CN209979199U - Photoelectric device reliability life verification platform - Google Patents
Photoelectric device reliability life verification platform Download PDFInfo
- Publication number
- CN209979199U CN209979199U CN201920989995.7U CN201920989995U CN209979199U CN 209979199 U CN209979199 U CN 209979199U CN 201920989995 U CN201920989995 U CN 201920989995U CN 209979199 U CN209979199 U CN 209979199U
- Authority
- CN
- China
- Prior art keywords
- integrating sphere
- light
- meter
- dark box
- platform
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The utility model relates to a photoelectric device reliability life verification platform, which comprises an optical platform, an integrating sphere, an optical filter, a camera bellows, an irradiance meter and a brightness meter, wherein the integrating sphere, the optical filter, the camera bellows, the irradiance meter and the brightness meter are sequentially arranged on the optical platform from front to back; a light source is arranged at the front end of the integrating sphere, the optical filter is positioned at the rear end of the integrating sphere, a preset distance is arranged between the integrating sphere and the dark box, a test fixture is arranged at the rearmost end of the interior of the dark box, the dark box is close to the irradiance meter, and the irradiance meter is close to the brightness meter; the test fixture is used for fixing the photoelectric device. The utility model discloses an useful part lies in: (1) because the adopted integrating sphere can reflect the light emitted by the light source for multiple times, the light outlet of the integrating sphere can generate uniform incident light; (2) because the adopted optical filter can shield stray light and generate monochromatic light, the requirement of monochromatic light incidence can be accurately and reliably met; (3) the adopted dark box has the advantages of shielding the influence of stray light such as visible light and the like.
Description
Technical Field
The utility model relates to a components and parts test device field especially relates to a photoelectric device reliability life verification platform.
Background
The photoelectric device adopts an internal photoelectric effect or an external photoelectric effect, and is an electric signal which is easy to measure by converting an optical signal into the electric signal. The photoelectric device is a core component for completing photoelectric conversion in aerospace instruments and equipment, and the reliability of the photoelectric device can bring important influence on the whole equipment. Reliability refers to the ability of a product (component, assembly, statistic, etc.) to perform a specified function without failure under specified conditions (temperature, air pressure, shock, etc.) and for a specified time (cycle count, mileage, etc.). The probability measure of reliability is called reliability, and is a measure of the fault-free working capacity of a product. For reliability research of optoelectronic devices, relevant reliability tests are required. The reliability test is a general term for various tests performed for measurement, verification, evaluation, analysis or for improving the reliability of products, and is an important link of the reliability work of the products. The reliability test is an important means for evaluating the reliability level of the product and is also an important link for producing high-reliability products. The service life is one of the important indexes of the reliability, so that the service life and service life test has profound significance in the engineering application of the photoelectric device.
In the field of photoelectricity, with the rapid development of photoelectric device material development technology, chip manufacturing technology and microelectronic technology, photoelectric devices have achieved tremendous achievements in the aspects of performance, scale and the like. The photoelectric device is successfully applied to the fields of space remote sensing and military affairs, and is paid attention from various countries. At present, a large gap exists between the domestic photoelectric technology level and the international advanced level, especially in the aspect of reliability of some engineering applications. In order to improve the engineering application level of the photoelectric device in China and shorten the gap with the international advanced level, it is necessary to establish a verification platform for the reliability and the service life of the photoelectric device, which is suitable for the technical route and the technical characteristics of China.
Therefore, the development of a reliability life verification platform of the photoelectric device is very necessary, and the verification platform also has an important application prospect.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to solve the above-mentioned weak point that exists among the prior art.
In order to achieve the purpose, the utility model provides a photoelectric device reliability life verification platform, which comprises an optical platform, an integrating sphere, an optical filter, a dark box, an irradiance meter and a brightness meter, wherein the integrating sphere, the optical filter, the dark box, the irradiance meter and the brightness meter are sequentially arranged on the optical platform from front to back; a light source is arranged at the front end of the integrating sphere, the optical filter is positioned at the rear end of the integrating sphere, a preset distance is arranged between the integrating sphere and the dark box, a test fixture is arranged at the rearmost end of the interior of the dark box, the dark box is close to the irradiance meter, and the irradiance meter is close to the brightness meter; the test fixture is used for fixing the photoelectric device.
In one possible embodiment, a light barrier is provided inside the integrating sphere.
In one possible embodiment, the light barrier is fixed inside the integrating sphere by a first support.
In one possible embodiment, the irradiance meter is model RM 9-PD.
In one possible embodiment, the luminance meter is model PR 880.
