CN210401604U - Power adapter testing device - Google Patents
Power adapter testing device Download PDFInfo
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- CN210401604U CN210401604U CN201920803783.5U CN201920803783U CN210401604U CN 210401604 U CN210401604 U CN 210401604U CN 201920803783 U CN201920803783 U CN 201920803783U CN 210401604 U CN210401604 U CN 210401604U
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Abstract
The utility model discloses a power adapter testing arrangement, include: the interface module is used for connecting a power adapter to be tested; the signal providing module is connected with the interface module and is used for providing test signals of different test modes for the power supply adapter to be tested, and the different test modes at least comprise an automatic test mode and a manual test mode; and the control input module is connected with the signal providing module and is used for selecting different test modes or adjusting the test signals. The technical scheme of the utility model during the test of power adapter has been solved, the test voltage gear is too few, can not test the technical problem of power adapter voltage in succession automatically, has realized convenience of customers and has adjusted the technological effect of test voltage and automatic test.
Description
Technical Field
The embodiment of the utility model provides a relate to adapter test technique, especially relate to a power adapter testing arrangement.
Background
The development, testing and aging of the rapid charging adapter need a testing device supporting the rapid charging protocol to assist the completion. Although the field of testing devices is a mature field, at present, due to the fact that a high-pass rapid charging protocol and a power output protocol of rapid charging are updated soon, testing devices which are integrated with testing and aging are rarely available on the market and can be used for meeting the requirement of development of adapters of the high-pass rapid charging protocol and the power output protocol, and testing devices which are compatible with the adapters of the high-pass rapid charging protocol and the power output protocol are rare.
In the prior art, the process of entering a fine tuning voltage mode by a high-pass quick charging protocol and a power output protocol is complex, the high-pass quick charging protocol and the power output protocol cannot enter directly through keys, and voltage testing gears are few, so that multi-gear voltage testing cannot be freely selected.
SUMMERY OF THE UTILITY MODEL
The utility model provides a power adapter testing arrangement to realize the effect of many gears of rapid survey voltage and automatic test voltage.
The utility model provides a power adapter testing arrangement, include:
the interface module is used for connecting a power adapter to be tested;
the signal providing module is connected with the interface module and is used for providing test signals of different test modes for the power supply adapter to be tested, and the different test modes at least comprise an automatic test mode and a manual test mode;
and the control input module is connected with the signal providing module and is used for selecting different test modes or adjusting the test signals.
Optionally, the interface module includes an interface C1, an interface C2, and an interface C3, one end of the interface C1 is connected to the power adapter to be tested, and the other end is connected to the signal providing module; one end of the interface C2 is connected with a test instrument, and the other end of the interface C2 is connected with the signal providing module; one end of the interface C3 is connected with the upper computer, and the other end is connected with the signal providing module.
Optionally, the signal providing module includes a chip U1, and the chip U1 is connected to the interface module and configured to provide test signals of different test modes to the power adapter to be tested.
Optionally, the control input module includes a key S1, a key S2, a key S3, a key S4, a key S5, a key S6, a key S7, a key S8, a switch K1, and a switch K2, where the key S1 is connected to the chip U1 and is used to control the test voltage to increase; the key S2 is connected to the chip U1 and used for controlling the reduction of the test voltage; the key S3 is connected to the chip U1 and is used for switching an automatic test mode and a manual test mode; the key S4 is connected to the chip U1 and is used for controlling the test voltage to be 5V; the key S5 is connected to the chip U1 and is used for controlling the test voltage to be 9V; the key S6 is connected to the chip U1 and is used for controlling the test voltage to be 12V; the key S7 is connected to the chip U1 and is used for controlling the test voltage to be 15V; the key S8 is connected to the chip U1 and is used for controlling the test voltage to be 20V; the switch K1 is connected to the chip U1 and is used for switching the power supply mode of the power adapter testing device; the switch K2 is connected to the chip U1 for switching test protocols.
