape.
It should be noted that, in the present embodiment, the specific arrangement of the resistors in the matched attenuation module 220 is not limited to the above two.
In this embodiment, a first coupling transformer may be disposed between the test terminal 130 and the matched attenuation module 220, or a second coupling transformer may be disposed between the matched attenuation module 220 and the base, or a first coupling transformer may be disposed between the test terminal 130 and the matched attenuation module 220 and a second coupling transformer may be disposed between the matched attenuation module 220 and the base at the same time.
Referring to fig. 4, in this embodiment, when a first coupling transformer is disposed between the test terminal 130 and the matched attenuation module 220, a primary coil of the first coupling transformer is connected between the first transmitting terminal of the test terminal 130 and the second transmitting terminal of the test terminal 130, and a secondary coil of the first coupling transformer is connected between a terminal of the first resistor R1 of the matched attenuation module 220, which is not connected with the second resistor, and the first terminal of the fourth resistor R4.
In this embodiment, a first coupling transformer is provided for coupling the test signal output by the test terminal 130 to the matching attenuation module 220, and meanwhile, the coupling transformer is provided for coupling the test signal and eliminating the common-mode signal in the test signal, so that the common-mode interference can be removed and the final test result is more accurate.
Optionally, in this embodiment, a second coupling transformer is disposed between the matched attenuation module 220 and the base, a primary coil of the second coupling transformer is connected between the end of the third resistor R3 not connected to the second resistor R2 and the second end of the fifth resistor R5, and a secondary coil of the second coupling transformer is connected between the first receiving end of the base and the second receiving end of the base.
In this embodiment, a second coupling transformer is provided for coupling the test signal output by the matching attenuation module 220 to the device under test 150 provided on the base, and meanwhile, the coupling transformer is provided to couple the signal and also eliminate the common mode signal in the test signal, so that the common mode interference can be eliminated and the final test result is more accurate.
Optionally, in this embodiment, the winding directions of the primary coil of the first coupling transformer and the secondary coil of the first coupling transformer are the same, and the winding direction of the primary coil of the second coupling transformer and the secondary coil of the second coupling transformer are the same.
In this embodiment, in the first coupling transformer and the second coupling transformer, the winding directions of the primary coil and the secondary coil are the same, that is, the same-name ends of the primary coil and the secondary coil are the same, so that the polarity of the voltage output by the secondary coil is the same as that of the primary coil, and the first coupling transformer and the second coupling transformer have the characteristic of easy setting.
Optionally, in this embodiment, the transformation ratio of the first coupling transformer is 1:1, and the transformation ratio of the second coupling transformer is 1: 1.
In this embodiment, the transformation ratio of the first coupling transformer and the second coupling transformer is 1:1, so that neither the first coupling transformer nor the second coupling transformer attenuates the signal, the attenuation of the signal is formed by the matched attenuation module 220, and the signal is linearly attenuated, so that the attenuation of the final test signal can be conveniently determined.
In this embodiment, the first coupling transformer or the second coupling transformer may be a transformer having a working frequency of 0 to 12MHz and an insertion loss of less than 1dB, and a relationship between the insertion loss and the signal frequency of the transformer is shown in fig. 6, where an abscissa represents a frequency in MHz, and an ordinate represents an insertion loss in dB.
Optionally, in this embodiment, there are a plurality of the bases, each of the bases is connected to the matched attenuation module 220, and the bases are connected in parallel.
In this embodiment, the plurality of bases are connected in parallel, and the plurality of devices under test 150 can be continuously tested, thereby improving the test efficiency.
Another object of the present application is to provide a PLC product testing system, which includes the PLC product testing device according to any of the embodiments, wherein the base is provided with a device under test 150.
Optionally, the system further includes a user input terminal for inputting a user instruction, the user input terminal is connected to the testing terminal 130, and sends a testing signal to the device under test 150 through the testing terminal 130.
In summary, in the present application, since the dc power supply is used for supplying power, the test process is not affected by the environmental noise of the power line 110, and therefore the grid isolator 120 is not needed. In addition, the whole testing device is powered by a direct-current power supply, and strong electricity does not exist in the testing process, so that the safety performance is higher. Because the matched attenuation module 220 formed by the resistor has linear characteristics, the attenuation characteristics of the PLC product testing device are stable and reliable, and the matched attenuation module does not need to be replaced aiming at different products when different communication products are tested, so that the cost can be saved. In addition, the direct current power supply is adopted for supplying power, power conversion is not needed, and the cost can be saved.
The above description is only for various embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of changes or substitutions within the technical scope of the present application, and all such changes or substitutions are included in the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. The PLC product testing device is characterized by comprising a power supply, a testing end, a matching attenuation module and a base, wherein the matching attenuation module is composed of a plurality of resistors, the base is used for connecting tested equipment, and the testing end is used for sending a testing signal to test the tested equipment;
the power supply is respectively connected with the test end and the matched attenuation module to provide electric energy for the test end and the tested equipment;
the matched attenuation module is respectively connected with the test end and the base and used for attenuating a test signal sent by the test end, and when the base is connected with a device to be tested, the test end is in communication connection with the device to be tested through the matched attenuation module and the base.
2. The apparatus of claim 1, wherein the matched attenuation module comprises a first resistor, a second resistor and a third resistor connected in series between a first sending end of the testing end and a first receiving end of the base in sequence, a second sending end of the testing end is connected to a first end of a fourth resistor, a second end of the fourth resistor is connected between the first resistor and the second resistor, a second receiving end of the base is connected to a first end of a fifth resistor, and a second end of the fifth resistor is connected between the second resistor and the third resistor.
3. The apparatus of claim 2, further comprising a first coupling transformer having a primary winding connected between a first terminal of the test terminal and a second terminal of the test terminal, and a secondary winding connected between a first terminal of the matched attenuation module and a first terminal of the fourth resistor.
4. The apparatus of claim 3, further comprising a second coupling transformer, a primary winding of the second coupling transformer being connected between the second ends of the third and fifth resistors, and a secondary winding of the second coupling transformer being connected between the first receiving end of the base and the second receiving end of the base.
5. The apparatus of claim 4, wherein the primary winding of the first coupling transformer and the secondary winding of the first coupling transformer are wound in the same direction, and wherein the primary winding of the second coupling transformer and the secondary winding of the second coupling transformer are wound in the same direction.
6. The apparatus of claim 5, wherein the first coupling transformer has a transformation ratio of 1:1 and the second coupling transformer has a transformation ratio of 1: 1.
7. The apparatus of claim 1, wherein the power supply comprises a first energy storage power source and a second energy storage power source, the first energy storage power source is a dc power source, the second energy storage power source is a dc power source, and the first energy storage power source and the second energy storage power source are respectively connected to one of the test terminal or the device under test.
8. The apparatus of claim 1, wherein the plurality of pedestals are each connected to the matched attenuation module, and the pedestals are connected in parallel to each other.
9. A PLC product testing system, characterized in that the system comprises a PLC product testing device according to any one of claims 1 to 8, the base having a device under test provided thereon.
10. The system of claim 9, further comprising a user input terminal for inputting user instructions, the user input terminal being connected to the test terminal and sending test signals to the device under test through the test terminal.
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| CN201922162391.8U CN210724789U (en) | 2019-12-05 | 2019-12-05 | PLC product testing device and system |
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| CN201922162391.8U CN210724789U (en) | 2019-12-05 | 2019-12-05 | PLC product testing device and system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113258957A (en) * | 2021-05-19 | 2021-08-13 | 深圳市多酷科技有限公司 | Power line communication product test system, control method and device |
| CN113740707A (en) * | 2021-08-20 | 2021-12-03 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Loopback test circuit of chip interface module |
-
2019
- 2019-12-05 CN CN201922162391.8U patent/CN210724789U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113258957A (en) * | 2021-05-19 | 2021-08-13 | 深圳市多酷科技有限公司 | Power line communication product test system, control method and device |
| CN113740707A (en) * | 2021-08-20 | 2021-12-03 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Loopback test circuit of chip interface module |
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