CN209879730U - Multi-channel infrared detection device - Google Patents
Multi-channel infrared detection device Download PDFInfo
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- CN209879730U CN209879730U CN201920907494.XU CN201920907494U CN209879730U CN 209879730 U CN209879730 U CN 209879730U CN 201920907494 U CN201920907494 U CN 201920907494U CN 209879730 U CN209879730 U CN 209879730U
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Abstract
A multi-channel infrared detection device comprises an MCU unit, an infrared emission circuit, a test data acquisition unit, a PLC control unit, an industrial personal computer unit, a switching circuit unit and an infrared receiving head, wherein the infrared emission circuit is electrically connected with the MCU unit and used for emitting infrared signals; the utility model has the advantages that: the utility model discloses utilize the singlechip of the MCU unit of high performance, reach the purpose of multichannel test through optimizing the MCU resource, effectively solve the problem that current single line test production efficiency is low, adopt preferred hardware circuit to improve measuring accuracy and success rate.
Description
Technical Field
The utility model relates to a detect and control field, especially relate to a multichannel infrared detection device.
Background
The infrared remote controller is widely used in household appliances and industrial control systems, and is characterized by not interfering with the work of other electric appliances and not affecting the surrounding environment.
The infrared remote control system is divided into a transmitting part and a receiving part, and a manufacturer carries out one-to-one test according to the mode; this test method has not been able to meet the current requirements for efficient production.
Therefore, it is important to obtain a multi-channel infrared detection device for one-to-many simultaneous testing.
SUMMERY OF THE UTILITY MODEL
The utility model aims at the above-mentioned problem, a multichannel infrared detection device of a pair of multichannel concurrent test is provided.
In order to achieve the above purpose, the utility model adopts the following technical proposal: a multi-channel infrared detection device comprises an MCU unit, an infrared emission circuit, a test data acquisition unit, a PLC control unit, an industrial personal computer unit, a switching circuit unit and an infrared receiving head, wherein the infrared emission circuit is electrically connected with the MCU unit and used for emitting infrared signals;
the infrared transmitting circuit is used for transmitting an infrared signal; the switching circuit unit is used for rapidly switching the infrared head; the test data acquisition unit is used for acquiring data; the MCU unit is used for processing the information of the units.
According to the technical scheme, the MCU unit processes all other signals in a centralized manner, the infrared transmitting circuit is responsible for transmitting infrared signals in the testing process, the switching circuit unit is mainly used for subpackaging the infrared heads arranged on the testing plate, and the data acquisition unit acquires data of each infrared head mobile phone and transmits the data to the MCU unit for calculation during testing; the MCU unit is STM32F103VET6 and is used for comprehensively processing the information of each unit.
Through the technical scheme, the data of the infrared head test are as follows: quiescent current, high voltage, operating current, low voltage, maximum pulse, minimum pulse, input delay, pull-up resistance, noise and decode tests, etc.
The timer of the MCU unit has a multipath input capturing function and detects multipath channels simultaneously; the utility model discloses a multichannel is still detected simultaneously to the MCU unit using multichannel ADC.
As one of the preferable modes, the infrared transmitting circuit includes a chip U7, an ADM101E is adopted, a pin 1 of the ADM receives an analog signal of the MCU through a resistor R23, and the ADM is grounded through a filter capacitor C15; the No. 3 pin of the capacitor is grounded through a C16 capacitor, the voltage of-150 mV is accessed through a resistor R18, and the resistor R25 is grounded; the No. 2 pin is connected with-150 mV voltage; the No. 5 pin is a chip power supply input pin and is connected with +5V voltage; the No. 6 pin of the PWM power supply is connected to a PWM pulse modulation signal through an R27 resistor; the signal is output to the grid electrode of the MOS tube Q4 through a No. 4 pin through an R24 resistor, the source electrode of the MOS tube Q4 is grounded through an R32 resistor, and the source electrode is connected to the No. 5 pin of the operational amplifier U7B through an R31 resistor; the operational amplifier U7B adopts a voltage follower circuit to improve the amplification capacity, and meanwhile, a simple first-order low-pass filter circuit is formed by the R33 and the capacitor C20, so that the acquisition precision is effectively improved;
the drain electrode of the MOS tube Q4 is connected with +10V voltage through resistors R22 and R21, wherein R22 is equivalent to an infrared emission head;
as one of the preferable modes, the operational amplifier is a model LM 2904.
