CN210243740U - Interface test circuit for ammeter capable of automatically identifying infrared communication circuit - Google Patents

Interface test circuit for ammeter capable of automatically identifying infrared communication circuit Download PDF

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Publication number
CN210243740U
CN210243740U CN201920811161.7U CN201920811161U CN210243740U CN 210243740 U CN210243740 U CN 210243740U CN 201920811161 U CN201920811161 U CN 201920811161U CN 210243740 U CN210243740 U CN 210243740U
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test
pin
circuit
infrared
triode
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CN201920811161.7U
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Huiping Huang
黄惠萍
Juexian Yang
杨觉先
Guangguo Zhang
张广国
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Guangdong Boli Technology Co ltd
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Guangdong Boli Technology Co ltd
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Abstract

The utility model relates to an interface test circuit for an ammeter capable of automatically identifying an infrared communication circuit, which comprises an MCU, a test cable interface circuit and an infrared communication circuit; the MCU is provided with a test input end, a test output end and a power supply VCC end, the test cable interface circuit comprises a test cable interface XS1 with test pins 1 to 6, the test input end is connected with a test pin 3, the test pin 5 is grounded, the test pin 3 is grounded through a resistor R54, and the test pin 6 is connected with the power supply VCC end; the infrared communication circuit comprises an infrared receiving circuit, the infrared receiving circuit comprises an infrared receiving head, the infrared receiving head is provided with a receiving pin 1, a receiving pin 2 and a receiving pin 3, the receiving pin 1 is connected with the testing pin 2, the receiving pin 2 is connected with the testing output end, and the receiving pin 3 is connected with the power VCC end; it can just start infrared receiving head work when the electric energy meter sets up the parameter of leaving the factory, so, reduces the whole consumption of electric energy meter by a wide margin, prolongs the life of battery.

