CN209764715U

CN209764715U - Fourier transform infrared spectrometer ATR accessory sample thickness control device

Info

Publication number: CN209764715U
Application number: CN201920136674.2U
Authority: CN
Inventors: 侯福金; 辛公锋; 高宾; 宁廷才; 任瑞波; 王鹏; 王鑫洋; 徐昊; 刘红
Original assignee: Shandong Expressway Jilai Intercity Highway Co Ltd; Shandong Hi Speed Engineering Inspection and Testing Co Ltd
Current assignee: Shandong Expressway Jilai Intercity Highway Co Ltd; Shandong Hi Speed Engineering Inspection and Testing Co Ltd
Priority date: 2019-01-25
Filing date: 2019-01-25
Publication date: 2019-12-10
Anticipated expiration: 2029-01-25

Abstract

The utility model provides a Fourier transform infrared spectroscopy ATR annex sample thickness control device, its characteristics are fixed measuring tool on the ATR annex, combine the elevating gear on the ATR annex, realize the accurate control to the pitch sample thickness that awaits measuring indirectly through the accurate control to the lift of ATR annex entablature. The sample thickness control device basically does not change the structural change and the appearance change of the original ATR accessory, has small influence on the structure of the original accessory, and has simple assembly process and strong practicability. The device can realize the accurate control to the pitch sample thickness that awaits measuring, realizes the thickness detection such as pitch sample, can guarantee that the thickness of the pitch sample that awaits measuring is greater than the degree of depth that infrared instrument incident light can pierce through the sample that awaits measuring for the information of the pitch sample that awaits measuring is by abundant collection.

Description

Fourier transform infrared spectrometer ATR accessory sample thickness control device

Technical Field

The utility model relates to a sample thickness control field especially relates to a Fourier transform infrared spectroscopy ATR annex sample thickness control device.

Background

The infrared spectrum technology is an effective means in qualitative analysis and quantitative analysis of petroleum asphalt, the method has the advantages of convenience, rapidness and accuracy, good application effect and economic benefit are obtained in rapid analysis of petroleum products, and the method is applied more and more in quality control of road asphalt and is accepted by the industry more and more.

The ATR method, attenuated total reflectance infrared spectroscopy, is an important method for conducting infrared tests. The test was completed using the self-contained ATR accessory of the bruker sensor series fourier transform infrared spectrometer. The ATR method for measuring the asphalt sample has the advantages of simple sample preparation, no damage to the sample and no special requirements on the size, the shape and the water content of the sample; in addition, the method can realize in-situ test and real-time tracking. Therefore, the method is the best choice for testing amorphous samples, the ATR method is simple to operate, the characteristic peak of a spectrogram is obvious, and the method is relatively suitable for quickly testing asphalt.

The ATR accessory is designed based on the principle of light internal reflection, when infrared light emitted by a light source is refracted to the surface of a sample with a small refractive index through a crystal with a large refractive index, and when the incident angle is larger than a critical angle, the incident light can generate total reflection. In practice, the infrared light is not totally reflected, but penetrates into the sample surface to a certain depth and returns to the surface. In the process, the sample has selective absorption in the incident light frequency region, the reflected light intensity is weakened, and a spectrogram similar to the projection absorption is generated, so that the structural information of the chemical components on the surface layer of the sample is obtained. The depth to which an incident ray penetrates the sample depends on the refractive index of the crystal, the refractive index of the sample, the wavelength of the incident ray, and the angle of incidence of the ray at the crystal surface. When the crystal material is ZnSe, the incident depth of the light of the petroleum asphalt is 0.3-2 μm, and the deeper the incident light penetrates through the surface of the sample, the richer the acquired information is; the incident light penetrates through the sample at different depths, and the representativeness of the sample information reflected on the spectrogram is also different; therefore, the thickness of the asphalt sample to be measured is a variable which has to be considered, but the existing ATR accessory cannot realize accurate thickness control on the asphalt sample to be measured.

In each experiment, firstly, one more thickness variable is added to the experiment to influence the experiment result due to the inconsistent thickness of the tested asphalt sample; secondly, when the thickness of the measured asphalt sample is smaller than the depth of the incident light penetrating through the asphalt sample, the problem that a spectrogram cannot collect sample information to the maximum extent is caused.

Disclosure of Invention

To the problem, the utility model provides a Fourier transform infrared spectroscopy ATR annex sample thickness control device, including depth chi, crossbeam, main scale, elevating gear, digital display screen, depression bar, optical bench and base. The device is fixed at the ATR accessory through a measuring tool, and is combined with a lifting part on the ATR accessory to indirectly realize the accurate control of the thickness of the asphalt sample to be measured through the accurate control of the lifting of an upper beam of the ATR accessory.

