CN210607181U - Mass spectrometer with double-source ionization source - Google Patents
Mass spectrometer with double-source ionization source Download PDFInfo
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- CN210607181U CN210607181U CN201922238059.5U CN201922238059U CN210607181U CN 210607181 U CN210607181 U CN 210607181U CN 201922238059 U CN201922238059 U CN 201922238059U CN 210607181 U CN210607181 U CN 210607181U
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Abstract
The utility model discloses a mass spectrometer with a double-source ionization source, which comprises a mass spectrometer body, wherein the mass spectrometer body comprises an instrument cavity, and a double-source ionization source, an electronic lens, a mass analyzer, a detector, a sample inlet pipe and a vacuum environment which are arranged in the instrument cavity; the dual-source ionization source comprises an ultraviolet lamp ionization source and an electron bombardment ion source; ultraviolet light emitted by the ultraviolet lamp ionization source passes through the center of the round filament of the electron bombardment ion source. Through the utility model discloses can solve single electron bombardment ion source and produce fragment ion, work vacuum easily and require highly to and the not high problem of single ultraviolet lamp ionization source ionization efficiency, and along with the extension of mass spectrum application, also can satisfy the detection of complicated many samples under the condition in dual-source ionization source.
Description
Technical Field
The utility model relates to an utilize the mass spectrometer instrument to carry out the field of analysis and detection, specifically a mass spectrometer with dual source ionization source.
Background
The mass spectrometer is one of the most important scientific instruments in the field of contemporary analysis, has the characteristics of strong qualitative capability, high sensitivity, fast response time and the like, and has wide application in the fields of environmental monitoring, food safety, life science and the like. The mass spectrometer mainly comprises a sample inlet tube, an ion source, a mass analyzer, a detector and the like, wherein the ion source is a device for ionizing neutral atoms or molecules and leading out ion beam current from the neutral atoms or molecules, and plays a decisive role in determining whether a sample can be detected. At present, an electron bombardment ion source is one of the most widely used ion sources, which needs to work in a low-pressure environment, has the advantage of high ionization efficiency, and has a standard spectrum library, but fragment ions are generated after a sample is ionized, thereby interfering with quantitative analysis in detection of various samples. The ultraviolet lamp ionization source can not generate fragment ion peaks, the requirement on the vacuum degree is not high, and the problem of low ionization efficiency exists. With the expansion of the application field of mass spectrometry, a single ionization source is sometimes difficult to satisfy the detection of complex multiple samples.
SUMMERY OF THE UTILITY MODEL
In order to overcome the defects of the prior art scheme, the utility model provides a mass spectrometer with double-source ionization source.
The utility model provides a technical scheme that its technical problem adopted is:
a mass spectrometer with a dual-source ionization source comprises a mass spectrometer body, wherein the mass spectrometer body comprises an instrument cavity, and the dual-source ionization source, an electronic lens, a mass analyzer, a detector, a sample inlet pipe and a vacuum environment which are arranged in the instrument cavity; the dual-source ionization source comprises an ultraviolet lamp ionization source and an electron bombardment ion source; ultraviolet light emitted by the ultraviolet lamp ionization source passes through the center of the round filament of the electron bombardment ion source.
As a preferred technical solution of the present invention, the sample inlet tube has a sample inlet port, and the sample inlet port extends to a position between the ultraviolet lamp ionization source and the electron bombardment ion source; the electron lens, the mass analyzer and the detector are positioned on one side of the electron bombardment ion source, which is far away from the ultraviolet lamp.
As a preferred embodiment of the present invention, the mass analyzer is one of a time-of-flight analyzer, a quadrupole or an ion trap.
As an optimized technical scheme of the utility model, electron bombardment ion source has an export, electron lens's one end subtend the export of electron bombardment ion source, the other end is just to mass analyzer's entry.
As an optimized technical proposal of the utility model, the sampling tube is one or a plurality of combinations of a quartz capillary tube, a glass tube, a peek tube, a stainless steel tube, a Teflon tube and a silicone tube.