As one preferable mode, the test data acquisition circuit unit includes an operational amplifier U2, an operational amplifier U1B, an operational amplifier U1A, and a clamp chip D1, where the clamp chip is BAT54S, a pin 5 of the operational amplifier U2 receives an infrared receiving head signal through a resistor R1, the pin 5 is connected to a collector of a transistor Q1 through a resistor R1 and a resistor R4, an emitter is grounded, and a base is directly grounded through a resistor R8; the amplifier U1B adopts a voltage follower circuit, and the pin No. 6 of the amplifier U1B is directly connected with the pin No. 7 thereof;
the data of the No. 7 pin of the amplifier U1B is divided by resistors R7 and R10 and then is sent to the No. 3 pin of the amplifier U1A; the amplifier U1A adopts a voltage follower circuit, and the No. 2 pin is directly connected with the No. 1 pin; the pin U1A 8 No. 8 of the amplifier is connected with the voltage of +10V, and the pin 4 is connected with the voltage of-5V; the No. 1 pin outputs an IR-A signal to the No. 25 pin of the MCU unit after first-order filtering through resistors R9 and C3;
in order to protect the MCU IO port, a clamping chip D1 is added; pin D12 of the clamp chip is connected with VPP, pin 3 is connected with IR-A signal, and pin 1 is grounded.
Through the technical scheme, the test data acquisition unit is isolated by the operational amplifier, and the acquired data is accurate.
As a preferable mode, the switching circuit unit includes that the chip U1 is 74HC238PW, and the chip U2 is ULN2803, and is configured to decode the digital signal of the MCU into a single signal and send the single signal to an actuator in the switching circuit through amplification and isolation. Through above-mentioned technical scheme, switching circuit adopts above-mentioned chip can the fast switch-over infrared head that awaits measuring, improves efficiency of software testing.
As the above-mentioned a preferred mode, PLC control unit and industrial control computer unit; the integrated circuit comprises a chip U5 and a chip U6, wherein the chip U5 is ADUM1201, the chip U6 is ADM101E, a pin 1 of the chip U5 is connected with 3.3V voltage, a pin 8 is connected with 5V voltage, a pin 2 and a pin 3 are connected with input and output serial port signals of an MCU unit, and a pin 4 and a pin 5 are directly grounded; the No. 7 pin is connected to the No. 5 pin of the chip U6, and the No. 6 pin is connected to the No. 4 pin of the chip U6;
the No. 3 pin of the chip U6 is grounded through a capacitor R8, and the No. 8 pin and the No. 1 pin are directly grounded; the No. 10 pin is connected with 5V voltage, the No. 6 pin and the No. 7 pin are connected with an industrial personal computer or a PLC serial port connector J2, and the No. 9 pin is connected with a second pin through a capacitor C7; pin number 10 and pin number 11 of the connector J2 are grounded.
Compared with the prior art, the utility model has the advantages of: the utility model discloses utilize the singlechip of the MCU unit of high performance, through optimizing the MCU resource, adopt preferred hardware circuit to reach the purpose of multichannel test, effectively solve the problem that current single line test production efficiency is low to improve measuring accuracy and success rate.
Drawings
FIG. 1 is a block diagram of the present invention;
FIG. 2 is a circuit diagram of a switching circuit unit of the present invention;
FIG. 3 is a circuit diagram of the test data acquisition unit of the present invention;
FIG. 4 is a circuit diagram of the MCU unit of the present invention;
FIG. 5 is a diagram of an infrared emitting circuit of the present invention;
figure 6 is the utility model discloses PLC the control unit and industrial computer unit circuit diagram.
Detailed Description
Referring to the attached drawings, the multichannel infrared detection device comprises an MCU unit 1, an infrared transmitting circuit 2 which is electrically connected with the MCU unit 1 and used for transmitting infrared signals, a test data acquisition unit 4 which is electrically connected with the MCU unit 1, a PLC control unit 5 which is electrically connected with the MCU unit 1, an industrial personal computer unit 6 which is connected with the MCU unit 1, a switching circuit unit 3 which is connected with the test data acquisition unit 4, and an infrared receiving head which provides data for the switching circuit 3;
the MCU unit 1 is an STM32F103VET6 and is used for comprehensively processing the information of each unit;
the data of the infrared receiving head test are as follows: quiescent current, high voltage, operating current, low voltage, maximum pulse, minimum pulse, input delay, pull-up resistance, noise and decode tests, etc. The timer of the MCU unit 1 has a multipath input capturing function and detects multipath channels simultaneously; the utility model discloses a multichannel is detected simultaneously to the MCU unit use multichannel ADC.