The utility model discloses a concrete technical scheme is:

The depth scale is positioned at the lower side of the main scale and connected with the main scale, and a digital display screen is arranged on the main scale; the lifting device is arranged on a platform of the base, the cross beam is sleeved on the main scale, the front end of the cross beam is provided with a pressure rod, and the tail end of the cross beam is fixed on a vertical rail of the lifting device; the optical table and the depth gauge are vertically fixed on a platform of the base;

The digital display screen is provided with a switch (OFF/ON) button and a ZERO clearing (ZERO) button, so that the beam can be cleared at any height within a certain height range.

During the operation, place the base and operate on the horizontally laboratory bench, adjustment depth chi makes its vertical fixation on the platform of base, the sample that will await measuring is placed on the optical bench, control elevating gear makes the crossbeam descend to suitable height, then the height of adjustment depression bar, make the bottom of depression bar and the crystal on the optical bench contact completely, both distances zero with the digital display screen zero clearing, then keep the depression bar unchangeable, control elevating gear raises the crossbeam, put the sample that awaits measuring according to the experiment requirement on the crystal of optical bench, control elevating gear landing crossbeam, along with the contact of depression bar and sample, the decline of limit reading limit slowly control elevating gear, make sample thickness reach the thickness that the experiment required can stop descending, begin follow-up experiment.

To sum up, the utility model discloses a this measuring device has realized the digital survey to the thickness of the pitch sample that awaits measuring, and the thickness that can guarantee the pitch sample is greater than the thickness that the infrared ray can pierce through the sample, and the thickness that also can guarantee the pitch sample is that the infrared ray can pierce through a definite value in the sample thickness, and this kind of thickness control device has the simplicity.

Drawings

Fig. 1 is a schematic structural diagram of an ATR accessory sample thickness control device of a fourier transform infrared spectrometer of the present invention;

In the figure: 1 is the depth gauge, 2 is the crossbeam, 3 is the main scale, 4 is elevating gear, 5 is the digital display screen, 6 is the depression bar, 7 is the optical bench, 8 is the base.

Detailed Description

Referring to fig. 1, the utility model provides a pair of fourier transform infrared spectrometer ATR annex sample thickness controlling means, including depth chi 1, crossbeam 2, main scale 3, elevating gear 4, digital display screen 5, depression bar 6, optical bench 7 and base 8. The depth scale 1 is positioned at the lower side of the main scale 3 and connected with the main scale 3, and the main scale 3 is provided with a digital display screen 5; the lifting device 4 is arranged on a platform of the base 8, the cross beam 2 is sleeved on the main scale 3, the front end of the cross beam 2 is provided with a pressure lever 6, and the tail end of the cross beam is fixed on a vertical track of the lifting device 4; the optical bench 7 and the depth gauge 1 are vertically fixed on a platform of the base 8; the digital display screen 5 is provided with a switch (OFF/ON) button and a ZERO clearing (ZERO) button.

During operation, the base 8 is placed on a horizontal experiment table for operation, the depth ruler 1 is adjusted to be vertically fixed on a platform of the base 8, a sample to be tested is placed on the optical table 7, the lifting device 4 is controlled to enable the cross beam 2 to descend to a proper height, then the height of the pressing rod 6 is adjusted, the bottom of the pressing rod 6 is enabled to be in complete contact with a crystal on the optical table 7, the distance between the bottom of the pressing rod 6 and the crystal on the optical table 7 is zero, the digital display screen 5 is cleared, then the pressing rod 6 is kept unchanged, the lifting device 4 is controlled to lift the cross beam 2, the sample to be tested is placed on the crystal of the optical table 7 according to experiment requirements, the lifting device 4 is controlled to descend the cross beam 2, along with the contact between the pressing rod 6 and the sample, the lifting device 4 is slowly descende.

Claims

1. The utility model provides a Fourier transform infrared spectrometer ATR annex sample thickness controlling means, includes depth chi (1), crossbeam (2), main scale (3), elevating gear (4), digital display screen (5), depression bar (6), optical bench (7) and base (8), its characterized in that: the depth scale (1) is positioned at the lower side of the main scale (3) and connected with the main scale (3), and a digital display screen (5) is arranged on the main scale (3); the lifting device (4) is arranged on a platform of the base (8), the cross beam (2) is sleeved on the main scale (3), the front end of the cross beam (2) is provided with a pressure lever (6), and the tail end of the cross beam is fixed on a vertical rail of the lifting device (4); the optical table (7) and the depth gauge (1) are vertically fixed on a platform of the base (8).

2. The ATR accessory sample thickness control device of a fourier transform infrared spectrometer as claimed in claim 1, wherein: and a switch button and a zero clearing button are arranged on the digital display screen (5).