CN210690778U

CN210690778U - Switching power supply single-board test system

Info

Publication number: CN210690778U
Application number: CN201921419278.7U
Authority: CN
Inventors: 胡磊; 张浩彬; 刘跃武
Original assignee: Shenzhen Maiming Technology Co ltd
Current assignee: Shenzhen Maiming Technology Co ltd
Priority date: 2019-08-27
Filing date: 2019-08-27
Publication date: 2020-06-05
Anticipated expiration: 2029-08-27

Abstract

The utility model discloses a switching power supply veneer test system, including power supply unit, output load, MCU the control unit, control button and display element, power supply unit, output load and communication and detection interface are connected respectively to the switching power supply veneer, and MCU the control unit is still connected to communication and detection interface, and MCU the control unit is still connected control button and display element respectively. The utility model discloses the reliability of test result has still been improved when test system saved the cost, compares with ATE test, and the cost is very big to be declined; compared with manual testing, the misjudgment rate is greatly reduced, and the reliability of the testing result is improved.

Description

Switching power supply single-board test system

Technical Field

The utility model relates to a test system specifically is a switching power supply veneer test system.

Background

In the production process of the switching power supply, the processed single board generally needs to be tested, and the single board can be assembled after the test is passed. In the stage of testing the single board, one is to adopt the artificial test mode, hang the apparatus that needs to use outside the test fixture, observe and judge manually the test result; and the other method adopts Automatic Test Equipment (ATE) for testing, manual intervention is not needed in the testing process, and the testing result is automatically processed by a computer.

The manual testing method needs to rely on the subjective will of the testers to judge whether the test is passed, the possibility of erroneous judgment is high, and the cost of personnel investment is high; the existing automatic test equipment is integrated into a set of system and is programmed and controlled at a computer end. Automatic test equipment and instruments are expensive, the whole system is higher in price, and common users cannot bear the system.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a switching power supply veneer test system to solve the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme:

a switch power supply single board test system comprises a power supply device, an output load, an MCU control unit, a control button and a display unit, wherein the switch power supply single board is respectively connected with the power supply device, the output load and a communication and detection interface, the communication and detection interface is also connected with the MCU control unit, and the MCU control unit is also respectively connected with the control button and the display unit.

As a further aspect of the present invention: the MCU control unit interacts with the tested single board through the communication and detection interface, the test is triggered by the control button, and the test progress and the test result are displayed to a tester through the display unit.

As a further aspect of the present invention: and the power supply device is responsible for supplying power to the whole test system.

As a further aspect of the present invention: the output load uses a resistor with a fixed resistance value.

As a further aspect of the present invention: the switching power supply of the switching power supply single board comprises a primary side and a secondary side, wherein an analog signal of the primary side is multiplexed onto an isolator through an analog switch, a channel selection signal is connected to a selection end of the analog switch after being isolated through an optical coupler, and the secondary side adopts an analog switch multiplexing AD port.

As a further aspect of the present invention: the optical coupler adopts a nonlinear common optical coupler.

As a further aspect of the present invention: the MCU control unit selects a primary analog quantity channel to be measured through the channel selection end, the analog quantity to be measured is output from the isolation signal output port after gating, the voltage of the isolation signal output end is directly collected by the MCU control unit, and the voltage is converted into an actual value through a corresponding coefficient.

Compared with the prior art, the beneficial effects of the utility model are that: the utility model discloses test system is with low costs, has saved the huge instrument of a great deal of volume of automatic test system, has saved the cost of instrument on the one hand, and on the other hand has reduced the test and has equipped the space that occupies, and each functional unit of whole test system is integrated on a PCB, and the embedding is in test fixture, and whether newly-increased or the cost of maintaining is very low. The utility model discloses test system still has improved the reliability of test result when saving the cost. Compared with ATE test, the cost is greatly reduced; compared with manual testing, the misjudgment rate is greatly reduced, and the reliability of the testing result is improved.

Drawings

Fig. 1 is a schematic block diagram of a switching power supply single board test system.

Fig. 2 is a schematic diagram of primary side analog quantity detection in a switching power supply single board test system.

Fig. 3 is a schematic diagram of an analog quantity detection portion of the switching power supply single board test system.

Fig. 4 is a test flow chart of the switching power supply single board test system.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1, a testing system for a single board of a switching power supply includes a power supply device, an output load, an MCU control unit, a control button, and a display unit, where the single board of the switching power supply is connected to the power supply device, the output load, and a communication and detection interface, the communication and detection interface is further connected to the MCU control unit, and the MCU control unit is further connected to the control button and the display unit.