The infrared transmitting circuit 2 comprises a chip U7, an ADM101E is adopted, a pin No. 1 of the ADM101 receives an analog signal of the MCU unit 1 through a resistor R23, and the ADM1 is grounded through a C15 filter capacitor; the No. 3 pin of the resistor is grounded through a C16 capacitor, the voltage of-150 mV is accessed through an R18 resistor, and the R25 resistor is grounded; the No. 2 pin is connected with-150 mV voltage; the No. 5 pin is a chip power supply input pin and is connected with +5V voltage; the No. 6 pin of the PWM power supply is connected to a PWM pulse modulation signal through an R27 resistor; the signal is output to the grid electrode of the MOS tube Q4 through a No. 4 pin through an R24 resistor, the source electrode of the MOS tube Q4 is grounded through an R32 resistor, and the source electrode is connected to the No. 7B5 pin of the operational amplifier through an R31 resistor; the operational amplifier U7B adopts a voltage follower circuit to improve the amplification capacity, and meanwhile, a simple first-order low-pass filter circuit is formed by R33 and C20, so that the acquisition precision is effectively improved;
the drain electrode of the MOS tube Q4 is connected with +10V voltage through resistors R22 and R21, wherein R22 is equivalent to an infrared emission head;
as one of the preferable modes, the operational amplifier is a model LM 2904.
The test data acquisition circuit unit 4 comprises an operational amplifier U2, an operational amplifier U1B, an operational amplifier U1A and a clamping chip D1, wherein the BAT54S is adopted, a No. 5 pin of the operational amplifier U2 receives an infrared receiving head signal through a resistor R1, a No. 5 pin is connected with a resistor R1 and a resistor R4 and is connected with a collector of a triode Q1, an emitter is grounded, and a base is directly grounded through a resistor R8; the amplifier U1B adopts a voltage follower circuit, and the pin No. 6 of the amplifier U1B is directly connected with the pin No. 7 thereof;
the data of the No. 7 pin of the amplifier U1B is divided by resistors R7 and R10 and then is sent to the No. 3 pin of the amplifier U1A; the amplifier U1A adopts a voltage follower circuit, and the No. 2 pin is directly connected with the No. 1 pin; the pin U1A 8 No. 8 of the amplifier is connected with the voltage of +10V, and the pin 4 is connected with the voltage of-5V; the No. 1 pin outputs an IR-A signal to the No. 25 pin of the MCU unit 1 after first-order filtering through resistors R9 and C3;
in order to protect the MCU IO port, a clamping chip D1 is added; pin 2 of the clamp chip D1 is connected to VPP, pin 3 is connected to IR- A signal, and pin 1 is connected to ground.
Through the technical scheme, the test data acquisition unit is isolated by the operational amplifier, and the acquired data is accurate.
The switching circuit unit 3 comprises a chip U1 and a chip U2, the first chip is 74HC238PW, the second chip is ULN2803, and the chip is used for decoding the digital signal of the MCU into a single-path signal and sending the single-path signal to an executive element in the switching circuit through amplification and isolation. Through above-mentioned technical scheme, switching circuit adopts above-mentioned chip can the fast switch-over infrared head that awaits measuring, improves efficiency of software testing.
A PLC control unit 5, a PLC control unit 5 and an industrial personal computer unit 6; the circuit comprises a chip U5 and a chip U6, wherein U5 is ADUM1201, U6 is ADM101E, a pin No. 1 of the chip U5D is connected with 3.3V voltage, a pin No. 8 is connected with 5V voltage, a pin No. 2 and a pin No. 3 are connected with input and output serial signals of an MCU unit (1), and a pin No. 4 and a pin No. 5 are directly grounded; the No. 7 pin is connected to the No. 5 pin of the chip U6, and the No. 6 pin is connected to the No. 4 pin of the chip U6;
the No. 3 pin of the chip U6 is grounded through a capacitor R8, and the No. 8 pin and the No. 1 pin are directly grounded; the No. 10 pin is connected with 5V voltage, the No. 6 pin and the No. 7 pin are connected with an industrial personal computer or a PLC serial port connector J2, and the No. 9 pin is connected with a second pin through a capacitor C7; pin number 10 and pin number 11 of the connector J2 are grounded.
The utility model discloses a theory of operation does: the infrared transmitting circuit 2 is used for transmitting an infrared signal; the switching circuit unit 3 is used for rapidly switching the infrared head 8; the test data acquisition unit 4 is used for acquiring data; the MCU unit 1 is used for processing the information of the units; MCU unit 1 centralized processing other all signals, infrared emission circuit 2 is responsible for the infrared signal transmission among the test procedure, and switching circuit unit 3's main function is for subcontracting the infrared receiving head of installing on surveying the board, and when testing, data acquisition unit 4 is to the data acquisition of each infrared receiving head collection to carry to MCU unit 1 and calculate.
The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications, additions and substitutions for the specific embodiments described herein may be made by those skilled in the art without departing from the spirit of the invention or exceeding the scope of the invention as defined in the accompanying claims. Although terms like supply voltage are used more here, the possibility of using other terms is not excluded. These terms are used merely to more conveniently describe and explain the nature of the present invention; they are to be construed in a manner that is inconsistent with the spirit of the invention.
