CN210536649U

CN210536649U - Out-of-band useless emission index over-the-air OTA performance test system of wireless equipment

Info

Publication number: CN210536649U
Application number: CN201921688006.7U
Authority: CN
Inventors: 宫剑; 张明远; 付靖
Original assignee: STATE RADIO MONITORING CENTER TESTING CENTER
Current assignee: STATE RADIO MONITORING CENTER TESTING CENTER
Priority date: 2019-10-10
Filing date: 2019-10-10
Publication date: 2020-05-15
Anticipated expiration: 2029-10-10

Abstract

The utility model provides an aerial OTA capability test system of useless emission index in outband of wireless device, including darkroom, revolving stage, surveyed wireless device, signal detection subassembly, spectral analysis appearance and controlling means, wherein, the path loss of darkroom is less than the difference between the background noise value of the required value of the useless emission index in outband of surveyed wireless device and spectral analysis appearance. The system adopts a darkroom with a specific path loss value as a test field, and performs near field test of out-of-band useless emission indexes of the tested wireless equipment by matching a single signal detection assembly serving as a probe and a rotary table capable of horizontally and vertically rotating, so that the total offset compensation value of field path loss and cable loss on the spectrum analyzer can be effectively ensured to be small enough, the bottom noise of the whole test system can be effectively controlled, and a stable and good out-of-band useless emission index test result is obtained, and the tested wireless equipment can pass the index requirement. The system has small floor area and low cost.

Description

Out-of-band useless emission index over-the-air OTA performance test system of wireless equipment

Technical Field

The utility model relates to a wireless device's test technical field, especially a wireless device's aerial OTA capability test system of useless emission index in outband.

Background

Currently, although some proposals have been made in relevant international and domestic standards regarding methods for out-of-band unwanted emission OTA (Over the Air) testing of wireless devices, such as 5G base stations, there has been no detailed description of the testing methods to date. Due to the increasing shortage of frequency resources, in order to avoid mutual interference among different systems, the domestic radio administration provides a very strict out-of-band useless transmission OTA test index for wireless transmission equipment (especially a 5G base station below 6 GHz), but does not provide a clear method proposal favorable for passing the test for the strict index.

In the prior art, the out-of-band useless emission index measured by a common method cannot really reflect the actual out-of-band useless emission level of the measured wireless equipment. For example, if the standard requires that the out-of-band unwanted emission indicator of the wireless device to be tested cannot be greater than-40 dBm/MHz, the actual out-of-band unwanted emission level of the wireless device to be tested may reach-50 dBm/MHz, but the results of the out-of-band unwanted emission indicators measured by using different testing methods may be-10 dBm/MHz, -38dBm/MHz, -47dBm/MHz, etc., which may not reflect the actual level of the wireless device to be tested, or even cause the wireless device to be tested to fail the standard out-of-band unwanted emission indicator limit requirement, thereby preventing the application of the wireless device to be tested.

Therefore, a standard and feasible test scheme for out-of-band unwanted emission indicators of wireless devices is needed to obtain better test results for the out-of-band unwanted emission indicators, so that the test results for the out-of-band unwanted emission indicators can meet the requirement of indicator limit.

SUMMERY OF THE UTILITY MODEL

In view of the above, the present invention has been developed to provide an over-the-air OTA performance test system for wireless devices that overcomes or at least partially solves the above-mentioned problems.

According to the embodiment of the utility model provides an aspect provides an aerial OTA capability test system of useless emission index in outband of wireless device, include:

a darkroom;

the rotary table is arranged in the darkroom and is used for rotating in the horizontal and vertical directions under the control of the control device;

the wireless device to be tested is arranged on the rotary table, rotates along with the rotary table and is used for transmitting wireless signals in a specified frequency band;

the signal detection component is arranged in the darkroom and at a preset distance from the wireless device to be detected and is used for receiving a wireless signal transmitted by the wireless device to be detected when the wireless device to be detected rotates;

the spectrum analyzer is connected with the signal detection component and is used for collecting, recording and analyzing the signal from the signal detection component to obtain out-of-band useless emission data of the wireless device to be detected at a preset rotation position; and

the control device is respectively connected with the rotary table and the spectrum analyzer and is used for controlling the rotation of the rotary table, and obtaining an out-of-band useless emission index of the wireless device to be detected according to a preset algorithm based on the out-of-band useless emission data of the wireless device to be detected at a preset rotation position obtained by the spectrum analyzer;

wherein the darkroom has a path loss lower than a difference between a desired value of an out-of-band unwanted emission indicator of the wireless device under test and a background noise value of the spectrum analyzer.

