CN210090614U - Test fixture - Google Patents
Test fixture Download PDFInfo
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- CN210090614U CN210090614U CN201920416101.5U CN201920416101U CN210090614U CN 210090614 U CN210090614 U CN 210090614U CN 201920416101 U CN201920416101 U CN 201920416101U CN 210090614 U CN210090614 U CN 210090614U
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- guide plates
- lower die
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Abstract
The utility model provides a test fixture, which comprises an upper die and a lower die, wherein the upper die and the lower die are both provided with test needles, the upper die and the lower die both comprise support columns, alignment needles, a plurality of first guide plates and a plurality of second guide plates arranged between the plurality of first guide plates, and the first guide plates and the second guide plates are stacked; a gap is reserved between every two adjacent second guide plates, the support column penetrates through the second guide plates, and the test needle penetrates through the first guide plates and the second guide plates; one side of the upper die, which is close to the lower die, is provided with a positioning hole or/and a positioning column, one side of the lower die, which is close to the upper die, is provided with a positioning column or/and a positioning hole, and the upper die and the lower die extend into the positioning hole through the positioning column for positioning. The utility model provides a test fixture has improved the positioning accuracy of counterpoint precision and PCB board between last mould and the lower mould to the measuring accuracy of test needle has been improved.
Description
Technical Field
The utility model belongs to the technical field of PCB test fixture, more specifically say, relate to a test fixture.
Background
PCB (printed Circuit board), which is called a printed Circuit board, is an important electronic component, a support body for electronic components, and a carrier for electrical connection of electronic components, so that it is necessary to test the function of the PCB to ensure that defects such as short Circuit and open Circuit do not occur when the PCB is used.
PCB test fixture on the existing market, when using the fixed PCB board of mould and lower mould, go up mould and lower mould can misplace, lead to the test needle when surveying the PCB board, can not accurately test out the functional defect of PCB board, reduced the yields of test PCB board.
Meanwhile, when the existing PCB test jig is used for testing a PCB, the test pins are easy to bend, so that short circuit between the test pins is caused; and because the diameter of the test needle is smaller, the phenomenon of needle breakage is easy to occur; the thickness of the upper die and the lower die also influences the testing precision and the alignment precision of the PCB.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a test fixture to solve the last mould that exists among the prior art and the poor technical problem of lower mould counterpoint precision.
In order to achieve the above object, the utility model adopts the following technical scheme: providing a test fixture, which comprises an upper die and a lower die, wherein the upper die and the lower die are respectively provided with a test needle, the upper die and the lower die respectively comprise a support column, a positioning needle for positioning a PCB (printed circuit board), a plurality of first guide plates and a plurality of second guide plates arranged among the plurality of first guide plates, and the first guide plates and the second guide plates are stacked;
a gap is reserved between every two adjacent second guide plates, the support column penetrates through the second guide plates, and the test needle penetrates through the first guide plates and the second guide plates;
one side of the upper die, which is close to the lower die, is provided with a positioning hole or/and a positioning column, one side of the lower die, which is close to the upper die, is provided with a positioning column or/and a positioning hole, and the upper die and the lower die extend into the positioning hole through the positioning column for positioning.
Furthermore, the length of the positioning column extending out of the upper die or the lower die is greater than the length of the alignment needle extending out of the upper die or the lower die.
Further, the device also comprises a first elastic piece, a first accommodating cavity is arranged in the lower die or/and the upper die, and the first accommodating cavity penetrates through the second guide plate;
one end of the positioning column extends into the first accommodating cavity, and the first elastic piece is arranged in the first accommodating cavity and sleeved on the positioning column and provides axial thrust along the positioning column for the positioning column.
Furthermore, both ends of the first accommodating cavity extend into the first guide plate.
Furthermore, the positioning column is arranged on the lower die, and the end part of the positioning column gradually converges from one end close to the lower die to one end close to the upper die;
the size of one end, close to the lower die, of the positioning hole is larger than that of one end, far away from the lower die, of the positioning hole.
Further, still include the second elastic component, go up in the mould with all be equipped with the second in the bed die and hold the chamber, the second holds the chamber and runs through the part first deflector and part the second deflector, the counterpoint needle runs through the second holds the chamber, the second elastic component is located the second holds the intracavity and the cover is located on the counterpoint needle and for the counterpoint needle provides the edge the axial thrust of counterpoint needle.
Furthermore, the test device also comprises a needle clamping piece for clamping the test needle, and the needle clamping piece is arranged between the two second guide plates.
Further, still including setting firmly in the accent tight piece at the both ends of support column, the accent tight piece will first deflector is fixed in on the support column, just the accent tight piece can adjust first deflector with the distance between the support column.
Furthermore, the supporting column further comprises a plurality of layering blocks sleeved on the supporting column, one end of each layering block is abutted against one second guide plate, and the other end of each layering block is abutted against the other second guide plate or the first guide plate.
Further, the thickness of the first guide plate is greater than that of the second guide plate.
The utility model provides a test fixture's beneficial effect lies in: compared with the prior art, the utility model discloses test fixture, when using, the counterpoint needle can fix a position the PCB board, avoids the test needle when testing, and the PCB board removes and influences the test accuracy; the first guide plate and the second guide plate have the function of guiding the test needle, so that the test needle is prevented from being bent; the gap between the second guide plates reduces the weight of the upper die and the lower die; the support column can avoid the dislocation of the second guide plate; the positioning column extends into the positioning hole, so that the alignment precision of the upper die and the lower die is improved, and the testing precision of the testing needle is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the embodiments or the prior art descriptions will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive labor.
Fig. 1 is a schematic structural view of an upper die of a test fixture according to an embodiment of the present invention;
fig. 2 is a schematic structural view of a lower die of the testing jig provided by the embodiment of the present invention.
Wherein, in the figures, the respective reference numerals:
1. an upper die; 2. a lower die; 3. a support pillar; 4. a test pin; 5. aligning needle; 6. a first guide plate; 7. a second guide plate; 8. a positioning column; 9. positioning holes; 10. a first elastic member; 101. a first accommodating chamber; 102. a second elastic member; 103. a second accommodating chamber; 104. a needle clamping piece; 105. an adjustment member; 106. a layering block; 107. a guide block; 108. and (4) reinforcing the column.
Detailed Description
In order to make the technical problem, technical solution and advantageous effects to be solved by the present invention more clearly understood, the following description is given in conjunction with the accompanying drawings and embodiments to illustrate the present invention in further detail. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in an orientation or positional relationship indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the device or element so referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.
Referring to fig. 1 and fig. 2, the testing fixture of the present invention will now be described. The test fixture comprises an upper die 1 and a lower die 2, wherein the upper die 1 and the lower die 2 are respectively provided with a test needle 4, the upper die 1 and the lower die 2 respectively comprise a support column 3, a contraposition needle 5 for positioning a PCB, a plurality of first guide plates 6 and a plurality of second guide plates 7 arranged among the plurality of first guide plates 6, and the first guide plates 6 and the second guide plates 7 are stacked;
a gap is reserved between every two adjacent second guide plates 7, the support column 3 penetrates through the second guide plates 7, and the test needle 4 penetrates through the first guide plate 6 and the second guide plates 7;
one side of the upper die 1 close to the lower die 2 is provided with a positioning hole 9, and one side of the lower die 2 close to the upper die 1 is provided with a positioning column 8; or
One side of the upper die 1 close to the lower die 2 is provided with a positioning column, and one side of the lower die 2 close to the upper die 1 is provided with a positioning hole; or
One side of going up mould 1 and being close to lower mould 2 is equipped with locating hole 9 and reference column, and one side of going up mould 1 that is close to of lower mould 2 is equipped with reference column 8 and locating hole, goes up and stretches into locating hole 9 location through reference column 8 between mould 1 and the lower mould 2.
Compared with the prior art, the test fixture provided by the utility model has the advantages that when in use, the alignment pins 5 can position the PCB, and the PCB is prevented from moving to influence the test precision when the test pins 4 are tested; the first guide plate 6 and the second guide plate 7 have the function of guiding the test needle 4, so that the test needle 4 is prevented from being bent; the gap between the second guide plates 7 reduces the weight of the upper die 1 and the lower die 2; the support column 3 can avoid the dislocation of the second guide plate 7; the positioning column 8 extends into the positioning hole 9, so that the alignment precision of the upper die 1 and the lower die 2 is improved, and the testing precision of the testing needle 4 is improved.
Specifically, when the test pin 4 is used for testing, the PCB is positioned between the upper die 1 and the lower die 2; a plurality of alignment pins 5 are arranged so as to better position the PCB; the support column 3 is provided in plurality.
Specifically, each first guide plate 6 and each second guide plate 7 are parallel to each other, and the alignment pins 5 are perpendicular to the first guide plates 6.
Specifically, the positioning holes 9 and the positioning posts 8 are provided with a plurality of sets so as to align the upper die 1 and the lower die 2 better.
Specifically, a reinforcing column 108 penetrating through the second guide plate 7 is further included to assist in supporting the second guide plate 7 and preventing misalignment between the second guide plates 7.
Optionally, the first guide plate 6 and the second guide plate 7 are both fiberboards; the test needle 4 is a steel needle, and the support column 3 is a copper column.
Easily understand the ground, all be equipped with a plurality of test needles 4 on last mould 1 and the lower mould 2, if test needle 4 when buckling, probably contact and the short circuit between test needle 4 and the test needle 4 influences the test yields of PCB board, consequently needs first deflector 6 and the direction of second deflector 7, avoids test needle 4 to buckle.
Further, please refer to fig. 1 and fig. 2, as the utility model provides a test fixture's a specific implementation, reference column 8 stretches out the length that goes up mould 1 or lower mould 2 and is greater than the length that counterpoint needle 5 stretches out mould 1 or lower mould 2 to earlier counterpoint last mould 1 and lower mould 2 after, fix a position the PCB board again, thereby improve the positioning accuracy to the PCB board.
Further, referring to fig. 1 and fig. 2, as a specific embodiment of the testing jig of the present invention, the testing jig further includes a first elastic member 10, a first accommodating cavity 101 is provided in the lower die 2, or in the upper die 1, or in the lower die 1 and the upper die 2, and the first accommodating cavity 101 penetrates through the second guide plate 7;
the one end of reference column 8 stretches into first chamber 101 that holds, first elastic component 10 is located first chamber 101 that holds and the cover is located on reference column 8 and for reference column 8 provides the axial thrust along reference column 8, when using, will go up mould 1 and lower mould 2 and be close to each other, when mould 1 on 8 butts of reference column, continue to be close to last mould 1 and lower mould 2, reference column 8 extrudes first elastic component 10 and moves towards first chamber 101 that holds this moment, first elastic component 10 contracts, until counterpoint needle 5 location PCB board, be convenient for reference column 8 stretch into first chamber 101 that holds, thereby make things convenient for counterpoint needle 5 location PCB board.
Optionally, one end of the first elastic element 10 is fixedly connected to the positioning column 8, and the other end is fixedly connected to the bottom wall of the first accommodating cavity 101.
Preferably, both ends of the first elastic member 10 abut against the positioning column 8 and the bottom wall of the first accommodating chamber 101, respectively.
Specifically, a protrusion is disposed on the positioning column 8 extending into the first accommodating cavity 101, and one end of the first elastic member 10 abuts against the protrusion.
Further, please refer to fig. 1 and fig. 2, as the utility model provides a test fixture's a specific implementation, the first both ends that hold chamber 101 all stretch into first deflector 6 in, make things convenient for the spacing first lateral wall that holds chamber 101 of first deflector 6, avoid the first chamber 101 slope that holds, and the counterpoint precision of mould 1 and lower mould 2 is gone up in the influence.
Further, referring to fig. 1 and 2, as a specific embodiment of the testing jig of the present invention, the positioning column 8 is disposed on the lower mold 2, and an end of the positioning column 8 gradually converges from an end close to the lower mold 2 to an end close to the upper mold 1;
the size of the end, close to the lower die 2, of the positioning hole 9 is larger than the size of the end, far away from the lower die 2, of the positioning hole 9, so that the moving amplitude of the upper die 1 relative to the lower die 2 is reduced, the alignment precision of the upper die 1 and the lower die 2 is improved, and the testing precision of the testing pin 4 is improved.
Specifically, the end of the positioning post 8 is tapered.
Further, please refer to fig. 1 and fig. 2, as the utility model provides a test fixture's a specific implementation way, still including locating lower mould 2 leading positive piece 107 that is close to one side of last mould 1, leading and being equipped with the guiding hole on the positive piece 107, reference column 8 runs through the guiding hole, has avoided reference column 8 slope and has influenced the counterpoint precision of last mould 1 and lower mould 2.
