CN210514522U - A testing arrangement has brush micropump for transistor - Google Patents
A testing arrangement has brush micropump for transistor Download PDFInfo
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- CN210514522U CN210514522U CN201921249878.3U CN201921249878U CN210514522U CN 210514522 U CN210514522 U CN 210514522U CN 201921249878 U CN201921249878 U CN 201921249878U CN 210514522 U CN210514522 U CN 210514522U
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Abstract
The utility model belongs to the technical field of transistor, and discloses a testing device for a transistor, which comprises a testing device body, the front surface of the testing device body is sequentially provided with a loudspeaker, a control panel, a current and voltage adjusting knob, a transistor jack, a power jack and a display screen, fixing lugs are respectively arranged at both sides of the testing device body, a connecting belt is fixedly connected between the two fixing lugs, the rear side of the testing device body is connected with an insulating rubber backing plate in a clamping way, two clamping springs are symmetrically arranged on the upper side and the lower side of the insulating rubber backing plate, the testing device is provided with a connecting band and a fixing lug, the connecting band is fixed on the testing device through the fixing lug, the testing device can be hung on the shoulders through the connecting belt, so that a user can conveniently carry the testing device to different places to test the triode.
Description
Technical Field
The utility model belongs to the technical field of the transistor, concretely relates to a testing arrangement for transistor.
Background
The triode is one of basic semiconductor components and has a current amplification effect and is a core element of an electronic circuit, the triode is formed by manufacturing two PN junctions which are very close to each other on a semiconductor substrate, the whole semiconductor is divided into three parts by the two PN junctions, the middle part is a base region, the two side parts are an emission region and a current collection region, the arrangement mode is a PNP mode and an NPN mode, and the triode needs to be detected after being used for a long time and is checked whether the triode is damaged or not.
However, the existing testing device for the transistor in the market has some disadvantages in use, for example, the testing device is not portable and cannot be carried to different places to test the transistor; and the triode detection device ensures that the high-voltage end is not contacted with the ground, otherwise, the short circuit is easy to cause accidents.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a testing arrangement for transistor to it need guarantee the problem that the high-pressure side does not contact ground not portable and triode detection device to propose testing arrangement in solving above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a testing arrangement for transistor, includes the testing arrangement body, the front surface of testing arrangement body has set gradually speaker, control panel, current-voltage adjust knob, transistor jack, electrical socket and display screen, fixed ear, two are all installed to the both sides of testing arrangement body fixedly connected with connecting band between the fixed ear, the rear side block of testing arrangement body is connected with the insulating rubber backing plate, two block springs are installed to the equal symmetry in upper and lower both sides of insulating rubber backing plate.
Preferably, four fixed blocks convenient for clamping the testing device body are arranged on the inner sides of the clamping springs
Preferably, the inside of testing arrangement body is provided with power module and singlechip, singlechip and power module electric connection, speaker, control panel and display screen all with singlechip electric connection.
Preferably, the surface walls of the two sides of the testing device body are provided with heat dissipation holes, and dust screens are arranged on the heat dissipation holes.
Preferably, the control panel is provided with a test button, a power indicator lamp and a power switch.
Compared with the prior art, the beneficial effects of the utility model are that:
(1) the utility model discloses a set up connecting band and fixed ear on testing arrangement, through fixed ear fixed connecting band on testing arrangement, can hang testing arrangement side on the shoulder through the connecting band to convenient to use person carries the place test triode that goes the difference.
(2) The utility model discloses a set up the insulating rubber board on testing arrangement to set up block spring and fixed block on the insulating rubber board, through it with the testing arrangement block on the insulating rubber board, can guarantee that triode detection device high-pressure side does not contact ground, avoid the short circuit to take place accident.
Drawings
Fig. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the internal structure of the present invention;
fig. 3 is a side view of the present invention;
FIG. 4 is a schematic structural view of the insulating rubber pad of the present invention;
fig. 5 is a circuit block diagram of the present invention;
in the figure: the device comprises a loudspeaker 1, a control panel 2, a current and voltage adjusting knob 3, a transistor jack 4, a power jack 5, a fixing lug 6, a connecting band 7, a display screen 8, a testing device body 9, a power module 10, a singlechip 11, heat dissipation holes 12, an insulating rubber base plate 13, a clamping spring 14 and a fixing block 15.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-5, the present invention provides a testing device for a transistor, which comprises: a testing device for a transistor comprises a testing device body 9, wherein the front surface of the testing device body 9 is sequentially provided with a loudspeaker 1, a control panel 2, a current and voltage adjusting knob 3, a transistor jack 4, a power jack 5 and a display screen 8, fixing lugs 6 are respectively arranged at two sides of the testing device body 9, a connecting belt 7 is fixedly connected between the two fixing lugs 6, the connecting belt 7 is hung on the shoulder laterally to facilitate carrying, the rear side of the testing device body 9 is connected with an insulating rubber cushion plate 13 in a clamping way, two clamping springs 14 are symmetrically arranged on the upper side and the lower side of the insulating rubber cushion plate 13, when in use, the testing device body 9 is fixed on the insulating rubber pad 13 through the clamping spring 14 and the fixing block 15, and the testing device body 9 can be prevented from being in direct contact with the ground on the insulating rubber pad 13, so that the high-voltage end of the testing device is prevented from being in a short circuit with the ground.