Optionally, the power adapter testing device further comprises an upgrade module, the upgrade module includes a chip U2, one end of the chip U2 is connected to the chip U1, the other end of the chip U2 is connected to the interface C3, and the chip U2 is configured to process information that an upper computer provides online upgrade for the power adapter testing device.
Optionally, the power adapter testing device further comprises a voltage stabilizing module, the voltage stabilizing module comprises a low dropout regulator M1, one end of the low dropout regulator M1 is connected to the interface C1, the other end of the low dropout regulator M1 is connected to the switch K1, and the low dropout regulator M1 is used for keeping the internal voltage of the power adapter testing device stable.
Optionally, the power adapter device further comprises a protection module, connected between the signal providing module and the interface module, for preventing the internal voltage of the power adapter device from being too high.
Optionally, the protection module includes MOS transistors Q1 and Q2, one end of the MOS transistor Q1 is connected to the chip U1, and the other end of the MOS transistor Q2 is connected to the interface C1, and the MOS transistor Q1 is used to prevent the adapter start protection caused by a large load before the power adapter testing apparatus tests; the MOS tube Q2 is connected to the chip U1 at one end and the interface C2 at the other end, and the MOS tube Q2 is used for preventing the voltage at the load end from reversely flowing into the chip U1.
Optionally, the test device further comprises an indicator light module, the indicator light module comprises an indicator light R1, the indicator light R1 is connected to the chip U1, and the indicator light R1 is used for displaying different test gear test voltage levels.
Optionally, the upper computer is a computer or a mobile phone.
The utility model discloses a power adapter testing arrangement, including interface module, signal provide module and control input module, interface module is with connecting power adapter, the signal provides the test signal that the module is used for providing different test modes for power adapter, control input module is used for different test voltage gears of user selection or automatic voltage test mode, in the power adapter test of having solved, the test voltage gear is too few, can not test the technical problem of power adapter voltage in succession automatically, the technological effect of convenience of customers regulation test voltage and automatic test has been realized.
Drawings
Fig. 1 is a diagram of a module connection relationship of a power adapter testing apparatus according to a first embodiment of the present invention;
fig. 2 is a schematic diagram of a circuit connection relationship of a power adapter testing apparatus according to a first embodiment of the present invention;
fig. 3 is a schematic diagram of a circuit connection relationship of a power adapter testing apparatus according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
FIG. 1 is a diagram illustrating a module connection relationship of a power adapter testing device according to an embodiment of the present invention, FIG. 2 is a diagram illustrating a circuit connection relationship of a power adapter testing device according to an embodiment of the present invention, which can be applied to a situation where the power adapter testing device tests a power adapter,
referring to fig. 1, the power adapter testing apparatus of the present embodiment includes an interface module 1, a signal providing module 2, and a control input module 3.
And the interface module 1 is used for connecting a power adapter to be tested.
And the signal providing module 2 is connected with the interface module 1 and is used for providing test signals of different test modes for the power adapter to be tested, and the different test modes at least comprise an automatic test mode and a manual test mode.
And the control input module 3 is connected with the signal providing module and is used for selecting different test modes or adjusting test signals.
Referring to fig. 2, in an alternative embodiment, the interface module 1 includes an interface C1, an interface C2, and an interface C3, one end of the interface C1 is connected to the power adapter to be tested, and the other end is connected to the signal providing module 2; one end of the interface C2 is connected with the test instrument, and the other end is connected with the signal providing module 2; one end of the interface C3 is connected with the upper computer, and the other end is connected with the signal providing module 2. The test instrument may be one or more of a voltmeter, ammeter, voltammeter, or the like, voltage or current test instrument.
