CN210222074U

CN210222074U - Split type electronic motherboard test carrier

Info

Publication number: CN210222074U
Application number: CN201920691995.9U
Authority: CN
Inventors: Suqiang Gao; 高苏强; Wen Chen; 陈文�; Qingqing Zhang; 张青青
Original assignee: Shenzhen Weiyuheng Automation Co Ltd
Current assignee: Shenzhen Liankang Measurement and Control Co.,Ltd.
Priority date: 2019-05-15
Filing date: 2019-05-15
Publication date: 2020-03-31
Anticipated expiration: 2029-05-15

Abstract

The utility model discloses a split type electronic mainboard test carrier, which comprises a base and a mainboard carrier plate, wherein a carrier plate clamping groove which is communicated from top to bottom is arranged in the middle of the base, retaining walls are respectively arranged at the two sides inside the carrier plate clamping groove, retaining wall screw holes are respectively arranged at the two ends of the retaining wall, a foolproof groove is arranged at one side of the base, a test hole is arranged at one end of the base, the transverse section of the mainboard carrier plate is in a T shape and is matched with the carrier plate clamping groove, the four corners of the mainboard carrier plate are uniformly provided with carrier plate screw holes which are matched with the, the product needs to be completely remanufactured when the product is updated, the cost is increased, and because the heights of the two sides of the carrier are consistent and have no height difference, if maloperation, can exist and insert the risk of turning over with the carrier, pull out again and insert, can cause certain influence to test equipment on the one hand, on the other hand waste time, influence defects and problems such as production efficiency.

Description

Split type electronic motherboard test carrier

Technical Field

The utility model relates to the field of electronic technology, especially, relate to a split type electronic motherboard tests carrier.

Background

The electronic mainboard test equipment can be used as an instrument for receiving and transmitting radio frequency signals, can replace CW 500 and IQViewer instruments and the like, and is low in cost and high in efficiency, so that the electronic mainboard test equipment can be applied to a production line in a large scale. At present, the testing equipment is generally designed as a 4-UP carrier, and an operator puts the mainboard into the carrier during assembly and then inserts the carrier into a corresponding slot position of the testing equipment.

The original test carrier is designed integrally, the carrier is a whole, the carrier needs to be manufactured again when the product is updated, the cost is increased, the heights of the two sides of the carrier are consistent, no height difference exists, if misoperation occurs, the risk of inserting the carrier reversely can exist, the carrier is pulled out and inserted again, on one hand, a certain influence can be caused on a back plate of the test equipment, on the other hand, the time is wasted, and the production efficiency is influenced.

SUMMERY OF THE UTILITY MODEL

In order to overcome the original test carrier that exists among the prior art and be the integrated design, need all to make again when the renewal of product, increase cost to because the height on carrier both sides is unanimous, there is not the difference in height, like the maloperation, can have the risk of inserting the carrier and turning over, pull out again and insert, can cause certain influence to test equipment on the one hand, on the other hand waste time, influence defects and problems such as production efficiency, the utility model discloses a split type electron mainboard test carrier.

The utility model adopts the following technical scheme:

the utility model provides a split type electron mainboard test carrier, includes base and mainboard support plate, sets up the support plate draw-in groove that link up from top to bottom in the middle of the base, and the inside both sides of support plate draw-in groove are equipped with the barricade respectively, and the barricade both ends are equipped with the barricade screw respectively, and one side of base is equipped with prevents slow-witted groove, and base one end is provided with the test hole, and mainboard support plate transverse section cooperatees with the support plate draw-in groove for "T" shape, and mainboard support plate four.

The utility model is composed of two parts, one part is a base used for bearing a mainboard support plate and has the functions of heat dissipation and fixed connection with test equipment; the other part is a mainboard carrier plate which is used for fixing and bearing the mainboard, dissipating heat and realizing the function of transmitting the mainboard and external signals. The cross section of the main board support plate is of a T-shaped structure, the main board support plate is arranged in a support plate clamping groove of the base, and is assembled with the base through four support plate screw holes and four retaining wall screw holes in the main board support plate in a threaded fit mode. When the product is updated, only the mainboard carrier plate needs to be replaced to achieve the effect of recycling the base and saving the cost.

Simultaneously, a fool-proof groove is formed in one side of the base of the carrier, the risk of inserting the carrier reversely during production operation can be prevented, certain protection effect is carried out on the test equipment, time is saved, and production efficiency is improved.