Optionally, the wireless device under test is a 5G base station.

Optionally, the out-of-band unwanted emission data is an effective isotropic radiated power EIRP of the out-of-band unwanted emission, and the out-of-band unwanted emission indicator is a total radiated power TRP of the out-of-band unwanted emission.

Optionally, a path loss of the darkroom is less than or equal to 50 dB.

Optionally, the system further comprises:

and the wave trap is arranged on a connecting path of the signal detection assembly and the spectrum analyzer and is used for carrying out frequency filtering on the signal from the signal detection assembly and transmitting the filtered signal to the spectrum analyzer.

Optionally, a passband insertion loss of the trap is less than or equal to 2 dB;

the stop band rejection of the wave trap is greater than or equal to 80 dB.

Optionally, the spectrum analyzer has a noise floor value less than or equal to-169 dBm/Hz.

Optionally, the signal detection assembly comprises:

an antenna mount; and

a measuring antenna disposed on the antenna mount;

alternatively, the first and second electrodes may be,

the signal detection assembly includes:

the reflecting surface is arranged opposite to the wireless device to be tested and used for reflecting a wireless signal emitted by the wireless device to be tested when the wireless device to be tested rotates; and

and the feed source antenna is arranged at the focus of the reflecting surface and used for receiving the wireless signal reflected from the reflecting surface and transmitted by the wireless device to be tested.

Optionally, the turntable comprises:

a turntable base; and

and the polarization shaft supporting rod is arranged on the rotary table base, and the tested wireless equipment is arranged on the polarization shaft supporting rod.

Optionally, the darkroom comprises:

a shield case; and

a wave absorbing material disposed on an inner surface of the shield shell.

The embodiment of the utility model provides an aerial capability test system of wireless device's outband useless emission index has adopted the darkroom that has specific path loss value as the test place, through single signal detection subassembly as the probe with can carry out the level and vertical rotatory revolving stage cooperation and carry out the out-of-band useless emission index's of being surveyed wireless device near field test. Because the path loss of the darkroom in the system is lower than the difference value between the required value of the out-of-band useless emission index of the tested wireless equipment and the background noise value of the spectrum analyzer, specifically, less than or equal to 50dB, the total offset compensation value of the field path loss and the cable loss on the spectrum analyzer can be effectively ensured to be small enough, so that the background noise of the whole test system can be effectively controlled, a stable and good out-of-band useless emission index test result is obtained, and the tested wireless equipment can pass the index requirement. Simultaneously, owing to adopted single probe's near field test darkroom, the utility model discloses test system has that area is little, advantage with low costs.

Further, the embodiment of the utility model provides a test system still includes the wave trap that sets up on the connecting path of signal detection subassembly and spectrum analyzer. By selecting a wave trap with specific passband insertion loss (less than or equal to 2dB) and stop band rejection (more than or equal to 80dB), the spectrum analyzer can be effectively ensured to work under the condition of optimal background noise, and the overall offset compensation value on the spectrum analyzer can be further reduced, so that the background noise of the whole system can be controlled to be lower. In addition, a spectrum analyzer with high dynamic range performance (the bottom noise value is less than or equal to-169 dBm/Hz) is matched and selected, so that a better out-of-band useless emission index test result can be obtained.

The above description is only an overview of the technical solutions of the present invention, and in order to make the technical means of the present invention more clearly understood, the present invention may be implemented according to the content of the description, and in order to make the above and other objects, features, and advantages of the present invention more obvious and understandable, the following detailed description of the present invention is given.

The above and other objects, advantages and features of the present invention will become more apparent to those skilled in the art from the following detailed description of specific embodiments thereof, taken in conjunction with the accompanying drawings.

Drawings

Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:

fig. 1 is a schematic structural diagram of an over-the-air performance testing system with out-of-band garbage emission indicators for a wireless device according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of an over-the-air performance testing system with out-of-band garbage emission indicators for a wireless device according to another embodiment of the present invention.