Compared with the prior art, the beneficial effects of the utility model are that:
through the utility model discloses can solve single electron bombardment ion source and produce fragment ion, work vacuum easily and require highly to and the not high problem of single ultraviolet lamp ionization source ionization efficiency, and along with the extension of mass spectrum application, also can satisfy the detection of complicated many samples under the condition in dual-source ionization source.
Drawings
Fig. 1 is a schematic structural diagram of an embodiment of the present invention.
Fig. 2 is a schematic diagram of an implementation manner of the embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a sample injection sleeve according to an embodiment of the present invention.
The reference numbers in the figure are 1-an ultraviolet lamp ionization source, 2-an electron bombardment ion source, 3-an electron lens, 4-a mass analyzer, 5-a detector, 6-a sample introduction system, 7-a vacuum environment and 8-an instrument cavity.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
A mass spectrometer with a dual-source ionization source comprises a mass spectrometer body, wherein the mass spectrometer body comprises an instrument cavity 8, the dual-source ionization source, an electronic lens 3, a mass analyzer 4, a detector 5, a sample inlet pipe 6 and a vacuum environment 7, wherein the dual-source ionization source, the electronic lens 3, the mass analyzer 4, the detector 5, the sample inlet pipe and the vacuum environment are arranged in the instrument cavity 8; the double-source ionization source comprises an ultraviolet lamp ionization source 1 and an electron bombardment ion source 2; the ultraviolet light emitted by the ultraviolet lamp ionization source 1 passes through the center of a circular filament of an electron bombardment ion source 2; the sample inlet and outlet of the sample inlet pipe 6 extend to the position between the ultraviolet lamp ionization source 1 and the electron bombardment ion source 2; the electron lens 3, the mass analyzer 4 and the detector 5 are positioned on one side of the electron bombardment ion source 2 away from the ultraviolet lamp; the mass analyser 4 is one of a time-of-flight analyser, a quadrupole or an ion trap; the electron bombardment ion source is provided with an outlet, and one end of the electron lens 3 faces the outlet of the electron bombardment ion source 2; the distance between an ultraviolet lamp projection port of the ultraviolet lamp ionization source 1, one port of the electron bombardment ion source 2 and the outlet of the sample injection tube 6 is less than 1 cm; a low-pressure environment is maintained in the vacuum environment 7 through a vacuum pump; the sampling tube 6 can be one or more of quartz capillary tube, glass tube, peek tube, stainless steel tube, Teflon tube and silicone tube; the sample inlet pipe 6 can be used for gas or liquid samples; the sample is detected by a pressure difference between the vacuum environment 7 and the atmosphere, by self-suction into the chamber or by a pump or the like, into the instrument chamber 8.
The utility model discloses a concrete embodiment: referring to fig. 1, in an embodiment of a mass spectrometer with a dual-source ionization source, the outlet direction of the sample inlet tube 6 is perpendicular to the central line of the filament, and can be used for sample injection.
Referring to fig. 2, in one embodiment, a mass spectrometer with a dual source ionization source, the outlet of the sample inlet tube 6 is oriented at an angle to the filament centerline to guide the sample to be detected while bound. Preferably, the exit of the sample introduction tube 6 faces the electron bombardment ion source 2 circular filament.
In one embodiment, as shown in fig. 3, a mass spectrometer comprising the dual source ionization source and a sample sleeve for use with the apparatus.
The following further describes embodiments of the present invention, its principles and advantages, in conjunction with the drawings.
