CN210533672U - Test fixture and chromaticity test device of LED filament - Google Patents

Abstract

The utility model provides a test fixture and a chromaticity test device of an LED filament, wherein the test fixture comprises a conductive base, an insulating baffle and a conductive plate; the LED filament lamp comprises a conductive base, an insulating baffle, a groove and a clamping plate, wherein the insulating baffle is arranged on the conductive base, the groove is suitable for coating a single light-emitting surface of the LED filament so as to shade the single light-emitting surface of the LED filament, and the clamping plate is suitable for mounting the LED filament on the insulating baffle; the conducting plate sets up on electrically conductive base, and the conducting plate is suitable for electrically connecting electrically conductive base and LED filament. Therefore, the color consistency of the two light emitting surfaces of the LED lamp filament can be ensured, and the phenomenon of a shade surface and a sun surface is avoided; and through the setting of this test fixture, can improve the accuracy and the efficiency of filament chromaticity test.

Description

Test fixture and chromaticity test device of LED filament

Technical Field

The utility model relates to a lighting device's test technical field, in particular to chromaticity testing arrangement of test fixture and LED filament.

Background

The LED filament lamp is a 360-degree luminous body, and the luminous surface of the LED filament lamp is divided into a front surface and a back surface. The LED filament is formed by attaching a chip to one surface of a ceramic substrate or a sapphire substrate and then coating fluorescent glue on the two surfaces of the sapphire substrate or the ceramic substrate respectively. Since the blue light emitted from both sides of the ceramic substrate or the sapphire substrate has different intensity, the phosphor concentration required to be coated is also different. Therefore, in order to ensure that the light emitting colors of the front surface and the back surface are consistent, the front surface and the back surface need to be subjected to chromaticity tests respectively.

However, because the front and the back of the LED filament emit light simultaneously, it is difficult to test the front and the back of the filament individually, which causes the color of the front and the back of the LED filament to be different and the phenomenon of the shade and the sun to occur.

SUMMERY OF THE UTILITY MODEL

The utility model discloses aim at solving one of the technical problem in the above-mentioned technique to a certain extent at least, realize testing the single light emitting area of LED filament promptly, ensure that the colour of two light emitting areas of filament is unanimous, avoid appearing the sun face phenomenon. Therefore, an object of the present invention is to provide a test fixture.

To achieve the above object, the present invention provides in one aspect a test fixture, including:

a conductive base;

the insulating baffle is arranged on the conductive base, a groove and a clamping plate are arranged on the insulating baffle, the groove is suitable for coating a single light-emitting surface of the LED filament so as to shade the single light-emitting surface of the LED filament, and the clamping plate is suitable for mounting the LED filament on the insulating baffle;

a conductive plate disposed on the conductive base, the conductive plate adapted to electrically connect the conductive base with the LED filament.

According to the utility model discloses a test fixture, through the setting of insulating barrier, can shelter from the one light emitting face in two light emitting faces of LED filament for testing device can test the single light emitting face of LED filament, again carries out the ratio debugging according to the test result, thereby ensures that the colour of two light emitting faces of LED filament is unanimous, avoids appearing the cloudy positive phenomenon; in addition, the clamping plates of the insulating baffle plates are arranged, so that the LED lamp filament is convenient to disassemble and assemble in the test process, and the test efficiency can be improved.

In addition, according to the present invention, the test fixture provided by the above embodiment can further have the following additional technical features:

according to the embodiment of the utility model, the conductive base is in a U-shaped outline structure with an upward opening along the front and back projection directions, and the insulating baffle is arranged at the opening of the conductive base; the upper end of the conductive base and the left and right parts of the U-shaped outline structure are both connected with the conductive plate.

According to the embodiment of the utility model, the clamping plate can be movably arranged along the length direction of the insulating baffle; the conductive plate is adapted to abut the pinch plate and is movable following movement of the pinch plate to electrically connect the conductive base with the LED filament. This scheme passes through splint and the equal movable setting of current-conducting plate for this test fixture can be adjusted according to the length of LED filament, tests the LED filament of different length.

According to the utility model discloses an embodiment, the current conducting plate sets up on a slide bar, the slide bar is movably inserted and is established the left part or the right part of U type profile structure.

According to the utility model discloses an embodiment, splint are the elasticity clamping piece, the elasticity clamping piece along the thickness direction of insulating barrier carries out the centre gripping, and the elasticity clamping piece has the orientation the protruding curved plate of establishing of recess.

According to the utility model discloses an embodiment, the recess internal surface with the curved plate all is equipped with black coating.

According to the utility model discloses an embodiment, two ends of insulating barrier pass through bolt one-to-one ground lock and connect the part about U type profile structure.

