CN209945264U - Optical film thickness measuring instrument - Google Patents

Abstract

The utility model discloses an optics rete thickness measurement appearance, include: the front surface of the machine body is provided with a control panel; and the circuit main board is positioned in the machine body, and the two support legs of the circuit main board are connected with the fixed plate fixedly installed at the bottom of the inner side of the machine body. The utility model provides an optics rete thickness measuring apparatu, voltage signal follow a 1's a pin input, through LM311 voltage comparator's V/F transform for voltage conversion is 0-1 KHz's frequency signal, and VR1 adjusts the lowest frequency, and RP1 adjusts the highest frequency. And comparing the frequency signal output by the pin III of the A1 to a CPLD digital logic processing chip with a reference of 11MHz to form film thickness data, and displaying a digital display of 0-999.9 by a 4-bit nixie tube. The value range of the display range is increased, the device of being convenient for is thick when detecting the film thickness and is convenient for distinguish the variable quantity, and the problem of the variable quantity is unclear in the resolution caused by the display value range process is well solved when the device is used.

Description

Optical film thickness measuring instrument

Technical Field

The utility model relates to a thick appearance equipment technical field of membrane relates to an optics rete thickness measurement appearance particularly.

Background

The thickness gauge detects the thickness of the coating thickness of the vacuum coating machine in an optical mode, the existing equipment for detecting the coating thickness of the vacuum coating machine is a purchased 2V gauge head which is arranged on the thickness gauge to display thickness data, the display range of the equipment is 0.0-199.9, in the actual use process, the display range of the existing film thickness gauge is found to be insufficient, gear positions between some film layers and the film layers are required to be continuously adjusted to enable the display number to be in the usable range, the number change is obvious when the thickness of the coating thickness is mechanically detected, if the number changes slightly, the variable quantity cannot be distinguished, and the variable quantity is too large to exceed 199.9 and cannot be seen.

Therefore, problems are encountered in the actual use process at the present stage, and need to be solved urgently.

SUMMERY OF THE UTILITY MODEL

In view of the above problems in the prior art, an aspect of the present invention is to provide an optical film thickness measuring instrument, which increases the number of the measuring points, and facilitates the demonstration of the variation of the thickness of the coating film after the measuring.

In order to achieve the above object, the utility model provides a pair of optics rete thickness measuring apparatu, include:

the front surface of the machine body is provided with a control panel;

a circuit board, the circuit board is located the inside of organism, just two stabilizer blades of circuit board all with organism inside bottom fixed mounting's fixed plate is connected, and with control panel electric connection.

Preferably, an LM311 voltage comparator is arranged in the circuit, the circuit adopts 200V as a power supply, a resistor R26 with a device protection function is connected to a pin of the LM311 voltage comparator and used for receiving a thickness signal of a film thickness gauge, a ground protection is arranged on a pin IV of the LM311 voltage comparator, a capacitor C13 is connected between a pin VII of the LM311 voltage comparator and the pin I in parallel, the circuit further comprises an amplifier connected with the pin VII and the pin I in parallel, one pin of the amplifier is connected in series with a resistor R45 and a resistor R2, the other pin is connected with a diode D1, one pin of the diode D1 is connected with the ground protection, a pin RP 37 is connected between a resistor R45 and a resistor R2 in parallel, one pin of the resistor R37 is provided with the ground protection, a cable head of the resistor R2 is connected with a potentiometer 1 which controls the resistor to change according to a preset rule, the three pins of the LM311 voltage comparator are connected in series with a resistor R4 and a CPLD digital logic processing chip of a protection circuit, the two pins of the LM311 voltage comparator are connected in series with a resistor R1 and a variable resistor VR1, the five pin of the LM311 voltage comparator is connected with a bypass capacitor PC1, one pin of the bypass capacitor PC1 is in ground protection, the six pin and the five pin of the LM311 voltage comparator are connected in parallel and are respectively provided with a resistor R3, a resistor R12 and a resistor R11, the resistor R3, the resistor R12 and the resistor R11 are connected in series, and one pin of the resistor R11 is provided with ground protection.