The interface C1 of this embodiment can adopt the female seat of Type-C, for input interface, is connected to the power adapter that awaits measuring. The interface C2 adopts a USB-A female socket, is an output interface, can be connected with equipment such as a universal meter and an electronic load to test and monitor voltage and current, and is used as an interface of a load resistor when a product is aged. The interface can support the load capacity of 5A at most. Interface C3 adopts the female seat of Type-C, for the external power supply interface, connects the 5V power to supply power for power adapter testing arrangement for use when efficiency testing. Meanwhile, the system can also be used for online upgrading and communication with an upper computer. In an alternative embodiment, the upper computer may be a computer or a mobile phone, and the user may control the power adapter testing apparatus on the APP of the computer or the mobile phone, so that the user may operate on the keys of the control input module 3 of the power adapter testing apparatus instead.
Referring to fig. 2, the signal providing module 2 of the present embodiment adopts a single chip microcomputer chip U1, and the chip U1 is connected to the interface module 1, and is configured to provide test signals of different test modes to the power adapter to be tested. In this embodiment, the chip U1 is a control chip with model LDR 6380.
The control input module 3 includes a key S1, a key S2, a key S3, a key S4, a key S5, a key S6, a key S7, a key S8, a switch K1, and a switch K2.
The key S1 is connected to the chip U1 and is used for controlling the test voltage to increase; specifically, the key S1 controls the test voltage to increase, and the voltage value of each increase can be set in advance.
The key S2 is connected to the chip U1 and is used for controlling the reduction of the test voltage; specifically, the key S2 controls the test voltage to decrease, and the voltage value of each decrease can be set in advance.
The key S3 is connected to the chip U1 and is used for switching an automatic test mode and a manual test mode; specifically, the key S3 controls the test mode, and if the current test protocol is the power output protocol, the test mode enters a PPS mode (short for Programmable power supply, a mode capable of automatically trimming voltage and current); if the current test protocol is a high-pass fast charging protocol, a CM mode (short for Continuous mode, a mode capable of trimming voltage) is entered.
The key S4 is connected to the chip U1 and is used for controlling the test voltage to be 5V; specifically, the key S4 controls the test voltage level to be 5V, and in the power adapter test, 5V is generally used as the safety voltage, so the key S4 can also be used as the reset key.
The key S5 is connected to the chip U1 and is used for controlling the test voltage to be 9V; specifically, the key S5 controls the test voltage level to be 9V, and in the PPS mode, the key S5 can also be used as a key for requesting a current increase during a current test, and the value of each current increase can be set in advance.
The key S6 is connected to the chip U1 and is used for controlling the test voltage to be 12V; specifically, the key S6 controls the test voltage level to be 12V, and in the PPS mode, the key S6 can also be used as a key for requesting a current reduction during the current test, and the value of each current reduction can be set in advance.
The key S7 is connected to the chip U1 and is used for controlling the test voltage to be 15V; specifically, the key S7 controls the test voltage step to be 15V. The key S8 controls the test voltage level to be 20V. The switch K1 is a power supply mode change-over switch, and can change over whether the power adapter testing device is supplied with power by a power adapter or an external upper computer.
The key S8 is connected to the chip U1 and is used for controlling the test voltage to be 20V; specifically, the key S8 controls the test voltage level to be 20V.
The switch K1 is connected to the chip U1 and is used for switching the power supply mode of the power adapter testing device; specifically, the switch K1 is a power supply mode switch, and can switch whether the power adapter testing device is powered by the power adapter or the external upper computer.
Switch K2 is connected to slice U1 for switching test protocols; the switch K2 is a test protocol switch that can be switched between a high-pass fast charge protocol and a power output protocol.
The power adapter testing device provided by the embodiment solves the technical problems that in the power adapter test, the testing voltage gears are too few, and the power adapter voltage cannot be automatically and continuously tested, and achieves the technical effects of facilitating the user to adjust the testing voltage and automatically testing.
Example two
Fig. 3 is a circuit structure diagram of a power adapter testing apparatus according to an embodiment of the present invention.
