CN210038002U - Voltage sag experiment platform - Google Patents
Voltage sag experiment platform Download PDFInfo
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- CN210038002U CN210038002U CN201920428027.9U CN201920428027U CN210038002U CN 210038002 U CN210038002 U CN 210038002U CN 201920428027 U CN201920428027 U CN 201920428027U CN 210038002 U CN210038002 U CN 210038002U
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Abstract
The utility model relates to a voltage sag experiment platform, include: the output end of the voltage sag generating device is electrically connected with the equipment to be tested and used for outputting corresponding voltage sag to the equipment to be tested according to the voltage sag signal; the signal acquisition device is arranged at the output end of the voltage sag generation device and used for acquiring the output voltage and the output current of the voltage sag generation device; the state acquisition device is arranged corresponding to the equipment to be tested and is used for acquiring the working state of the equipment to be tested; the main control device is used for outputting a voltage sag signal to the voltage sag generating device and analyzing the voltage sag sensitivity of the equipment to be tested according to the output voltage and the output current of the voltage sag generating device and the working state of the equipment to be tested. Therefore, automatic test of voltage sag sensitivity of the equipment can be realized, and the problem that manpower and material resources are greatly consumed due to manual experiments is effectively solved.
Description
Technical Field
The utility model relates to an electric energy quality technical field especially relates to a voltage sag experiment platform.
Background
The frequency converter is a device widely applied to industrial production, and in the using process, when voltage sag occurs to a power grid, the voltage on the direct current side of the frequency converter is lowered along with the voltage sag, and when the voltage sag to a certain degree, low-voltage protection is triggered to trip, so that the whole industrial process is interrupted, huge loss can be possibly caused to the economy, and potential safety hazards can be brought to human life.
In recent years, with the continuous access of non-linear and impact loads, the problem of power quality in a power grid becomes more serious, and the problem of voltage sag becomes the most serious power quality problem which is highly concerned by power supply departments and power consumers. Generally, most voltage sags in an electric power system are caused by short-circuit faults, and the voltage sags caused by various types of short-circuit faults are mainly divided into three types after being transmitted through a transformer and a line, namely three-phase sag, two-phase sag and single-phase sag. The tolerance capability of the frequency converter under different types of sag is greatly different, the frequency converter is most sensitive to three-phase sag and has lower sensitivity to two-phase sag and single-phase sag, and some frequency converters even have immunity to two-phase sag and single-phase sag.
The research on the tolerance characteristics of the frequency converter under different types of sag is the basis for analyzing the voltage sag tolerance capability and suppressing the sag of the frequency converter, so that related research is gradually developed domestically. However, at present, most of domestic related researches are directed at the frequency converter of the auxiliary engine of the thermal power plant, mainly take measures for improving the low-voltage ride through capability of the frequency converter, few experimental researches are conducted on the frequency converter affected by voltage sag, and partial scholars conduct voltage sag experiments on the frequency converter, but the frequency converter is a large number of manual experiments and needs a large amount of manpower and material resources.
SUMMERY OF THE UTILITY MODEL
Therefore, it is necessary to provide a voltage sag experiment platform for solving the problem of large consumption of manpower and material resources caused by a large number of manual experiments in the process of performing research and test on the voltage sag tolerance characteristics of a device to be tested, such as a frequency converter.
A voltage sag experiment platform, comprising:
the output end of the voltage sag generating device is electrically connected with the equipment to be tested and used for outputting corresponding voltage sag to the equipment to be tested according to the voltage sag signal;
the signal acquisition device is arranged at the output end of the voltage sag generating device and used for acquiring the output voltage and the output current of the voltage sag generating device;
the state acquisition device is arranged corresponding to the equipment to be tested and is used for acquiring the working state of the equipment to be tested;
and the main control device is electrically connected with the voltage sag generating device, the signal acquisition device and the state acquisition device respectively and is used for outputting a voltage sag signal to the voltage sag generating device and analyzing the voltage sag sensitivity of the equipment to be tested according to the output voltage and the output current of the voltage sag generating device and the working state of the equipment to be tested.
In one embodiment, the device under test is a frequency converter under test.
In one embodiment, the voltage sag generating device comprises:
the direct current capacitor is electrically connected between the output ends of the direct current power supply;
the input end of the inverter circuit is electrically connected with the direct current capacitor, and the control end of the inverter circuit is electrically connected with the main control device and used for converting direct current output by the direct current power supply into voltage sag according to the voltage sag signal;
and the input end of the filter circuit is electrically connected with the output end of the inverter circuit, and the output end of the filter circuit is electrically connected with the equipment to be tested, so that the filter circuit is used for filtering the voltage sag and transmitting the filtered voltage sag to the equipment to be tested.
In one embodiment, the signal acquisition device comprises a voltage signal acquisition unit and a current signal acquisition unit, wherein the voltage signal acquisition unit comprises: the voltage acquisition and conditioning circuit is used for acquiring the output voltage of the voltage sag generator and outputting a first analog signal, and the voltage data acquisition circuit is used for converting the first analog signal into a first digital signal and outputting the first digital signal to the main control device;
the current signal acquisition unit includes: the voltage sag generator comprises a current acquisition and conditioning circuit and a current data acquisition circuit, wherein the current acquisition and conditioning circuit is used for acquiring output current of the voltage sag generator and outputting a second analog signal, and the current data acquisition circuit is used for converting the second analog signal into a second digital signal and outputting the second digital signal to the main control device.
In one embodiment, the voltage acquisition conditioning circuit comprises:
the voltage transformer is arranged at the output end of the voltage sag generating device and used for collecting the output voltage of the voltage sag generating device and outputting a first analog signal;
the first isolation circuit is electrically connected with the voltage transformer and used for following the first analog signal and isolating the first analog signal;
and the first voltage stabilizing circuit is electrically connected with the first isolating circuit and is used for stabilizing the first analog signal within a first preset analog signal range.