Preferably, the pins at two sides of the amplifier are respectively connected with the anode of a 12V direct current power supply and the cathode of the 12V direct current power supply for stabilizing current.

Preferably, the CPLD digital logic processing chip is a nixie tube for digital exhibition.

Advantageous effects

Compared with the prior art, the utility model provides a pair of optics rete thickness measuring apparatu, in the effect, voltage signal is from an input of A1's pin, through LM311 voltage comparator's V/F transform for voltage conversion is 0-1 KHz's frequency signal, and the minimum frequency is adjusted to variable resistance VR1, and potentiometre RP1 adjusts the maximum frequency. And comparing the frequency signal output by the pin III of the A1 to a CPLD digital logic processing chip with a reference of 11MHz to form film thickness data, and displaying a digital display of 0-999.9 by a 4-bit nixie tube. The problem of thick being convenient for distinguish the change when the device of being convenient for detects the film thickness is solved at present stage film thickness appearance in the actual use of examining, because the display range value range is less, and can not distinguish the size of change, has increased the value range of display range, the device of being convenient for.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.

This document provides an overview of various implementations or examples of the technology described in this disclosure, and is not a comprehensive disclosure of the full scope or all features of the disclosed technology.

Drawings

FIG. 1 is a general schematic view of the structure of the present invention;

fig. 2 is a structural circuit diagram of the present invention.

The main reference numbers:

1. a body; 2. a circuit main board; 3. a fixing plate; 4. a control panel; 5. an LM311 voltage comparator; 6. a CPLD digital logic processing chip; 7. a nixie tube.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present disclosure more clear, the technical solutions of the embodiments of the present disclosure will be described below clearly and completely with reference to the accompanying drawings of the embodiments of the present disclosure. It is to be understood that the described embodiments are only a few embodiments of the present disclosure, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the described embodiments of the disclosure without any inventive step, are within the scope of protection of the disclosure.

Unless otherwise defined, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this disclosure belongs. The use of the word "comprising" or "comprises", and the like, in this disclosure is intended to mean that the elements or items listed before that word, include the elements or items listed after that word, and their equivalents, without excluding other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may also include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.

To maintain the following description of the embodiments of the present disclosure clear and concise, a detailed description of known functions and known components have been omitted from the present disclosure.

Referring to fig. 1-2, an optical film thickness measuring apparatus includes a body 1 and a circuit board 2.

As shown in fig. 1, a control panel 4 is disposed on the front surface of the machine body 1, and the circuit board 2 is mounted through a fixing plate 3 fixedly mounted at the bottom of the inner side of the machine body 1 and electrically connected to the control panel 4, the control panel 4 is used for starting the control device and displaying the film thickness range, and the code tube for displaying the numerical value is located on the control panel 4 (not marked in the drawing), so that the user can visually know the variation of the film thickness.

The film thickness meters on the market at present are mounted on the film thickness meter through a purchased 2V gauge head to display the variation of the film thickness after film coating, and the display range is in the range of 0.0-199.9.