Detailed Description

Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

Today, relevant international and domestic standards have imposed increasingly stringent pass limit requirements on out-of-band spurious emission OTA test metrics for wireless transmitting devices. Taking the 5G base station as an example, the requirement of the out-of-band useless emission index is more severe than the past, and the limit value of the out-of-band useless emission index is not more than ten or even dozens of dB higher than the actual measurement value as before, so that the actual measurement value of the out-of-band useless emission index of many measured emission systems is quite close to the required limit value or the margin is not high.

The inventor finds that the out-of-band unwanted emission indicator test result is susceptible to the influence of the background noise performance of the test system, so that under the condition that the measured out-of-band unwanted emission indicator values of a plurality of current tested emission systems are quite close to the requirement limit value or the margin is not high, the fluctuation of the measured out-of-band unwanted emission indicator values caused by the background noise of the test system becomes the key for determining whether the test is passed or not. However, no standard and feasible test scheme for the out-of-band useless emission index of the wireless device exists at present, so that the measured out-of-band useless emission index can truly reflect the actual out-of-band useless emission level of the measured wireless device, and the measured wireless device can pass strict index requirements.

In order to solve the above technical problem, an embodiment of the present invention provides an over-the-air (OTA) performance test system with out-of-band useless emission indexes for wireless devices.

Fig. 1 is a schematic structural diagram of an over-the-air performance testing system 10 with out-of-band garbage emission indicators for wireless devices according to an embodiment of the present invention. Referring to fig. 1, the system 10 may include at least: a darkroom 7, a rotary table 5, a wireless device under test 6, a signal detection assembly 4, a spectrum analyzer 2 and a control device 3.

The darkroom (also called anechoic chamber) 7 is a sealed shielded room for radiation measurement. The dark chamber 7 may include a shielding shell 71, and a wave-absorbing material 72 disposed on an inner surface of the shielding shell 71. The wave-absorbing material 72 may be, for example, a conical polyurethane foam type sponge wave-absorbing material containing carbon (such as graphene, carbon black, carbon nanotube, etc.), which is not limited by the present invention. The embodiment of the utility model provides an utilize the darkroom to realize the near field test as the test place.

The turntable 5 is disposed in the darkroom, and the turntable 5 is connected to the control device 3 such that the turntable 5 can rotate in horizontal and vertical directions under the control of the control device 3. The wireless device 6 to be tested is mounted on the rotary table 5 and rotates along with the rotary table 5, and is used for transmitting wireless signals in the designated frequency band. Specifically, the turntable 5 can rotate 360 degrees in the horizontal direction and 180 degrees in the vertical direction under the control of the control device 3, so as to drive the wireless device 6 to be tested to rotate to simulate a radiation spherical surface. The wireless device under test 6 may be a wireless transmitting device, such as a 5G base station, that transmits signals in a designated frequency band.

As shown in fig. 1, the turntable 5 may generally include a turntable base 51, and a polarization axis support rod 52 provided on the turntable base 51. At this time, the wireless device 6 to be measured is mounted on the polarization axis support rod 52, specifically, on the end of the polarization axis support rod 52 remote from the turntable base 51, so that the wireless device 6 to be measured can freely rotate along with the turntable 5.

The signal detection component 4 is fixedly arranged in the darkroom 7 at a preset distance from the wireless device 6 to be detected and is used for receiving the wireless signal transmitted by the wireless device 6 to be detected when rotating. As shown in fig. 1, the signal detection assembly 4 may generally include an antenna mount 42, and a measurement antenna 41 disposed on the antenna mount 42. The embodiment of the utility model provides an in adopt single signal detection subassembly to measure the signal of being surveyed the wireless device transmission as the probe, simplify test system's structure. In application, the distance between the signal detection component 4 and the wireless device under test 6 can be set according to signal frequency, signal strength, receiving sensitivity of the antenna, and the like. Typically, the distance between the signal detection component 4 and the wireless device under test 6 can be set to be about 2.5 m.

The spectrum analyzer 2 is connected to the signal detection assembly 4 by, for example, a radio frequency cable, and is used for collecting, recording and analyzing signals from the signal detection assembly 4 to obtain out-of-band unwanted emission data of the wireless device under test 6 at a predetermined rotational position (i.e., a predetermined point on the above-mentioned radiation sphere).

The control means 3 may be a means with a built-in control software program, which is connected to the turntable 5 and the spectrum analyzer 2, respectively, for controlling the rotation of the turntable 5, and obtaining an out-of-band spurious emission index of the wireless device under test 6 according to a preset algorithm based on the out-of-band spurious emission data of the wireless device under test 6 at a predetermined rotation position obtained by the spectrum analyzer 2. In practical application, controlling means 3 can be integrated in spectral analysis appearance 2, also can independently set up outside spectral analysis appearance 2, the utility model discloses do not do the restriction to this.

The embodiment of the utility model provides a wireless device's OTA capability test system of useless emission index in outband can be used to the useless Total Radiated Power (TRP) test in outband, stray TRP test etc..

As indicated in the background art, the performance of the background noise (also referred to as background noise) of the test system is crucial to the test result of the out-of-band useless emission indicator, and especially at the present time that the frequency resources are increasingly tight, so that the use condition of the wireless devices in each frequency band is more complicated, the requirements on the out-of-band useless emission indicator of the wireless devices are more severe than before in order to avoid mutual interference and improve compatibility between devices or systems in different frequency bands. In this case, in order to obtain better out-of-band spurious emission test results as much as possible to meet the increasingly stringent specification requirements, controlling the noise floor of the test system becomes the key to determining whether the out-of-band spurious emission test of the wireless device can pass the standard specification requirements. Factors affecting the noise floor of the test system mainly include the path loss of the test site, the dynamic performance of the spectrum analyzer (e.g., the lowest noise floor achievable), and the performance of the trap. In the embodiment of the present invention, the path loss of the darkroom 7 is lower than the difference between the required value of the out-of-band unwanted emission indicator of the wireless device under test 6 and the noise floor value of the spectrum analyzer 2. Therefore, the total offset compensation value of the field path loss and the cable loss on the spectrum analyzer can be effectively ensured to be small enough, so that the background noise of the whole test system can be effectively controlled, a stable and good out-of-band useless emission index test result is obtained, and the passing index requirement of the tested wireless equipment is facilitated.

The embodiment of the utility model provides an aerial capability test system of wireless device's outband useless emission index has adopted the darkroom that has specific path loss value as the test place, through single signal detection subassembly as the probe with can carry out the level and vertical rotatory revolving stage cooperation and carry out the out-of-band useless emission index's of being surveyed wireless device near field test. Because the path loss of the darkroom in the system is lower than the difference value between the required value of the out-of-band useless emission index of the tested wireless equipment and the background noise value of the spectrum analyzer, the total offset compensation value of the field path loss and the cable loss on the spectrum analyzer can be effectively ensured to be small enough, so that the background noise of the whole test system can be effectively controlled, a stable and good out-of-band useless emission index test result is obtained, and the passing of the index requirement of the tested wireless equipment is facilitated. Simultaneously, owing to adopted the near field test darkroom of single probe, the utility model discloses the test system area is little, with low costs.

The following describes the selection of the path loss value of the darkroom 7 by taking the wireless device under test 6 as a 5G base station as an example.

When the wireless device under test 6 is a 5G base station, the measured out-of-band unwanted emission indicator is preferably the TRP of the out-of-band unwanted emission of the 5G base station. In this test scenario, the 5G base station is driven by the turntable 5 to rotate 360 degrees in the horizontal direction and 180 degrees in the vertical direction, and transmits wireless signals (electromagnetic wave signals) below 6GHz (approximately in the range of 2-6 GHz) while rotating. The signal detection assembly 4 receives the wireless signals transmitted by the 5G base station and transmits the signals to the spectrum analyzer 2. The spectrum analyzer 2 performs scanning analysis on the signal to obtain Effective Isotropic Radiated Power (EIRP) of the out-of-band unwanted emissions of the 5G base station at different predetermined rotational positions (i.e., predetermined points on the radiating sphere). Finally, the control device 3 performs spherical integration on the EIRP of the out-of-band unwanted emissions of the 5G base station at each predetermined point on the radiation spherical surface, thus obtaining the TRP test value of the out-of-band unwanted emissions of the 5G base station. The operation of scanning measurement of EIRP at each point of the radiation sphere and integral calculation of TRP is well known to those skilled in the art and will not be described herein.