In one embodiment, the current collection conditioning circuit comprises:
the current transformer is arranged at the output end of the voltage sag generating device and used for collecting the output current of the voltage sag generating device and outputting a second analog signal;
the second isolation circuit is electrically connected with the current transformer and used for following the second analog signal and isolating the second analog signal;
and the second voltage stabilizing circuit is electrically connected with the second isolating circuit and is used for stabilizing the second analog signal within a second preset analog signal range.
In one embodiment, the dc power supply includes: and the rectifying circuit is electrically connected with the alternating current power supply and the voltage sag generating device respectively and is used for converting alternating current output by the alternating current power supply into direct current.
In one embodiment, the platform further includes:
the first switch is arranged between the direct current power supply and the voltage sag generating device and used for controlling the connection and disconnection of the direct current power supply and the voltage sag generating device;
the second switch is arranged between the voltage sag generating device and the equipment to be tested and is used for controlling the connection and disconnection of the voltage sag generating device and the equipment to be tested;
and the third switch is arranged between the alternating current power supply and the equipment to be tested and used for controlling the connection and disconnection between the alternating current power supply and the equipment to be tested.
In one embodiment, the platform further includes: and the mechanical output end of the starting control device corresponds to the starting switch of the equipment to be tested and is used for controlling the equipment to be tested to start according to the starting signal output by the main control device.
In one embodiment, the start-up control means comprises:
the motion control unit is electrically connected with the main control device and used for outputting a pulse signal according to a starting signal output by the main control device;
the motor driving unit is electrically connected with the motion control unit and used for outputting a driving signal according to the pulse signal;
the motor is electrically connected with the motor driving unit and is used for rotating according to the driving signal;
the sliding table is mechanically connected with the motor and the operating rod respectively and used for controlling the operating rod to act under the driving of the motor so as to control the equipment to be tested to start.
According to the voltage sag experiment platform, the voltage sag generating device outputs corresponding voltage sag to equipment to be tested according to the voltage sag signal output by the main control device, the signal acquisition device acquires the output voltage and the output current of the voltage sag generating device, the state acquisition device acquires the working state of the equipment to be tested, and the main control device analyzes the voltage sag sensitivity of the equipment to be tested according to the output voltage and the output current of the voltage sag generating device and the working state of the equipment to be tested. Therefore, the automatic test of the voltage sag sensitivity of the equipment can be realized through the experimental platform, and the problem that manpower and material resources are greatly consumed through manual experiments is effectively solved.
Drawings
FIG. 1 is a schematic diagram of an exemplary voltage sag test platform;
FIG. 2 is a circuit topology diagram of a voltage sag generator device in one embodiment;
FIG. 3 is a circuit diagram of a voltage acquisition conditioning circuit in one embodiment;
FIG. 4 is a circuit diagram of a current acquisition conditioning circuit in one embodiment;
FIG. 5 is a schematic diagram of a voltage sag testing platform according to another embodiment;
FIG. 6 is a schematic diagram of a voltage sag testing platform according to another embodiment;
FIG. 7 is a schematic diagram of an exemplary start-up control apparatus;
fig. 8 is a schematic view showing the installation position of the stepping motor in one embodiment.
Detailed Description
In order to make the above objects, features and advantages of the present invention more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention can be embodied in many different forms other than those specifically described herein, and it will be apparent to those skilled in the art that similar modifications can be made without departing from the spirit and scope of the invention, and it is therefore not to be limited to the specific embodiments disclosed below.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
Fig. 1 is a schematic structural diagram of a voltage sag experiment platform in an embodiment, as shown in fig. 1, the voltage sag experiment platform includes: the voltage sag generator 10, the signal collector 20, the state collector 30 and the main controller 40.
The output end of the voltage sag generator 10 is electrically connected to the device to be tested 50, and is configured to output a corresponding voltage sag to the device to be tested 50 according to the voltage sag signal; the signal acquisition device 20 is arranged at the output end of the voltage sag generator 10 and is used for acquiring the output voltage and the output current of the voltage sag generator 10; the state acquisition device 30 is arranged corresponding to the device to be tested 50 and is used for acquiring the working state of the device to be tested 50; the main control device 40 is electrically connected to the voltage sag generating device 10, the signal collecting device 20, and the state collecting device 30, respectively, and is configured to output a voltage sag signal to the voltage sag generating device 10, and analyze the voltage sag sensitivity of the device under test 50 according to the output voltage and the output current of the voltage sag generating device 10 and the working state of the device under test 50. The device under test 50 may be a frequency converter under test.
Specifically, referring to fig. 1, the voltage sag generator 10 may output a corresponding voltage to the device under test 50 (e.g., a frequency converter) according to the voltage control signal output by the main control device 40. For example, when the main control device 40 outputs a voltage normal signal to the voltage sag generating device 10, the voltage sag generating device 10 outputs a stable voltage to the device under test 50 according to the voltage normal signal, and the output stable voltage is consistent with the rated operating voltage of the device under test 50, such as 220V/380V ac voltage; when the main control device 40 outputs a voltage sag signal to the voltage sag generating device 10, the voltage sag generating device 10 outputs a corresponding single voltage sag or continuous voltage sag according to the voltage sag signal, and an initial phase, a sag depth, and a sag duration of the single voltage sag or continuous voltage sag signal correspond to the voltage sag signal, that is, the voltage sag generating device 10 can output a single voltage sag or continuous voltage sag of any initial phase, any sag depth, and any sag duration according to set parameters, so as to implement tests on different voltage sags, and further implement tests on different types of devices to be tested.