In order to fix the insulating rubber pad 13 on the testing device body 9, in this embodiment, preferably, the fixing blocks 15 for conveniently clamping the testing device body 9 are installed on the inner sides of the four clamping springs 14.
In order to facilitate power supply and execute the testing process and result, in this embodiment, preferably, the inside of the testing device body 9 is provided with a power module 10 and a single chip microcomputer 11, the single chip microcomputer 11 is electrically connected with the power module 10, the speaker 1, the control panel 2 and the display screen 8 are all electrically connected with the single chip microcomputer 11, and the single chip microcomputer 11 adopts an EPSON single chip microcomputer.
In order to facilitate power supply for the related electrical components inside the testing device body 9, in this embodiment, preferably, the heat dissipation holes 12 are formed in the surface walls of the two sides of the testing device body 9, and the dust-proof nets are arranged on the heat dissipation holes 12, so that dust can be prevented, and heat dissipation is facilitated.
In order to facilitate checking the normal work of the testing device, in the embodiment, preferably, the control panel 2 is provided with a testing button, a power indicator lamp and a power switch, and when the testing device body 9 works normally, the power indicator lamp is turned on to ensure that the testing result is accurate enough.
The utility model discloses a theory of operation and use flow: the utility model discloses a when using, single chip microcomputer 11 and the equal switch-on power module 10 of relevant electrical element that links to each other with single chip microcomputer 11, insert in electrical socket 5 with external power plug, for the power supply of electrical socket 10, open the switch on control panel 2, insert in transistor jack 4 with transistor's joint, adjust the result of test under the not equidimension current-voltage condition through current-voltage adjust knob 3, transmit the result that detects to single chip microcomputer 11, single chip microcomputer 11 carries out the operational analysis, the result of analysis shows on display screen 8, and report through speaker 1, insulating rubber backing plate 13 avoids ground connection to play insulating effect.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (5)
1. The utility model provides a testing arrangement for transistor, a serial communication port, includes the testing arrangement body, the front surface of testing arrangement body has set gradually speaker, control panel, current-voltage regulation knob, transistor jack, power jack and display screen, fixed ear, two are all installed to the both sides of testing arrangement body fixedly connected with connecting band between the fixed ear, the rear side block of testing arrangement body is connected with the insulating rubber backing plate, two block springs are installed to the equal symmetry in upper and lower both sides of insulating rubber backing plate.
2. A test apparatus for a transistor according to claim 1, wherein: and four fixing blocks convenient for clamping the testing device body are arranged on the inner sides of the clamping springs.
3. A test apparatus for a transistor according to claim 1, wherein: the testing device comprises a testing device body and is characterized in that a power supply module and a single chip microcomputer are arranged inside the testing device body, the single chip microcomputer is electrically connected with the power supply module, and the loudspeaker, the control panel and the display screen are electrically connected with the single chip microcomputer.
4. A test apparatus for a transistor according to claim 1, wherein: the testing device comprises a testing device body and is characterized in that heat dissipation holes are formed in the surface walls of two sides of the testing device body, and dust screens are arranged on the heat dissipation holes.
5. A test apparatus for a transistor according to claim 1, wherein: and the control panel is provided with a test button, a power indicator lamp and a power switch.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921249878.3U CN210514522U (en) | 2019-07-31 | 2019-07-31 | A testing arrangement has brush micropump for transistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921249878.3U CN210514522U (en) | 2019-07-31 | 2019-07-31 | A testing arrangement has brush micropump for transistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210514522U true CN210514522U (en) | 2020-05-12 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921249878.3U Active CN210514522U (en) | 2019-07-31 | 2019-07-31 | A testing arrangement has brush micropump for transistor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210514522U (en) |
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2019
- 2019-07-31 CN CN201921249878.3U patent/CN210514522U/en active Active
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