CN209823497U - Backup power supply of semiconductor test equipment - Google Patents
Backup power supply of semiconductor test equipment Download PDFInfo
- Publication number
- CN209823497U CN209823497U CN201920228782.2U CN201920228782U CN209823497U CN 209823497 U CN209823497 U CN 209823497U CN 201920228782 U CN201920228782 U CN 201920228782U CN 209823497 U CN209823497 U CN 209823497U
- Authority
- CN
- China
- Prior art keywords
- power supply
- module
- backup
- test equipment
- semiconductor test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B70/00—Technologies for an efficient end-user side electric power management and consumption
- Y02B70/30—Systems integrating technologies related to power network operation and communication or information technologies for improving the carbon footprint of the management of residential or tertiary loads, i.e. smart grids as climate change mitigation technology in the buildings sector, including also the last stages of power distribution and the control, monitoring or operating management systems at local level
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y04—INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
- Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
- Y04S20/00—Management or operation of end-user stationary applications or the last stages of power distribution; Controlling, monitoring or operating thereof
- Y04S20/20—End-user application control systems
Landscapes
- Stand-By Power Supply Arrangements (AREA)
Abstract
The utility model discloses a semiconductor test equipment's backup power supply unit, the device includes power module, power module control display module, local/backup selector switch module, relay module, its technical scheme main points provide a semiconductor test equipment's backup power supply, can reduce the number of times of failure of test equipment monitoring system power through inserting this backup power supply, reached and reduced the maintenance processing time after this power failure, be the improvement scheme that the start monitoring system power to semiconductor test equipment is difficult to detect.
Description
Technical Field
The utility model relates to a backup power supply, more specifically say, it relates to a semiconductor test equipment's backup power supply.
Background
Large semiconductor devices typically have a preference for the device's monitoring system (including but not limited to cooling system monitoring, smoke alarms, temperature sensing) to be activated before the run switch is activated. And the power supply of these monitoring system can be by the direct power supply access of factory power, receives the impact easily and appears the anomaly and lead to whole equipment unable work. These power supplies are generally installed in the entire power supply module of the test facility, making repair and maintenance difficult.
SUMMERY OF THE UTILITY MODEL
Not enough to prior art exists, the utility model aims to provide a semiconductor test equipment's backup power, its number of times that became invalid that can reduce test equipment monitoring system power reduces the maintenance process time after this power became invalid.
In order to achieve the above purpose, the utility model provides a following technical scheme:
a backup power supply for semiconductor test equipment. The power supply system comprises a first power supply module monitoring display module, a second power supply module monitoring display module, a local/backup selection switch module, a standby power supply working indicator lamp, an alternating current input indicator lamp, a first power supply module, a relay module, a second power supply module, a third power supply module, a cooling fan, a power supply box cover plate, an alternating current input/output interface and a main body frame. Wherein: the first power supply module monitoring display module and the second power supply module monitoring display module are positioned at the front end of the main body frame and are arranged in parallel, the standby power supply working display lamp and the alternating current input indicator lamp are positioned at the front end of the main body frame and are arranged in parallel, the local/backup selection switch module is positioned at the front end of the main body frame, the relay module is positioned in the main body frame and is positioned in front of the first power supply module, and the first power supply module, the second power supply module and the third power supply module are positioned in the backup power supply and are arranged in parallel and adopt a discrete module design; the cooling fan is positioned at the rear end of the main body frame; the outer surface of the cover plate of the power box is distributed with a plurality of strip-shaped through holes, and the alternating current input and output interface is positioned at the rear end of the main body frame and is used for connecting a power supply to supply power for the whole device.
Preferably, the alternating current input indicator lamp is internally connected with the alternating current input and output interface through a wire. The AC input indicator light indicates whether the power access is normal or not.
Preferably, the device is started when being started, a user uses a key switch to select to use the backup power supply or the local system as required, and the backup power supply and the local system are not started at the same time, so that power resources are not wasted.
Preferably, the first power module monitoring display module provides voltage output monitoring for the first power module, and the digital display screen displays the current output voltage.
Preferably, the second power module monitoring display module displays the output voltage for the second power module in real time, so that power attenuation can be checked in advance, and power problems can be prevented in advance.
Preferably, the first power supply module, the second power supply module and the third power supply module are arranged in parallel inside the backup power supply.
Preferably, the alternating current input indicator lamp is internally connected with the alternating current input and output interface through a wire.
To sum up, through adopting above-mentioned technical scheme, the utility model discloses following beneficial effect has:
1. the backup power supply or the original system can be easily selected to be used according to the requirement, and the use of the power supply of the original system is not influenced;
2. the indicator light indicates whether the power access is normal;
3. the backup power supply has voltage output monitoring function, and a digital display screen displays the current output voltage, so that a maintainer can conveniently and visually check whether the power supply has problems;
4. the backup power supply adopts a discrete module design, and is easy to maintain;
5. and the reserved voltage output interface can be connected to a data acquisition system parallel network for monitoring.