The signal collecting device 20 is disposed at an output end of the voltage sag generator 10, and can collect the output voltage and the output current of the voltage sag generator 10 in a contact or non-contact manner, and transmit the output voltage and the output current to the main control device 40. The state collecting device 30 is aligned with the working indicator lamp of the device to be tested 50, and is used for collecting the color of the working indicator lamp, accurately and sensitively identifying the color of the working indicator lamp, and outputting the corresponding working state to the main control device 40 for subsequent analysis according to the identification result, for example, in a normal case, when the working indicator lamp is green, it indicates that the device to be tested 50 is in a normal working state, and when the working indicator lamp is red, it indicates that the device to be tested 50 is in a fault state, and specifically indicates which state can be determined according to an actual situation, and no limitation is made here. The main control device 40 is provided with corresponding software operated by a user, and can be used to set a rated operating voltage of the device under test 50, operating parameters of voltage sag, and the like, coordinate efficient operation of each device, and process data such as collected voltage, current, operating state, and the like, so as to perform voltage sag sensitivity analysis on the device under test 50, wherein the main control device 40 may be a personal computer.
During the test, the user may first control the main control device 40 to output a voltage normal signal to the voltage sag generating device 10, and at this time, the voltage sag generating device 10 outputs a stable voltage to the device to be tested 50 according to the voltage normal signal to detect whether the device to be tested 50 can normally work in a normal power supply state, and if the device to be tested can not normally work, the device to be tested 50 is replaced and retested; if the voltage sag generator can work normally, the output voltage and the output current of the voltage sag generator 10 collected by the signal collector 20 are recorded, and the working state of the device under test 50 collected by the state collector 30 is recorded as a reference value for the voltage sag.
Then, the main control device 40 is controlled to output a voltage sag signal to the voltage sag generating device 10, where the voltage sag signal may include a voltage sag trigger signal and an initial phase, a sag depth, a sag duration, a sag form (single or continuous) of the voltage sag, and the like, at this time, the voltage sag generating device 10 outputs a corresponding voltage sag to the device under test 50 according to the voltage sag signal, so that the device under test 50 operates under the voltage sag, and at the same time, the main control device 40 records the output voltage and the output current of the voltage sag generating device 10 collected by the signal collecting device 20, and the working state of the device under test 50 collected by the state collecting device 30, and analyzes the voltage sag sensitivity (such as tolerance) of the device under test 50 according to the recorded voltage, current, and working state when the voltage is normal and the voltage, current, and working state under the voltage sag, and outputs the corresponding analysis result.
In this embodiment, the voltage sag generator outputs a corresponding voltage sag to the device to be tested according to the voltage sag signal output by the main controller, the signal collector collects the output voltage and the output current of the voltage sag generator, and the state collector collects the operating state of the device to be tested, and the main controller analyzes the voltage sag sensitivity of the device to be tested according to the output voltage and the output current of the voltage sag generator and the operating state of the device to be tested. Therefore, automatic test of voltage sag sensitivity of the equipment can be realized, and the problem that manpower and material resources are greatly consumed due to manual experiments is effectively solved.
In one embodiment, the voltage sag generating device 10 comprises: the direct current power supply comprises a direct current capacitor 11, an inverter circuit 12 and a filter circuit 13, wherein the direct current capacitor 11 is electrically connected between output ends of a direct current power supply 60; the input end of the inverter circuit 12 is electrically connected to the dc capacitor 11, and the control end of the inverter circuit 12 is electrically connected to the main control device 40, so as to convert the dc power output by the dc power supply 60 into a voltage sag according to the voltage sag signal; the input end of the filter circuit 13 is electrically connected to the output end of the inverter circuit 12, and the output end of the filter circuit 13 is electrically connected to the device under test 50, so as to filter the voltage sag and transmit the filtered voltage sag to the device under test 50.
Specifically, referring to fig. 2, the dc capacitor 11 may be formed by a plurality of capacitors connected in series, for example, the dc capacitor 11 may include a first dc capacitor C connected in seriesd1And a second DC capacitor Cd2Wherein, the first DC capacitor Cd1Is electrically connected to one end of a DC power supply 60, a first DC capacitor Cd1And the other end of the first capacitor and a second direct current capacitor Cd2Is electrically connected with the first direct current capacitor C, and the connection point is used as a central line Nd2And the other end thereof is electrically connected to the other end of the dc power supply 60.
The inverter circuit 12 may be a midpoint clamping type three-level inverter circuit, and specifically may include a first leg 121, a second leg 122, and a third leg 123, where the first leg 121, the second leg 122, and the third leg 123 have the same structure. Wherein, the first bridge arm 121 may include a first switch tube Sa1To the fourth switching tube Sa4A first diode Da1And a second diode Da2A first switch tube Sa1First terminal and first direct current capacitor Cd1Is electrically connected with one end of the first switch tube Sa1Second terminal and second switch tube Sa2Is electrically connected with the first end of the second switch tube Sa2Second terminal and third switch tube Sa3Is electrically connected with the first end of the third switching tube Sa3Second end and fourth switch tube Sa4Is electrically connected with the first end of the fourth switching tube Sa4Second terminal and second capacitor Cd2Is electrically connected with the other end of the first switch tube Sa1To the fourth switching tube Sa4The control ends of the main control device 40 are respectively and electrically connected with the main control device; first diode Da1Is connected to the first switch tube Sa1And a second switch tube Sa2First diode Da1Anode of and a second diode Da2Cathode and first DC capacitor Cd1And the other end of the first capacitor and a second direct current capacitor Cd2Respectively, of one end ofElectrically connected, second diode Da2Is connected to the third switching tube Sa3And a fourth switching tube Sa4In the meantime. Since the first bridge arm 121, the second bridge arm 122, and the third bridge arm 123 have the same structure, the description of the structure of the second bridge arm 122 and the third bridge arm 123 may refer to the description of the structure of the first bridge arm 121, and will not be repeated here in detail.