Description

Interface test circuit for ammeter capable of automatically identifying infrared communication circuit
Technical Field
The utility model belongs to the technical field of an ammeter technique and specifically relates to indicate an interface test circuit that is used for ammeter ability automatic identification infrared communication circuit.
Background
In the existing low power consumption electric energy meter, it is necessary to reduce or eliminate all extra power consumption as much as possible, especially in the electric energy meter using battery for power supply. For example, an infrared receiver circuit in a battery-powered electric energy meter is always in a working state, so that the power consumption of a battery is increased; even in standby, power consumption of several milliamperes occurs.
Therefore, in the patent application of the present invention, the applicant has elaborately studied an interface test circuit for an electric meter capable of automatically identifying an infrared communication circuit to solve the above problems.
SUMMERY OF THE UTILITY MODEL
The utility model discloses not enough to above-mentioned prior art exists, what be the purpose lies in providing an interface test circuit that is used for the ammeter ability automatic identification infrared communication circuit, and it only sets up when dispatching from the factory the parameter at the electric energy meter, just starts the work of infrared receiving head, so, reduces the whole consumption of electric energy meter by a wide margin, prolongs the life of battery.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
an interface test circuit for an ammeter capable of automatically identifying an infrared communication circuit comprises an MCU, a test cable interface circuit and an infrared communication circuit;
the test cable interface circuit comprises a test cable interface XS1, the test cable interface XS1 is provided with test pins 1 to 6, the test input end is connected with a test pin 3, the test pin 5 is grounded, the test pin 3 is grounded through a resistor R54, and the test pin 6 is connected with the power VCC end;
the infrared communication circuit comprises an infrared receiving circuit, the infrared receiving circuit comprises an infrared receiving head, the infrared receiving head is provided with a receiving pin 1, a receiving pin 2 and a receiving pin 3, the receiving pin 1 is connected with a testing pin 2, the receiving pin 2 is connected with a testing output end, and the receiving pin 3 is connected with a power supply VCC end;
during testing, the level of a non-grounded end of the corresponding resistor R54 on the testing pin 3 of the testing cable interface XS1 is pulled low, at the moment, the MCU detects that the testing input end is low level, the MCU controls the testing output end to output low level to the receiving pin 2 of the infrared receiving head, the infrared receiving head enters a working state, and the infrared receiving circuit works normally;
when the test is not performed, the level of the non-grounding end of the resistor R54 on the test pin 3 of the test cable interface XS1 is at a high level, at this time, the MCU detects that the test input end is at the high level, the MCU controls the test output end to output the high level to the receiving pin 2 of the infrared receiving head, the infrared receiving head does not work, and the infrared receiving circuit does not work.
As a preferred scheme, the MCU further has a PULSE pin, and the test pin 4 is connected to the PULSE pin.
As a preferred scheme, the infrared communication circuit further comprises a switch control circuit and an infrared transmitting circuit;
the switch control circuit comprises a triode V13 and a triode V11, an emitter of the triode V13 is connected with a VCC end, a base of the triode V13 is connected with a test pin 1 through a resistor R32, a collector of the triode V13 is connected with an emitter of a triode V11, the MCU is also provided with a 38KHz carrier control end, and a base of the triode V11 is connected with the 38KHz carrier control end through a resistor R35 and a resistor R53; and the collector of the triode V11 is connected with an infrared emission circuit.
Preferably, the infrared emission circuit comprises a power supply-12V end, a triode V12, a resistor R36, a resistor R37, a resistor R38, a resistor R39, an infrared emission head and a capacitor C24;
the base of triode V12 passes through resistance R36 and connects triode V11's collecting electrode, triode V12's projecting pole passes through resistance R37 and connects triode V11's collecting electrode, triode V12's projecting pole still connects power-12V end, and power-12V end passes through electric capacity C24 ground connection, triode V12's collecting electrode connects the negative pole of infrared emission head, and the positive pole of infrared emission head passes through resistance R29 ground connection, and resistance R28 connects in parallel at the both ends of resistance R29.
Compared with the prior art, the utility model obvious advantage and beneficial effect have, particularly: it is mainly that whole circuit structure design benefit, set up infrared receiving head's receiving pin 2 (also refer to GND pin) to the high level when the normality, and make infrared receiving head can not work, only when the electric energy meter sets up the parameter of leaving the factory, through the test cable interface XS1 with the cable end insertion ammeter of tester, make the level that corresponds the non-earthing terminal of resistance R54 on test cable interface XS 1's the testing pin 3 pulled down, be in the low level state promptly, at this moment, MCU control infrared receiving head's receiving pin 2 is the low level, just start infrared receiving head work, so, reduce the whole consumption of electric energy meter by a wide margin, the life of extension battery.
To more clearly illustrate the structural features and effects of the present invention, the following detailed description is given with reference to the accompanying drawings and specific embodiments.
Drawings
Fig. 1 is a schematic circuit diagram of an embodiment of the present invention.
10、MCU
20. Test cable interface circuit
31. Infrared receiving circuit 32 and switch control circuit
33. An infrared emission circuit.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and the detailed description.
As shown in fig. 1, an interface test circuit for an electricity meter capable of automatically identifying an infrared communication circuit comprises an MCU10, a test cable interface circuit 20 and an infrared communication circuit;
the MCU10 has a test input terminal, a test output terminal and a power VCC terminal, the test cable interface circuit 20 includes a test cable interface XS1, the test cable interface XS1 has test pins 1 to 6, the test input terminal is connected to a test pin 3, the test pin 3 and the test pin 5 are both grounded, and preferably, the test pin 3 is grounded through a resistor R54; the test pin 6 is connected with a power VCC end; in this embodiment, the MCU further has a PULSE pin, and the test pin 4 is connected to the PULSE pin.
The infrared communication circuit comprises an infrared receiving circuit 31, a switch control circuit 32 and an infrared transmitting circuit 33, wherein the infrared receiving circuit 31 comprises an infrared receiving head which is respectively connected with a test output end, a test pin 1, a test pin 2 and a power supply VCC end;
during testing, the cable end of the tester is inserted into a test cable interface XS1 of the ammeter, and the level of the non-grounding end of the corresponding resistor R54 on the test pin 3 of the test cable interface XS1 is pulled down, namely, is in a low level state; at the moment, the MCU detects that the test input end is at a low level, the MCU controls the test output end to output the low level to a receiving pin 2 of the infrared receiving head, the infrared receiving head enters a working state, and the infrared receiving circuit works normally;
when the test is not performed, the cable end of the tester is unplugged, the level of the non-grounding end of the resistor R54 on the test pin 3 of the test cable interface XS1 is at a high level, at the moment, the MCU detects that the test input end is at the high level, the MCU controls the test output end to output the high level to the receiving pin 2 of the infrared receiving head, the infrared receiving head does not work, and the infrared receiving circuit does not work.
In this embodiment, the infrared receiving head has receiving pin 1, receiving pin 2 and receiving pin 3, receiving pin 1 connects test pin 2 through resistance R34, test pin 2 connects the power VCC end through resistance R17, receiving pin 2 connects the test output, receiving pin 3 passes through electric capacity C23 ground connection, receiving pin 3 connects receiving pin 2 through resistance R33, receiving pin 3 connects the power VCC end.
The switch control circuit 32 comprises a triode V13 and a triode V11, an emitter of the triode V13 is connected with a VCC end, a base of the triode V13 is connected with a test pin 1 through a resistor R32, a collector of the triode V13 is connected with an emitter of a triode V11, the MCU is further provided with a 38KHz carrier control end, and a base of the triode V11 is connected with the 38KHz carrier control end through a resistor R35 and a resistor R53; and the collector of the triode V11 is connected with an infrared emission circuit. As shown in fig. 1, in this embodiment, the test input terminal is a pin P1.0 in the figure, the test output terminal is a pin P1.5 in the figure, and the 38KHz carrier control terminal is a pin P2.0.
Preferably, the infrared emission circuit 33 includes a power supply-12V terminal, a transistor V12, a resistor R36, a resistor R37, a resistor R38, a resistor R39, an infrared emission head, and a capacitor C24; the base of triode V12 passes through resistance R36 and connects triode V11's collecting electrode, triode V12's projecting pole passes through resistance R37 and connects triode V11's collecting electrode, triode V12's projecting pole still connects power-12V end, and power-12V end passes through electric capacity C24 ground connection, triode V12's collecting electrode connects the negative pole of infrared emission head, and the positive pole of infrared emission head passes through resistance R29 ground connection, and resistance R28 connects in parallel at the both ends of resistance R29.
The utility model relates to a main points lie in, it is whole circuit structure design benefit mainly, set up infrared receiving head's receiving pin 2 (also refer to GND pin) into the high level when the normality, and make infrared receiving head can not work, only when the electric energy meter sets up the parameter of dispatching from the factory, through the test cable interface XS1 with the cable end insertion ammeter of tester, make the level of corresponding resistance R54's non-earthing terminal on test cable interface XS 1's the test pin 3 pulled down, be in the low level state promptly, at this moment, MCU control infrared receiving head's receiving pin 2 is the low level, just start infrared receiving head work, so, reduce the whole consumption of electric energy meter by a wide margin, the life of extension battery.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the technical scope of the present invention, so that any slight modifications, equivalent changes and modifications made by the technical spirit of the present invention to the above embodiments are all within the scope of the technical solution of the present invention.

