CN210572594U - Aging testing device of power device - Google Patents
Aging testing device of power device Download PDFInfo
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- CN210572594U CN210572594U CN201921327232.2U CN201921327232U CN210572594U CN 210572594 U CN210572594 U CN 210572594U CN 201921327232 U CN201921327232 U CN 201921327232U CN 210572594 U CN210572594 U CN 210572594U
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Abstract
The utility model provides an aging testing device of power device, including electric capacity, the controllable switch device, power device test position, two diodes and inductance, electric capacity is connected between voltage access port and earthing terminal, the first end of controllable switch device, the positive pole and the voltage access port of first diode are connected, the second end of controllable switch device, the positive pole and the first end of inductance of second diode are connected, the second end of inductance, the negative pole of first diode is connected with the first end of power device test position, the negative pole of second diode, the second end and the earthing terminal of power device test position are connected. The energy injected into the inductor by the input power supply in the inductor charging process is equal to the energy fed back to the input power supply by the inductor in the inductor energy feedback process, the aging test basically has no loss, and meanwhile, the energy consumption in the long-time aging test is avoided, the energy is saved, and the test cost is reduced.
Description
Technical Field
The utility model relates to a device aging testing field especially relates to a power device's aging testing device.
Background
Burn-in testing is the long-term operation of many devices in a closed environment, which is an essential part of power semiconductor reliability tests. The currently used burn-in test circuits are mainly Boost circuits (fig. 1) and Buck circuits (fig. 2), which use electronic loads or resistors to discharge energy. On the one hand, every resistance load all is consuming energy, the device is in large quantity and test time is long can cause very big power consumption, test cost is very high, when using electronic load, electronic load itself is also very expensive, on the other hand, the electric energy of load consumption can change into the heat, can let test environment's temperature rise very high, be unfavorable for long-time ageing tests's going on, then need costly radiator and air cooling equipment for improving the heat dissipation, the complexity of test cost and test system has been increased.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing an energy saving just reduces the aging testing device of power device of experimental cost.
In order to realize the utility model discloses the purpose, the utility model provides a power device's aging testing device, including the voltage access port, the earthing terminal, electric capacity, controllable switch device, power device test position, first diode, second diode and inductance, electric capacity is connected between voltage access port and earthing terminal, controllable switch device's first end, the positive pole and the voltage access port of first diode are connected, controllable switch device's second end, the positive pole of second diode is connected with the first end of inductance, the second end of inductance, the negative pole of first diode is connected with the first end of power device test position, the negative pole of second diode, the second end and the earthing terminal of power device test position are connected.
The aging test device further comprises a control unit, wherein the control end of the controllable switch device is connected with the control unit, and the control end of the power device test position is connected with the control unit.
Further, the controllable switch device can adopt a MOSFET device, an IGBT device or an electromagnetic switch device.
The aging test device further comprises a power device, the power device is arranged on a test position of the power device, a source electrode of the power device is connected with a grounding end, and a drain electrode of the power device is connected with a negative electrode of the first diode.
It is thus clear that, the power device can set up on power device test position, through the break-make of different time series to controllable switch device and power device test position, then can realize inductance charging, inductance afterflow, inductance repayment energy, inductance afterflow, inductance charging function, and carry out aging testing through the circulation of above-mentioned function, can make inductance charging process input power inject into the energy of inductance and inductance repayment energy process inductance repay the energy of input power equal, whole device aging test's process will basically not have the loss like this, avoided consuming a large amount of electric energy in the long-time aging test process simultaneously, reach the effect of energy saving and reduction test cost, and this circuit can not produce a large amount of heats, guaranteed going on smoothly of long-time aging test, the circuit structure of this scheme is simple in addition. And the long-time aging test of the semiconductor switch device is utilized, so that the test stability can be improved, and the reduction of energy consumption and the generation of waste heat are facilitated.
Drawings
Fig. 1 is a circuit diagram of a Boost circuit in the related art.
Fig. 2 is a circuit diagram of a Buck circuit in the prior art.
Fig. 3 is a schematic circuit diagram of an embodiment of the aging testing apparatus of the present invention.
Fig. 4 is a schematic circuit diagram of the inductor charging step in the first embodiment of the aging testing method of the present invention.
Fig. 5 is a schematic circuit diagram of the first inductor freewheeling step in the first embodiment of the burn-in test method of the present invention.
Fig. 6 is a schematic circuit diagram of the inductor feedback energy according to the first embodiment of the aging test method of the present invention.
Fig. 7 is a circuit diagram of a second inductor freewheeling step in a second embodiment of the burn-in test method of the present invention.
Fig. 8 is a timing diagram of control signals in the first embodiment of the burn-in test method of the present invention.
Fig. 9 is a timing diagram of control signals in a second embodiment of the burn-in test method of the present invention.
Fig. 10 is a flowchart of the first embodiment of the burn-in test method of the present invention.