The filter circuit 13 may be an LCL type filter circuit, and specifically may include a first filter circuit 131, a second filter circuit 132, and a third filter circuit 133, and the first filter circuit 131, the second filter circuit 132, and the third filter circuit 133 have the same structure. Wherein the first filter circuit 131 comprises a first inductor L11A second inductor L12And a first capacitor C1First inductance L11Is electrically connected to the first bridge arm 121, specifically to the second switching tube Sa2Second terminal and third switching tube Sa3Is electrically connected to the first end of the first inductor L11And the other end of the second inductor L12Is electrically connected to the second inductor L12The other end of the neutral line N is electrically connected to one end of the device under test 50, and the other end of the device under test 50 is electrically connected to the neutral line N; a first capacitor C1One end of (1) and the first inductor L11And the other end of the second inductor L12Are electrically connected to the first capacitor C1And the other end of the second filter circuit 132 and a second capacitor C of the second filter circuit 1322And a third capacitor C of the third filter circuit 1333Are electrically connected respectively. Since the structures of the first filter circuit 131, the second filter circuit 132, and the third filter circuit 133 are the same, the description of the structures of the second filter circuit 132 and the third filter circuit 133 may refer to the description of the structure of the first filter circuit 131, and will not be repeated here.
When the voltage sag generator 10 operates, the voltage sag generator 10 may control the voltage at the output terminal in a voltage outer loop control manner according to the voltage control signal output by the main control device 40, so that the voltage at the output terminal tracks the voltage control signal. When the voltage control signal is a normal voltage signal, the switching on and off of the switching tube in the inverter circuit 12 is controlled according to the normal voltage signal, so that the direct current output by the direct current power supply 60 can be inverted into a stable alternating current (such as 220V/380V alternating current), and the stable alternating current is filtered by the filter circuit 13 and then is provided to the device to be tested 50 to perform a standard voltage test; when the voltage control signal is a voltage sag signal, the dc power output by the dc power supply 60 can be inverted into a single voltage sag or a continuous voltage sag with a certain sag depth by controlling the on/off of the switching tube in the inverter circuit 12 according to the voltage sag signal, and the single voltage sag or the continuous voltage sag is filtered by the filter circuit 13 and then provided to the device under test 50 for voltage sag testing.
It should be noted that, in the example shown in fig. 2, the inverter circuit 12 is a midpoint clamping type three-level inverter circuit, and the inverter circuit can output three-phase voltages with adjustable voltages, so that power can be supplied to one three-phase input device to be tested (e.g., a three-phase input frequency converter), or power can be supplied to three single-phase input devices to be tested (e.g., a single-phase input frequency converter). When the device to be tested 50 is a three-phase input device to be tested, the voltage sag test can be performed on the three-phase input device to be tested; when the device under test 50 is a single-phase input device under test, a voltage sag test of one single-phase input device under test may be implemented, a voltage sag test of any combination of three single-phase input devices under test may also be implemented, and a test may be specifically selected according to actual requirements. Of course, in practical application, the inverter circuit 12 may also adopt other circuit structures, for example, a single-phase inverter circuit (only one single-phase input device to be tested is subjected to a voltage sag test), a multi-phase inverter circuit, and the like may be adopted, and the setting is specifically selected according to actual requirements, which is not limited herein.
In one embodiment, the signal acquisition device 20 includes a voltage signal acquisition unit and a current signal acquisition unit, wherein the voltage signal acquisition unit includes: the voltage acquisition and conditioning circuit is used for acquiring the output voltage of the voltage sag generator 10 and outputting a first analog signal, and the voltage data acquisition circuit is used for converting the first analog signal into a first digital signal and outputting the first digital signal to the main control device 40.
Further, referring to fig. 3, the voltage acquisition conditioning circuit includes: the voltage transformer 211 is arranged at the output end of the voltage sag generator 10, and is used for collecting the output voltage of the voltage sag generator 10 and outputting a first analog signal; the first isolation circuit 212 is electrically connected with the voltage transformer 211 and is used for following the first analog signal and isolating the first analog signal; the first voltage stabilizing circuit 213 is electrically connected to the first isolation circuit 212 for stabilizing the first analog signal within a first predetermined analog signal range.
Specifically, the voltage acquisition and conditioning circuit is electrically connected to the output terminal of the voltage sag generator 10, and specifically may be composed of a voltage transformer 211 and its peripheral circuit, and is configured to detect the output voltage waveform of the voltage sag generator 10, and the voltage data acquisition circuit is electrically connected to the voltage acquisition and conditioning circuit and the main control device 40, and is configured to convert an analog signal of the output voltage obtained by the voltage acquisition and conditioning circuit into a digital signal, and transmit the digital signal to the main control device 40 through a data line (e.g., a USB line).
Specifically, the voltage collecting and conditioning circuit may include a voltage transformer 211, a first isolation circuit 212, and a first voltage stabilizing circuit 213, wherein the voltage transformer 211 may be a hall voltage sensor of CLSM-10mA type, and the sensor may have characteristics of output linearization, high precision, fast response speed, strong anti-interference capability, and being applicable to DC, AC, or any other waveforms, so that the requirement of measuring the voltage sag waveform may be satisfied. During actual testing, the first input end Ux of the voltage transformer 211 may be electrically connected to a phase (e.g., phase a, phase B, or phase C) to be tested of the voltage sag generator 10 through the first resistor R1, the second input end Un is electrically connected to the neutral line N of the voltage sag generator 10, the output end MUx is grounded through the second resistor R2 and electrically connected to the first isolation circuit 212, and the voltage transformer 211 collects an output voltage waveform of the voltage sag generator 10 in real time and outputs a corresponding first analog signal to the first isolation circuit 212.