Claims (5)
1. A multichannel infrared detection device which characterized in that: the device comprises an MCU unit (1), an infrared emission circuit (2) which is connected with the MCU unit (1) and used for emitting infrared signals, a test data acquisition unit (4) which is electrically connected with the MCU unit (1), a PLC control unit (5) which is connected with the MCU unit (1), an industrial personal computer unit (6) which is connected with the MCU unit (1), a switching circuit unit (3) which is connected with the test data acquisition unit (4), and a plurality of infrared receiving heads which provide data for the switching circuit unit (3);
the infrared transmitting circuit (2) is used for transmitting an infrared signal; the switching circuit unit (3) is used for switching among a plurality of infrared receiving heads; the MCU unit (1) is used for processing the information of the units.
2. The multi-channel infrared detection device as claimed in claim 1, characterized in that the infrared emission circuit (2) comprises a chip U7, the pin No. 1 of which receives the analog signal of the MCU unit (1) through a resistor R23 and is grounded through a C15 filter capacitor; the No. 3 pin of the capacitor is grounded through a capacitor C16, the voltage of-150 mV is accessed through a resistor R18, and the resistor R25 is grounded; the No. 2 pin is connected with-150 mV voltage; the No. 5 pin is a chip power supply input pin and is connected with +5V voltage; the No. 6 pin of the PWM signal is connected to a PWM pulse modulation signal through a resistor R27; the signal is output to the grid of the MOS tube Q4 through a No. 4 pin and an R24 resistor, the source of the MOS tube Q4 is grounded through an R32 resistor, and the source is connected to the No. 5 pin of the operational amplifier U7B through a resistor R31; the operational amplifier U7B forms a simple first-order low-pass filter circuit through R33 and C20; the drain of the MOS transistor Q4 is connected to +10V voltage through a resistor R22 and a resistor R21.
3. The multi-channel infrared detection device as claimed in claim 2, wherein the test data acquisition unit (4) comprises an operational amplifier U2, an operational amplifier U1B, an operational amplifier U1A and a clamping chip D1, a No. 5 pin of the operational amplifier U2 receives an infrared receiving head signal through a resistor R1, the No. 5 pin is connected with a collector of a triode Q1 through a resistor R1 and a resistor R4, an emitter of the triode Q1 is grounded, and a base of the triode Q3624 is directly grounded through a resistor R8; the amplifier U1B adopts a voltage follower circuit, and the No. 6 pin of the operational amplifier U1B is directly connected with the No. 7 pin thereof;
the data of the No. 7 pin of the operational amplifier U1B is divided by a resistor R7 and a resistor R10 and then is sent to the No. 3 pin of the operational amplifier U1A; the No. 2 pin of the operational amplifier U1A is directly connected with the No. 1 pin; the pin U1A 8 No. 8 of the amplifier is connected with the voltage of +10V, and the pin 4 is connected with the voltage of-5V; the No. 1 pin outputs an IR-A signal to the No. 25 pin of the MCU unit (1) after first-order filtering through A resistor R9 and A resistor C3; pin 2 of the clamp chip D1 is connected to VPP, pin 3 is connected to IR- A signal, and pin 1 is connected to ground.
4. The multi-channel infrared detection device as claimed in claim 1, wherein the switching circuit unit comprises a chip U1 and a chip U2, and the MCU digital signal is decoded into a single-channel signal and sent to an actuator relay in the switching circuit through isolation.
5. The multi-channel infrared detection device according to claim 2, characterized in that the PLC control unit (5) and the industrial personal computer unit (6); the circuit comprises a chip U5 and a chip U6, wherein a No. 1 pin of the chip U5 is connected with 3.3V voltage, a No. 8 pin is connected with 5V voltage, a No. 2 pin and a No. 3 pin are connected with input and output serial port signals of an MCU unit (1), and a No. 4 pin and a No. 5 pin are directly grounded; the No. 7 pin is connected to the No. 5 pin of the chip U6, and the No. 6 pin is connected to the No. 4 pin of the chip U6;
the No. 3 pin of the chip U6 is grounded through a capacitor R8, and the No. 8 pin and the No. 1 pin are directly grounded; the No. 10 pin is connected with 5V voltage, the No. 6 pin and the No. 7 pin are connected with an industrial personal computer or a PLC serial port connector (J2), and the No. 9 pin is connected with a second pin through a capacitor C7; pin number 10 and pin number 11 of the connector (J2) are grounded.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920907494.XU CN209879730U (en) | 2019-06-17 | 2019-06-17 | Multi-channel infrared detection device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201920907494.XU CN209879730U (en) | 2019-06-17 | 2019-06-17 | Multi-channel infrared detection device |
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| CN209879730U true CN209879730U (en) | 2019-12-31 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114978325A (en) * | 2022-05-31 | 2022-08-30 | 天津市山石机器人有限责任公司 | Free space high frequency infrared light communication device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114978325A (en) * | 2022-05-31 | 2022-08-30 | 天津市山石机器人有限责任公司 | Free space high frequency infrared light communication device |
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