CN210639203U - Probe structure - Google Patents
Probe structure Download PDFInfo
- Publication number
- CN210639203U CN210639203U CN201920896571.6U CN201920896571U CN210639203U CN 210639203 U CN210639203 U CN 210639203U CN 201920896571 U CN201920896571 U CN 201920896571U CN 210639203 U CN210639203 U CN 210639203U
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- CN
- China
- Prior art keywords
- probe
- probe body
- diameter
- circuit board
- reduce
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model provides a probe structure, its reduce the measuring area of probe to the circuit board, and reduce the skew of measuring central point, it includes the probe body, its characterized in that: one end of the probe body is in a conical needle point shape, and the other end of the probe body is provided with two vertical rods.
Description
Technical Field
The utility model relates to a circuit testing tool's technical field especially indicates a probe structure.
Background
Referring to fig. 1, in the four-wire measurement method, four test points are set on a tested PCB line, two feeder lines are added compared with the conventional measurement method, and the connection between a voltage measurement end and two ends of a constant current source is disconnected. One loop is used as power supply, the other loop is used for high impedance measurement, and the constant current source, the measured resistor Rx, the feeder lines RL1 and RL2 form a loop. The voltage supplied to the voltage measuring end is only the voltage at the two ends Rx, and the voltages of the feeding lines RL1 and RL2 are not supplied to the voltage measuring end. Therefore, feeder resistances RL1 and RL2 have no influence on the measurement result, feeder resistances RL3 and RL4 have influence on the measurement, but the influence is small, and the impedance (M Ω level) of a voltage measurement loop is far greater than the impedance (Ω level) of the feeder resistances, so that the accuracy of the four-wire measurement method for measuring the small resistance is high.
Disclosure of Invention
Not enough to prior art, the utility model provides a probe structure, its area of measurement that reduces the probe to the circuit board, and reduces the skew of measuring the central point.
The technical scheme is as follows: a probe structure, it includes the probe body, its characterized in that: one end of the probe body is in a conical needle point shape, and the other end of the probe body is provided with two vertical rods.
It is further characterized in that: the vertical rod is connected with the probe body in a welding mode; the probe body and the vertical rod are made of metal materials; the diameter of the probe body is 0.6mm-1.3 mm; the diameter of the vertical rod is 0.1mm-0.5 mm; the diameter of the probe body is 0.8mm, and the diameter of the vertical rod is 0.2 mm.
The above technical scheme is adopted in the utility model, because probe body one end is toper pinpoint form, the probe body other end is provided with two montants, and two montant connecting wire realize resistance measurement, and a needle structure of two needle integrations when realizing two needle measurements reduces the measuring area of visiting the circuit board, and reduces the skew of measuring center position.
Drawings
FIG. 1 is a schematic diagram of a four-wire measurement method;
FIG. 2 is a schematic view of the probe structure of the present invention;
fig. 3 is a schematic diagram of the probe structure measurement of the present invention.
Detailed Description
The present invention will be further explained with reference to the drawings and examples.
Referring to fig. 2, the probe structure comprises a probe body 1, wherein one end of the probe body 1 is in a conical needle point shape 3, two vertical rods 2 are arranged at the other end of the probe body 1, the vertical rods 2 are welded with the probe body 1, the probe body and the vertical rods 1 are made of metal materials, the diameter of the probe body is 0.6mm-1.3mm, and the diameter of the vertical rods is 0.1mm-0.5 mm; the diameter of the preferred probe body is 0.8mm, the montant diameter is 0.2mm, originally two independent probes measure and become a two-needle completion, reduce 50% to the area of contact of circuit, use a probe head to contact circuit board test point central point more accurately, reduce the skew, the accuracy reliability in the circuit board four-wire test process is guaranteed to the maximize, the probe has original about the same thick syringe needle that becomes to enlarge the shape, make syringe needle compressive resistance reinforcing, reduce the bent needle consume, the durability is stronger, thereby simplify the probe, reduce the loss, improve the rate of utilization and reduce production cost.
In the embodiment, the diameter of the probe body is 0.8mm, the diameter of the vertical rod is 0.2mm, the detection performance is optimal, and the application range is widest.
The working principle of the probe structure test of the present invention is described with reference to fig. 3:
the product is used in the four-wire test process of the circuit, the tester 4 transmits current to the lead 5 → the probe 6 → the circuit board test point 7 → the circuit board test point 8 at the other end → the probe 9 → the lead 10 → the tester 4, and a first loop is formed to be used as current supply; the tester 4 is connected to the lead 11 → the probe 9 → the circuit board test point 8 → the other end circuit board test point 7 → the probe 6 → the lead 12 → the tester 4, and a second loop is formed as a high impedance resistance.
The present invention and the embodiments thereof have been described above schematically, and the description is not limited thereto, and the embodiment shown in the drawings is only one of the embodiments of the present invention, and the actual structure is not limited thereto, and as long as the person skilled in the art receives the teaching, without departing from the spirit of the present invention, the present invention shall not be limited to the embodiments and the structural modes similar to the technical solution, but also shall belong to the protection scope of the present invention.
Claims (3)
1. A probe structure, it includes the probe body, its characterized in that: the probe body one end is toper pinpoint form, the probe body other end is provided with two montants, the probe body with the montant is metal material and passes through welded connection.
2. A probe structure according to claim 1, characterized in that: the diameter of the probe body is 0.6mm-1.3 mm; the diameter of the vertical rod is 0.1mm-0.5 mm.
3. A probe structure according to claim 2, characterized in that: the diameter of the probe body is 0.8 mm; the diameter of the vertical rod is 0.2 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920896571.6U CN210639203U (en) | 2019-06-14 | 2019-06-14 | Probe structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920896571.6U CN210639203U (en) | 2019-06-14 | 2019-06-14 | Probe structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210639203U true CN210639203U (en) | 2020-05-29 |
Family
ID=70796431
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920896571.6U Expired - Fee Related CN210639203U (en) | 2019-06-14 | 2019-06-14 | Probe structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210639203U (en) |
-
2019
- 2019-06-14 CN CN201920896571.6U patent/CN210639203U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200529 Termination date: 20210614 |