CN209945395U

CN209945395U - Test fixture suitable for ultrasonic probe

Info

Publication number: CN209945395U
Application number: CN201920771824.7U
Authority: CN
Inventors: 蒋英超; 张晓燕
Original assignee: Kona Medical Technology (suzhou) Co Ltd
Current assignee: Kona Medical Technology (suzhou) Co Ltd
Priority date: 2019-05-27
Filing date: 2019-05-27
Publication date: 2020-01-14
Anticipated expiration: 2029-05-27

Abstract

The utility model relates to a test fixture suitable for ultrasonic probe, comprises a box body, the one end of box body is provided with supply socket, supply socket's output links to each other with the switch input, switch's output links to each other with the input of transformer, the output of transformer links to each other with the input of probe high voltage power module, the output of probe high voltage power module links to each other with probe test interface module, the output of transformer still links to each other with probe low voltage power module, probe low voltage power module links to each other with probe test interface module, probe low voltage power module output still links to each other with control module's input; the output end of the channel switching control switch is connected with the input end of the control module, and the output end of the control module is connected with the probe test interface module. The utility model discloses can make things convenient for ultrasonic probe's test, reach reduce cost's purpose.

Description

Test fixture suitable for ultrasonic probe

Technical Field

The utility model relates to a test fixture suitable for ultrasonic probe.

Background

Ultrasonic probe testing generally requires a complex test system, particularly for probes with channel switches at the handle end, and also provides various power supplies and control signals for the switches. During unconventional testing and maintenance testing, the use of the testing system is troublesome, the composition of the testing system is complex, only fixed testing can be performed, and the cost is too high.

In view of the above-mentioned defects, the present designer actively makes research and innovation to create a testing tool with a novel structure suitable for an ultrasonic probe, so that the testing tool has industrial utilization value.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problem, the utility model aims at providing a test fixture suitable for ultrasonic probe.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides a test fixture suitable for ultrasonic probe, includes the box body, the one end of box body is provided with supply socket, supply socket's output links to each other with the switch input, switch's output links to each other with the input of transformer, the output of transformer links to each other with probe high voltage power supply module's input, probe high voltage power supply module's output links to each other with probe test interface module, the output of transformer still links to each other with probe low voltage power supply module, probe low voltage power supply module links to each other with probe test interface module. The output end of the probe low-voltage power supply module is also connected with the input end of the control module; the output end of the channel switching control switch is connected with the input end of the control module, and the output end of the control module is connected with the probe test interface module.

Preferably, the control module is a single chip microcomputer.

Preferably, the transformer is a bridge type rectifying and voltage stabilizing circuit.

Preferably, the high-voltage power module includes a first pin of a first chip N1 connected to one end of a capacitor C9, a third pin of a first chip N1 connected to one end of a power supply, a second pin of the first chip N1 connected to the other end of the power supply, a fourth pin of the first chip N1 connected to the other end of a capacitor C9, a first pin of a first chip N1 further connected to an IN terminal of a second chip N4, the capacitor C12 and the capacitor C6 connected IN parallel to the capacitor C9, an ADJ terminal of the second chip N4 being an output ADJ terminal, and also connected to an OUT terminal of the second chip N4 through a resistor R2, the OUT terminal of the second chip N4 connected to one end of the capacitor C7, the other end of the capacitor C7 connected to the other end of the capacitor C9, and the capacitor C8 connected IN parallel to a capacitor C7.

Preferably, the probe test interface module is a connector interface module.

Preferably, the model of the first chip N1 is KBP 202G.

Preferably, the model of the second chip N4 is TL783 CKC.

Borrow by above-mentioned scheme, the utility model discloses at least, have following advantage:

the utility model discloses a test is more convenient, can effectual control cost, reaches reduce cost's purpose.

The above description is only an overview of the technical solution of the present invention, and in order to make the technical means of the present invention clearer and can be implemented according to the content of the description, the following detailed description is made with reference to the preferred embodiments of the present invention and accompanying drawings.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a schematic structural diagram of the present invention;

FIG. 2 is a circuit diagram of a probe high voltage power supply module;

FIG. 3 is a circuit diagram of a probe test interface module.

Detailed Description

The following detailed description of the embodiments of the present invention is provided with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.

In order to make the technical solution of the present invention better understood, the technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. The components of embodiments of the present invention, as generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present invention, presented in the accompanying drawings, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiment of the present invention, all other embodiments obtained by the person skilled in the art without creative work belong to the protection scope of the present invention.