At present, the limit value of TRP (total radiated power) of the out-of-band useless emission of the 5G base station by domestic and foreign standards is-40 dBm/MHz, which means that the minimum EIRP of each point on a radiation spherical surface of the 5G base station obtained by scanning is ensured to be below-40 dBm/MHz (the single polarization measurement result is-43 dBm/MHz), and the 5G base station to be measured can pass the limit value requirement. At present, the background noise of a general spectrum analyzer can reach-170 dBm/Hz to-160 dBm/Hz, namely-110 dBm/MHz to-100 dBm/MHz under the condition that an internal attenuator is 0 and a preamplifier (or preamplifier) is opened. To the utility model discloses to the test system that the embodiment provided, the offset value that needs compensate the spectrum analysis appearance in the test contains place path loss (being darkroom 2's path loss) and radio frequency cable loss. It can be found from the calculation that if the background noise of the spectrum analyzer 2 is-100 dBm/MHz, the total offset compensation value of the field path loss and the rf cable loss on the spectrum analyzer 2 must be controlled to be 57dB or less. Considering the influence of the loss of the radio frequency cable, when the path loss of the darkroom 2 is less than or equal to 50dB, the noise floor of the whole test system can be effectively controlled, and a stable and good out-of-band useless emission index test result is obtained. Furthermore, the actual test result shows that the darkroom 2 with the path loss of about 45dB is used as a test field, the offset compensation value on the spectrum analyzer 2 is smaller, the bottom noise of the test system is controlled to be lower, and a better out-of-band useless emission TRP test result can be obtained.

In some embodiments, with continued reference to fig. 1, the present invention provides an airborne performance testing system 10 that further includes a wave trap 1. The wave trap 1 is arranged in the connection path of the signal detection assembly 4 and the spectrum analyser 2, i.e. the spectrum analyser 2 is connected to the signal detection assembly 4 via the wave trap 1. The trap 1 is used to frequency filter the signal from the signal detection assembly 4 and to pass the filtered signal to the spectrum analyser 2. The interference of other frequency band signals to the detection of out-of-band useless transmitting signals is eliminated through the wave trap 1.

When the trap 1 is included in the test system, the offset value that needs to be compensated to the spectrum analyzer 2 during the test should include the field path loss (i.e., the path loss of the dark room 2), the pass-band loss of the trap 1 (i.e., the pass-band insertion loss), and the radio frequency cable loss. Therefore, to ensure that the offset compensation value on the spectrum analyzer is small enough so that the noise floor of the test system is controlled to be lower, a trap with as little passband insertion loss as possible should be used. Preferably, in the embodiment of the present invention, the passband insertion loss of the wave trap 1 is less than or equal to 2 dB. The insertion loss values of the trap corresponding to the signal frequencies (2515-.

TABLE 1

Signal frequency (GHz)	Insertion loss (dB)
		2.4835	1.2649
2.50	2.3738
		2.515	-74.776
2.675	-89.684
		2.70	1.6908
2.90	0.7940

In addition, the stop-band rejection characteristics of the wave trap also influence the TRP test result, and a deeper stop-band rejection degree is more favorable for the test result. The peak EIRP of a 5G base station below 6GHz is generally greater than 74dBm (the maximum peak EIRP can reach more than 77 dBm), and if the stopband rejection of the notch filter is not large enough, a signal entering the spectrum analyzer is large, which may cause that a preamplifier of the spectrum analyzer cannot be turned on, and a built-in attenuator cannot be 0, and in this case, the spectrum analyzer cannot be guaranteed to work under the condition of optimal background noise, and further may cause that the out-of-band OTA test condition for useless TRP emission cannot be satisfied. Therefore, the trap with a larger degree of stop band suppression is more advantageous for the spectrum analyzer to exhibit the best noise suppression capability. For example, for a signal at 2.515GHz, the recommended notch rejection is about 74dB, while for a signal at 2.675GHz, the recommended notch rejection is about 89 dB. Preferably, in the embodiment of the present invention, the stop band rejection of the wave trap 1 is greater than or equal to 80dB, so as to ensure that the spectrum analyzer 2 exerts better noise floor performance.