Referring to fig. 3, the power adapter testing apparatus of the present embodiment includes an interface module 1, a signal providing module 2, a control input module 3, an upgrading module 4, a voltage stabilizing module 5, a protection module 6, and an indicator light module 7.
And the interface module 1 is used for connecting a power adapter to be tested.
Referring to fig. 3, in an alternative embodiment, the interface module 1 includes an interface C1, an interface C2, and an interface C3, one end of the interface C1 is connected to the power adapter to be tested, and the other end is connected to the signal providing module 2; one end of the interface C2 is connected with the test instrument, and the other end is connected with the signal providing module 2; one end of the interface C3 is connected with the upper computer, and the other end is connected with the signal providing module 2. The test instrument may be one or more of a voltmeter, ammeter, voltammeter, or the like, voltage or current test instrument.
The interface C1 of this embodiment can adopt the female seat of Type-C, for input interface, is connected to the power adapter that awaits measuring. The interface C2 adopts a USB-A female socket, is an output interface, can be connected with equipment such as a universal meter and an electronic load to test and monitor voltage and current, and is used as an interface of a load resistor when a product is aged. The interface can support the load capacity of 5A at most. Interface C3 adopts the female seat of Type-C, for the external power supply interface, connects the 5V power to supply power for power adapter testing arrangement for use when efficiency testing. Meanwhile, the system can also be used for online upgrading and communication with an upper computer. In an alternative embodiment, the upper computer may be a computer or a mobile phone, and the user may control the power adapter testing apparatus on the APP of the computer or the mobile phone, so that the user may operate on the keys of the control input module 3 of the power adapter testing apparatus instead.
And the signal providing module 2 is connected with the interface module 1 and is used for providing test signals of different test modes for the power adapter to be tested, and the different test modes at least comprise an automatic test mode and a manual test mode.
The signal providing module 2 of this embodiment adopts a single chip microcomputer chip U1, and the chip U1 is connected to the interface module 1, and is configured to provide test signals of different test modes to the power adapter to be tested. In this embodiment, the chip U1 is a control chip with model LDR 6380.
And the control input module 3 is connected with the signal providing module and is used for selecting different test modes or adjusting test signals.
The control input module 3 includes a key S1, a key S2, a key S3, a key S4, a key S5, a key S6, a key S7, a key S8, a switch K1, and a switch K2.
The key S1 is connected to the chip U1 and is used for controlling the test voltage to increase; specifically, the key S1 controls the test voltage to increase, and the voltage value of each increase can be set in advance.
The key S2 is connected to the chip U1 and is used for controlling the reduction of the test voltage; specifically, the key S2 controls the test voltage to decrease, and the voltage value of each decrease can be set in advance.
The key S3 is connected to the chip U1 and is used for switching an automatic test mode and a manual test mode; specifically, the key S3 controls the test mode, and if the current test protocol is the power output protocol, the test mode enters a PPS mode (short for Programmable power supply, a mode capable of automatically trimming voltage and current); if the current test protocol is a high-pass fast charging protocol, a CM mode (short for Continuous mode, a mode capable of trimming voltage) is entered.
The key S4 is connected to the chip U1 and is used for controlling the test voltage to be 5V; specifically, the key S4 controls the test voltage level to be 5V, and in the power adapter test, 5V is generally used as the safety voltage, so the key S4 can also be used as the reset key.
The key S5 is connected to the chip U1 and is used for controlling the test voltage to be 9V; specifically, the key S5 controls the test voltage level to be 9V, and in the PPS mode, the key S5 can also be used as a key for requesting a current increase during a current test, and the value of each current increase can be set in advance.
The key S6 is connected to the chip U1 and is used for controlling the test voltage to be 12V; specifically, the key S6 controls the test voltage level to be 12V, and in the PPS mode, the key S6 can also be used as a key for requesting a current reduction during the current test, and the value of each current reduction can be set in advance.