In a further improvement proposed in the present application, as shown in fig. 2, for the circuit connection of the circuit main board 2, specifically, an LM311 voltage comparator 5 is provided in the circuit, a resistor R26 with a device protection function is connected to a pin of the LM311 voltage comparator 5 for receiving a thickness signal of a film thickness gauge, a pin four of the LM311 voltage comparator 5 is provided with a ground protection, a capacitor C13 is connected in parallel between a pin seven of the LM311 voltage comparator 5 and the pin one, the circuit further includes an amplifier connected in parallel with the pin seven and the pin one, one pin of the amplifier is connected in series with a resistor R45 and a resistor R2, the other pin is connected with a diode D1, one pin of the diode D1 is connected with the ground protection, a resistor R37 is connected in parallel with the pin between the resistor R45 and the resistor R2, one pin of the resistor R37 is provided with the ground protection, a cable head of the resistor R2 is connected with a potentiometer RP1 which controls the resistor to change according to a preset, a resistor R4 of a protection circuit and a CPLD digital logic processing chip 6 are connected in series with a pin III of an LM311 voltage comparator 5, a resistor R1 and a variable resistor VR1 are connected in series with a pin II of the LM311 voltage comparator 5, a pin V of the LM311 voltage comparator 5 is connected with a bypass capacitor PC1, one pin of the bypass capacitor PC1 is protected to be grounded, a resistor R3, a resistor R12 and a resistor R11 are respectively arranged in parallel with a pin VI of the LM311 voltage comparator 5, the resistor R3, the resistor R12 and the resistor R11 are connected in series, a pin of the resistor R11 is provided with ground protection, and pins at two sides of an amplifier are respectively connected with a positive pole of a 12V direct current power supply and a negative pole of the 12V direct current power supply for stabilizing current, a nixietube 7 for digitally displaying the CPLD digital logic processing chip 6 is further included in the circuit, because a voltage signal is input from a pin I of the A1, the voltage is converted into a frequency signal of 0-1KHz through the V/F conversion of the voltage comparator LM311, the variable resistor VR1 adjusts the lowest frequency, the potentiometer RP1 adjusts the highest frequency, the frequency signal output by the pin III of A1 is compared with the CPLD and the reference 11MHz to form film thickness data, and the 4-bit nixie tube displays the digital display of 0-999.9, so that the value range of the thickness of the reaction film of the equipment is enlarged, and a user can conveniently distinguish the magnitude of the variation.

Moreover, the device provided by the utility model can be directly connected with commercial power and 220V to be used as a starting power supply of equipment.

It will be appreciated by those skilled in the art that other similar connecting means, such as welding, bonding or screwing, may also be used to implement the present invention.

The above embodiments are merely exemplary embodiments of the present invention, which is not intended to limit the present invention, and the scope of the present invention is defined by the appended claims. Various modifications and equivalents may be made by those skilled in the art to the present invention without departing from the spirit and scope of the invention, and such modifications and equivalents should be considered to be within the scope of the invention.

Claims (4)

1. An optical film thickness measuring instrument, comprising:

the front side of the machine body (1) is provided with a control panel (4);

a circuit main board (2), the circuit main board (2) is located inside the machine body (1), and two support legs of the circuit main board (2) are connected with the fixed plate (3) fixedly installed at the bottom of the inner side of the machine body (1) and electrically connected with the control panel (4).

2. The optical film thickness measuring instrument of claim 1, further comprising an LM311 voltage comparator (5) disposed in the circuit, wherein 200V is adopted as a power supply, a resistor R26 with a device protection function is connected to a pin of the LM311 voltage comparator (5) for receiving a film thickness gauge thickness signal, a ground protection is disposed on a pin IV of the LM311 voltage comparator (5), a capacitor C13 is connected in parallel between a pin VII of the LM311 voltage comparator (5) and the pin I, an amplifier is disposed in the circuit and is connected in parallel with the pin VII, one pin of the amplifier is connected with a resistor R45 and a resistor R2 in series, the other pin is connected with a diode D1, one pin of the diode D1 is connected with a ground protection, a resistor R37 is connected in parallel between the pin R45 and the resistor R2, and one pin of the resistor R37 is disposed with a ground protection, the cable head of the resistor R2 is connected with a potentiometer RP1 which controls a resistor to change according to a preset rule, the pin III of the LM311 voltage comparator (5) is connected in series with a resistor R4 and a CPLD digital logic processing chip (6) of a protection circuit, the pin II of the LM311 voltage comparator (5) is connected in series with a resistor R1 and a variable resistor VR1, the pin V of the LM311 voltage comparator (5) is connected with a bypass capacitor PC1, one pin of the bypass capacitor PC1 is in ground protection, the pin VI of the LM311 voltage comparator (5) and the pin V are connected in parallel and are respectively provided with a resistor R3, a resistor R12 and a resistor R11, the resistor R3, the resistor R12 and the resistor R11 are series circuits, and a pin positioned on the resistor R11 is provided with ground protection.

3. The optical film thickness measuring instrument according to claim 2, wherein the pins at both sides of the amplifier are respectively connected to the positive electrode of the 12V DC power supply and the negative electrode of the 12V DC power supply for stabilizing the current.

4. The optical film thickness measuring instrument according to claim 2, further comprising a nixie tube (7) for digital display of the CPLD digital logic processing chip (6).