In addition, in the out-of-band unwanted emission index test of the 5G base station, the interval between the useful signal of the low frequency band and the unwanted emission signal outside the tested band is only 15MHz, the interval between the useful signal of the high frequency band and the unwanted emission signal outside the tested band is only 25MHz, and the transition from the pass band insertion loss of 2dB to the stop band rejection of 70-80dB needs to be met at the interval, so that higher requirements are provided for the manufacture of a wave trap.

In some embodiments, the spectrum analyzer 2 with a noise floor value less than or equal to-169 dBm/Hz may be selected, so as to further ensure that the noise floor of the whole test system can be controlled to be lower, and obtain a better out-of-band useless emission indicator test result.

In some embodiments, the aforementioned signal detection assembly 4 may also be replaced by a signal detection assembly 8. Fig. 2 is a schematic structural diagram of an over-the-air performance testing system 20 with out-of-band garbage emission indicators for wireless devices according to another embodiment of the present invention. Referring to fig. 2, the system 20 may include at least a darkroom 7, a turntable 5, a wireless device under test 6, a signal detection assembly 8, a spectrum analyzer 2, and a control device 3. The signal detection assembly 8 may generally include a reflective surface 81 and a feed antenna 82. The reflecting surface 81 may be a reflecting mirror surface, and is disposed opposite to the wireless device under test 6, and is used for reflecting the wireless signal emitted by the wireless device under test 6 when rotating to the feed antenna 82 for receiving. The feed antenna 82 is disposed at the focal point of the reflecting surface 81 and is used for receiving the wireless signal transmitted by the wireless device under test 6 reflected from the reflecting surface 81. The darkroom 7, the turntable 5, the wireless device under test 6, the spectrum analyzer 2 and the control means 3 are as described above and will not be described in further detail herein. By adopting a compact field test system based on a reflecting surface and a feed source antenna to replace the near field test system, the OTA performance test of the wireless equipment with out-of-band useless emission indexes can be realized without near-far field teaching transformation, and the data analysis and processing process is simplified.

Further, with continued reference to fig. 2, the system 20 also desirably includes a wave trap 1. The trap 1 is also as described above and will not be described further here.

According to any one of the above-mentioned optional embodiments or the combination of a plurality of optional embodiments, the embodiment of the present invention can achieve the following advantageous effects:

Further, the embodiment of the present invention provides a test system, which further includes a wave trap disposed on a connection path between the signal detection module and the spectrum analyzer. By selecting a wave trap with specific passband insertion loss (less than or equal to 2dB) and stop band rejection (more than or equal to 80dB), the spectrum analyzer can be effectively ensured to work under the condition of optimal background noise, and the overall offset compensation value on the spectrum analyzer can be further reduced, so that the background noise of the whole system can be controlled to be lower. In addition, a spectrum analyzer with high dynamic range performance (the bottom noise value is less than or equal to-169 dBm/Hz) is matched and selected, so that a better out-of-band useless emission index test result can be obtained.

In the description provided herein, numerous specific details are set forth. It is understood, however, that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments can be modified or some or all of the technical features can be equivalently replaced within the spirit and principles of the present invention; such modifications and substitutions do not depart from the scope of the present invention.

Claims

1. An over-the-air OTA performance testing system for out-of-band garbage emission indicators for a wireless device, comprising:

a darkroom;

2. The system of claim 1, wherein the wireless device under test is a 5G base station.

3. The system of claim 1, wherein the out-of-band unwanted emission data is an Effective Isotropic Radiated Power (EIRP) of the out-of-band unwanted emissions, and wherein the out-of-band unwanted emission indicator is a Total Radiated Power (TRP) of the out-of-band unwanted emissions.

4. The system of claim 3, wherein the darkroom has a path loss less than or equal to 50 dB.

5. The system of any one of claims 1-4, further comprising:

6. The system of claim 5, wherein the passband insertion loss of the notch filter is less than or equal to 2 dB;

the stop band rejection of the wave trap is greater than or equal to 80 dB.

7. The system of any of claims 1-4, wherein the spectrum analyzer has a noise floor value of less than or equal to-169 dBm/Hz.

8. The system of claim 1, wherein the signal detection component comprises: