CN210071713U - Sample clamp for ultra-high temperature ablation performance examination test - Google Patents
Sample clamp for ultra-high temperature ablation performance examination test Download PDFInfo
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- CN210071713U CN210071713U CN201920795036.1U CN201920795036U CN210071713U CN 210071713 U CN210071713 U CN 210071713U CN 201920795036 U CN201920795036 U CN 201920795036U CN 210071713 U CN210071713 U CN 210071713U
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Abstract
The utility model provides a sample anchor clamps for ultra-temperature ablation performance examination is experimental, include: the fixture comprises a fixture floor fixing frame, a sample clamping unit, a supporting base, a first fixing piece and a second fixing piece; the sample clamping unit is hollow and is fixed on the clamp floor fixing frame through a first fixing piece; the sample to be tested and the supporting base are positioned in the hollow part of the sample clamping unit; the sample is fixed on the sample clamping unit through a second fixing piece, and the supporting base is clamped and fixed between the sample and the clamp floor fixing frame. The utility model discloses can overcome high temperature, high-speed air current and wash away the oxide layer loss that brings, obtain the ablation test result of high credibility.
Description
Technical Field
The utility model relates to an ultra-temperature ablation performance examination field of material, concretely relates to a sample anchor clamps that is used for ultra-temperature ablation performance examination of ultra-temperature ceramic material to test.
Background
The superhigh temperature ceramic is one kind of compound with melting point over 3000 deg.c capable of being used at temperature over 2000 deg.c and in environment atmosphere, and is mainly the carbide, boride and nitride ceramic material of transition metal tantalum, hafnium and zirconium. Due to excellent performance, the ultra-high temperature ceramic can bear extreme application environments such as ultra-high sound speed long-time flight, atmosphere reentry, atmospheric layer crossing flight, rocket propulsion systems and the like, and can be used for various key hot end components such as reentry aircrafts, hypersonic aircrafts nose cones in atmosphere, wing leading edges, engine combustion chambers and the like.
The material ablation refers to that mass transfer is generated on the surface of a material to take away a large amount of heat through physical and chemical processes such as pyrolysis, gasification, melting, sublimation, radiation, oxidation and the like under the flushing of high-temperature and high-pressure air flow, so that the aim of high-temperature resistance is fulfilled. The ablation resistance is an important index for evaluating the service reliability of the ultra-high temperature material, and the ablation resistance needs to be systematically and comprehensively evaluated according to the actual service environment. At present, ground equipment is mostly adopted to carry out performance test on the ablated sample, and the performance test mainly comprises an oxyacetylene ablation test, a plasma ablation test and a wind tunnel test. Wind tunnel tests are closest to the real ablation environment, but the tests are more costly and suitable for final evaluation. The oxygen-acetylene ablation test and the plasma ablation test have the advantages of simple equipment, convenient operation, economy and practicability, and are suitable for basic theoretical research in laboratories.
When the ultra-high temperature material is subjected to ablation examination, the rapid change of the temperature can cause the internal thermal stress of the material, so that the ceramic product is subjected to thermal shock damage and is often accompanied with cracking; the oxide skin on the surface layer of the ultrahigh-temperature ceramic can crack and fall off under the scouring of high-temperature and high-speed airflow. At present, the clamp of a sample in ablation examination is designed by adopting an adjustable clamping size, the design is complex, the size of the clamp is difficult to perfectly fit with the sample, so that the oxide layer falls off and runs off under the high-temperature and high-speed air flow scouring, and the accurate research on the mass ablation rate and the line ablation rate of the sample is directly influenced. In order to ensure the consistency of the results of the sample ablation test, a sample clamp suitable for the ablation performance examination test of the ultra-high temperature ceramic material needs to be developed, the influence of thermal shock cracking on the examination is reduced as much as possible, and the data of the quality ablation rate and the line ablation rate with higher credibility of the ultra-high temperature ceramic material are obtained.
SUMMERY OF THE UTILITY MODEL
In view of the above, the to-be-solved technical problem of the utility model is to provide a sample anchor clamps for ultra-high temperature ablation performance examination test, overcome oxide layer loss that high temperature, high-speed air current erode and bring, obtain the ablation test result of high credibility.
Therefore, the utility model adopts the following technical scheme:
the utility model provides a pair of a sample anchor clamps for ultra-temperature ablation performance examination is experimental, include:
the fixture comprises a fixture floor fixing frame, a sample clamping unit, a supporting base, a first fixing piece and a second fixing piece;
the sample clamping unit is hollow and is fixed on the clamp floor fixing frame through a first fixing piece;
the sample to be tested and the supporting base are positioned in the hollow part of the sample clamping unit;
the sample is fixed on the sample clamping unit through a second fixing piece, and the supporting base is clamped and fixed between the sample and the clamp floor fixing frame.
According to the utility model discloses a sample anchor clamps can fix the sample that awaits measuring that is erodeed by the air current, makes the ultra-temperature erode the accessible diffusion of air current to provide the holding power by supporting the sample that the base is awaited measuring, this sample anchor clamps repeatedly usable, simple structure is practical, simple to operate.
Preferably, the sample clamping unit is an eccentric hollow cylinder, the diameter of the cylinder is 30-50 mm, the diameter of the hollow part is phi 10-30 mm, and the center of the hollow part is downward 15-5 mm from the center of the clamping unit; a threaded hole with the diameter of 4-8 mm is formed in the top of the central shaft of the tangent plane of the cylinder, and the center of the hole is 10-15 mm upward from the center of the clamping unit.
Therefore, the use reliability of the sample clamp can be improved, and clamp collapse caused by thermal shock in the ablation process is avoided.
Preferably, the supporting base is a solid cylinder,is thick and thick
Preferably, the sample clamping unit is detachably fixed to the fixture floor mount.
Preferably, the first and second fixing members are made of graphite.
Drawings
Fig. 1 is a schematic structural diagram of a sample clamp for an ultra-high temperature ablation performance examination test according to an embodiment of the present invention;
fig. 2 (a) and (b) are schematic front and left side views, respectively, of the sample-holding unit shown in fig. 1;
reference numerals:
1. the fixture comprises a fixture floor fixing frame 2, a sample clamping unit 3, a supporting base 4-1, a first fixing piece (fixing the sample clamping unit-the fixture floor fixing frame), 4-2 and a second fixing piece (fixing the sample clamping unit-the sample).
Detailed Description
The present invention is further described below in conjunction with the following embodiments and the accompanying drawings, it being understood that the drawings and the following embodiments are illustrative of the present invention only and are not limiting.
Fig. 1 is a schematic structural diagram of a sample clamp for an ultra-high temperature ablation performance examination test according to an embodiment of the present invention. As shown in FIG. 1, the sample clamp for the ablation performance assessment of the ultra-high temperature ceramic material in the embodiment comprises a clamp floor fixing frame 1, a sample clamping unit 2, a supporting base 4 and first and second fixing pieces 4-1 and 4-2. The sample clamping unit 2 is hollow and is fixed on the fixture floor fixing frame 1 by a first fixing piece 4-1. The sample to be measured (sample shown in fig. 1) and the support base 3 are located in the hollow portion of the sample holding unit 2. The sample is fixed to the sample-holding unit 2 by the second fixing member 4-2. The supporting base 3 is clamped and fixed between the sample and the floor fixing frame 1 of the clamp, and provides stable support for the sample to be tested.
In this embodiment, the sample to be tested may be a disk-shaped sample, for example, a disk-shaped sample to be tested having a diameter of 30mm, 20mm or 10 mm. The sample clamp is not limited to be applied to a wafer-shaped sample, and can be a sample with other shapes, but as indicated in ablated material ablation test method (GJB323A-96), the ablated sample is generally circular in shape.
Preferably, the sample clamping unit 2 is an eccentric hollow cylinder, the diameter of the cylinder is 30-50 mm, the diameter of the hollow part is phi 10-30 mm, and the center of the hollow part is downward 15-5 mm from the center of the clamping unit; a threaded hole with the diameter of 4-8 mm is formed in the top of the central shaft of the tangent plane of the cylinder, and the center of the hole is 10-15 mm upward from the center of the clamping unit. The eccentric hollow cylinder has the advantages that the threaded hole (such as M6) is formed in the vertical direction of the sample clamping unit, so that the use reliability of the sample clamp is improved, the clamp is prevented from being broken due to thermal shock in the ablation process, and the position of the hollow part is adjusted to enable the hollow part to have a certain distance from the threaded hole.
Specifically, in the embodiment shown in FIG. 1, the sample-holding means 2 can be configured, for example, as follows for a wafer-like sample having a diameter of 30mm, 20mm, or 10 mm: the diameter of the cylinder is 45mm, the diameter of the hollow part is phi 30mm (phi 20mm, phi 10mm), and the center of the hollow part is about 5mm (10mm, 15mm) downward from the center of the sample clamping unit; the top of the central shaft of the section of the cylinder is provided with a threaded hole with the diameter of 5mm, and the distance between the center of the hole and the center of the sample clamping unit is 15mm upwards.
Preferably, the support base 3 is cylindrical, in particular solid, with a diameterIs thick and thick
This thickness prevents damage. In addition, the sample clamp can be fixed on the clamp floor fixing frame in a replaceable manner.
Preferably, the first and second fixing members 41 and 42 are made of graphite, such as graphite bolts and nuts.
The sample clamp provided by the utility model can overcome the oxide layer loss caused by high temperature and high speed air flow scouring, and obtain the ablation test result with high reliability; can stably clamp disc-shaped samples to be examined with the diameters of phi 30mm, phi 20mm and phi 10 mm; the clamp is simple and practical in design, convenient to install a sample, capable of being repeatedly used, long in service life and strong in applicability.
The present invention will be described in detail with reference to examples. It should also be understood that the following examples are only for illustrating the present invention and should not be construed as limiting the scope of the present invention, and that the modifications and adjustments made by those skilled in the art according to the above-mentioned contents of the present invention are not essential to the present invention. The specific process parameters and the like of the following examples are also only one example of suitable ranges, i.e., those skilled in the art can select the appropriate ranges through the description herein, and are not limited to the specific values exemplified below.
Example 1
The simple fixture for the embedded wafer-shaped sample for the ultra-high temperature ablation performance assessment test in the embodiment 1 is shown in fig. 1, and comprises a fixture floor fixing frame 1, a sample clamping unit 2, a cylindrical supporting base 3 and fixing pieces 4-1 and 4-2 formed by graphite bolts and nuts. The sample clamping unit 2 is fixed on the fixture floor fixing frame 1 by graphite bolts and nuts. The supporting base 3 is firstly embedded into the sample clamping unit 2, and a round surface on one side is attached to the floor fixing frame 1 of the clamp. And after the to-be-detected wafer-shaped sample and the cylindrical support base 3 are stacked, the to-be-detected wafer-shaped sample is tightly screwed and fixed on the sample clamping unit 2 by graphite bolts.
In this embodiment, the support base is a solid cylinder, the diameter of which is consistent with that of the current sample to be tested and the thickness of which is thick
In the experimental process, the ablation flame is vertically aligned to the center of the surface of the sample. And adjusting the dual-wavelength infrared thermometer, aligning the dual-wavelength infrared thermometer to the circle center area of the sample from the side, testing the surface temperature of the sample, and drawing a temperature change curve of the surface of the sample in the ablation process.
