CN210072077U - Active embedded fragment speed testing device - Google Patents

Active embedded fragment speed testing device Download PDF

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Publication number
CN210072077U
CN210072077U CN201920667087.6U CN201920667087U CN210072077U CN 210072077 U CN210072077 U CN 210072077U CN 201920667087 U CN201920667087 U CN 201920667087U CN 210072077 U CN210072077 U CN 210072077U
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China
Prior art keywords
laser
speed
fragment
signal processing
testing
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CN201920667087.6U
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Chinese (zh)
Inventor
江剑
张迎
郭飞飞
齐昕雨
路卓
王杰兵
孙涵
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Nanjing Hua Jian Bao Ke Engineering Technology Co Ltd
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Nanjing Hua Jian Bao Ke Engineering Technology Co Ltd
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Abstract

The utility model provides an active type embedded fragment speed testing arrangement, includes storage formula laser test host computer, a line nature laser instrument and photoelectric detector, a line nature laser instrument with storage formula laser test host computer homonymy is placed, set up twice target slit on the body of storage formula laser test host computer, the target slit is used for the installation to receive fragment reflection laser signal's photoelectric detector, a line nature laser instrument forms the light curtain effective area, and its position that covers the fragment, photoelectric detector gives signal processing apparatus with signal transmission after receiving the laser signal of reflection, signal processing apparatus handles received signal and sends the speed sensor well and give, the speed sensor carries the result of testing the speed for the host computer. The device simple structure can adjust the vertical distance between line linear laser ware and the fragment in order to reach the purpose that can adjust the area of light curtain effective area, and adopts storage and integrated design, has avoided split type field arrangement and the heavy problem of measuring work load.

Description

Active embedded fragment speed testing device
Technical Field
The utility model relates to a shooting range fragment speed test equipment technical field especially relates to an active type of burying fragment speed testing arrangement.
Background
The measurement of the fragment speed can be divided into an instantaneous speed measurement method and an average speed measurement method in principle. The instantaneous velocity of a fragment is difficult to measure directly, so it is usually measured using an average velocity measurement. At present, according to whether the fragment contacts with measuring device, the technique of testing the speed of actual application can be divided into two kinds: contact measurement systems and non-contact measurement systems.
The contact type measuring system mainly comprises a mesh target, a foil target, an inertia target and the like. The contact type measuring system has the advantages of simple structure, convenience in manufacturing, strong anti-interference capability and the like, but the contact type measuring system can directly influence the flying speed and flying posture of the fragments after the fragments pass through, so that the state of the fragments before and after the fragments pass through the target surface is changed, and the error of the measuring result is larger. When the non-contact speed measuring system is used, the fragments are not in direct contact with the speed measuring device, the speed measuring target surface is not damaged, and the speed and the posture of the fragments penetrating through the target surface are not influenced. It is therefore imperative to those skilled in the art to address this problem.
SUMMERY OF THE UTILITY MODEL
In order to solve the above problems, the present invention provides an active embedded fragment speed testing device, which has a simple structure, can adjust the vertical distance between a linear laser and a fragment to achieve the purpose of adjusting the area of an effective area of a light curtain, and adopts a storage and integrated design, thereby avoiding the problem of heavy workload of split type field arrangement and measurement, and for achieving the purpose, the device comprises a storage type laser testing host, a linear laser and a photoelectric detector, wherein the linear laser and the storage type laser testing host are arranged at the same side, the body of the storage type laser testing host is provided with two target slits, the target slits are used for installing a photoelectric detector for receiving the laser signal reflected by the fragment, the linear laser forms the effective area of the light curtain and covers the position of the fragment, the photoelectric detector transmits the signal to a signal processing device after receiving the reflected laser signal, the signal processing device processes the received signals and transmits the processed signals to the speed measuring device, and the speed measuring device transmits speed measuring results to the upper computer.
As an improvement of the present invention, the signal processing device is electrically connected to the photoelectric detector and the speed measuring device.
As an improvement of the utility model, a partly setting of a line nature laser is in the outside of storage formula laser test host computer, its another part sets up the inner chamber of storage formula laser test host computer.
As an improvement of the present invention, the signal processing device includes a signal processing sensor.
As an improvement of the utility model, the speed measuring device includes a speed sensor.
As an improvement of the present invention, each of the light curtain effective areas formed by the linear laser is provided with a detection area.
As an improvement of the utility model, photodetector, signal processing device, speed sensor set up the inside of storage formula laser test host computer.
As an improvement of the utility model, storage formula laser test host computer buries the underground, a line nature laser instrument sets up the outside portion of storage formula laser test host computer exposes ground.
The utility model provides an active type of burying fragment speed testing arrangement, the device simple structure, can adjust the vertical distance between linear laser instrument to the fragment in order to reach the purpose that can adjust light curtain effective area, and adopt storage and integrated design, the problem of split type field arrangement with the heavy work load of measurement has been avoided, bury underground storage formula test host, test device's safety has been protected well, adopt the structure of integral type, it is swift convenient to install, bury underground when the field usage, avoid the destruction that the fragment was hit.
Drawings
FIG. 1 is a schematic diagram of an internal system of the present application;
FIG. 2 is a schematic view of the outer surface of the present application;
description of reference numerals:
1. a storage type laser test host; 2. a linear laser; 3. a photodetector; 4. a target slit; 5. a light curtain effective area; 6. breaking; 7. a signal processing device; 8. a speed measuring device; 9. and (4) an upper computer.
Detailed Description
The invention will be described in further detail with reference to the following detailed description and accompanying drawings:
the utility model provides an active type of burying fragmentation speed testing arrangement, the device simple structure can adjust the purpose of the vertical distance between a linear laser instrument to the fragmentation in order to reach the area that can adjust the light curtain effective area, and adopts storage and integrated design, has avoided split type field arrangement and the heavy problem of measuring work load, buries the underground with storage formula test host, has protected testing arrangement's safety well.
Example 1: referring to fig. 1 and fig. 2, the active embedded type fragment speed testing apparatus provided by the present invention is now described, which comprises a storage type laser testing host 1, a linear laser 2 and a photodetector 3, the linear laser 2 and the storage type laser testing host machine 1 are arranged at the same side, two target slits 4 are arranged on the body of the storage type laser testing host machine 1, the target slit 4 is used for installing a photoelectric detector 3 for receiving laser signals reflected by the fragments 6, the linear laser 2 forms a light curtain effective area 5, which covers the position of the fragment 6, the photodetector 3 transmits the signal to the signal processing device 7 after receiving the reflected laser signal, the signal processing device 7 processes the received signals and transmits the processed signals to the speed measuring device 8, and the speed measuring device 8 transmits speed measuring results to the upper computer 9. According to the requirements on the time response characteristic, the spectral response characteristic and the like of the photoelectric detector, and in combination with the performance parameter comparison of various photoelectric detectors, a silicon PIN photoelectric diode with a large light receiving area is selected as the photoelectric detector.
Example 2: referring to fig. 1 and fig. 2, as an improvement of the present invention, the signal processing device 7 is electrically connected to the photodetector 3 and the speed measuring device 8.
Example 3: referring to fig. 1 and fig. 2, as an improvement of the present invention, a part of the linear laser 2 is disposed outside the storage laser testing host 1, and another part of the linear laser is disposed in the inner cavity of the storage laser testing host 1.
Example 4: referring to fig. 1 and 2, as a modification of the present invention, the signal processing device 7 includes a signal processing sensor.
Example 5: referring to fig. 1 and 2, as an improvement of the present invention, the speed measuring device 8 includes a speed measuring sensor.
Example 6: referring to fig. 1 and 2, as an improvement of the present invention, each of the linear lasers 2 is provided with a detection region in the light curtain effective region 5.
Example 7: referring to fig. 1 and fig. 2, as an improvement of the present invention, the photodetector 3, the signal processing device 7, and the speed measuring device 8 are disposed inside the storage type laser testing host 1.
Example 8: referring to fig. 1 and fig. 2, as an improvement of the present invention, the storage laser test host 1 is buried underground, and the linear laser 2 is disposed on the outside of the storage laser test host 1.
The working process is as follows: as shown in fig. 1 and fig. 2, the system is composed of a linear laser 2, a photodetector 3, a signal processing device 7, and a speed measuring device 8, wherein the linear laser 2, the photodetector 3, the signal processing device 7, and the speed measuring device 8 are integrated in a storage laser test host 1. When the on-site test is carried out, the power supply of the linear laser 2 is switched on, and the laser light source emits laser to form a single fan-shaped light curtain area. The front and rear two linear lasers 2 form front and rear pairs of light curtain regions. Then, the storage type test host 1 is completely buried, and only the linear laser 2 is exposed out of the ground surface, so that the storage type test host 1 is protected from being hit and damaged by the fragment 6. When in security protection, the device is required to form a light curtain which is vertical to the ground. When the fragments 6 pass through the effective area 5 of the light curtain, laser irradiates the fragments to form reflection, and the reflected laser signals are received by the photoelectric detector 3, so that the photocurrent changes, and pulse triggering signals are generated after the photocurrent passes through the signal processing circuit. Because the fragment speed is very fast, two pulse signals which occur at different time can be formed in the paired light curtain effective areas, and the instantaneous speed of the fragment 6 at the distance can be calculated only by reading the time difference of the two similar pulse signals because the distance between the two target slits 4 of the whole device is fixed.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in any way, but also to cover any modifications or equivalent changes made in the technical spirit of the present invention, which fall within the scope of the present invention.