The key S7 is connected to the chip U1 and is used for controlling the test voltage to be 15V; specifically, the key S7 controls the test voltage step to be 15V. The key S8 controls the test voltage level to be 20V. The switch K1 is a power supply mode change-over switch, and can change over whether the power adapter testing device is supplied with power by a power adapter or an external upper computer.
The key S8 is connected to the chip U1 and is used for controlling the test voltage to be 20V; specifically, the key S8 controls the test voltage level to be 20V.
The switch K1 is connected to the chip U1 and is used for switching the power supply mode of the power adapter testing device; specifically, the switch K1 is a power supply mode switch, and can switch whether the power adapter testing device is powered by the power adapter or the external upper computer.
Switch K2 is connected to slice U1 for switching test protocols; the switch K2 is a test protocol switch that can be switched between a high-pass fast charge protocol and a power output protocol.
And the upgrading module 4 comprises a chip U2, one end of the chip U2 is connected to the chip U1, the other end of the chip U2 is connected to the interface C3, and the chip U2 is used for processing information of online upgrading provided by an upper computer to the power adapter testing device.
In this embodiment, the chip U2 is a control chip with a model CH340E, and is configured to convert a USB into a UART, and the chip U2 is connected to the chip U1 and is configured to receive online upgrade information provided by an upper computer and upgrade a circuit.
And the voltage stabilizing module 5 comprises a low dropout regulator M1, one end of the low dropout regulator M1 is connected to the interface C1, the other end of the low dropout regulator M1 is connected to the switch K1, and the low dropout regulator M1 is used for keeping the internal voltage of the power adapter testing device stable.
In this embodiment, the low dropout regulator M1 is HT7550 in model, and is configured to stabilize the circuit voltage at the input port C1, and prevent the internal structure of the power adapter testing apparatus from being damaged by an excessive circuit voltage.
And the protection module 6, wherein the protection module 6 is connected between the signal providing module 2 and the interface module 1 and is used for preventing the internal voltage of the power adapter device from being overhigh. The protection module 6 comprises MOS tubes Q1 and Q2, one end of the MOS tube Q1 is connected to the chip U1, the other end of the MOS tube Q2 is connected to the interface C3838, and the MOS tube Q1 is used for preventing the power adapter testing device from being connected with a large load before testing to cause the start protection of the adapter; the MOS transistor Q2 has one end connected to the chip U1 and the other end connected to the interface C2, and the MOS transistor Q2 is used for preventing the voltage at the load end from reversely flowing into the chip U1.
In this embodiment, the MOS transistor is a metal, oxide, or semiconductor field effect transistor, and the MOS transistor Q1 is used to isolate the input terminal and the output terminal, so that the power output protocol and the high-pass fast charging protocol are successfully handshake-on, thereby preventing the adapter from being started and protected due to the large load connected before handshake. The function of the MOS transistor Q2 is to prevent the voltage at the load end from flowing backwards, and affecting the power output protocol or the high-pass fast charging protocol handshake of the input port.
And the indicator lamp module 7 comprise indicator lamps R1, the indicator lamp R1 is connected to the chip U1, and the indicator lamp R1 is used for displaying different test gear test voltage magnitudes.
In this embodiment, the indicator light R1 is an RGB light, the chip U1 controls the RGB light to illuminate different colors to prompt corresponding voltage steps, and the voltage steps are controlled by the buttons S1-S8.
The power adapter testing device provided by the embodiment solves the technical problems that the voltage in the internal circuit of the power adapter testing device is unstable, no indicating lamp prompts a user and no online upgrading system is available, the voltage stability of the internal circuit of the power adapter testing device is guaranteed, and the indicating lamp prompts the testing condition of the user and the technical effect of online upgrading of the power adapter testing device are achieved.
It should be noted that the foregoing is only a preferred embodiment of the present invention and the technical principles applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments illustrated herein, but is capable of various obvious modifications, rearrangements and substitutions without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the scope of the present invention.
