CN210038049U - Diode reverse-installation test bench - Google Patents
Diode reverse-installation test bench Download PDFInfo
- Publication number
- CN210038049U CN210038049U CN201920859106.5U CN201920859106U CN210038049U CN 210038049 U CN210038049 U CN 210038049U CN 201920859106 U CN201920859106 U CN 201920859106U CN 210038049 U CN210038049 U CN 210038049U
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- grooves
- cover plate
- diode
- placing
- test bench
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- 238000012360 testing method Methods 0.000 title claims abstract description 16
- 238000009434 installation Methods 0.000 title description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 21
- 229910052802 copper Inorganic materials 0.000 claims abstract description 21
- 239000010949 copper Substances 0.000 claims abstract description 21
- 238000001514 detection method Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
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Abstract
The utility model relates to the technical field of diode test tables, in particular to a diode reverse-mounting test table, which comprises a placing table, wherein the top of the placing table is provided with a fixed seat along one side edge, the fixed seat is articulated with a cover plate, the placing table is provided with through grooves distributed in an array manner along a table surface, the bottom of the through grooves is provided with first copper contact sheets, the top of each through groove is respectively provided with a guide tube seat, diodes are inserted in the guide tube seats, grooves distributed in an array manner are arranged on one side surface of the table surface of the placing table facing the cover plate, the bottom of each groove is provided with a second copper contact sheet, and the placing table is provided with a mounting frame. The work efficiency of detection has been promoted greatly.
Description
Technical Field
The utility model relates to a diode testboard technical field especially relates to a diode reverse loading testboard.
Background
The diode is a device with two electrodes in an electronic element, only current is allowed to flow in a single direction, the rectifying function of the diode is applied to many fields, and the current in the diode flows in a single direction, so that the function of the diode cannot be realized when the diode is reversely mounted.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the diode that exists among the prior art and detecting its forward and reverse in-process at the manual work, shortcoming that work efficiency is low, and the diode that provides is turned over and is adorned the testboard.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a diode reverse-mounting test bench comprises a placing table, wherein a fixed seat is arranged at the top of the placing table along the edge of one side, a cover plate is hinged on the fixed seat, through grooves distributed in an array manner are arranged along a table top of the placing table, the through grooves are vertically arranged, first copper contact pieces are placed at the bottoms of the through grooves, a guide tube seat is respectively arranged at the top end of each through groove, the interior of each guide tube seat is communicated up and down, diodes are inserted into the guide tube seats, grooves distributed in an array manner are formed in the surface of one side, facing the table top of the placing table, of the cover plate, and second copper contact pieces are arranged;
place the bench and be provided with the mounting bracket, the inside of mounting bracket is provided with movable block and spring, and the movable block articulates on one side inner wall of mounting bracket, and the bottom of spring is fixed on the diapire of mounting bracket, and the bottom at the movable block is fixed on the top of spring.
Preferably, the edge of the cover plate far away from the fixed seat is provided with a projection.
Preferably, the number of the through grooves formed in the top surface of the placing table is the same as the number of the grooves formed in the bottom surface of the cover plate, and the through grooves are arranged in one-to-one correspondence to the grooves.
Preferably, the bottom end of the diode is in contact with the first copper contact and the top end of the diode is in contact with the second copper contact.
Preferably, the cover plate is provided with indicating lamps on the surface away from the placing table, the number of the indicating lamps is the same as that of the grooves, and each indicating lamp is electrically connected with the second copper contact piece on the inner side of the cover plate through a wire.
Preferably, the top of movable block is provided with some contact pieces, and the apron is provided with the point touch switch that corresponds with some contact pieces on the face towards the mounting bracket.
The utility model has the advantages that: through the test bench that this scheme provided, solved the diode and at its forward and reverse in-process of artifical detection, problem that work efficiency is low can detect the forward and reverse state of diode in batches, and the testing process is simple and convenient, provides convenience for artifical detection, and save time has promoted the work efficiency who detects greatly.
Drawings
Fig. 1 is a schematic view of a front view structure of a diode reverse-mounting test board according to the present invention;
fig. 2 is a schematic structural diagram of a position a in fig. 1 of a diode reverse-mounting test bench according to the present invention;
fig. 3 is the utility model provides a diode reverse loading testboard place platform overlook schematic diagram.
In the figure: the 1 place platform, 2 fixing bases, 3 apron, 4 lugs, 5 direction tube seats, 6 diodes, 7 first copper contact, 8 second copper contact, 9 wire, 10 pilot lamps, 11 mounting brackets, 12 movable block, 13 springs, 14 point touch switch, 15 point contacts.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
Referring to fig. 1-3, a diode reverse-mounting test bench comprises a placing table 1, wherein a fixed seat 2 is arranged at the top of the placing table 1 along one side edge, a cover plate 3 is hinged on the fixed seat 2, through grooves distributed in an array manner are arranged on the placing table 1 along a table top, the through grooves are vertically arranged, first copper contact pieces 7 are placed at the bottoms of the through grooves, a guide tube seat 5 is respectively arranged at the top end of each through groove, the interior of the guide tube seat 5 is communicated up and down, diodes 6 are inserted into the guide tube seats 5, grooves distributed in an array manner are formed in one side plate surface of the cover plate 3, which faces the table top of the placing table 1, and second copper contact pieces 8 are arranged; the placing table 1 is provided with a mounting frame 11, a movable block 12 and a spring 13 are arranged inside the mounting frame 11, the movable block 12 is hinged on the inner wall of one side of the mounting frame 11, the bottom end of the spring 13 is fixed on the bottom wall of the mounting frame 11, the top end of the spring 13 is fixed at the bottom of the movable block 12, the edge of the cover plate 3 far away from the fixed seat 2 is provided with a lug 4, the number of through grooves formed on the top surface of the placing table 1 is the same as that of grooves formed on the bottom surface of the cover plate 3, the through grooves are arranged opposite to the grooves one by one, the bottom end of the diode 6 is contacted with the first copper contact piece 7, the top end of the diode 6 is contacted with the second copper contact piece 8, the surface of the cover plate 3 far away from the placing table 1 is provided with indicating lamps 10, the number of the indicating lamps 10 is the same as that of the grooves, each indicating lamp 10 is electrically, a point contact switch 14 corresponding to the point contact piece 15 is arranged on the surface of the cover plate 3 facing the mounting frame 11.