The first isolation circuit 212 is mainly used for voltage following and isolation, and may specifically be a voltage follower including a first operational amplifier K1, a third resistor R3, and a fourth resistor R4. The positive input end of the first operational amplifier K1 is electrically connected to one end of the third resistor R3, and the other end of the third resistor R3 is electrically connected to the output end MUx of the voltage transformer 211; the negative input end of the first operational amplifier K1 is electrically connected with one end of a fourth resistor R4; the output terminal of the first operational amplifier K1 is electrically connected to the other terminal of the fourth resistor R4, and is electrically connected to the first regulator circuit 213 through the fifth resistor R5. The first isolation circuit 212 can realize the following of the first analog signal output by the voltage transformer 211 and the isolation of high and low voltages. The model of the first operational amplifier K1 may be OP4277, and the like, which is not limited herein.
The first voltage stabilizing circuit 213 is mainly configured to stabilize the first analog signal within a first preset analog signal range, and specifically may include a first zener diode WY1 and a second zener diode WY2, wherein an anode of the first zener diode WY1 is electrically connected to the fifth resistor R5 and the voltage data acquisition circuit (not shown in the figure), a cathode of the first zener diode WY1 is electrically connected to a cathode of the second zener diode WY2, and an anode of the second zener diode WY2 is grounded to GND. The first voltage regulator circuit 213 can stabilize the first analog signal outputted by the first isolation circuit 212 in a first predetermined analog signal range, such as-5V- +5V, to prevent the voltage data acquisition circuit from being damaged when acquiring an excessive voltage due to an excessive voltage of the outputted analog signal.
Further, the voltage collecting and conditioning circuit may further include: the filter circuit 214, the filter circuit 214 may be an RC filter circuit formed by connecting the sixth resistor R6 and the fourth capacitor C4 in parallel, and the filter circuit may filter the first analog signal output by the first isolation circuit 212, so as to ensure the stability of the first analog signal, and further ensure the reliability of the output voltage data acquisition.
The voltage data acquisition circuit may be a data acquisition card of the type smacq USB-4250, and converts the first analog signal output by the voltage acquisition conditioning circuit into a first digital signal through the voltage data acquisition circuit, and transmits the first digital signal to the main control device 40 through a data line (e.g., a USB line).
In one embodiment, the current signal collecting unit includes: the voltage sag generator comprises a current collecting and conditioning circuit and a current data collecting circuit, wherein the current collecting and conditioning circuit is used for collecting the output current of the voltage sag generator 10 and outputting a second analog signal, and the current data collecting circuit is used for converting the second analog signal into a second digital signal and outputting the second digital signal to the main control device 40.
Further, referring to fig. 4, the current collection conditioning circuit includes: the voltage regulator circuit comprises a current transformer 221, a second isolation circuit 222 and a second voltage stabilizing circuit 223, wherein the current transformer 221 is arranged at the output end of the voltage sag generating device 10 and is used for collecting the output current of the voltage sag generating device 10 and outputting a second analog signal; the second isolation circuit 222 is electrically connected to the current transformer 221, and is configured to follow the second analog signal and isolate the second analog signal; the second voltage stabilizing circuit 223 is electrically connected to the second isolation circuit 222 for stabilizing the second analog signal within a second predetermined analog signal range.
Specifically, the current collecting and conditioning circuit is electrically connected to the output end of the voltage sag generator 10, and specifically may be composed of a current transformer 221 and a peripheral circuit thereof, for detecting the output current waveform of the voltage sag generator 10, and the current data collecting circuit is electrically connected to the current collecting and conditioning circuit and the main control device 40, respectively, for converting the analog signal of the output current obtained by the current collecting and conditioning circuit into a digital signal and transmitting the digital signal to the main control device 40 through a data line (e.g., a USB line).
Specifically, the current collection conditioning circuit may include a current transformer 221, a second isolation circuit 222, and a second voltage stabilizing circuit 223, where the current transformer 221 may be a hall current sensor of LA100-P type, and the sensor has the characteristics of high accuracy, small temperature drift, fast response speed, and wide frequency band, so that the requirement of measuring the voltage sag waveform can be satisfied. During actual testing, the current transformer 221 passes through a phase to be tested (such as an a phase, a B phase or a C phase) of the voltage sag generator 10, the output terminal MIx is grounded through the seventh resistor R7 and electrically connected to the second isolation circuit 222, the current transformer 221 collects an output current waveform of the voltage sag generator 10 in real time, and outputs a corresponding second analog signal to the second isolation circuit 222.
The second isolation circuit 222 is mainly used for voltage following and isolation, and may specifically be a voltage follower including a second operational amplifier K2, an eighth resistor R8, and a ninth resistor R9. The positive input end of the second operational amplifier K2 is electrically connected to one end of the eighth resistor R8, and the other end of the eighth resistor R8 is electrically connected to the output end MIx of the current transformer 221; the negative input end of the second operational amplifier K2 is electrically connected with one end of a ninth resistor R9; the output terminal of the second operational amplifier K2 is electrically connected to the other terminal of the ninth resistor R9, and the output terminal of the second operational amplifier K2 is grounded through the tenth resistor R10 and electrically connected to the second regulator circuit 223. The second isolation circuit 222 can be used to follow the second analog signal output by the current transformer 221 and isolate the high and low voltages. The model of the second operational amplifier K2 may be OP4277, and the like, which is not limited herein.