Fig. 11 is a flowchart of a second embodiment of the burn-in test method of the present invention.
The present invention will be further explained with reference to the drawings and examples.
Detailed Description
Burn-in test apparatus embodiment:
referring to fig. 3, fig. 3 is a circuit diagram of an aging test apparatus, the aging test apparatus of the present case is mainly used for aging test of power devices, which are also called power semiconductor devices, and are mainly used for high-power electronic devices in the aspects of electric energy conversion and control circuits of power equipment, and the power devices include conventional devices such as thyristors, IGBT tubes, MOSFET tubes, SITH tubes, and the like.
The aging test device comprises a control unit (not shown), a voltage access port, a ground terminal, a capacitor C1, a controllable switching device Q1, a power device test position, a first diode D1, a second diode D2 and an inductor Lf, wherein the voltage access port is connected with a power input end VIN, the ground terminal GND is connected with the ground, the capacitor C1 is connected between the voltage access port and the ground terminal, a first end of the controllable switching device Q1 and an anode of the first diode D1 are connected with the voltage access port, a second end of the controllable switching device Q1 and an anode of the second diode D2 are connected with a first end of the inductor Lf, a second end of the inductor Lf and a cathode of the first diode D1 are connected with the first end of the power device test position, and a cathode of the second diode D2 and a second end of the power device test position are connected with the ground terminal.
In this embodiment, the controllable switching device Q1 employs a MOSFET device, and the power device Q2 is mounted on a power device test site for performing an aging test, so that a first end of the controllable switching device Q1 is a drain of the controllable switching device Q1, a drain of the controllable switching device Q1 is connected to an anode of the first diode D1, a second end of the controllable switching device Q1 is a source of the controllable switching device Q1, a source of the controllable switching device Q1 is connected to an anode of the second diode D2, a control end of the controllable switching device Q1 is a gate of the controllable switching device Q1, and a gate of the controllable switching device Q1 is connected to the control unit and receives a control signal output by the control unit.
The power device test position can be provided with a socket, so that the power device Q2 can be conveniently plugged and tested, the first end of the power device test position is connected with the drain of the power device Q2, the second end of the power device test position is connected with the source of the power device Q2, then the drain of the power device Q2 is connected with the negative electrode of the first diode D1, the source of the power device Q2 is grounded, the control end of the power device Q2 test position is connected with the gate of the power device Q2, and the gate of the power device Q2 is connected with the control unit and receives a control signal output by the control unit. The control unit is provided with a processor, a memory and a driving circuit, and the processor can respectively output corresponding control signals to the controllable switching device Q1 and the power device Q2 through the driving circuit according to preset time sequence so as to realize the on-off of the controllable switching device Q1 and the power device Q2.
First embodiment of burn-in test method:
referring to fig. 4 to 6 in combination with fig. 8 and 10, the burn-in test method includes an inductor charging step S1, an inductor freewheeling step S21, and an inductor feedback energy step S3.
Referring to fig. 4, the inductive charging step S1 includes:
in the initial OFF state of both Q1 and Q2, when Q1 is turned on and Q2 is turned OFF, so that the voltage across Q2 is Vin, then Q2 is turned on, i.e. Q1 and Q2 are turned on, so that the drain voltage of Q2 is reduced, and the current of the inductor Lf gradually increases to a preset current under the action of Vin.
Referring to fig. 5, the inductive freewheeling step S21 includes:
when the inductor Lf reaches a set current point, the Q1 is turned on to block the Q2, and the voltage of the drain of the Q2 rises, because the inductor current does not suddenly change, and the inductor current freewheels with the diode D1 through the Q1, so that the current circularly freewheels among the inductor Lf, the first diode D1 and the controllable switching device Q1.
Referring to fig. 6, the step of feeding back energy inductively includes:
the controllable switch device Q1 and the power device Q2 are blocked, so that the current passes through the second diode D2, the inductor Lf and the first diode D1, that is, the energy on the inductor is fed back to the input terminal Vin through the D1 and the D2.
Referring to fig. 8 and 10, when performing the aging test on the power device Q2, the power device Q2 is set at the power device test position, and the control unit is enabled to drive the Q1 and the Q2 respectively according to the duty ratios shown in fig. 8, so as to implement the aging test cycle shown in fig. 10, that is, the aging test method is executed in sequence according to the inductor charging step S1, the inductor freewheeling step S21, the inductor feedback energy step S3, the inductor freewheeling step S21, and the inductor charging step S1, of course, when the inductor feedback energy step S3 is executed, the inductor current will be continuously reduced, when the inductor current is reduced to the set value, or reduced to 0, the inductor freewheeling step S21 is executed again, and the Q1 is turned on to block the Q2. By controlling the duty ratio of the Q1 and the Q2, the energy injected into the inductor by the input power supply in the inductor charging process can be equal to the energy fed back to the input power supply by the inductor in the inductor energy feedback process, so that the whole device aging test process has no loss basically.