2 filaments of electron bombardment ion source be circular, the ultraviolet ray of 1 outgoing of ultraviolet lamp ionization source pass 2 circular filaments of electron bombardment ion source, advance the telescopic center of appearance, advance the sample sleeve and fix in the middle of 1 of ultraviolet lamp ionization source and 2 of electron bombardment ion source, advance the pipeline and advance a kind muffjoint. The mass analyser 4 and detector 5 are located to the right of the electron impact ion source 2. The inner diameter of the sample injection sleeve is larger than that of the ultraviolet lamp exit port. The sample injection sleeve is tightly connected with the ultraviolet lamp ionization source 1; preferably, the sample injection sleeve is sleeved on the ultraviolet lamp ionization source 1, and no gap exists between the sample injection sleeve and the ultraviolet lamp ionization source 1; the distance between the sample injection sleeve and the electron bombardment ion source 2 is less than 1 mm. The side surface of the sample injection sleeve is provided with a hole which is vertical to the side surface of the sleeve or forms a certain angle with the side surface of the sleeve, and the hole has the same outer diameter as the sample injection pipeline; the length of the sample introduction pipeline inserted into the hole is larger than 1 mm, and the end face of the sample introduction pipeline does not touch the inner wall of the sleeve. The vacuum environment 7 is maintained at a low pressure by a vacuum pump. The sample injection sleeve can be made of Teflon, peek and metal materials. The sample inlet pipeline can be used for introducing gas or liquid samples. The sample can be detected by self-priming into the chamber by the pressure difference between the vacuum environment 7 and the atmosphere, or by a pump or the like into the instrument chamber 8. The sample can fully contact with the light path after entering, easily passes through the circular filament of the electron bombardment ion source 2, and can be efficiently utilized. After the sample enters the vacuum environment 7 through the sample inlet pipe 6, the electron bombardment ion source 2 and the ultraviolet lamp ionization source 1 can ionize simultaneously or independently, and further, the sample can be analyzed and detected more effectively.
It should be noted that the present invention is not limited to the types of mass analyzer 4, detector 5, instrument chamber 8, and the specific means of sample introduction.
Through the utility model discloses can solve single electron bombardment ion source and produce fragment ion, work vacuum easily and require highly to and the not high problem of single ultraviolet lamp ionization source ionization efficiency, and along with the extension of mass spectrum application, also can satisfy the detection of complicated many samples under the condition in dual-source ionization source.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (5)
1. A mass spectrometer having a dual source ionization source, characterized by: the mass spectrometer comprises a mass spectrometer body, wherein the mass spectrometer body comprises an instrument cavity, and a dual-source ionization source, an electronic lens, a mass analyzer, a detector, a sample inlet pipe and a vacuum environment which are arranged in the instrument cavity; the dual-source ionization source comprises an ultraviolet lamp ionization source and an electron bombardment ion source; ultraviolet light emitted by the ultraviolet lamp ionization source passes through the center of the round filament of the electron bombardment ion source.
2. A mass spectrometer having a dual source ionization source as claimed in claim 1, wherein: the sample inlet pipe is provided with a sample inlet and extends to a position between the ultraviolet lamp ionization source and the electron bombardment ion source; the electron lens, the mass analyzer and the detector are positioned on the other side of the electron bombardment ion source.
3. The mass spectrometer with a dual source ionization source of claim 1, wherein: the mass analyser is one of a time of flight analyser, a quadrupole or an ion trap.
4. The mass spectrometer with a dual source ionization source of claim 1, wherein: the electron bombardment ion source is provided with an outlet, one end of the electron lens faces the outlet of the electron bombardment ion source, and the other end of the electron lens faces the inlet of the mass analyzer.
5. The mass spectrometer with a dual source ionization source of claim 1, wherein: the sampling tube is one or a combination of a quartz capillary tube, a glass tube, a peek tube, a stainless steel tube, a Teflon tube and a silicone tube.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922238059.5U CN210607181U (en) | 2019-12-13 | 2019-12-13 | Mass spectrometer with double-source ionization source |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922238059.5U CN210607181U (en) | 2019-12-13 | 2019-12-13 | Mass spectrometer with double-source ionization source |
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| Publication Number | Publication Date |
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| CN210607181U true CN210607181U (en) | 2020-05-22 |
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| CN201922238059.5U Active CN210607181U (en) | 2019-12-13 | 2019-12-13 | Mass spectrometer with double-source ionization source |
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