Claims (4)

1. The utility model provides an interface test circuit that is used for ammeter ability automatic identification infrared communication circuit which characterized in that: the device comprises an MCU, a test cable interface circuit and an infrared communication circuit;
the test cable interface circuit comprises a test cable interface XS1, the test cable interface XS1 is provided with test pins 1 to 6, the test input end is connected with a test pin 3, the test pin 5 is grounded, the test pin 3 is grounded through a resistor R54, and the test pin 6 is connected with the power VCC end;
the infrared communication circuit comprises an infrared receiving circuit, the infrared receiving circuit comprises an infrared receiving head, the infrared receiving head is provided with a receiving pin 1, a receiving pin 2 and a receiving pin 3, the receiving pin 1 is connected with a testing pin 2, the receiving pin 2 is connected with a testing output end, and the receiving pin 3 is connected with a power supply VCC end;
during testing, the level of a non-grounded end of the corresponding resistor R54 on the testing pin 3 of the testing cable interface XS1 is pulled low, at the moment, the MCU detects that the testing input end is low level, the MCU controls the testing output end to output low level to the receiving pin 2 of the infrared receiving head, the infrared receiving head enters a working state, and the infrared receiving circuit works normally;
when the test is not performed, the level of the non-grounding end of the resistor R54 on the test pin 3 of the test cable interface XS1 is at a high level, at this time, the MCU detects that the test input end is at the high level, the MCU controls the test output end to output the high level to the receiving pin 2 of the infrared receiving head, the infrared receiving head does not work, and the infrared receiving circuit does not work.
2. The interface test circuit for the ammeter capable of automatically identifying the infrared communication circuit as claimed in claim 1, wherein: the MCU also has a PULSE pin, and the test pin 4 is connected with the PULSE pin.
3. The interface test circuit for the ammeter capable of automatically identifying the infrared communication circuit as claimed in claim 1, wherein: the infrared communication circuit also comprises a switch control circuit and an infrared transmitting circuit;
the switch control circuit comprises a triode V13 and a triode V11, an emitter of the triode V13 is connected with a VCC end, a base of the triode V13 is connected with a test pin 1 through a resistor R32, a collector of the triode V13 is connected with an emitter of a triode V11, the MCU is also provided with a 38KHz carrier control end, and a base of the triode V11 is connected with the 38KHz carrier control end through a resistor R35 and a resistor R53; and the collector of the triode V11 is connected with an infrared emission circuit.
4. An interface test circuit for an electric meter capable of automatically identifying an infrared communication circuit according to claim 3, wherein: the infrared emission circuit comprises a power supply-12V end, a triode V12, a resistor R36, a resistor R37, a resistor R38, a resistor R39, an infrared emission head and a capacitor C24;
the base of triode V12 passes through resistance R36 and connects triode V11's collecting electrode, triode V12's projecting pole passes through resistance R37 and connects triode V11's collecting electrode, triode V12's projecting pole still connects power-12V end, and power-12V end passes through electric capacity C24 ground connection, triode V12's collecting electrode connects the negative pole of infrared emission head, and the positive pole of infrared emission head passes through resistance R29 ground connection, and resistance R28 connects in parallel at the both ends of resistance R29.
CN201920811161.7U 2019-05-31 2019-05-31 Interface test circuit for ammeter capable of automatically identifying infrared communication circuit Active CN210243740U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920811161.7U CN210243740U (en) 2019-05-31 2019-05-31 Interface test circuit for ammeter capable of automatically identifying infrared communication circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920811161.7U CN210243740U (en) 2019-05-31 2019-05-31 Interface test circuit for ammeter capable of automatically identifying infrared communication circuit

Publications (1)

Publication Number Publication Date
CN210243740U true CN210243740U (en) 2020-04-03

Family

ID=69972816

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920811161.7U Active CN210243740U (en) 2019-05-31 2019-05-31 Interface test circuit for ammeter capable of automatically identifying infrared communication circuit

Country Status (1)

Country Link
CN (1) CN210243740U (en)

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