Second embodiment of burn-in test method:
based on the application of the first embodiment of the burn-in test method, referring to fig. 4 to 7 in combination with fig. 9 and 11, the burn-in test method further includes an inductor freewheeling step S22.
Referring to fig. 5, the inductive freewheeling step S21 includes:
blocking Q1 turns on Q2, allowing current to freewheel cyclically between inductor Lf, the power device Q2 test bit, and the second diode D2.
Referring to fig. 9 and 11, the control unit is configured to drive Q1 and Q2 according to the duty ratios shown in fig. 9, so as to implement the aging test cycle shown in fig. 11, that is, the aging test method is executed in sequence according to the inductor charging step S1, the inductor freewheeling step S21, the inductor feedback energy step S3, the inductor freewheeling step S22, and the inductor charging step S1, where, of course, when the inductor feedback energy step S3 is executed, the inductor current is continuously decreased, and when the inductor current is decreased to a set value or is decreased to 0, the control unit is further configured to execute the inductor freewheeling step S22, so as to block Q1 from conducting Q2. By controlling the duty ratio of the Q1 and the Q2, the energy injected into the inductor by the input power supply in the inductor charging process can be equal to the energy fed back to the input power supply by the inductor in the inductor energy feedback process, so that the whole device aging test process has no loss basically.
The embodiment of the computer device comprises:
the computer arrangement comprises a processor for implementing the steps of the burn-in test method as described above when executing the computer program stored in the memory.
Computer-readable storage medium embodiments:
the computer readable storage medium has stored thereon a computer program which, when executed by a processor, carries out the steps of the burn-in test method as described above.
Illustratively, the computer program may be partitioned into one or more modules, which are stored in the memory and executed by the processor to implement the present invention. One or more of the modules may be a series of computer program instruction segments capable of performing specific functions, the instruction segments describing the execution process of the computer program in the control unit of the burn-in test apparatus.
The computer device may be a desktop computer, a notebook, a palm computer, a cloud server, or other computing devices, and the above devices are provided with the control unit of the embodiment. The processor may be a central processing unit, or may be other general purpose processors, digital signal processors, application specific integrated circuits, off-the-shelf programmable gate arrays or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
Therefore, by controlling the on-off of the testing position of the controllable switch device and the power device, such as controlling the duty ratio of signals Q1 and Q2, the functions of inductive charging, inductive follow current, inductive feedback energy, inductive follow current, inductive charging and the like can be realized, and the aging test is carried out through the circulation of the functions, so that the energy injected into the inductor by the input power in the inductive charging process is equal to the energy fed back to the input power by the inductor in the inductive feedback energy process, the process of the aging test of the whole device basically has no loss, meanwhile, the consumption of a large amount of electric energy in the long-time aging test process is avoided, the effects of saving energy and reducing the test cost are achieved, the circuit can not generate a large amount of heat, and the smooth operation of the long-.
Claims (4)
1. An aging testing device of a power device is characterized in that:
the power device testing device comprises a voltage access port, a grounding terminal, a capacitor, a controllable switch device, a power device testing position, a first diode, a second diode and an inductor, wherein the capacitor is connected between the voltage access port and the grounding terminal, the first end of the controllable switch device, the anode of the first diode and the voltage access port are connected, the second end of the controllable switch device, the anode of the second diode and the first end of the inductor are connected, the second end of the inductor, the cathode of the first diode and the first end of the power device testing position are connected, and the cathode of the second diode, the second end of the power device testing position and the grounding terminal are connected.
2. The burn-in test apparatus of claim 1, wherein:
the aging test device further comprises a control unit, wherein the control end of the controllable switch device is connected with the control unit, and the control end of the power device test position is connected with the control unit.
3. The burn-in test apparatus of claim 1, wherein:
the controllable switch device can adopt a MOSFET device, an IGBT device or an electromagnetic switch device.
4. The burn-in test apparatus according to any one of claims 1 to 3, wherein:
the aging test device further comprises a power device, the power device is arranged on a power device test position, a source electrode of the power device is connected with the grounding end, and a drain electrode of the power device is connected with the negative electrode of the first diode.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201921327232.2U CN210572594U (en) | 2019-08-15 | 2019-08-15 | Aging testing device of power device |
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| CN201921327232.2U CN210572594U (en) | 2019-08-15 | 2019-08-15 | Aging testing device of power device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110333434A (en) * | 2019-08-15 | 2019-10-15 | 英诺赛科（珠海）科技有限公司 | A kind of ageing tester of power device, ageing testing method, computer installation and computer readable storage medium |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110333434A (en) * | 2019-08-15 | 2019-10-15 | 英诺赛科（珠海）科技有限公司 | A kind of ageing tester of power device, ageing testing method, computer installation and computer readable storage medium |
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