An embodiment of another aspect of the utility model provides a chromaticity testing arrangement of LED filament, including foretell test fixture.

According to the utility model discloses chromaticity testing arrangement of LED filament through the setting of above-mentioned test fixture, ensures that the colour of two light emitting areas of filament is unanimous, avoids appearing the cloudy positive surface phenomenon.

Drawings

Fig. 1 is a schematic structural diagram of a test fixture according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of a portion of a test fixture according to an embodiment of the present invention;

description of reference numerals: the testing fixture comprises a testing fixture 1, a conductive base 100, a first bolt 101, a sliding rod 102, a sliding groove 103, a second bolt 104, an insulating baffle 200, a groove 201, a clamping plate 202, a through hole 203, a conductive plate 300, an LED filament 400 and a light-emitting surface 401.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention.

In order to better understand the above technical solutions, exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention can be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

The test fixture 1 according to an embodiment of the present invention is described below with reference to the drawings.

As shown in fig. 1 and fig. 2, according to the utility model discloses test fixture 1 can carry out the centre gripping location to the LED filament in the chromaticity test of LED filament to can realize testing alone the different light emitting areas of LED filament, guarantee that the colour of two light emitting areas of LED filament is unanimous, avoid appearing the negative and positive phenomenon.

Specifically, the test fixture 1 includes a conductive base 100, an insulating barrier 200, and a conductive plate 300.

The insulating baffle 200 is arranged on the conductive base 100, the insulating baffle 200 is provided with a groove 201 and a clamping plate 202, the groove 201 is suitable for coating a single light-emitting surface 401 of the LED filament 400 so as to shade the single light-emitting surface 401 of the LED filament 400, and the clamping plate 202 is suitable for mounting the LED filament 400 on the insulating baffle 200; the conductive plate 300 is disposed on the conductive base 100, and the conductive plate 300 is adapted to electrically connect the conductive base 100 with the LED filament 400.

That is to say, the test fixture 1 clamps the LED filament 400 through the clamping plate 202 to position the LED filament 400, and the single light emitting surface 401 of the LED filament 400 is shielded by the arrangement of the groove 201, so that the light emission of one surface does not interfere with the test of the other surface during the chromaticity test; in addition, the conductive plate 300 and the conductive base 100 are provided, so that the LED filament can be energized to emit light.

Therefore, according to the utility model discloses a test fixture 1, through the setting of insulating barrier 200, can shelter from the one-emitting face in two light emitting areas 401 of LED filament 400 for testing arrangement can test single light emitting area 401 of LED filament 400, again according to the test result carry out the ratio and debug the fluorescent glue concentration, thereby ensure that the colour of two light emitting areas 401 of LED filament 400 is unanimous, avoid appearing the sun and shade face phenomenon; in addition, the clamping plates 202 of the insulating baffle 200 are arranged, so that the LED filament 400 is convenient to disassemble and assemble in the test process, and the test efficiency can be improved.

Optionally, the conductive base 100 has a U-shaped profile structure with an upward opening along the front-back projection direction, and the insulating baffle 200 is disposed at the opening of the conductive base 100; a conductive plate 300 is connected to both left and right portions of the U-shaped outline structure at the upper end of the conductive base 100. It is understood that the insulating barrier 200 is installed at one end at the left portion of the U-shaped outline structure and at the other end at the right portion of the U-shaped outline structure such that it is disposed at the opening of the conductive base 100 to facilitate testing of the LED filament 400 installed on the insulating barrier 200.

Specifically, both ends of the insulating barrier 200 are locked to the left and right portions of the U-shaped outline structure by the first bolts 101 in a one-to-one correspondence. The left and right parts of the U-shaped outline structure are provided with a support, the support is provided with a threaded hole, the two ends of the insulating baffle 200 are provided with a through hole 203, and then the first bolt 101 penetrates through the through hole 203 and is locked on the threaded hole, so that the two ends of the insulating baffle 200 are locked on the left and right parts of the U-shaped outline structure in a one-to-one correspondence manner.

Alternatively, the clamp plate 202 is movably disposed along the length direction of the insulation barrier 200; the conductive plate 300 is adapted to abut the clamping plate 202 and can move following the movement of the clamping plate 202 to electrically connect the conductive base 100 with the LED filament 400. That is, the clamping plate 202 is made of conductive material, and directly clamps and contacts the LED filament 400; the conductive plate 300 abuts the clip 202 on one hand and connects to the conductive base 100 on the other hand, so that the LED filament 400 can emit light when the conductive base 100 is energized. Then, the clamping plate 202 and the conductive plate 300 can be movably arranged, so that the test fixture 1 can be adjusted according to the length of the LED filament 400 to test the LED filament 400 with different lengths. In addition, the clamping plate 202 can be brought into close contact with the conductive plate 300 by adjusting the first bolt 101 to achieve electrical connection.