The second voltage stabilizing circuit 223 is mainly configured to stabilize the second analog signal within a second preset analog signal range, and specifically may include a third zener diode WY3 and a fourth zener diode WY4, wherein an anode of the third zener diode WY3 is electrically connected to an output terminal of the second operational amplifier K2 and a current data acquisition circuit (not shown in the figure), a cathode of the third zener diode WY3 is electrically connected to a cathode of the fourth zener diode WY4, and an anode of the fourth zener diode WY4 is grounded to GND. The second analog signal output by the second isolation circuit 222 can be stabilized in a second preset analog signal range, such as-5V- +5V, by the second voltage stabilizing circuit 223, and the current data acquisition circuit is prevented from being damaged when acquiring an excessively high voltage due to an excessively high voltage of the output analog signal.
The current data acquisition circuit may be a data acquisition card of the type smacq USB-4250, and converts a second analog signal output by the current acquisition conditioning circuit into a second digital signal through the current data acquisition circuit, and transmits the second digital signal to the main control device 40 through a data line (e.g., a USB line).
It should be noted that, in practical applications, the number of the voltage signal collecting units and the number of the current signal collecting units may be determined according to the number of voltage phases output by the inverter circuit 12. For example, when the inverter circuit 12 is a single-phase inverter circuit, the circuit only outputs one phase voltage, and only one single-phase input device under test is tested, so that a voltage signal acquisition unit and a current signal acquisition unit are provided at this time. When the inverter circuit 12 is a midpoint clamping type three-level inverter circuit shown in fig. 2, the inverter circuit can output three-phase voltages, which are phase a, phase B, and phase C voltages, respectively, and can test a three-phase input device to be tested or a combination of three single-phase input devices to be tested, so that a voltage signal acquisition unit and a current signal acquisition unit are provided for each phase at this time to detect an output voltage and an output current of each phase. In addition, a corresponding voltage signal acquisition unit and a corresponding current signal acquisition unit can be arranged to acquire the voltage and the current on the neutral line N for subsequent analysis, and the arrangement can be specifically selected according to actual conditions.
In one embodiment, referring to fig. 5, the dc power supply 60 may include a rectifying circuit electrically connected to the AC power supply AC and the voltage sag generator 10, respectively, for converting the AC power output by the AC power supply AC into dc power to power the voltage sag generator 10. When the alternating current power supply AC is a 220V/380V three-phase alternating current power supply, the corresponding rectifying circuit can be a three-phase uncontrollable rectifying bridge; when the alternating current power supply AC is a 220V/380 single-phase alternating current power supply, the corresponding rectifying circuit may be a single-phase uncontrollable rectifying bridge, which may be specifically set according to actual conditions, and is not limited herein.
In one embodiment, with continued reference to fig. 5, the voltage sag experiment platform further includes: a first switch S1, a second switch S2, and a third switch S3, wherein the first switch S1 is disposed between the dc power supply 60 and the voltage sag generator 10 for controlling the on/off of the dc power supply 60 and the voltage sag generator 10; the second switch S2 is disposed between the voltage sag generator 10 and the device under test 50, and is used to control the voltage sag generator 10 and the device under test 50 to be turned on and off; the third switch S3 is disposed between the AC power source AC and the device under test 50, and is used to control the connection and disconnection between the AC power source AC and the device under test 50.
Specifically, as can be seen from the foregoing description, when performing the voltage sag test, the main control device 40 is first controlled to output a voltage normal signal to the voltage sag generating device 10, so that the voltage sag generating device 10 outputs a stable voltage to the device under test 50, so as to detect whether the device under test 50 can normally operate in a normal power supply state, and collect corresponding output voltage, output current and operating state as reference values when the device under test 50 can normally operate. In practical application, besides the above manner, the method can be realized by setting a corresponding switch and reasonably controlling the switch.
Specifically, referring to fig. 5, when performing a test, the signal acquisition device 20 may be first connected to the output end of the voltage sag generator 10, and the signal acquisition device 20 and the main control device 40 are electrically connected through a data line (e.g., a USB line) to perform data communication, and meanwhile, the probe of the state acquisition device 30 is aligned with the operation indicator of the device under test 50, and the state acquisition device 30 and the main control device 40 are electrically connected through a data line (e.g., a USB line) to perform data communication. Then, a standard voltage experiment is started, at this time, the first switch S1 and the second switch S2 are controlled to be kept in an open state, and the third switch S3 is controlled to be closed, because the third switch S3 is in a closed state, the alternating current power supply AC directly supplies power to the device to be tested 50, so as to detect whether the device to be tested 50 can normally work in a normal power supply state, and if the device to be tested cannot normally work, the device to be tested 50 is replaced; if the device can work normally, the output voltage and the output current of the alternating current power supply AC and the working state of the device under test 50 are recorded by the main control device 40 as reference values when the voltage sags.
Next, a voltage sag experiment is started, in which the third switch S3 is controlled to be open, and the first switch S1 and the second switch S2 are controlled to be closed. Since the first switch S1 and the second switch S2 are in the closed state, the AC power supply AC starts to supply power to the dc power supply 60 and the voltage sag generating device 10, and the voltage sag generating device 10 is powered on and enters the standby state. At this time, the main control device 40 can send a voltage sag signal to the voltage sag generating device 10, the voltage sag generating device 10 outputs a corresponding voltage sag according to the voltage sag signal, and the main control device 40 records the output voltage and the output current of the voltage sag generating device 10 and the working state of the device under test 50, and compares the output voltage and the output current with a reference value obtained in a standard voltage experiment to obtain the voltage sag sensitivity of the device under test 50.
