CN209911176U - Sampling device of laser particle analyzer - Google Patents

Sampling device of laser particle analyzer Download PDF

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Publication number
CN209911176U
CN209911176U CN201920417703.2U CN201920417703U CN209911176U CN 209911176 U CN209911176 U CN 209911176U CN 201920417703 U CN201920417703 U CN 201920417703U CN 209911176 U CN209911176 U CN 209911176U
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pipe
baffle
laser particle
feeding
side wall
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CN201920417703.2U
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Chinese (zh)
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王克庆
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Qingdao Pearl Ocean Pharmaceutical Co Ltd
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Qingdao Pearl Ocean Pharmaceutical Co Ltd
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Abstract

The utility model provides a sampling device of laser particle size analyzer, relate to particle size analysis equipment technical field, including inlet pipe and transport pipe, the top of inlet pipe is equipped with the shield, built-in board is connected to the inside wall of inlet pipe, the lateral wall of inlet pipe runs through and is equipped with first baffle, the diameter of the cross section of first baffle is the same with the internal diameter of inlet pipe, the lower surface of the upper surface connection built-in board of first baffle, the lateral wall of transport pipe is connected to the lower surface of first baffle, the lateral wall of transport pipe is connected to the bottom of inlet pipe, intake-tube connection air compressor is passed through to the one end of transport pipe, the entrance point of laser particle size analyzer is connected to the other end, the entrance point of aspirator pump is connected through first connecting pipe to the transport pipe, the first entrance point of receiving tank is connected through the second connecting pipe to the exit end of aspirator pump, the. The utility model is simple in operation, the cleanness of being convenient for can reduce the error.

Description

Sampling device of laser particle analyzer
Technical Field
The utility model belongs to the technical field of particle size analysis equipment, concretely relates to sampling device of laser particle analyzer.
Background
The laser particle analyzer is an apparatus for analyzing the size of particles through the spatial distribution (scattering spectrum) of diffraction or scattering light of the particles, and adopts Furanhofer diffraction and Mie scattering theories, so that the testing process is not influenced by various factors such as temperature change, medium viscosity, sample density, surface state and the like, and accurate testing results can be obtained as long as a sample to be tested is uniformly displayed in a laser beam. The sample feeding device of the laser particle analyzer disperses the powder through compressed air and plays a role in conveying the powder into the next measuring unit. The existing sample feeding device of the laser particle analyzer is easy to leave samples and dust in a sample feeding pipeline, and the detection result is influenced.
Therefore, it is urgently needed to provide a sample feeding device of a laser particle analyzer, which is simple to operate and convenient to clean and can reduce errors.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a sampling device of laser particle analyzer to the not enough of sampling device of current laser particle analyzer.
The utility model provides a following technical scheme:
a sample feeding device of a laser particle analyzer comprises a feeding pipe and a conveying pipe, wherein the top of the feeding pipe is provided with a dustproof cover, the inner side wall of the feeding pipe is connected with the built-in plate, the side wall of the feeding pipe is provided with a first baffle plate in a penetrating way, the diameter of the cross section of the first baffle is the same as the inner diameter of the feeding pipe, the upper surface of the first baffle is connected with the lower surface of the built-in plate, the lower surface of the first baffle plate is connected with the outer side wall of the conveying pipe, the bottom of the feeding pipe is connected with the side wall of the conveying pipe, one end of the conveying pipe is connected with an air compressor through an air inlet pipe, the other end of the conveying pipe is connected with the inlet end of a laser particle analyzer, the transportation pipe is connected with the inlet end of the air suction pump through a first connecting pipe, the outlet end of the air suction pump is connected with the first inlet end of the material receiving groove through a second connecting pipe, and the bottom of the laser particle size analyzer is connected with the second inlet end of the material receiving groove through a material discharging pipe.
Preferably, the external diameter of shield bottom with the internal diameter of inlet pipe is the same, the lower surface of the last fixed surface of shield connection handle, the bottom of shield is equipped with the sealing ring, the edge of shield lower surface is located to the sealing ring.
Preferably, the top side wall of the first connecting pipe is provided with a first valve, and the top side wall of the discharge pipe is provided with a second valve.
Preferably, a second baffle plate penetrates through the side wall of the conveying pipe, the diameter of the cross section of the second baffle plate is the same as the inner diameter of the conveying pipe, and the second baffle plate is arranged between the air inlet pipe and the first connecting pipe.
Preferably, one end of the first baffle plate is inserted into the feeding pipe, the other end of the first baffle plate is fixedly connected with a first handle outside the feeding pipe, one end of the second baffle plate is inserted into the transport pipe, and the other end of the second baffle plate is fixedly connected with a second handle outside the transport pipe.
The utility model has the advantages that: the feeding pipe is internally provided with a sample to be detected after the dust cover is opened, the sample can be placed in the conveying pipe, most of the volume of the first baffle plate is arranged outside the feeding pipe in the sample adding process, the thickness of the built-in plate and the feeding pipe can ensure that the first baffle plate can be clamped on the side wall of the feeding pipe, the sample is not blocked by the edge of the first baffle plate, and errors can be reduced when the particle size detection operation is carried out on various samples; after a sample enters the conveying pipe, the first baffle plate is completely pushed into the feeding pipe, the second baffle plate is pulled out to be clamped on the side wall of the conveying pipe, the first valve and the second valve are closed, the air compressor is started, and the sample can be quickly blown into the laser particle analyzer for analysis and detection; the air compressor is closed, the second baffle plate is completely pushed into the conveying pipe, and after the particle analyzer finishes detection and analysis, the second valve is opened to discharge the residual materials into the material receiving groove through the material discharging pipe; and the second valve is closed, the first valve and the air suction pump are opened, and the residual sample in the conveying pipe is sucked into the material receiving groove through the first connecting pipe and the second connecting pipe, so that the operation is simple and the cleaning is convenient.
Drawings
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention. In the drawings:
fig. 1 is a schematic diagram of the internal structure of the present invention.
Labeled as: 1. a feed pipe; 2. a transport pipe; 3. a dust cover; 4. a built-in plate; 5. a first baffle plate; 6. an air inlet pipe; 7. an air compressor; 8. a laser particle size analyzer; 9. a first connecting pipe; 10. a getter pump; 11. a second connecting pipe; 12. a material receiving groove; 13. a discharge pipe; 14. a handle; 15. a seal ring; 16. a first valve; 17. a second valve; 18. a second baffle; 19. a first handle; 20. a second handle.
Detailed Description
As shown in fig. 1, a sampling device of laser particle analyzer, including inlet pipe 1 and conveying pipe 2, the top of inlet pipe 1 is equipped with shield 3, built-in board 4 is connected to the inside wall of inlet pipe 1, the lateral wall of inlet pipe 1 runs through and is equipped with first baffle 5, the diameter of the cross section of first baffle 5 is the same with the internal diameter of inlet pipe 1, the lower surface of built-in board 4 of upper surface connection of first baffle 5, the lateral wall of conveying pipe 2 is connected to the lower surface of first baffle 5, the lateral wall of conveying pipe 2 is connected to the bottom of inlet pipe 1, air compressor 7 is connected through intake pipe 6 to the one end of conveying pipe 2, the entrance point of laser particle analyzer 8 is connected to the other end, conveying pipe 2 connects the entrance point of aspirator pump 10 through first connecting pipe 9, the exit end of aspirator pump 10 passes through the first entrance point of second connecting pipe 11 connection receipts silo 12, the second entrance point of receiving silo 12 is connected through discharging pipe 13.
The external diameter of shield 3 bottom is the same with the internal diameter of inlet pipe 1, and the lower surface of the upper surface fixed connection handle 14 of shield 3, the bottom of shield 3 are equipped with sealing ring 15, and the edge of shield 3 lower surface is located to sealing ring 15, covers shield 3 during idle, prevents that the dust from getting into inlet pipe 1, and sealing ring 15 improves the leakproofness of shield 3, reduces the error that the dust brought for the sample. The top side wall of the first connecting pipe 9 is provided with a first valve 16 and the top side wall of the discharge pipe 13 is provided with a second valve 17 for switching the detection and cleaning functions. The lateral wall of conveying pipe 2 runs through and is equipped with second baffle 18, and the diameter of the cross section of second baffle 18 is the same with the internal diameter of conveying pipe 2, and second baffle 18 is located between intake pipe 6 and the first connecting pipe 9, and the in-process of conveying pipe 2 clearance pushes second baffle 18 completely in conveying pipe 2, can prevent that the sample from getting into intake pipe 6 in, influencing the testing result of next sample. One end of the first baffle 5 is inserted into the feeding pipe 1, the other end of the first baffle is fixedly connected with a first handle 19 outside the feeding pipe 1, one end of the second baffle 18 is inserted into the conveying pipe 2, the other end of the second baffle is fixedly connected with a second handle 20 outside the conveying pipe 2, and the first handle 19 and the second handle 20 are convenient for pulling the first baffle 5 and the second baffle 18.
The utility model discloses a use-way does: starting a laser particle analyzer 8 for balancing for 30min, pulling a first handle 19, arranging most of the volume of a first baffle plate 5 outside a feeding pipe 1, ensuring that the first baffle plate 5 can be clamped on the side wall of the feeding pipe 1 by the thicknesses of a built-in plate 4 and the feeding pipe 1, pulling a second handle 20, pulling a second baffle plate 18 out of a conveying pipe 2, clamping the edge of the second baffle plate 18 on the side wall of the conveying pipe 2, closing a first valve 16 and a second valve 17, pulling a handle 14 to open a dust cover 3, adding a sample to be detected into the feeding pipe 1, then placing the sample into the conveying pipe 2, and starting an air compressor 7 to rapidly blow the sample in the conveying pipe 2 into the laser particle analyzer 8 for analysis and detection; the air compressor 7 is closed, the second baffle 18 is completely pushed into the conveying pipe 2, and after the particle size analyzer finishes detection and analysis, the second valve 17 is opened to discharge the residual materials into the material receiving groove 12 through the material discharging pipe 13; the second valve 17 is closed, the first valve 16 and the suction pump 10 are opened, and the remaining sample in the transport pipe 2 is sucked into the receiving tank 12 through the first connection pipe 9 and the second connection pipe 11, and the next sample detection is continued.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described in the foregoing embodiments, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (5)

1. A sample feeding device of a laser particle analyzer is characterized by comprising a feeding pipe and a conveying pipe, the top of the feeding pipe is provided with a dust cover, the inner side wall of the feeding pipe is connected with the built-in plate, the side wall of the feeding pipe is provided with a first baffle plate in a penetrating way, the diameter of the cross section of the first baffle is the same as the inner diameter of the feeding pipe, the upper surface of the first baffle is connected with the lower surface of the built-in plate, the lower surface of the first baffle plate is connected with the outer side wall of the conveying pipe, the bottom of the feeding pipe is connected with the side wall of the conveying pipe, one end of the conveying pipe is connected with an air compressor through an air inlet pipe, the other end of the conveying pipe is connected with the inlet end of a laser particle analyzer, the transportation pipe is connected with the inlet end of the air suction pump through a first connecting pipe, the outlet end of the air suction pump is connected with the first inlet end of the material receiving groove through a second connecting pipe, and the bottom of the laser particle size analyzer is connected with the second inlet end of the material receiving groove through a material discharging pipe.
2. The sample introduction device of the laser particle analyzer according to claim 1, wherein the outer diameter of the bottom of the dust cap is the same as the inner diameter of the feed pipe, the upper surface of the dust cap is fixedly connected with the lower surface of the handle, and the bottom of the dust cap is provided with a sealing ring which is arranged at the edge of the lower surface of the dust cap.
3. The sample introduction device of the laser particle analyzer as claimed in claim 1, wherein a first valve is disposed on a top side wall of the first connection pipe, and a second valve is disposed on a top side wall of the discharge pipe.
4. The sample introduction device of the laser particle analyzer according to claim 1, wherein a second baffle plate penetrates through a side wall of the transport pipe, a diameter of a cross section of the second baffle plate is the same as an inner diameter of the transport pipe, and the second baffle plate is arranged between the air inlet pipe and the first connection pipe.
5. The sample introduction device of the laser particle analyzer as claimed in claim 4, wherein one end of the first baffle is inserted into the feeding tube, the other end of the first baffle is fixedly connected to a first handle outside the feeding tube, one end of the second baffle is inserted into the transport tube, and the other end of the second baffle is fixedly connected to a second handle outside the transport tube.
CN201920417703.2U 2019-03-29 2019-03-29 Sampling device of laser particle analyzer Active CN209911176U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920417703.2U CN209911176U (en) 2019-03-29 2019-03-29 Sampling device of laser particle analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920417703.2U CN209911176U (en) 2019-03-29 2019-03-29 Sampling device of laser particle analyzer

Publications (1)

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CN209911176U true CN209911176U (en) 2020-01-07

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CN201920417703.2U Active CN209911176U (en) 2019-03-29 2019-03-29 Sampling device of laser particle analyzer

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111272620A (en) * 2020-03-26 2020-06-12 珠海欧美克仪器有限公司 Particle size analyzer, particle size analyzer system and sample injection control method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111272620A (en) * 2020-03-26 2020-06-12 珠海欧美克仪器有限公司 Particle size analyzer, particle size analyzer system and sample injection control method

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