The power supply device is responsible for the power supply of the whole test system, including the power supply of the main power circuit and the power supply required by the additional analog signal; in the single-board test stage, only a single-point load test is generally carried out or a load test is not required, and a load jump test is not required, so that the output load can use a resistor with a fixed resistance value; the switch power supply single board is a tested target, and the physical quantity to be tested is generally connected with the single board through a thimble on a test fixture; the MCU control unit interacts with the tested single board through the communication and detection interface, the test is triggered by the control button, and the test progress and the test result are displayed to the tester through the display unit. Specific test items, test sequences and result criteria may be implemented by programming the MCU.

The common switching power supply has a primary side and a secondary side, the primary side and the secondary side are isolated, and the test equipment is commonly grounded with the secondary side, so that the isolation is needed when the signal of the primary side is measured. Common optical coupler isolation can be directly used for digital signals, and the method is low in cost and easy to realize. However, for the isolation of analog signals, dedicated isolation devices, such as linear optocouplers, are required.

In order to reduce the cost and complexity of an isolation part, a primary analog signal is multiplexed to an isolator through an analog switch, and a channel selection signal is connected to a selection end of the analog switch after being isolated by a common optical coupler. Therefore, eight analog quantities of the primary side can be collected by only one linear optocoupler-isolator.

The MCU selects a primary analog quantity channel to be measured through the channel selection end, the analog quantity to be measured is output from the isolation signal output port after gating, the voltage of the isolation signal output end is directly collected by the MCU, and the voltage is converted into an actual value through a corresponding coefficient.

The secondary side signal is grounded with the test system, so that the isolation is not needed, but under the condition of measuring a large number of signals, the AD channel can be insufficient, so that the secondary side also adopts an analog switch to multiplex an AD port, and an expandable space is reserved for measuring the analog quantity.

Fig. 3 is a schematic diagram of the analog quantity detection part of the entire single board test system.

As shown in fig. 4, the general test items in the single board test stage include:

(1) detecting the voltage of an auxiliary power supply;

(2) detecting an LED indicator light;

(3) and detecting the fan circuit.

(4) Detecting a communication function;

(5) detecting by a sampling circuit;

(6) detecting the frequency and amplitude of the PWM driving signal;

(7) and detecting output voltage and current.

To sum up, the utility model discloses test system is with low costs, has saved the huge instrument of automatic test system a great deal of volume, has saved the cost of instrument on the one hand, and on the other hand has reduced the test and has equipped the space that occupies, and each functional unit of whole test system is integrated on a PCB, and the embedding is in test fixture, and whether newly-increased or the cost of maintaining is very low.

The utility model discloses test system still has improved the reliability of test result when saving the cost. Compared with ATE test, the cost is greatly reduced; compared with manual testing, the misjudgment rate is greatly reduced, and the reliability of the testing result is improved.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims

1. A switch power supply single board test system is characterized by comprising a power supply device, an output load, an MCU control unit, a control button and a display unit, wherein the switch power supply single board is respectively connected with the power supply device, the output load and a communication and detection interface, the communication and detection interface is also connected with the MCU control unit, and the MCU control unit is also respectively connected with the control button and the display unit.

2. The switch power supply single board test system according to claim 1, wherein the MCU control unit interacts with the single board to be tested through the communication and detection interface, the control button triggers the test, and the test progress and the test result are displayed to the tester through the display unit.

3. The switch power supply board test system according to claim 2, wherein the power supply device is responsible for power supply of the whole test system.

4. The switch power supply single board test system according to claim 3, wherein the output load uses a resistor with a fixed resistance value.

5. The system according to claim 4, wherein the switching power supply of the switching power supply board comprises a primary side and a secondary side, the analog signal of the primary side is multiplexed onto an isolator through an analog switch, the channel selection signal is connected to the selection end of the analog switch after being isolated by an optical coupler, and the secondary side adopts an analog switch multiplexing AD port.

6. The switching power supply single board test system according to claim 5, wherein the optical coupler is a non-linear common optical coupler.

7. The switch power supply single board test system according to claim 5, wherein the MCU control unit selects the analog quantity channel to be measured on the primary side through the channel selection terminal, the analog quantity to be measured is output from the isolation signal output port after gating, and the MCU control unit directly collects the voltage at the isolation signal output terminal.