It can be understood that the voltage sag experiment can be repeated for a plurality of times to test the output voltage, the output current and the working state under different voltage sags, so as to realize the sensitivity test under different voltage sags. For example, the main control device 40 may send different voltage sag signals to the voltage sag generator 10 at intervals, and collect corresponding output voltage, output current, and working state to perform different voltage sag sensitivity tests.
In an embodiment, referring to fig. 6, the voltage sag experiment platform further includes: and a signal input end of the start control device 70 is electrically connected with the main control device 40, and a mechanical output end of the start control device 70 is arranged corresponding to a start switch of the device to be tested 50 and used for controlling the device to be tested 50 to start according to a start signal output by the main control device 40.
That is, the user can output a corresponding start control signal to the start control device 70 through the main control device 40, and start the device under test 50 in the voltage sag test process through the start control device 70, so as to effectively ensure the safety of the user in the test process.
In one embodiment, referring to fig. 7, the activation control means 70 includes: the motion control unit 71, the motor driving unit 72, the motor 73, the sliding table 74 and the operating rod 75, wherein the motion control unit 71 is electrically connected with the main control device 40 and used for outputting a pulse signal according to a starting signal output by the main control device 40; the motor driving unit 72 is electrically connected with the motion control unit 71 and is used for outputting a driving signal according to the pulse signal; the motor 73 is electrically connected with the motor driving unit 72 for rotation according to the driving signal; the sliding table 74 is mechanically connected to the motor 73 and the operating rod 75 respectively, and is used for controlling the operation of the operating rod 75 under the driving of the motor 73 so as to control the start of the device under test 50.
Specifically, the start control device 70 may be constituted by a motion control unit 71, a motor drive unit 72, a motor 73, a slide table 74, and an operation lever 75 connected in this order. The motor driving unit 72 and the motor 73 can be powered by a 24V switching power supply, the motion control unit 71 further communicates with the main control device 40 to output a corresponding pulse signal to the motor driving unit 72 according to an operation signal sent by the main control device 40, the motor driving unit 72 outputs a corresponding motor driving signal to the motor 73 according to the frequency of the pulse signal to drive the motor 73 to rotate by a certain angle, and when the motor 73 rotates, the sliding table 74 can be controlled to move, so that the device to be tested 50 can be automatically operated. For example, the sliding table 74 is controlled to move, so that the operating rod 75 drives the start switch of the device under test 50 to rotate to the on position, so as to start the device under test 50; the operation rod 75 drives the starting switch of the equipment to be tested 50 to rotate to the closing position by controlling the sliding table 74 to move, so that the equipment to be tested 50 is closed, the equipment to be tested can be controlled quickly, accurately and circularly, and the efficiency and the safety of an experiment are improved. The speed and frequency of the operation depend on the frequency of the pulses sent by the main control device 40, and the speed can be adjusted at will and can be set according to the actual situation.
In practical applications, the motion control unit 71 may be a motion controller of model HC130-3, the motor driving unit 72 may be a motor driver of model HC-6560-V4, the motor 73 may be a stepping motor of model 57HC2P76, the axial diameter of the motor driver is 8mm, the slide table 74 may be a numerical control three-axis slide table, such as a three-dimensional XYZ synchronous belt side-standing slide table, and the operation rod 75 may be a manipulator, through which a three-dimensional manipulator may be formed to perform start control on the device under test 50. The stepping motor can be arranged at one end of the numerical control three-axis sliding table, as shown in fig. 8, and is used for controlling the movement of the corresponding axial sliding table in the numerical control three-axis sliding table on the track.
When testing, the signal acquisition device 20 may be connected to the output end of the voltage sag generator 10, and the signal acquisition device 20 is electrically connected to the main control device 40 through a data line for data communication, and the probe of the state acquisition device 30 is aligned to the operation indicator of the device under test 50, and the state acquisition device 30 is electrically connected to the main control device 40 through a data line for data communication. Then, a standard voltage experiment is started, at this time, the first switch S1 and the second switch S2 are controlled to be kept in an off state, the third switch S3 is controlled to be closed, the alternating current power supply AC supplies power to the device to be tested 50, meanwhile, a start control signal is output to the start control device 70 (such as a three-dimensional manipulator) through the main control device 40 to start the device to be tested 50, at this time, whether the device to be tested 50 can normally work in a normal power supply state can be detected, and if not, the device to be tested 50 is replaced; if the voltage is available, the output voltage and the output current of the AC power supply AC and the operating state of the device under test 50 are recorded by the main control device 40 as reference values when the voltage is temporarily dropped.
Next, a voltage sag experiment is performed, at this time, the third switch S3 is controlled to be opened, the first switch S1 and the second switch S2 are controlled to be closed, the AC power supply AC supplies power to the dc power supply 60 and the voltage sag generator 10, the voltage sag generator 10 is powered on to operate, and stable AC power is output to the device under test 50. At this time, the main control device 40 can output a start control signal to the start control device 70 to start the device under test 50, then the main control device 40 sends a voltage sag signal to the voltage sag generating device 10, the voltage sag generating device 10 outputs a corresponding voltage sag according to the voltage sag signal, and meanwhile, the main control device 40 records the output voltage and the output current of the voltage sag generating device 10 and the working state of the device under test 50, and compares and analyzes the output voltage and the output current with a reference value obtained in a standard voltage experiment to obtain the voltage sag sensitivity of the device under test 50.