Furthermore, other areas of the base are provided with heat dissipation holes, so that heat dissipation is performed during production, the carrier and the test mainboard are protected, and the test precision is improved.

Furthermore, the height of the upper surface of the retaining wall is lower than that of the upper surface of the base, so that the mainboard carrier can be better matched with the carrier clamping groove.

Furthermore, prevent slow-witted groove face and base upper surface difference in height be 3mm, can't cooperate with equipment under the condition of putting the carrier on the contrary, can protect test equipment, save time.

Furthermore, the number of the test holes is at least two, each test hole has different test functions, and multiple functional tests of the tested mainboard can be realized.

Drawings

FIG. 1 is a schematic view of the present invention;

FIG. 2 is a top view of the base of the present invention;

FIG. 3 is a front view of the base of the present invention;

FIG. 4 is a schematic view of a motherboard support plate according to the present invention;

in the figure: the testing device comprises a base 1, a mainboard carrier plate 2, a carrier plate clamping groove 3, a retaining wall 301, retaining wall screw holes 4, a fool-proof groove 5, testing holes 6, carrier plate screw holes 7 and heat dissipation holes 8.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Please refer to fig. 1, fig. 2, fig. 3 and fig. 4: the utility model provides a split type electron mainboard test carrier, including base 1 and mainboard support plate 2, base 1 sets up in the middle of being equipped with from top to bottom through-going support plate draw-in groove 3, the inside both sides of support plate draw-in groove 3 are equipped with barricade 301 respectively, barricade 301 both ends are equipped with barricade screw 4 respectively, one side of base 1 is equipped with prevents slow-witted groove 5, base 1 one end is provided with

test hole

6, 2 transverse section of mainboard support plate cooperatees with support plate draw-in groove 3 for "T" shape, 2 four corners of mainboard support plate evenly are equipped with support plate screw 7 and pass through screw-thread fit with barricade screw 4, other regions of base 1 are equipped with louvre 8, barricade 301 upper surface height is less than base 1 upper surface height, prevent that slow-.

The utility model provides a split type electron mainboard test carrier falls into

base

1 and 2 two parts of mainboard support plate with the carrier, in order to reach carrier base 1 reuse when the product is updated, practices thrift the effect of cost, has simple structure again simultaneously, installs convenient characteristics. The utility model comprises two parts, one part is a base 1 for bearing a mainboard support plate 2, and has the functions of heat dissipation and fixed connection with test equipment; the other part is a mainboard carrier plate 2 which is used for fixing and bearing the test mainboard, dissipating heat and realizing the function of transmitting the mainboard and external signals. The cross section of the mainboard support plate 2 is of a T-shaped structure, is arranged in a support plate clamping groove 3 of the base 1, is assembled with the base through four support plate screw holes 7 and four retaining wall screw holes 4 on the mainboard support plate 2 in threaded fit, and has simple structure and convenient disassembly. When the product is updated, only the mainboard carrier plate 2 needs to be replaced to achieve the purpose of recycling the base 1, thereby saving the cost.

Simultaneously the utility model discloses base 1 one side is equipped with prevents slow-witted groove 5 for the carrier can only forward and test equipment cooperation, in order to reach the purpose that the protection test was established, save time has simple structure again simultaneously, installs convenient characteristics.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims

1. The utility model provides a split type electron mainboard test carrier, includes base (1) and mainboard support plate (2), its characterized in that: the testing device is characterized in that a support plate clamping groove (3) which is through from top to bottom is arranged in the middle of the base (1), retaining walls (301) are arranged on two sides of the interior of the support plate clamping groove (3) respectively, retaining wall screw holes (4) are arranged at two ends of each retaining wall (301), a fool-proof groove (5) is arranged on one side of the base (1), a testing hole (6) is formed in one end of the base (1), a transverse section of the mainboard support plate (2) is T-shaped and is matched with the support plate clamping groove (3), and support plate screw holes (7) are uniformly formed in four corners of the mainboard support plate (2) and are matched with the.

2. The carrier of claim 1, wherein: other areas of the base (1) are provided with heat dissipation holes (8).

3. The carrier of claim 1, wherein: the height of the upper surface of the retaining wall (301) is lower than that of the upper surface of the base (1).

4. The carrier of claim 1, wherein: the height difference between the groove surface of the fool-proof groove (5) and the upper surface of the base (1) is 3 mm.

5. The carrier of claim 1, wherein: at least two test holes (6) are arranged.