CN209928942U - Test device and test system - Google Patents
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- CN209928942U CN209928942U CN201920326058.3U CN201920326058U CN209928942U CN 209928942 U CN209928942 U CN 209928942U CN 201920326058 U CN201920326058 U CN 201920326058U CN 209928942 U CN209928942 U CN 209928942U
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- 238000012360 testing method Methods 0.000 title claims abstract description 169
- 238000001514 detection method Methods 0.000 claims abstract description 20
- 230000005540 biological transmission Effects 0.000 claims abstract description 15
- 238000013522 software testing Methods 0.000 abstract description 3
- 238000005259 measurement Methods 0.000 description 13
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- 239000004973 liquid crystal related substance Substances 0.000 description 2
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Abstract
The application discloses testing arrangement and test system, this testing arrangement have image transmission interface, and testing arrangement receives image signal and provides image signal for the device under test through image transmission interface, and its characterized in that, testing arrangement still have first interface and second interface, and testing arrangement includes: the controller receives the test parameters through the first interface and sends second test parameters to the detection device through the second interface; and the processor is connected with the controller, generates a test signal and a control signal according to the first test parameter, provides the test signal for the tested device, and generates a display signal according to the image signal and the test signal by the tested device. Compared with the prior art, the utility model discloses no longer need carry out manual parameter setting respectively to measuring device and detection device, only need carry out parameter setting once, improved efficiency of software testing.
Description
Technical Field
The utility model relates to a show technical field, more specifically relates to a testing arrangement and test system.
Background
Liquid Crystal Display (LCD) devices have many advantages such as being light and thin, saving energy, and having no radiation, and thus have gradually replaced conventional Cathode Ray Tube (CRT) displays. Liquid crystal displays are widely used in high definition digital televisions, desktop computers, Personal Digital Assistants (PDAs), notebook computers, mobile phones, digital cameras, and other electronic devices.
Generally, before being shipped out of a factory, an LCD must be subjected to tests such as electromagnetic interference (emi), Radio Frequency (RF), and the like, so as to measure the influence of the LCD on the RF of an antenna and the noise interference level of the LCD caused by outside. Fig. 1 shows a schematic diagram of a principle of detecting LCD noise in the prior art, the control terminal 10 needs to provide an image signal to the display device 30 through the DP interface in the measuring device 20, the test parameters are manually set in the measuring device 20, the measuring device 20 generates a measurement signal based on the manually set test parameters and supplies the measurement signal to the display device 30, the display device 30 generates a display signal based on the image signal and the measurement signal and supplies the display signal to the spectrum analyzer 40, the testing parameters are manually set in the spectrum analyzer 40, the spectrum analyzer 40 generates a measuring result according to the manually set testing parameters and the display signal, the measuring result is finally sent to the control terminal 10 to complete the test, a worker judges whether the standard specification is met according to the noise degree of the display signal of the display device, and if the standard specification is not met, the display device 30 needs to be debugged by a noise reduction method.
However, in the prior art, the measurement apparatus 20 and the spectrum measuring apparatus 40 need to be manually set before each measurement, which affects the efficiency of testing and subsequent debugging.
SUMMERY OF THE UTILITY MODEL
The utility model discloses the above-mentioned problem to exist among the prior art provides a testing arrangement and test system, has solved above-mentioned problem.
According to the utility model discloses an aspect of the embodiment provides a testing arrangement, has the image transmission interface, testing arrangement passes through the image transmission interface receives image signal and will image signal provides the device under test, its characterized in that, testing arrangement still has first interface and second interface, testing arrangement includes: a controller that receives test parameters through the first interface and transmits the test parameters to a detection apparatus via the second interface; and the processor is connected with the controller, receives the test parameters provided by the controller, generates a test signal and a control signal according to the test parameters, provides the test signal for the tested device, and generates a display signal according to the image signal and the test signal by the tested device.
Preferably, the control signal includes a switching signal, and the test apparatus further includes: the switch is connected with the processor to receive the switching signal; and the connector, respectively with image interface, the treater and the switch is connected, wherein, when switching signal is the first state, the switch control the connector will image signal with test signal provides the device under test, when switching signal second state, the switch control the connector stops to the device under test provides image signal with test signal.
Preferably, the control signal further includes a clock control signal, and the test apparatus further includes a clock connected to the processor to receive the clock control signal, wherein the clock is configured to control the measurement time and the measurement times of the test apparatus according to the clock control signal.
Preferably, the image transmission interface includes a DP interface.
Preferably, the first interface and the second interface each comprise an RJ45 interface.
Preferably, the controller comprises an ethernet bridge chip.
Preferably, the processor comprises an ARM processor, the ARM processor comprises a reduced media independent interface, and the ARM processor receives the test parameters through the reduced media independent interface.
According to the utility model discloses an on the other hand of the embodiment provides a test system, include: a test device as described above; and the control terminal is provided with a terminal image interface and a terminal network interface, the terminal image interface is connected with the image transmission interface, and the terminal network interface is connected with the first interface and is configured to provide the image signal and the test parameters for the test device.
Preferably, the device under test is further included, and the detection device is connected to the device under test to receive the display signal, and is connected to the test device through the second interface to receive the test parameter, wherein the test device generates a test result according to the test parameter and the display signal, and transmits the test result to the control terminal through the second interface, the first interface, and the terminal network interface in sequence.
Preferably, the detection means comprises an EMI instrument.
According to the utility model discloses testing arrangement and test system that provides, through set up first interface, second interface and controller in testing arrangement, the controller receives the test parameter through first interface, provides the test parameter to detection device in through the second interface to directly provide the test parameter to testing arrangement's treater in, compare with prior art, the utility model discloses no longer need carry out manual parameter setting respectively to measuring device and detection device, only need carry out parameter setting once, improved efficiency of software testing.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings.
Fig. 1 shows a schematic diagram of the prior art for detecting LCD noise.
Fig. 2 shows a schematic diagram of the testing system of the present invention.
Fig. 3 shows a schematic diagram of the testing steps of the present invention.
Detailed Description
The invention will be described in more detail below with reference to the accompanying drawings. Like elements in the various figures are denoted by like reference numerals. For purposes of clarity, the various features in the drawings are not necessarily drawn to scale. In addition, certain well known components may not be shown.
Numerous specific details of the invention are set forth in the following description in order to provide a more thorough understanding of the invention. However, as will be understood by those skilled in the art, the present invention may be practiced without these specific details.
Fig. 2 shows a schematic diagram of the testing system of the present invention.
As shown in fig. 2, the testing system of the present invention comprises: control terminal 100, test apparatus 200, and detection apparatus 300. The control terminal 100 has a terminal image interface 101 and a terminal network interface 102, the testing device 200 has a first interface 201, a second interface 202 and an image transmission interface 203, the terminal image interface 101 is connected with the image transmission interface 203, the terminal network interface 102 is connected with the first interface 201, and the detecting device 300 is connected with the device under test 50 and is connected with the testing device 200 through the second interface 202.
In the present embodiment, the test apparatus 200 includes: controller 210, processor 220, switch 230, connector 240, and clock 250. The first interface 201 and the second interface 202 are respectively connected to the controller 210, the processor 220 is respectively connected to the controller 210, the switch 230, the connector 240 and the terminator 250, and the connector 240 is respectively connected to the image transmission interface 203 and the switch 230. The testing device 200 is connected to the device under test 50 through the connector 240, and the processor 220 is connected to the clock 250 through the I2C bus.
In this embodiment, the first Interface 201 and the second Interface 202 are preferably RJ45 interfaces, the image transmission Interface 203 is preferably a DP Interface, the controller 210 is preferably an ethernet bridge chip, the processor 220 is preferably an ARM processor including a Reduced Media Independent Interface (RMII), the switch 230 is preferably a relay, the Clock 250 is preferably a Real-Time Clock (RTC), and the detection device 300 is preferably an EMI instrument. The control terminal 100 is preferably a personal computer.
Fig. 3 shows a schematic diagram of the testing steps of the present invention. The working principle of the testing system according to the embodiment of the present invention will be described in detail with reference to fig. 2 and 3.
In step S01, the image signal photo and the test parameters are set in the software environment of the control terminal 100. The test parameters include test times, test time, parameters for forming the PWM signal, and the like.
In step S02, the start measurement button in the software is clicked.
In step S03, the control terminal 100 sends the test parameters and the image signal photo to the testing device 200, the testing device 200 sends the image signal photo and the test signal to the device under test 50, the device under test 50 generates the display signal rev according to the test signal and the image signal photo, and provides the display signal rev to the detecting device 300.
In this step, the image signal photo is sequentially transmitted to the connector 240 through the terminal image interface 101 and the image transmission interface 203, and then transmitted to the device under test 50 through the connector 240, and the test parameters are sequentially transmitted to the controller 210 through the terminal network interface 102 and the first interface 201. Further, the controller 210 sends the test parameter to the processor 220, and the processor 220 generates a test signal and a control signal according to the test parameter, and provides the test signal to the device under test 50 via the connector 240, wherein the test signal includes the pulse width modulation signal PWM, and the control signal includes the switching signal EN and the clock control signal clk. When the processor 220 is implemented by an ARM processor, the test parameters are received through a simplified media independent interface.
In step S04, the control terminal 100 controls the testing device 200 to stop providing the image signal photo and the testing signal to the device under test 50 according to the testing parameters.
In this step, the switch 230 receives the switching signal EN, when the switching signal EN is in a first state (for example, high level), the switch 230 generates the Output signal Power Output according to the external Input signal Power Input to control the connector 240 to provide the image signal photo and the test signal to the device under test 50, at this time, the device under test 50 generates the display signal rev and sends the display signal rev to the detection device 300, and when the switching signal EN is in a second state (for example, low level), the switch 230 controls the connector 240 to stop providing the image signal photo and the test signal to the device under test 50, and the device under test 50 also stops sending the display signal rev to the detection device 300. Among them, the external Input signal Power Input is preferably provided by the control terminal 100.
In step S05, the control terminal 100 provides the test parameters to the detecting device 300 via the testing device 200, and the detecting device 300 generates the detecting result according to the display signal rev and the test parameters and provides the detecting result to the control terminal 100 via the testing device 200.
In this step, the controller 210 sends the received test parameters to the detection apparatus 300 through the second interface 202, and the detection apparatus 300 produces a detection result according to the display signal rev and the test parameters, and the detection result is provided to the control terminal 100 through the second interface 202, the first interface 201, and the terminal network interface 102 and can be presented in a software interface.
In step S06, the control terminal determines whether or not the predetermined number of measurements is completed based on the test parameters.
In this step, the clock 250 receives the clock control signal clk provided by the processor 220, the clock control signal clk includes test parameters including information about the number of tests and the test time, and the clock 250 may control the measurement time and the number of measurements of the test apparatus 200 according to the clock control signal clk. When the number of measurements is not completed, the process returns to step S03, and the next test is performed, and when the number of measurements is completed,
according to the utility model provides a testing arrangement and test system, through set up first interface, second interface and controller in testing arrangement, the controller receives the test parameter through first interface, provides the test parameter to detection device in through the second interface to directly provide the test parameter to testing arrangement's treater in, compare with prior art, the utility model discloses no longer need carry out manual parameter setting respectively to measuring device and detection device, only need carry out parameter setting once in control terminal, press and begin to measure behind the button, can realize automatic test, improved efficiency of software testing.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
In accordance with the embodiments of the present invention as set forth above, these embodiments are not exhaustive and do not limit the invention to the precise embodiments described. The above description is only a preferred embodiment of the present invention, and should not be taken as limiting the invention, and any person skilled in the art can make various changes, modifications, etc. without departing from the scope of the present invention. The embodiments were chosen and described in order to best explain the principles of the invention and its practical application, to thereby enable others skilled in the art to best utilize the invention and its various embodiments with various modifications as are suited to the particular use contemplated.
Claims (10)
1. A test apparatus having an image transmission interface, the test apparatus receiving an image signal through the image transmission interface and providing the image signal to a device under test, the test apparatus further having a first interface and a second interface, the test apparatus comprising:
a controller that receives test parameters through the first interface and transmits the test parameters to a detection apparatus via the second interface; and
and the processor is connected with the controller, receives the test parameters provided by the controller, generates a test signal and a control signal according to the test parameters, provides the test signal for the tested device, and generates a display signal according to the image signal and the test signal by the tested device.
2. The test device of claim 1, wherein the control signal comprises a switching signal, the test device further comprising:
the switch is connected with the processor to receive the switching signal; and
a connector connected to the image transmission interface, the processor and the switch respectively,
wherein when the switch signal is in a first state, the switch controls the connector to provide the image signal and the test signal to the device under test,
when the switch signal is in a second state, the switch controls the connector to stop providing the image signal and the test signal to the device under test.
3. The test apparatus of claim 2, wherein the control signal further comprises a clock control signal, the test apparatus further comprising a clock coupled to the processor to receive the clock control signal,
the clock device is used for controlling the measuring time and the measuring times of the testing device according to the clock control signal.
4. A test device as claimed in any one of claims 1 to 3, wherein the image transfer interface comprises a DP interface.
5. The testing device of any of claims 1-3, wherein the first interface and the second interface comprise RJ45 interfaces.
6. A test device as claimed in any one of claims 1 to 3, wherein the controller comprises an ethernet bridge chip.
7. The test device as claimed in any one of claims 1-3, wherein the processor comprises an ARM processor, the ARM processor comprising a reduced media independent interface, the ARM processor receiving the test parameters through the reduced media independent interface.
8. A test system, comprising:
the test device of any one of claims 1-7; and
and the control terminal is provided with a terminal image interface and a terminal network interface, the terminal image interface is connected with the image transmission interface, and the terminal network interface is connected with the first interface and is configured to provide the image signal and the test parameters for the test device.
9. The test system of claim 8, further comprising the detection device coupled to the device under test to receive the display signal and coupled to the test device via the second interface to receive the test parameters,
the test device generates a test result according to the test parameters and the display signal, and transmits the test result to the control terminal through the second interface, the first interface and the terminal network interface in sequence.
10. The test system of claim 9, wherein the detection device comprises an EMI instrument.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920326058.3U CN209928942U (en) | 2019-03-14 | 2019-03-14 | Test device and test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920326058.3U CN209928942U (en) | 2019-03-14 | 2019-03-14 | Test device and test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209928942U true CN209928942U (en) | 2020-01-10 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201920326058.3U Active CN209928942U (en) | 2019-03-14 | 2019-03-14 | Test device and test system |
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| Country | Link |
|---|---|
| CN (1) | CN209928942U (en) |
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- 2019-03-14 CN CN201920326058.3U patent/CN209928942U/en active Active
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