Examples

As shown in fig. 1, 2 and 3, a test tool suitable for an ultrasonic probe comprises a box body 1, wherein one end of the box body 1 is provided with a power socket 2, the output end of the power socket 2 is connected with the input end of a power switch 3, the output end of the power switch 3 is connected with the input end of a transformer 4, the output end of the transformer 4 is connected with the input end of a probe high-voltage power module 7, the output end of the probe high-voltage power module 7 is connected with a probe test interface module 9, the output end of the transformer 4 is also connected with a probe low-voltage power module 8, the probe low-voltage power module 8 is connected with the probe test interface module 9, and the output end of the probe low-voltage power module 8 is also connected with the input end of a control module 5; the output end of the channel switching control switch 6 is connected with the input end of the control module 5, and the output end of the control module 5 is connected with the probe test interface module 9.

The utility model discloses in control module 5 is the singlechip.

The utility model discloses in transformer 4 is bridge type rectification voltage stabilizing circuit.

The utility model discloses IN high voltage power supply module 7 includes that first pin of first chip N1 links to each other with electric capacity C9's one end, first chip N1's third pin links to each other with the one end of power, first chip N1's second pin links to each other with the other end of power, first chip N1's fourth pin links to each other with electric capacity C9's the other end, first pin of first chip N1 still links to each other with second chip N4's IN end, electric capacity C12 and electric capacity C6 connect IN parallel with electric capacity C9, second chip N4's ADJ end is output ADJ end, still link to each other with second chip N4's OUT end through resistance R2 simultaneously, second chip N4's OUT end links to each other with electric capacity C8's one end, electric capacity C7's the other end links to each other with electric capacity C9's the other end, electric capacity C8 connects IN parallel with electric capacity C7.

The utility model discloses in probe test interface module 9 is connector interface module.

The model of the first chip N1 in the present invention is KBP 202G.

The utility model discloses in the model of second chip N4 is TL783 CKC.

The utility model discloses well passageway switching control switch 6 and switch 3 are the technique known in the art, do not do any more here and describe.

The working principle of the utility model is as follows:

the 220V alternating current outputs two groups of voltages through a transformer, and one group of voltages outputs direct current high voltage for the probe after rectification and voltage stabilization; the other group outputs direct current low voltage for the probe after rectification and voltage stabilization. The singlechip recognizes the state of the channel switching control switch, outputs a corresponding control signal and connects the working channel of the probe.

The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.

Claims

1. The utility model provides a test fixture suitable for ultrasonic probe which characterized in that: the device comprises a box body (1), wherein a power socket (2) is arranged at one end of the box body (1), the output end of the power socket (2) is connected with the input end of a power switch (3), the output end of the power switch (3) is connected with the input end of a transformer (4), the output end of the transformer (4) is connected with the input end of a probe high-voltage power module (7), the output end of the probe high-voltage power module (7) is connected with a probe test interface module (9), the output end of the transformer (4) is also connected with a probe low-voltage power module (8), the probe low-voltage power module (8) is connected with the probe test interface module (9), and the output end of the probe low-voltage power module (8) is also connected with the input end of a control module (5); the output end of the channel switching control switch (6) is connected with the input end of the control module (5), and the output end of the control module (5) is connected with the probe test interface module (9).

2. The test tool applicable to the ultrasonic probe according to claim 1, wherein: the control module (5) is a singlechip.

3. The test tool applicable to the ultrasonic probe according to claim 1, wherein: the transformer (4) is a bridge type rectifying and voltage-stabilizing circuit.

4. The test tool applicable to the ultrasonic probe according to claim 1, wherein: the high-voltage power supply module (7) comprises a first pin of a first chip N1 connected with one end of a capacitor C9, a third pin of a first chip N1 connected with one end of a power supply, a second pin of the first chip N1 connected with the other end of the power supply, a fourth pin of the first chip N1 connected with the other end of a capacitor C9, a first pin of a first chip N1 further connected with an IN end of a second chip N4, the capacitor C12 and a capacitor C6 connected IN parallel with the capacitor C9, an ADJ end of the second chip N4 serving as an output ADJ end and connected with an OUT end of the second chip N4 through a resistor R2, the OUT end of the second chip N4 connected with one end of the capacitor C7, the other end of the capacitor C7 connected with the other end of the capacitor C9, and a capacitor C8 connected IN parallel with a capacitor C7.

5. The test tool applicable to the ultrasonic probe according to claim 1, wherein: the probe test interface module (9) is a connector interface module.

6. The test tool applicable to the ultrasonic probe according to claim 4, wherein: the model of the first chip N1 is KBP 202G.

7. The test tool applicable to the ultrasonic probe according to claim 4, wherein: the model of the second chip N4 is TL783 CKC.