Drawings
FIG. 1 is a diagram: the structure schematic diagram of a backup power supply of the semiconductor test equipment;
FIG. 2 is a diagram of: a module schematic diagram of a backup power supply of a semiconductor test device;
FIG. 3 is a schematic view; a circuit schematic of a backup power supply of a semiconductor test device;
in the figure: 1. the first power supply module monitors the display module; 2. the second power supply module monitors the display module; 3. a local/backup selection switch module; 4. a standby power supply working indicator lamp; 5. an AC input indicator light; 6. a first power supply module; 7. a relay module; 8. a second power supply module; 9. a third power supply module; 10. a cooling fan; 11. a power box cover plate; 12. an AC input/output interface; 13. a main body frame.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
Example 1:
a backup power supply of semiconductor testing equipment refers to fig. 1 and comprises a first power supply module monitoring display module 1, a second power supply module monitoring display module 2, a local/backup selection switch module 3, a backup power supply working indicator lamp 4, an alternating current input indicator lamp 5, a first power supply module 6, a relay module 7, a second power supply module 8, a third power supply module 9, a cooling fan 10, a power supply box cover plate 11, an alternating current input and output interface 12 and a main body frame 13.
The first power module monitoring display module 1 and the second power module monitoring display module 2 are arranged in parallel at the front end of the main body frame 13. The first power supply module monitoring display module 1 and the second power supply module monitoring display module 2 are digital voltage measurement display modules. The first power supply module monitoring display module 1 provides voltage output monitoring for the first power supply module 6, and the current output voltage is displayed by the digital display screen. The second power module monitoring display module 2 displays the output voltage for the second power module 8 in real time, so that power attenuation can be checked in advance, and the problem of power supply can be prevented in advance.
The local/backup selection switch module 3 is an internal and external selection module and is positioned at the front end of the main body frame 13. Its internal conductor is connected to the third power module 9 and the other end conductor is connected to the relay module 7. The local/backup selection switch module 3 can easily select whether to use the backup power supply or the original system according to the requirement, and when the original system is selected, the use of the power supply of the original system is not influenced.
The standby power supply working indicator lamp 4 and the alternating current input indicator lamp 5 are arranged in parallel at the front end of the main body frame 13. The standby power supply working indicator lamp 4 is internally connected with the first power supply module monitoring display module 1 through a wire, and the indicator lamp is turned on when the standby power supply is selected. The inside of the AC input indicator lamp 5 is connected with the AC input/output interface 12 by a wire. The AC input indicator lamp 5 indicates whether the power connection is normal or not.
The first power supply module 6, the second power supply module 8 and the third power supply module 9 are arranged in parallel inside the backup power supply, and the discrete module design is adopted, so that the maintenance operation is convenient. The first power module 6 is a 24V power module, the second power module 8 is a 5V power module, and the third power module 9 is a 12V power module and supplies power to the cooling fan 10 and the relay module 7.
The relay module 7 is located inside the main body frame 13, in front of the first power supply module 6. When the backup power supply is selected, the third power supply module 9 is turned on, the relay module 7 is switched, and the first power supply module 6 and the second power supply module 8 are turned on. The cooling fan 10 is located at the rear end of the main body frame 13 to dissipate heat and cool the whole components. The ac input/output interface 12 is located at the rear end of the main body frame 13 for connecting to a power supply to supply power to the whole device. The outer surface of the power box cover plate 11 is distributed with a plurality of strip-shaped through holes, so that heat dissipation is facilitated.
The working principle is as follows:
referring to fig. 2 and 3, 208 vac is connected to a backup power supply through the ac input/output interface 12 at the back end of the main air switch of the test equipment, and is switched on when the equipment is started. A user uses the key switch to select to use the backup power supply or the local system as required, and the backup power supply and the local system are not started at the same time, so that power resources are not wasted. When the standby power supply working indicator lamp 4 is displayed in red, the standby power supply working indicator lamp indicates that a power supply is connected and an original system power supply is selected to work. When the backup power supply is selected, the third power supply module 9 is turned on, the relay module 7 is switched, and the first power supply module 6 and the second power supply module 8 are turned on. Meanwhile, the cooling fan 10 works to dissipate heat and cool the whole component. After the first power supply module 6 and the second power supply module 8 are started, the voltage required by the test system is output to the output interface for the test machine to use, and is also output to the standby interface for standby. The voltage measuring/monitoring module also monitors the output voltages of the first power module 6 and the second power module 8 and directly displays the values on the display screen. And the green indicator light is turned on to indicate that the backup power supply works.
The above-mentioned embodiments are merely illustrative of the present invention, and are not restrictive of the present invention, and those skilled in the art can modify the embodiments as required after reading the present specification, but only fall within the protection scope of the patent laws.