Claims (10)
1. A power adapter testing apparatus, comprising:
the interface module is used for connecting a power adapter to be tested;
the signal providing module is connected with the interface module and is used for providing test signals of different test modes for the power supply adapter to be tested, and the different test modes at least comprise an automatic test mode and a manual test mode;
and the control input module is connected with the signal providing module and is used for selecting different test modes or adjusting the test signals.
2. The power adapter testing device of claim 1, wherein the interface module comprises an interface C1, an interface C2 and an interface C3, one end of the interface C1 is connected to the power adapter to be tested, and the other end is connected to the signal providing module; one end of the interface C2 is connected with a test instrument, and the other end of the interface C2 is connected with the signal providing module; one end of the interface C3 is connected with the upper computer, and the other end is connected with the signal providing module.
3. The power adapter testing device of claim 1, wherein the signal providing module comprises a chip U1, and the chip U1 is connected to the interface module and is used for providing test signals of different test modes for the power adapter to be tested.
4. The power adapter testing device of claim 1, wherein the control input module comprises a key S1, a key S2, a key S3, a key S4, a key S5, a key S6, a key S7, a key S8, a switch K1 and a switch K2, the key S1 is connected to the chip U1 for controlling the test voltage to increase; the key S2 is connected to the chip U1 and used for controlling the reduction of the test voltage; the key S3 is connected to the chip U1 and is used for switching an automatic test mode and a manual test mode; the key S4 is connected to the chip U1 and is used for controlling the test voltage to be 5V; the key S5 is connected to the chip U1 and is used for controlling the test voltage to be 9V; the key S6 is connected to the chip U1 and is used for controlling the test voltage to be 12V; the key S7 is connected to the chip U1 and is used for controlling the test voltage to be 15V; the key S8 is connected to the chip U1 and is used for controlling the test voltage to be 20V; the switch K1 is connected to the chip U1 and is used for switching the power supply mode of the power adapter testing device; the switch K2 is connected to the chip U1 for switching test protocols.
5. The power adapter testing device of claim 3, further comprising an upgrade module, wherein the upgrade module comprises a chip U2, one end of the chip U2 is connected to the chip U1, the other end of the chip U3 is connected to the interface C3, and the chip U2 is configured to process information that an upper computer provides online upgrade for the power adapter testing device.
6. The power adapter tester as claimed in claim 1, further comprising a voltage regulator module, wherein the voltage regulator module comprises a low dropout regulator M1, one end of the low dropout regulator M1 is connected to the interface C1, the other end is connected to the switch K1, and the low dropout regulator M1 is used for keeping the internal voltage of the power adapter tester stable.
7. The power adapter testing device of claim 1, further comprising a protection module connected between the signal providing module and the interface module for preventing excessive internal voltage of the power adapter device.
8. The power adapter testing device according to claim 7, wherein the protection module comprises MOS transistors Q1 and Q2, the MOS transistor Q1 is connected to the chip U1 at one end and the interface C2 at the other end, and the MOS transistor Q1 is used for preventing the power adapter testing device from being connected with a large load before testing to cause adapter start protection; the MOS tube Q2 is connected to the chip U1 at one end and the interface C2 at the other end, and the MOS tube Q2 is used for preventing the voltage at the load end from reversely flowing into the chip U1.
9. The power adapter testing device of any one of claims 1-8, further comprising an indicator light module, wherein the indicator light module comprises an indicator light R1, the indicator light R1 is connected to the chip U1, and the indicator light R1 is used for displaying different test gear test voltage levels.
10. The power adapter testing device of any one of claims 2 or 5, wherein the upper computer is a computer or a mobile phone.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111856256A (en) * | 2020-09-24 | 2020-10-30 | 深圳英集芯科技有限公司 | Quick charging equipment test system and test method thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111856256A (en) * | 2020-09-24 | 2020-10-30 | 深圳英集芯科技有限公司 | Quick charging equipment test system and test method thereof |
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