The installation and use process of the clamp of the embodiment is as follows:
selecting a sample clamping unit and a cylindrical supporting base which are matched according to the diameter of a sample to be detected; the sample clamping unit is fixed on the clamp floor fixing frame by a graphite bolt and a nut through threaded connection; embedding the cylindrical support base into the sample clamping unit, and attaching a round surface on one side to the floor fixing frame of the clamp; embedding a sample to be detected, enabling a circular surface on one side of the sample to be tightly attached to the cylindrical supporting base, and fixing the cylindrical supporting base on the sample clamping unit by using a graphite bolt and a nut; the ablation resistance performance assessment test can be started by selecting a proper ablation method and parameters according to an ablation material ablation test method (GJB323A-96, FL 0183). After the test is finished, the surface of the sample is completely cooled to room temperature, and the graphite bolt and the graphite nut are disassembled, so that the test sample can be taken down.
In conclusion, the embodiment provides a simple embedded type wafer-shaped sample clamp for an ultrahigh-temperature ablation performance examination test, which comprises a clamp floor fixing frame, a sample clamping unit, a supporting base, a graphite bolt and a nut; the sample clamping unit and the clamp floor fixing frame are fixedly connected through a graphite bolt and a nut; the wafer-shaped sample adopts threads matched with a graphite bolt and a sample clamping unit; the cylindrical supporting base is clamped between the sample to be tested and the clamp floor fixing frame. The sample holder of this embodiment can be examined to have a diameter of
The disc-shaped ablated sample with the thickness of 10 +/-0.1 mm can fix the disc-shaped sample to be detected which is scoured by the airflow, so that the ultrahigh temperature scoured airflow can be diffused without obstacles, and the fixture can be repeatedly used, has a simple and practical structure and is convenient to install.
The present invention may be embodied in several forms without departing from the spirit of the essential characteristics thereof, and the embodiments are therefore to be considered in all respects as illustrative and not restrictive, since the scope of the invention is defined by the appended claims rather than by the description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein.
Claims (5)
1. A sample anchor clamps for ultra-high temperature ablation performance examination test, its characterized in that includes:
the device comprises a fixture floor fixing frame (1), a sample clamping unit (2), a supporting base (3) and first and second fixing pieces (4-1 and 4-2);
the sample clamping unit (2) is hollow and is fixed on the clamp floor fixing frame (1) by a first fixing piece (4-1);
the sample to be measured and the supporting base (3) are positioned in the hollow part of the sample clamping unit;
the sample is fixed on the sample clamping unit (2) through a second fixing piece (4-2), and the supporting base (3) is clamped and fixed between the sample and the clamp floor fixing frame (1).
2. Sample holder according to claim 1,
the sample clamping unit (2) is an eccentric hollow cylinder, the diameter of the cylinder is 30-50 mm, the diameter of the hollow part is phi 10-30 mm, and the center of the hollow part is downward 15-5 mm from the center of the clamping unit; a threaded hole with the diameter of 4-8 mm is formed in the top of the central shaft of the tangent plane of the cylinder, and the center of the hole is 10-15 mm upward from the center of the clamping unit.
3. Root of herbaceous plantSpecimen holder according to claim 2, characterized in that the support base (3) is a solid cylinder with a diameter
Is thick and thick
4. Sample clamp according to any of claims 1 to 3, characterized in that the sample holding unit (2) is detachably fixed to the clamp floor mount (1).
5. Sample holder as claimed in any of claims 1 to 3, wherein the first and second fixing members are of graphite.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920795036.1U CN210071713U (en) | 2019-05-30 | 2019-05-30 | Sample clamp for ultra-high temperature ablation performance examination test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920795036.1U CN210071713U (en) | 2019-05-30 | 2019-05-30 | Sample clamp for ultra-high temperature ablation performance examination test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210071713U true CN210071713U (en) | 2020-02-14 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920795036.1U Active CN210071713U (en) | 2019-05-30 | 2019-05-30 | Sample clamp for ultra-high temperature ablation performance examination test |
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| Country | Link |
|---|---|
| CN (1) | CN210071713U (en) |
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2019
- 2019-05-30 CN CN201920795036.1U patent/CN210071713U/en active Active
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