In one possible embodiment, a diaphragm is provided at the entrance of the integrating sphere.
In one possible embodiment, a second support is arranged below the integrating sphere, the integrating sphere is fixed on a base through the second support, and the base is placed on the optical platform.
Compared with the prior art, the utility model discloses an useful part lies in:
(1) because the adopted integrating sphere can reflect the light emitted by the light source for multiple times, the light outlet of the integrating sphere can generate uniform incident light;
(2) because the adopted optical filter can shield stray light and generate monochromatic light, the requirement of monochromatic light incidence can be accurately and reliably met;
(3) the adopted dark box has the advantages of shielding the influence of stray light such as visible light and the like.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the description below are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic composition diagram of a platform for verifying reliability and lifetime of a photoelectric device according to an embodiment of the present invention;
fig. 2 is a schematic view illustrating the principle that light generated by a light source propagates in an integrating sphere according to an embodiment of the present invention;
description of reference numerals:
1-optical platform, 2-light source, 3-integrating sphere, 31-light inlet, 32-light outlet, 33-light barrier, 34-first support, 35-second support, 36-base, 4-optical filter, 5-irradiance meter, 6-luminance meter, 7-test fixture, 8-dark box and 9-diaphragm.
Detailed Description
The terms "first," "second," and the like in the description and in the claims and in the drawings of the present invention are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. Furthermore, the terms "comprises" and "comprising," as well as any variations thereof, are intended to cover a non-exclusive inclusion, such as a list of steps or elements. The methods, systems, articles, or apparatus need not be limited to the explicitly listed steps or elements, but may include other steps or elements not expressly listed or inherent to such processes, methods, articles, or apparatus
The technical solution of the present invention will be described in further detail with reference to the accompanying drawings and embodiments.
As shown in fig. 1, the embodiment of the utility model provides a photoelectric device reliability life verification platform, a serial communication port, including optical platform 1, the integrating sphere 3, light filter 4, camera bellows 8, irradiance meter 5 and the luminance meter 6 that set gradually on optical platform 1 from the front to the back.
The front end of integrating sphere 3 is provided with light source 2, and light filter 4 is located the rear end of integrating sphere 3, is equipped with between integrating sphere 3 and the camera bellows 8 and predetermines the distance, and the rearmost end of the inside of camera bellows 8 is provided with test fixture 7, and camera bellows 8 is close to with irradiance meter 5, and irradiance meter 5 is close to with luminance meter 6.
The test fixture 7 is used to secure the optoelectronic device.
In one example, as shown in fig. 2, a light barrier 33 is added inside the integrating sphere 3, and the light barrier 22 is fixed inside the integrating sphere 3 by a first bracket 34.
In one example, integrating sphere 3 is fixed to base 36 by second bracket 35.
In one example, the irradiance meter 5 is model RM9-PD for calibrating irradiance in the optical path.
In one example, the luminance meter 6 is model PR880 for testing the luminance gain of the optoelectronic device.
The optical platform 1 has the functions of fixing the light source 2, the integrating sphere 3, the optical filter 4, the test fixture 7 and the dark box 8, and also has the shockproof function, and the dark box 8 has the function of shielding stray light.
In one example, a closed manual slit is adopted between the integrating sphere 3 and the light source 2, a diaphragm 9 is arranged at a light inlet 31 of the integrating sphere, and the light intensity of a light outlet 32 can be changed by adjusting the diaphragm 9 at the light inlet. A light barrier 33 is added in the integrating sphere to improve the light homogenization effect
The light source has monochromatic light peak output in a specified waveband, and has monochromatic light output in other wavebands, so the spectral characteristics of the optical filter are very important. The practically used spectral slice should only transmit the required monochromatic light as far as possible, while the light of other bands, especially the light of visible light band, should be completely shielded, and the designed filter is a narrow band filter, the half bandwidth of which is not more than 10 nm. The light filter 4 that the incident light that the light-emitting port of integrating sphere 3 produced entered, shielded stray light, guaranteed the monochromatic light to incide on the photoelectric device.