Claims (8)

1. The utility model provides an active embedded fragment speed testing arrangement which characterized in that: including storage formula laser test host computer, a line nature laser instrument and photoelectric detector, a line nature laser instrument with storage formula laser test host computer homonymy is placed, set up twice target slit on the body of storage formula laser test host computer, the target slit is used for installing the photoelectric detector who receives fragment reflection laser signal, a line nature laser instrument forms light curtain effective area, and its place that covers the fragment, photoelectric detector gives signal processing device with signal transmission after receiving the laser signal of reflection, signal processing device handles received signal and sends to the speed sensor well, the speed sensor carries the result of testing the speed for the host computer.
2. The active embedded fragment speed testing device of claim 1, wherein: and the signal processing device is electrically connected with the photoelectric detector and the speed measuring device.
3. An active embedded fragment speed testing device as claimed in claim 2, wherein: one part of the linear laser is arranged outside the storage type laser test host, and the other part of the linear laser is arranged in the inner cavity of the storage type laser test host.
4. An active embedded fragment speed testing device as claimed in claim 3, wherein: the signal processing device comprises a signal processing sensor.
5. The active embedded fragment speed testing device of claim 1, wherein: the speed measuring device comprises a speed measuring sensor.
6. The active embedded fragment speed testing device of claim 5, wherein: and a detection area is arranged in the effective area of the light curtain formed by each linear laser.
7. The active embedded fragment speed testing device of claim 6, wherein: the photoelectric detector, the signal processing device and the speed measuring device are arranged inside the storage type laser testing host.
8. The active embedded fragment speed testing device of claim 7, wherein: the storage type laser testing host machine is buried underground, and the linear laser is arranged on the outer side part of the storage type laser testing host machine and exposed out of the ground.
CN201920667087.6U 2019-05-10 2019-05-10 Active embedded fragment speed testing device Active CN210072077U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920667087.6U CN210072077U (en) 2019-05-10 2019-05-10 Active embedded fragment speed testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920667087.6U CN210072077U (en) 2019-05-10 2019-05-10 Active embedded fragment speed testing device

Publications (1)

Publication Number Publication Date
CN210072077U true CN210072077U (en) 2020-02-14

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920667087.6U Active CN210072077U (en) 2019-05-10 2019-05-10 Active embedded fragment speed testing device

Country Status (1)

Country Link
CN (1) CN210072077U (en)

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