Further, please refer to fig. 1 and fig. 2, as the utility model provides a test fixture's a specific implementation way, still include second elastic component 102, it holds chamber 103 all to be equipped with the second in last mould 1 and lower mould 2, the second holds chamber 103 and runs through part first deflector 6 and part second deflector 7, counterpoint needle 5 runs through the second and holds chamber 103, second elastic component 102 is located the second and holds in the chamber 103 and the cover is located counterpoint needle 5 and provide the axial thrust along counterpoint needle 5 for counterpoint needle 5, be convenient for counterpoint needle 5 passes through the butt PCB board, restriction PCB board removes.
Further, please refer to fig. 1 and fig. 2, as a specific embodiment of the testing jig provided by the present invention, the testing jig further includes a needle clip 104 for clipping the testing needle 4, the needle clip 104 is disposed between the two second guiding plates 7, and the testing needle 4 is prevented from dropping from the upper die 1 or the lower die 2.
Specifically, the latch 104 is a sponge.
Further, please refer to fig. 1 and fig. 2, as the utility model provides a test fixture's a concrete implementation way, still including setting firmly in the tightening piece 105 at the both ends of support column 3, tightening piece 105 is fixed in on the support column 3 with first deflector 6, and tightening piece 105 can adjust the distance between first deflector 6 and the support column 3, so that according to the type of PCB board, the thickness of mould 1 and lower mould 2 is gone up in the adjustment, improve the test accuracy of test needle 4, thereby the survey yield of test needle 4 has been improved, the misdetection rate has been reduced, the cost is practiced thrift.
Specifically, the tightening member 105 is located at a side of the aligning needle 5 protruding from the upper mold 1 or the lower mold 2.
Specifically, the tightening member 105 is a countersunk screw, and the distance between the first guide plate 6 and the support column 3 can be finely adjusted by rotating the screw.
Further, please refer to fig. 2, as a specific embodiment of the testing jig provided by the present invention, the testing jig further includes a plurality of layered blocks 106 sleeved on the supporting column 3, one end of the layered block 106 abuts against one second guiding plate 7, and the other end abuts against another second guiding plate 7 or the first guiding plate 6, so that the layered block 106 can play a supporting role, and it is ensured that a gap is reserved between the first guiding plate 6 and the second guiding plate 7 and between two adjacent second guiding plates 7.
Further, please refer to fig. 2, as a specific embodiment of the testing jig provided by the present invention, the thickness of the first guiding plate 6 is greater than the thickness of the second guiding plate 7, so as to improve the service life of the upper die 1 and the lower die 2, avoid the external force applied on the upper die 1 or the lower die 2 to damage, and simultaneously avoid the bending of the testing pin 4 penetrating through the first guiding plate 6.
Further, referring to fig. 1 and fig. 2, as a specific embodiment of the testing fixture provided by the present invention, at least two layers of first guiding plates 6 are stacked together on one side of the upper die 1 close to the lower die 2, and the thickness of the first guiding plate 6 on one side of the upper die 1 close to the lower die 2 is smaller than the thickness of the first guiding plate 6 on one side of the upper die 1 away from the lower die 2;
at least two layers of first guide plates 6 which are stacked together are arranged on one side of the lower die 2 close to the upper die 1, and the thickness of the first guide plate 6 on one side of the lower die 2 close to the upper die 1 is smaller than that of the first guide plate 6 on one side of the lower die 2 far away from the lower die 2;
at least two layers of first guide plates 6 are stacked together, so that the positioning columns 8 and the alignment pins 5 are conveniently guided, and the alignment precision between the upper die 1 and the lower die 2 and the positioning precision of the PCB are improved; the thickness of first deflector 6 is inconsistent, and the convenience is according to actual need, selects suitable thickness, saves the material of making first deflector 6, alleviates the weight of going up mould 1 and lower mould 2.
Referring to fig. 1 and 2, the preferred embodiment will now be described in detail:
the PCB board is located between last mould 1 and lower mould 2, it is from one side that is close to the PCB board to keep away from one side of PCB board and lower mould 2 is from one side that is close to the PCB board to keep away from one side of PCB board to go up mould 1, once pile up and set up two-layer 4mm fibreboard, 4mm high layering piece 106, continuous three-layer interval is 0.5mm thick fibreboard of 4mm (supporting with 4mm high layering piece 106 between fibreboard and the fibreboard), 5.5mm high layering piece 106, continuous three-layer interval is 0.5mm thick fibreboard of 4mm (supporting with 4mm high layering piece 106 between fibreboard and the fibreboard, and set up one deck sponge between wherein two-layer fibreboard) and the fibreboard of 5mm thickness, the diameter of test needle 4 is 0.15mm, in the test, this test needle 4 non-deformable.
The above description is only exemplary of the present invention and should not be taken as limiting the scope of the present invention, as any modifications, equivalents, improvements and the like made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. Test fixture, including last mould and lower mould, go up the mould with all be equipped with test needle, its characterized in that on the lower mould: the upper die and the lower die respectively comprise a support column, a positioning pin for positioning a PCB, a plurality of first guide plates and a plurality of second guide plates arranged among the first guide plates, and the first guide plates and the second guide plates are stacked;
a gap is reserved between every two adjacent second guide plates, the support column penetrates through the second guide plates, and the test needle penetrates through the first guide plates and the second guide plates;
one side of the upper die, which is close to the lower die, is provided with a positioning hole or/and a positioning column, one side of the lower die, which is close to the upper die, is provided with a positioning column or/and a positioning hole, and the upper die and the lower die extend into the positioning hole through the positioning column for positioning.
2. The test fixture of claim 1, wherein: the length of the positioning column extending out of the upper die or the lower die is greater than the length of the alignment needle extending out of the upper die or the lower die.
3. The test fixture of claim 2, wherein: the first elastic piece is arranged in the lower die or/and the upper die, and a first accommodating cavity is formed in the lower die and/or the upper die and penetrates through the second guide plate;
one end of the positioning column extends into the first accommodating cavity, and the first elastic piece is arranged in the first accommodating cavity and sleeved on the positioning column and provides axial thrust along the positioning column for the positioning column.
4. The test fixture of claim 3, wherein: and two ends of the first accommodating cavity extend into the first guide plate.
5. The test fixture of claim 1, wherein: the positioning column is arranged on the lower die, and the end part of the positioning column gradually converges from one end close to the lower die to one end close to the upper die;
the size of one end, close to the lower die, of the positioning hole is larger than that of one end, far away from the lower die, of the positioning hole.
6. The test fixture of claim 1, wherein: still include the second elastic component, go up in the mould with all be equipped with the second in the lower mould and hold the chamber, the second holds the chamber and runs through the part first deflector and part the second deflector, run through to the counterpoint needle the second holds the chamber, the second elastic component is located the second holds the intracavity and the cover is located counterpoint needle is last and for provide the edge to the counterpoint needle the axial thrust of counterpoint needle.
7. The test fixture of claim 1, wherein: still including being used for blocking the card needle spare of test needle, card needle spare is located two between the second deflector.
8. The test fixture of claim 1, wherein: still including set firmly in the tightening piece at the both ends of support column, tightening piece will first deflector is fixed in on the support column, just tightening piece can be adjusted first deflector with distance between the support column.
9. The test fixture of claim 1, wherein: the supporting column is provided with a plurality of second guide plates and a plurality of first guide plates, the first guide plates are arranged on the supporting column in a sleeved mode, one ends of the first guide plates are connected with the first guide plates in an abutted mode, and the other ends of the first guide plates are connected with the second guide plates in an abutted mode.
10. The test fixture of claim 1, wherein: the first guide plate has a thickness greater than a thickness of the second guide plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920416101.5U CN210090614U (en) | 2019-03-29 | 2019-03-29 | Test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920416101.5U CN210090614U (en) | 2019-03-29 | 2019-03-29 | Test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210090614U true CN210090614U (en) | 2020-02-18 |
Family
ID=69473100
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920416101.5U Active CN210090614U (en) | 2019-03-29 | 2019-03-29 | Test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210090614U (en) |
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2019
- 2019-03-29 CN CN201920416101.5U patent/CN210090614U/en active Active
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| TR01 | Transfer of patent right |
Effective date of registration: 20200618 Address after: 518000 zone a, floor 2, floor 3, floor 5, zone a, plant 3, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN MASON ELECTRONICS Co.,Ltd. Address before: 518000 No. 9988 Shennan Avenue, Shenzhen, Guangdong, Nanshan District Co-patentee before: SHENZHEN MASON ELECTRONICS Co.,Ltd. Patentee before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. |