When the device works, a photoelectric device to be tested is arranged on the test fixture 7, light radiated by the light source 2 is reflected for multiple times by the integrating sphere 3 to form uniform incident light at a light outlet of the integrating sphere 3, and the incident light enters the filter 4 to form uniform narrow-band incident light required by the photoelectric device to irradiate the photoelectric device
The above embodiments further describe the objects, technical solutions and advantages of the present invention in detail, it should be understood that the above embodiments are only specific embodiments of the present invention, and are not intended to limit the protection scope of the present invention, and any modifications, improvements, etc. made on the basis of the technical solutions of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. A photoelectric device reliability life verification platform is characterized by comprising an optical platform, an integrating sphere, an optical filter, a dark box, an irradiance meter and a brightness meter, wherein the integrating sphere, the optical filter, the dark box, the irradiance meter and the brightness meter are sequentially arranged on the optical platform from front to back;
a light source is arranged at the front end of the integrating sphere, the optical filter is positioned at the rear end of the integrating sphere, a preset distance is arranged between the integrating sphere and the dark box, a test fixture is arranged at the rearmost end of the interior of the dark box, and the dark box is close to the irradiance meter and the irradiance meter is close to the brightness meter;
the test fixture is used for fixing the photoelectric device.
2. The optoelectronic device reliability life verification platform of claim 1, wherein the integrating sphere is internally provided with a light barrier.
3. The optoelectronic device reliability life verification platform of claim 2, wherein the light barrier is fixed inside the integrating sphere by a first support.
4. The optoelectronic device reliability life verification platform of claim 1, wherein the irradiance meter is model number RM 9-PD.
5. The optoelectronic device reliability life verification platform of claim 1, wherein the luminance meter is model number PR 880.
6. The optoelectronic device reliability life verification platform of claim 1, wherein an aperture is provided at an entrance of the integrating sphere.
7. The optoelectronic device reliability life verification platform of claim 1, wherein a second support is disposed below the integrating sphere, the integrating sphere is fixed on a base by the second support, and the base is placed on the optical platform.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920989995.7U CN209979199U (en) | 2019-06-28 | 2019-06-28 | Photoelectric device reliability life verification platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920989995.7U CN209979199U (en) | 2019-06-28 | 2019-06-28 | Photoelectric device reliability life verification platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209979199U true CN209979199U (en) | 2020-01-21 |
Family
ID=69266720
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920989995.7U Expired - Fee Related CN209979199U (en) | 2019-06-28 | 2019-06-28 | Photoelectric device reliability life verification platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209979199U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112557351A (en) * | 2020-12-08 | 2021-03-26 | 珠海市运泰利自动化设备有限公司 | Optical material light transmittance detection system and system setting method |
-
2019
- 2019-06-28 CN CN201920989995.7U patent/CN209979199U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112557351A (en) * | 2020-12-08 | 2021-03-26 | 珠海市运泰利自动化设备有限公司 | Optical material light transmittance detection system and system setting method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9007590B2 (en) | Apparatus for measuring transmittance | |
| CN104344890B (en) | The device for quick testing of faint optical signal spectrum and method | |
| CN107063456B (en) | Time resolution diffraction efficiency of grating spectral measurement device in situ and method | |
| CN108957426A (en) | A kind of laser radar photoelectric detecting system detection performance test method and device | |
| CN110864882B (en) | Multispectral ultraviolet light sensitivity detection system and method | |
| CN209979199U (en) | Photoelectric device reliability life verification platform | |
| CN201016843Y (en) | LED light flux testing device employing narrow beam standard light source | |
| CN202547778U (en) | Grating spectrophotometer and biochemical analyzer adopting same | |
| CN103616162B (en) | Depth test device is ended outside day blind ultraviolet filter band | |
| CN204594580U (en) | A kind of spectrograph of adjustable incident light luminous flux | |
| CN205317347U (en) | Blue light harm measuring device | |
| CN110926762B (en) | System and method for detecting out-of-band inhibition capability of ultraviolet imager | |
| CN108871563A (en) | Optical power detection system and method | |
| CN109084962A (en) | A kind of fiber coupling CCD component tester and test method | |
| CN106872871A (en) | A kind of system and method for testing light source photoelectric transformation efficiency | |
| CN103616163A (en) | Solar blind ultraviolet filter out-of-band cut-off depth testing method | |
| CN102636257B (en) | Film-based laser light intensity response range measuring device and measuring method | |
| CN203274911U (en) | Luminous flux measuring device of sharp-beam LED lamp | |
| CN109632658A (en) | Modularization Physico-chemical tests system | |
| CN207020087U (en) | A kind of automatic lmunoassays analyzer photon detection device | |
| CN110346042A (en) | A kind of multisensor stray light elimination spectrometer | |
| CN204495468U (en) | A kind of spectrograph with ccd sensor | |
| CN110823370A (en) | Ultraviolet weak light detector radiation sensitivity calibration device based on photon counting method | |
| CN211824724U (en) | Hand-held type laser testing arrangement | |
| Carron et al. | Cryogenic characterization of LEDs for space application |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200121 Termination date: 20200628 |