In this embodiment, with reference to the drawings of the specification, each first copper contact 7 is electrically connected to the contact piece 15 through a wire, and the contact switch 14 is electrically connected to the power supply, the cover plate 3 is opened, the diodes 6 are sequentially inserted into the guide tube bases 5, the bottom contact of the diode 6 contacts with the first copper contact 7, and then the cover plate 3 is closed, so that: firstly, the point contact piece 15 is communicated with the point contact switch 14, and secondly, the contact angle at the top of the diode 6 is contacted with the second copper contact piece 8, so that the whole circuit is in a connected state, when the diode 6 is in a forward position, namely, current flows in a forward direction, the current can be ensured to turn on the indicator light 10 at the top of the cover plate 3, whether the indicator light 10 is lightened or not is an external characteristic for judging the forward and reverse states of the diode 6.
Above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the design of the present invention, equivalent replacement or change should be covered within the protection scope of the present invention.
Claims (6)
1. The diode reverse-mounting test bench comprises a placing bench (1) and is characterized in that a fixed seat (2) is arranged at the top of the placing bench (1) along the edge of one side, a cover plate (3) is hinged to the fixed seat (2), through grooves distributed in an array form are formed in the placing bench (1) along a table top, the through grooves are vertically arranged, first copper contact pieces (7) are placed at the bottoms of the through grooves, a guide pipe seat (5) is arranged at the top end of each through groove respectively, the interior of the guide pipe seat (5) is communicated up and down, diodes (6) are inserted into the guide pipe seats (5), grooves distributed in an array form are formed in the surface of one side, facing the table top of the placing bench (1), of the cover plate (3), and second copper contact pieces (8) are arranged at the;
placing table (1) and being provided with mounting bracket (11), the inside of mounting bracket (11) is provided with movable block (12) and spring (13), and movable block (12) articulate on the inner wall of one side of mounting bracket (11), and the bottom mounting of spring (13) is on the diapire of mounting bracket (11), and the bottom at movable block (12) is fixed on the top of spring (13).
2. The diode reverse-loading test bench according to claim 1, characterized in that the edge of the cover plate (3) far away from the fixed base (2) is provided with a bump (4).
3. The diode reverse-loading test bench is characterized in that the number of through grooves formed in the top surface of the placing bench (1) is the same as that of grooves formed in the bottom surface of the cover plate (3), and the through grooves are arranged in a one-to-one manner relative to the grooves.
4. A diode flip-chip test bench according to claim 3, characterized in that the bottom end of the diode (6) is in contact with the first copper contact (7) and the top end of the diode (6) is in contact with the second copper contact (8).
5. The diode reverse-mounting test bench is characterized in that the surface of the cover plate (3) far away from the placing bench (1) is provided with indicating lamps (10), the number of the indicating lamps (10) is the same as that of the grooves, and each indicating lamp (10) is electrically connected with the second copper contact piece (8) on the inner side of the cover plate (3) through a lead.
6. The diode reverse-loading test bench according to claim 1, characterized in that a point contact piece (15) is arranged at the top of the movable block (12), and a point contact switch (14) corresponding to the point contact piece (15) is arranged on the surface of the cover plate (3) facing the mounting frame (11).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920859106.5U CN210038049U (en) | 2019-06-10 | 2019-06-10 | Diode reverse-installation test bench |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920859106.5U CN210038049U (en) | 2019-06-10 | 2019-06-10 | Diode reverse-installation test bench |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210038049U true CN210038049U (en) | 2020-02-07 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920859106.5U Active CN210038049U (en) | 2019-06-10 | 2019-06-10 | Diode reverse-installation test bench |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210038049U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111880019A (en) * | 2020-08-19 | 2020-11-03 | 江苏云意电气股份有限公司 | High-power diode low-frequency noise test system for multi-way vehicle |
-
2019
- 2019-06-10 CN CN201920859106.5U patent/CN210038049U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111880019A (en) * | 2020-08-19 | 2020-11-03 | 江苏云意电气股份有限公司 | High-power diode low-frequency noise test system for multi-way vehicle |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 315400 No. 112, Tangnan East, Lucheng village, Ditang street, Yuyao City, Ningbo City, Zhejiang Province Patentee after: Zhejiang Minghe New Energy Technology Co.,Ltd. Country or region after: China Address before: 315400 No. 112, Tangnan East, Lucheng village, Ditang street, Yuyao City, Ningbo City, Zhejiang Province Patentee before: NINGBO MINGHE NEW ENERGY TECHNOLOGY Co.,Ltd. Country or region before: China |
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| CP03 | Change of name, title or address |