Wherein, the conductive plate 300 may be movably disposed such that the conductive plate 300 is disposed on a slide bar 102, and the slide bar 102 is movably inserted into a left portion or a right portion of the U-shaped profile structure. That is, the left part and the right part of the U-shaped outline structure of the guide base 100 are both provided with the sliding grooves 103, the sliding rod 102 is inserted into the sliding grooves 103, and the conductive plate 300 is fixed on the sliding rod 102, so that when the sliding rod 102 is driven to slide, the conductive plate 300 can be driven to move; and, the sliding rod 102 slides along the length direction of the insulation barrier 200, so that the conductive plate 300 can move following the movement of the clamping plate 202. The slide bar 102 is then parked on the conductive base 100 by abutment of the second bolt 104. It is understood that the sliding rod 102 is also made of a conductive material, and the conductive base 100 and the conductive plate 300 can be electrically connected by fixing the sliding rod to the conductive base 100 through the second bolt 104.

Wherein, the movable setting of splint 202 can be, splint 202 is the elasticity clamping piece, and the elasticity clamping piece carries out the centre gripping along the thickness direction of insulating barrier 200 to the elasticity clamping piece has towards the protruding curved plate that establishes of recess 101. That is, the clamping plate 202 is configured by the elastic clip, and the position thereof can be manually adjusted, so that the LED filament 400 can be mounted on the insulating barrier 200 and can also move along the length direction of the insulating barrier 200. Moreover, the curved plate on the elastic clip is disposed so that the clip 202 can firmly hold the LED filament 400. In addition, to achieve close contact of the conductive plate 300 with the clamping plate 202, the conductive plate 300 may be a curved plate having the same shape as the curved plate such that the conductive plate 300 is partially embedded in the clamping plate 202.

In some examples, the inner surface of groove 101 and the upper curved plate of clamping plate 202 are both provided with a black coating; the side of the insulating barrier 200 opposite to the groove 101 may be provided with a white coating. Therefore, the black coating can fully shield and absorb light rays emitted by the light emitting surface of the LED filament 400 embedded in the groove 101; by the design of the color, the accuracy of the test can be improved.

The utility model discloses a chromaticity test device of LED filament is proposed in another aspect embodiment, including foretell test fixture.

Therefore, through the arrangement of the test fixture 1, the colors of two light emitting surfaces of the LED filament 400 can be ensured to be consistent, and the phenomenon of a shade surface and a sun surface is avoided; and through the setting of this test fixture 1, can improve the accuracy and the efficiency of filament chromaticity test.

Other components of the chromaticity testing device for the LED filament according to the embodiment of the present invention may adopt the existing structure, and are not described in detail herein.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and to simplify the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above should not be understood to necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples described in this specification can be combined and combined by those skilled in the art.

Although embodiments of the present invention have been shown and described, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art without departing from the scope of the present invention.

Claims (8)

1. A test fixture, comprising:

a conductive base;

the insulating baffle is arranged on the conductive base, a groove and a clamping plate are arranged on the insulating baffle, the groove is suitable for coating a single light-emitting surface of the LED filament so as to shade the single light-emitting surface of the LED filament, and the clamping plate is suitable for mounting the LED filament on the insulating baffle;

a conductive plate disposed on the conductive base, the conductive plate adapted to electrically connect the conductive base with the LED filament.

2. The test fixture of claim 1, wherein the conductive base has a U-shaped profile structure with an upward opening along a front-to-back projection direction, and the insulating barrier is disposed at the opening of the conductive base; the upper end of the conductive base and the left and right parts of the U-shaped outline structure are both connected with the conductive plate.

3. The test fixture of claim 2, wherein the clamping plate is movably disposed along a length of the insulating barrier; the conductive plate is adapted to abut the pinch plate and is movable following movement of the pinch plate to electrically connect the conductive base with the LED filament.

4. The test fixture of claim 3, wherein the conductive plate is disposed on a slide bar movably inserted in a left portion or a right portion of the U-shaped profile structure.

5. The test fixture of claim 3, wherein the clamping plate is a resilient clip that clamps in a thickness direction of the insulating barrier, and the resilient clip has a curved plate protruding toward the groove.

6. The test fixture of claim 5, wherein the inner surface of the recess and the curved plate are each provided with a black coating.

7. The test fixture of claim 2, wherein the two ends of the insulating barrier are bolted to the left and right portions of the U-shaped profile in a one-to-one correspondence.

8. A colorimetric test device for an LED filament, comprising the test fixture of any one of claims 1 to 7.

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