CN210293010U - Quartz wafer lump measuring device - Google Patents
Quartz wafer lump measuring device Download PDFInfo
- Publication number
- CN210293010U CN210293010U CN201921707655.7U CN201921707655U CN210293010U CN 210293010 U CN210293010 U CN 210293010U CN 201921707655 U CN201921707655 U CN 201921707655U CN 210293010 U CN210293010 U CN 210293010U
- Authority
- CN
- China
- Prior art keywords
- rotating plate
- main scale
- hole
- scale
- vernier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000010453 quartz Substances 0.000 title claims abstract description 16
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 16
- 210000000078 claw Anatomy 0.000 claims abstract description 16
- 230000005389 magnetism Effects 0.000 claims abstract description 5
- 239000000696 magnetic material Substances 0.000 claims description 12
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 7
- 229910052802 copper Inorganic materials 0.000 claims description 7
- 239000010949 copper Substances 0.000 claims description 7
- 229910052701 rubidium Inorganic materials 0.000 claims description 7
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 claims description 7
- 238000003466 welding Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 8
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000005452 bending Methods 0.000 abstract description 2
- 235000012431 wafers Nutrition 0.000 description 11
- 238000000034 method Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
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- Length-Measuring Instruments Using Mechanical Means (AREA)
Abstract
The utility model provides a quartz wafer sticks together's measuring device, concretely relates to quartz wafer production field, including the main scale, main scale one end both sides are equipped with interior measuring claw and outer measuring claw respectively, are equipped with the vernier scale on the main scale, vernier scale one end both sides also are equipped with interior measuring claw and outer measuring claw respectively, the vernier scale can slide on the main scale, the vernier scale is concave type structure, and concave type structure tip is to horizontal direction and main scale block, be equipped with the through-hole on the extension part side of vernier scale, be equipped with the rotor plate in the through-hole, rotor plate one end is parallel with the side of main scale, and meet through magnetism, the rotor plate other end becomes 15 to 30 contained angles with the horizontal plane, namely the rotor plate is bending structure; a rotating shaft is arranged at the bent part of the rotating plate, and the rotating plate is rotatably connected with the inner side wall of the through hole through the rotating shaft; and when one end of the rotating plate is pressed downwards, the other end of the rotating plate is separated from the side face of the main scale. The utility model discloses can conveniently carry out quartz wafer and stick together the measurement.
Description
Technical Field
The utility model belongs to quartz wafer production field, concretely relates to quartz wafer sticks together's measuring device.
Background
In the production of quartz wafers, the lump size of the quartz wafers needs to be measured, the conventional measuring device mostly adopts a vernier caliper to realize measurement, and after the measurement of the conventional vernier caliper, the conventional vernier caliper is generally screwed by bolts and then read; due to the fact that the bolts are adopted for screwing, in the measuring process, a person can take the ruler with one hand and the object to be measured with the other hand, and then screwing is inconvenient, and great inconvenience is brought to measurement.
In view of the deficiencies of the prior art, there is a need for a device for measuring a lump of quartz wafers, which is convenient for measuring the lump of quartz wafers.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a quartz wafer sticks together's measuring device can conveniently carry out quartz wafer and stick together the measurement.
The utility model provides a following technical scheme:
the utility model provides a quartz wafer sticks together's measuring device, includes the main scale, main scale one end both sides are equipped with respectively and measure claw and measure the claw outward, be equipped with the vernier on the main scale, vernier one end both sides also are equipped with respectively and measure claw and measure the claw outward in the interior, the vernier can slide its characterized in that on the main scale: the vernier scale is of a concave structure, the end part of the concave structure is clamped with the main scale in the horizontal direction, a through hole is formed in the side face of the extending part of the vernier scale, a rotating plate is arranged in the through hole, one end of the rotating plate is parallel to the side face of the main scale and is connected with the main scale through magnetism, and the other end of the rotating plate forms an included angle of 15-30 degrees with the horizontal plane, namely the rotating plate is of a bent structure; a rotating shaft is arranged at the bent part of the rotating plate, and the rotating plate is rotatably connected with the inner side wall of the through hole through the rotating shaft; and when one end of the rotating plate is pressed downwards, the other end of the rotating plate is separated from the side face of the main scale.
Preferably, the through hole is of a rectangular structure, and the rotating plate is arranged in the through hole, namely the length and the width of the rotating plate are smaller than those of the through hole.
Preferably, one end of the rotating plate, which is connected with the main scale, is made of a magnetic material, and the other end of the rotating plate is made of a non-magnetic material;
preferably, the magnetic material is rubidium magnet, the non-magnetic material is copper, and the rotating plate is formed by welding rubidium magnet plate and the copper plate.
Preferably, a limiting rod is arranged below one bent end of the rotating plate in the through hole, and two ends of the limiting rod are connected with the inner side of the through hole.
The utility model has the advantages that:
one end of the rotating plate is parallel to the side surface of the main ruler and is connected with the main ruler through magnetism, and the other end of the rotating plate forms an included angle of 15-30 degrees with the horizontal plane, namely the rotating plate is of a bending structure; a rotating shaft is arranged at the bent part of the rotating plate, and the rotating plate is rotatably connected with the inner side wall of the through hole through the rotating shaft; and when one end of the rotating plate is pressed downwards, the other end of the rotating plate is separated from the side face of the main scale, so that the vernier and the main scale can be conveniently separated and combined, and the operation and measurement are convenient.
Drawings
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a view of the structure of the present invention;
FIG. 2 is a partial enlarged view of the present invention;
FIG. 3 is a partial enlarged sectional view of the present invention;
labeled as: 1. a main scale; 2. a vernier scale; 3. an inner measuring jaw; 4. an outer measuring jaw; 5. a through hole; 6. a rotating plate; 7. a limiting rod; 8. a rotating shaft.
Detailed Description
As shown in fig. 1 and fig. 2, a measuring device for a quartz wafer lump comprises a main scale 1, wherein an inner measuring claw 3 and an outer measuring claw 4 are respectively arranged on two sides of one end of the main scale 1, a vernier scale 2 is arranged on the main scale 1, an inner measuring claw 3 and an outer measuring claw 4 are respectively arranged on two sides of one end of the vernier scale 2, and the vernier scale 2 can slide on the main scale 1, and is characterized in that: the vernier scale 2 is of a concave structure, the end part of the concave structure is clamped with the main scale 1 in the horizontal direction, a through hole 5 is formed in the side surface of the extending part of the vernier scale 2, a rotating plate 6 is arranged in the through hole 5, one end of the rotating plate 6 is parallel to the side surface of the main scale 1 and is connected with the side surface of the main scale through magnetism, and the other end of the rotating plate 6 forms an included angle of 15-30 degrees with the horizontal plane, namely the rotating plate 6 is of a bent structure; a rotating shaft 8 is arranged at the bent part of the rotating plate 6, and the rotating plate 6 is rotatably connected with the inner side wall of the through hole 5 through the rotating shaft 8; and when one end of the rotating plate 6 is pressed downwards, the other end of the rotating plate is separated from the side surface of the main ruler 1, so that the vernier and the main ruler can be conveniently separated and combined, and the operation and measurement are convenient.
The through hole 5 is of a rectangular structure, and the rotating plate 6 is arranged in the through hole 5, namely the length and the width of the rotating plate 6 are smaller than those of the through hole 5. One end of the rotating plate 6, which is connected with the main scale 1, is made of a magnetic material, and the other end of the rotating plate is made of a non-magnetic material; the magnetic material adopts rubidium magnet, the magnetic property of the rubidium magnet is strong, the non-magnetic material adopts copper, the rotating plate 6 is formed by welding rubidium magnet plate and copper plate, and the copper can be prevented from being adsorbed with the main scale 1 and is convenient to rotate; in the through-hole 5, be located the one end below that rotor plate 6 buckles is equipped with gag lever post 7, gag lever post 7 both ends with 5 inboard meet of through-hole, meet with main scale 1 when avoiding rotor plate 6 to push down through gag lever post 7, hinder the vernier scale and slide.
The utility model discloses a working method:
as shown in fig. 1 to 3, one end of the rotating plate is parallel to the side surface of the main ruler and is magnetically connected, and the other end of the rotating plate forms an included angle of 15 to 30 degrees with the horizontal plane, i.e. the rotating plate is in a bent structure; a rotating shaft is arranged at the bent part of the rotating plate, and the rotating plate is rotatably connected with the inner side wall of the through hole through the rotating shaft; and when one end of the rotating plate is pressed downwards, the other end of the rotating plate is separated from the side face of the main scale, so that the vernier and the main scale can be conveniently separated and combined, and the operation and measurement are convenient.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described in the foregoing embodiments, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. The utility model provides a quartz wafer sticks together's measuring device, includes the main scale, main scale one end both sides are equipped with respectively and measure claw and measure the claw outward, be equipped with the vernier on the main scale, vernier one end both sides also are equipped with respectively and measure claw and measure the claw outward in the interior, the vernier can slide its characterized in that on the main scale: the vernier scale is of a concave structure, the end part of the concave structure is clamped with the main scale in the horizontal direction, a through hole is formed in the side face of the extending part of the vernier scale, a rotating plate is arranged in the through hole, one end of the rotating plate is parallel to the side face of the main scale and is connected with the main scale through magnetism, and the other end of the rotating plate forms an included angle of 15-30 degrees with the horizontal plane, namely the rotating plate is of a bent structure; a rotating shaft is arranged at the bent part of the rotating plate, and the rotating plate is rotatably connected with the inner side wall of the through hole through the rotating shaft; and when one end of the rotating plate is pressed downwards, the other end of the rotating plate is separated from the side face of the main scale.
2. The apparatus of claim 1, wherein the apparatus comprises: the through hole is of a rectangular structure, and the rotating plate is arranged in the through hole, namely the length and the width of the rotating plate are smaller than those of the through hole.
3. The apparatus of claim 2, wherein: one end of the rotating plate, which is connected with the main scale, is made of a magnetic material, and the other end of the rotating plate is made of a non-magnetic material.
4. The apparatus of claim 3, wherein: the magnetic material adopts rubidium magnet, the non-magnetic material adopts copper, and the rotating plate is formed by welding rubidium magnet plate and the copper plate.
5. The apparatus of claim 4, wherein: and a limiting rod is arranged below one bent end of the rotating plate in the through hole, and two ends of the limiting rod are connected with the inner side of the through hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921707655.7U CN210293010U (en) | 2019-10-12 | 2019-10-12 | Quartz wafer lump measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921707655.7U CN210293010U (en) | 2019-10-12 | 2019-10-12 | Quartz wafer lump measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210293010U true CN210293010U (en) | 2020-04-10 |
Family
ID=70065924
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921707655.7U Expired - Fee Related CN210293010U (en) | 2019-10-12 | 2019-10-12 | Quartz wafer lump measuring device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210293010U (en) |
-
2019
- 2019-10-12 CN CN201921707655.7U patent/CN210293010U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200410 |