According to the voltage sag experiment platform, single voltage sag or continuous voltage sag of any initial phase, any sag depth and any sag duration can be generated to the equipment to be tested through the voltage sag generating device, the voltage waveform and the current waveform of the voltage sag are collected through the signal collecting device, the equipment to be tested is automatically operated through the starting control device, the working state of the equipment to be tested is identified through the state collecting device, organic integration and coordination control of all devices are achieved through the main control device, and therefore automatic cycle experiment, automatic operation, automatic recording and data analysis of the voltage sag can be achieved. In addition, in the test process, a user can basically complete the voltage sag test by operating the main control device, the test convenience is improved, the labor cost and the material resource cost are effectively reduced, meanwhile, the safety of the user and equipment in the test process is improved, the whole test platform has the characteristics of low cost and high operation efficiency, and the voltage sag test device is suitable for the voltage sag test of various types of voltage sensitive equipment to be tested, such as a frequency converter, and has very important significance.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (10)
1. A voltage sag experiment platform, comprising:
the output end of the voltage sag generating device is electrically connected with the equipment to be tested and used for outputting corresponding voltage sag to the equipment to be tested according to the voltage sag signal;
the signal acquisition device is arranged at the output end of the voltage sag generation device and is used for acquiring the output voltage and the output current of the voltage sag generation device;
the state acquisition device is arranged corresponding to the equipment to be tested and is used for acquiring the working state of the equipment to be tested;
the master control device is electrically connected with the voltage sag generating device, the signal collecting device and the state collecting device respectively, is used for outputting the voltage sag signal to the voltage sag generating device, and analyzes the voltage sag sensitivity of the equipment to be tested according to the output voltage and the output current of the voltage sag generating device and the working state of the equipment to be tested.
2. The platform of claim 1, wherein the device under test is a frequency converter under test.
3. The platform of claim 1, wherein the voltage sag generating device comprises:
the direct current capacitor is electrically connected between the output ends of the direct current power supply;
the input end of the inverter circuit is electrically connected with the direct current capacitor, and the control end of the inverter circuit is electrically connected with the main control device and used for converting direct current output by the direct current power supply into voltage sag according to the voltage sag signal;
and the input end of the filter circuit is electrically connected with the output end of the inverter circuit, and the output end of the filter circuit is electrically connected with the equipment to be tested, so that the filter circuit is used for filtering the voltage sag and transmitting the filtered voltage sag to the equipment to be tested.
4. The platform of claim 1, wherein the signal acquisition device comprises a voltage signal acquisition unit and a current signal acquisition unit, wherein the voltage signal acquisition unit comprises: the voltage acquisition and conditioning circuit is used for acquiring the output voltage of the voltage sag generator and outputting a first analog signal, and the voltage data acquisition circuit is used for converting the first analog signal into a first digital signal and outputting the first digital signal to the main control device;
the current signal acquisition unit includes: the voltage sag generator comprises a current acquisition and conditioning circuit and a current data acquisition circuit, wherein the current acquisition and conditioning circuit is used for acquiring output current of the voltage sag generator and outputting a second analog signal, and the current data acquisition circuit is used for converting the second analog signal into a second digital signal and outputting the second digital signal to the main control device.
5. The platform of claim 4, wherein the voltage acquisition conditioning circuit comprises:
the voltage transformer is arranged at the output end of the voltage sag generating device and used for collecting the output voltage of the voltage sag generating device and outputting the first analog signal;
the first isolation circuit is electrically connected with the voltage transformer and used for following the first analog signal and isolating the first analog signal;
the first voltage stabilizing circuit is electrically connected with the first isolating circuit and used for stabilizing the first analog signal within a first preset analog signal range.
6. The platform of claim 4, wherein the current collection conditioning circuit comprises:
the current transformer is arranged at the output end of the voltage sag generating device and used for collecting the output current of the voltage sag generating device and outputting the second analog signal;
the second isolation circuit is electrically connected with the current transformer and used for following the second analog signal and isolating the second analog signal;
and the second voltage stabilizing circuit is electrically connected with the second isolating circuit and is used for stabilizing the second analog signal within a second preset analog signal range.
7. The platform of claim 3, wherein the DC power supply comprises: and the rectifying circuit is electrically connected with the alternating current power supply and the voltage sag generating device respectively and is used for converting alternating current output by the alternating current power supply into direct current.
8. The platform of claim 7, further comprising:
a first switch, disposed between the dc power supply and the voltage sag generator, for controlling the on/off of the dc power supply and the voltage sag generator;
the second switch is arranged between the voltage sag generating device and the equipment to be tested and is used for controlling the connection and disconnection of the voltage sag generating device and the equipment to be tested;
and the third switch is arranged between the alternating current power supply and the equipment to be tested and used for controlling the connection and disconnection between the alternating current power supply and the equipment to be tested.
9. The platform of any one of claims 1-8, further comprising: and the signal input end of the starting control device is electrically connected with the main control device, and the mechanical output end of the starting control device corresponds to the starting switch of the equipment to be tested and is used for controlling the equipment to be tested to start according to the starting signal output by the main control device.
10. The platform of claim 9, wherein the activation control device comprises:
the motion control unit is electrically connected with the main control device and used for outputting a pulse signal according to a starting signal output by the main control device;
the motor driving unit is electrically connected with the motion control unit and used for outputting a driving signal according to the pulse signal;
the motor is electrically connected with the motor driving unit and is used for rotating according to the driving signal;
and the sliding table is mechanically connected with the motor and the operating rod respectively and is used for controlling the operation of the operating rod under the driving of the motor so as to control the starting of the equipment to be tested.
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| CN113866539A (en) * | 2021-09-24 | 2021-12-31 | 国网北京市电力公司 | Method and system for testing voltage sag tolerance characteristics of equipment to be tested and testing device |
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| CN113866539A (en) * | 2021-09-24 | 2021-12-31 | 国网北京市电力公司 | Method and system for testing voltage sag tolerance characteristics of equipment to be tested and testing device |
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