Claims (10)
1. A backup power supply of semiconductor test equipment comprises a first power supply module monitoring display module (1), a second power supply module monitoring display module (2), a local/backup selection switch module (3), a backup power supply working indicator lamp (4), an alternating current input indicator lamp (5), a first power supply module (6), a relay module (7), a second power supply module (8), a third power supply module (9), a cooling fan (10), a power supply box cover plate (11), an alternating current input/output interface (12) and a main body frame (13); the method is characterized in that: the first power supply module monitoring display module (1) and the second power supply module monitoring display module (2) are located at the front end of a main body frame (13) and are arranged in parallel, the standby power supply working indicator lamp (4) and the alternating current input indicator lamp (5) are located at the front end of the main body frame (13) and are arranged in parallel, the local/backup selection switch module (3) is located at the front end of the main body frame (13), the relay module (7) is located inside the main body frame (13) and is located in front of the first power supply module (6), and the first power supply module (6), the second power supply module (8) and the third power supply module (9) are located inside the backup power supply and are arranged in parallel and adopt a discrete module design; the cooling fan (10) is positioned at the rear end of the main body frame (13); the outer surface of the power box cover plate (11) is distributed with a plurality of strip-shaped through holes, and an alternating current input and output interface (12) is positioned at the rear end of the main body frame (13) and is used for connecting a power supply and supplying power to the whole device.
2. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: the first power supply module monitoring display module (1) and the second power supply module monitoring display module (2) are digital voltage measurement display modules.
3. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: the local/backup selection switch module (3) is an internal and external selection module, the internal lead of the local/backup selection switch module is connected with the third power module (9), and the lead at the other end of the local/backup selection switch module is connected with the relay module (7).
4. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: the standby power supply working indicator lamp (4) is internally connected with the first power supply module monitoring display module (1) through a lead.
5. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: the interior of the alternating current input indicator lamp (5) is connected with the alternating current input and output interface (12) through a conducting wire.
6. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: the first power supply module (6) is a 24V power supply module.
7. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: the second power supply module (8) is a 5V power supply module.
8. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: and the third power supply module (9) is a 12V power supply module and supplies power to the cooling fan (10) and the relay module (7).
9. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: a plurality of strip-shaped through holes are distributed on the outer surface of the power box cover plate (11), so that heat dissipation is facilitated.
10. The backup power supply of semiconductor test equipment as claimed in claim 1, wherein: the alternating current input and output interface (12) is located at the rear end of the main body frame (13) and used for being connected with a power supply, supplying power to the whole device and being capable of being connected to a data acquisition system for monitoring in a parallel network mode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920228782.2U CN209823497U (en) | 2019-02-22 | 2019-02-22 | Backup power supply of semiconductor test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920228782.2U CN209823497U (en) | 2019-02-22 | 2019-02-22 | Backup power supply of semiconductor test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209823497U true CN209823497U (en) | 2019-12-20 |
Family
ID=68873569
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920228782.2U Active CN209823497U (en) | 2019-02-22 | 2019-02-22 | Backup power supply of semiconductor test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209823497U (en) |
-
2019
- 2019-02-22 CN CN201920228782.2U patent/CN209823497U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108674690B (en) | Automatic testing equipment and testing method for electric accessories of hanging beam of certain type aircraft | |
| CN104394406A (en) | Detection system and method applicable to AC startup and shutdown test of television | |
| CN107680520A (en) | The diagnostic method of Precise Diagnosis LED failure on a kind of intelligent APP lines | |
| CN207198255U (en) | A kind of power supply changeover device batch aging test device | |
| CN101975904A (en) | System for intelligently detecting high temperature aging of electronic assembly | |
| CN110061318B (en) | Storage battery cabinet and control method thereof | |
| CN209823497U (en) | Backup power supply of semiconductor test equipment | |
| CN105629188A (en) | Nuclear power plant inverter voltage monitoring card integrated test system and test method | |
| KR101417897B1 (en) | Apparatus of measuring the partial discharge and method for measuring the same | |
| CN218003646U (en) | Protector for PLC control detection line | |
| CN114966280A (en) | Electric power supply real-time monitoring system | |
| CN211785917U (en) | High-temperature reverse-bias test monitoring cabinet | |
| CN210119299U (en) | Camera device for multi-point temperature detection | |
| CN204044743U (en) | Power inverter agingtable | |
| CN105510858A (en) | Inverter static bypass switch voltage monitoring card work performance test system and inverter static bypass switch voltage monitoring card work performance test method | |
| CN109450491B (en) | Cable modem system capable of monitoring temperature and implementation method thereof | |
| CN201852890U (en) | Intelligent detecting system for high-temperature aging of electronic component | |
| CN205593667U (en) | System for carry out temperature measurement to cable termination | |
| CN215066959U (en) | Railway signal grounding detection device | |
| CN212989526U (en) | Intelligent PT on-line measurement and control device | |
| CN220017307U (en) | Electric wire netting dispatch debugging overhauls searchlighting device | |
| CN210803577U (en) | Structure for monitoring working voltage of liquid crystal display screen panel | |
| CN217403509U (en) | Electrical control cabinet inspection platform system | |
| CN215071802U (en) | 61850 standard-based intelligent protocol conversion device and system | |
| CN215871249U (en) | KYCK-153 synchronous machine control device shell structure |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |