CN209746895U - Integrated circuit teaching test platform - Google Patents

Integrated circuit teaching test platform Download PDF

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Publication number
CN209746895U
CN209746895U CN201920112163.7U CN201920112163U CN209746895U CN 209746895 U CN209746895 U CN 209746895U CN 201920112163 U CN201920112163 U CN 201920112163U CN 209746895 U CN209746895 U CN 209746895U
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China
Prior art keywords
integrated circuit
test
test platform
circuit teaching
display
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Active
Application number
CN201920112163.7U
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Chinese (zh)
Inventor
徐振
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Hangzhou Langxun Technology Co ltd
Original Assignee
HANGZHOU LUNTEK TECHNOLOGY Co Ltd
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Priority to CN201920112163.7U priority Critical patent/CN209746895U/en
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Abstract

The utility model discloses an integrated circuit teaching test platform, include: the device comprises a rack, an industrial personal computer, a test module for testing the integrated circuit, a display and a multi-path special power supply for supplying power to the industrial personal computer, the test module and the display; the industrial personal computer, the test module and the multi-path special power supply are arranged inside the rack; the display is mounted to the outside of the frame; the industrial personal computer, the test module and the display are electrically connected to the multi-path special power supply; the frame includes: the device comprises two beam frames, a position-adjustable laminate and a mounting frame; the beam frame is provided with a plurality of mounting holes; the laminate is detachably mounted in the mounting hole; the mounting rack is rotatably connected to the outer side of the rack; the display is mounted to the mounting bracket; the test module comprises a test mainboard, a guide rail and a test machine experiment board; the guide rail and the test machine experiment plate are fixed to the laminate; the test main board is connected to the guide rail in a sliding manner; the test mainboard is electrically connected to the test machine experiment board. The integrated circuit teaching test platform is small in size and convenient to install.

Description

integrated circuit teaching test platform
Technical Field
The utility model relates to an integrated circuit teaching test platform.
Background
The integrated circuit teaching test platform is a high-performance integrated circuit tester for testing integrated circuit products such as digital chips, analog chips and the like. The traditional integrated circuit testing machine adopts an independent practical training platform and an independent practical training frame, and two sets of equipment are matched for use, so that the integrated circuit testing machine is large in size, heavy and high in cost, simultaneously provides higher requirements for an experimental field, and cannot place a plurality of sets of equipment in a smaller laboratory.
SUMMERY OF THE UTILITY MODEL
The utility model provides an integrated circuit teaching test platform adopts following technical scheme:
an integrated circuit teaching test platform comprising: the device comprises a rack, an industrial personal computer, a test module for testing an integrated circuit, a display for user input operation, and a multi-path special power supply for supplying power to the industrial personal computer, the test module and the display; the industrial personal computer, the test module and the multi-path special power supply are arranged inside the rack; the display is mounted to the outside of the frame; the industrial personal computer, the test module and the display are electrically connected to the multi-path special power supply; the frame includes: the device comprises two beam frames, a position-adjustable laminate and a mounting frame; the beam frame is provided with a plurality of mounting holes; the laminate is detachably mounted in the mounting hole; the mounting rack is rotatably connected to the outer side of the rack; the display is mounted to the mounting bracket; the test module comprises a test mainboard, a guide rail and a test machine experiment board; the guide rail and the test machine experiment plate are fixed to the laminate; the test main board is connected to the guide rail in a sliding manner; the test mainboard is electrically connected to the test machine experiment board.
Furthermore, the industrial personal computer, the test module and the multi-path special power supply are sequentially arranged in the rack from top to bottom in the vertical direction.
Further, the two beam frames are arranged in parallel in the vertical direction.
Further, a plurality of mounting holes of the beam frame are arranged in a straight line in the vertical direction; the mounting holes of the two beam frames correspond to one another.
Further, the frame still includes: the door comprises a door panel, two side plates and a back plate; the two side plates are respectively connected with the door plate and the back plate; beam frames are respectively formed or mounted on the two side plates.
Further, the display is rotatably connected to the side plates through a mounting frame; the display has an operative position perpendicular to the side panels and a stowed position parallel to the side panels.
Further, the integrated circuit teaching test platform further comprises: a coded lock; the combination lock is mounted to the door panel.
Further, the integrated circuit teaching test platform further comprises: an experiment resource box for accommodating experiment tools or materials; the two sides of the experiment resource box are respectively connected to the two side plates in a sliding mode.
Further, the integrated circuit teaching test platform further comprises: the system comprises a heat dissipation grid and a heat dissipation fan, wherein the heat dissipation grid is used for dissipating heat of an industrial personal computer and a test module positioned below the industrial personal computer, and the heat dissipation fan is used for dissipating heat of a plurality of paths of special power supplies so as to ensure normal operation of an integrated circuit teaching test platform; the heat dissipation grid is arranged at the upper end of the rack; the heat radiation fan is arranged on the multi-path special power supply.
Further, the integrated circuit teaching test platform further comprises: a plurality of universal wheels for facilitating movement of the housing by a user; a plurality of universal wheels are mounted to the underside of the frame.
the utility model discloses an useful part lies in that the integrated circuit teaching test platform who provides will test integrated circuit's test module, main control computer and multichannel special power supply integration in the frame, has effectively reduced the volume, has saved installation space. And the plywood can be according to the size of the inside test module of frame along vertical direction upper and lower adjusting position to the not test module of equidimension in installation, the commonality is higher.
drawings
Fig. 1 is a schematic diagram of an integrated circuit teaching test platform according to the present invention;
FIG. 2 is a schematic diagram of another perspective of the integrated circuit teaching test platform of FIG. 1;
FIG. 3 is a schematic view of the integrated circuit teaching test platform of FIG. 1 with the door panel removed;
FIG. 4 is a schematic diagram of the integrated circuit teaching test platform of FIG. 2 with the backplane removed.
The integrated circuit teaching test platform comprises an integrated circuit teaching test platform 10, a rack 11, a beam frame 12, a mounting hole 13, a layer plate 14, a door plate 15, a side plate 16, a mounting rack 18, an industrial personal computer 19, a test mainboard 20, a guide rail 21, a test machine experiment plate 22, a display 23, a multi-path special power supply 24, a coded lock 25, an experiment resource box 26, a heat dissipation grid 27, a handle 29, a heat dissipation fan 30, a second heat dissipation fan 31, an air switch 32, a filter 33, a power supply terminal 34, a special power supply switch 35, a 220V output port 36, a 220V input port 37, an indicator light 38, a test module power supply switch 39, a switching port 42, a USB interface 43, a slot 44, a keyboard 45, a test.
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings and specific embodiments.
As shown in fig. 1 to 4, an integrated circuit teaching test platform 10 includes: the device comprises a rack 11, an industrial personal computer 19, a test module, a display 23 and a multi-path special power supply 24. The test die may be used to test an integrated circuit. The display 23 is used for user input operations. The multi-path special power supply 24 is used for supplying power to the industrial personal computer 19, the test module and the display 23. Specifically, the industrial personal computer 19, the test module, and the multi-path dedicated power supply 24 are installed inside the rack 11. The display 23 is mounted to the outside of the chassis 11. The industrial personal computer 19, the test module and the display 23 are electrically connected to the multi-path special power supply 24.
The frame 11 includes: two beam mounts 12, a deck 14 and a mounting bracket 18.
the position of the layer 14 can be adjusted. Specifically, the beam frame 12 is formed with a plurality of mounting holes 13, and the layer plate 14 is detachably mounted into the mounting holes 13 so as to achieve position adjustment of the layer plate 14. Preferably, two beam frames 12 are arranged in parallel in the vertical direction so that the layer plate 14 can be adjusted up and down in the vertical direction, so that the installation space of the test module can be adjusted according to the size of the test module.
More specifically, the plurality of mounting holes 13 of the beam frames 12 are aligned in a straight line in the vertical direction, and the plurality of mounting holes 13 of two beam frames 12 correspond one-to-one.
The display 23 is rotatably mounted to the outside of the housing 11 for easy use by a user. In particular, the mounting frame 18 is rotatably connected to the outside of the frame 11. A display 23 is mounted to the mounting bracket 18. The display 23 has an operative position perpendicular to the side panels 16 and a stowed position parallel to the side panels 16. When the display 23 is required for use in conducting a test on the integrated circuit, the display 23 is moved to an operative position. After the test is completed, the display 23 is rotated back to the storage position.
In this embodiment, the display 23 is further provided with a display holder 47, a keyboard 45, and a mouse. The keyboard 45 and mouse are placed on the display stand 47. The user rotates the display 23 to the working position while using the display 23, and inputs an operation through the keyboard 45 and the mouse.
The test module comprises a test main board 20, a guide rail 21 and a tester experiment board 22. The rail 21 and the tester test board 22 are fixed to the layer board 14 by bolts. The test main board 20 is slidably coupled to the guide rails 21 to adjust the position of the test main board 20. The test motherboard 20 is electrically connected to the tester test board 22. Specifically, the guide rail 21 guides the movement direction of the test main board 20 to move perpendicularly to the side board 16. The test main board 20 is connected to the tester test board 22 through a patch.
As an embodiment, the industrial personal computer 19, the test module and the multi-path dedicated power supply 24 are sequentially installed in the rack 11 from top to bottom in the vertical direction. In this way, the test module may be placed in a suitable location for use by a user.
As a preferred embodiment, the frame 11 further comprises: a door panel 15, two side panels 16 and a back panel. The two side plates 16 are connected to the door panel 15 and the back plate, respectively. The two side plates 16 are respectively formed with beam frames 12.
Alternatively, the side plates and the beam frame may be separate bodies, and the beam frame is attached to the side plates.
In a preferred embodiment, the display 23 is pivotally attached to the side panels 16 by means of mounting brackets 18.
As a preferred embodiment, the integrated circuit teaching test platform 10 further comprises: a combination lock 25. The combination lock 25 includes two unlocking modes, digital unlocking and fingerprint unlocking. After the combination lock 25 is unlocked, the user can open the door 15 to operate the test module inside the rack 11. Specifically, the combination lock 25 is mounted on the outside of the door panel 15.
as a preferred embodiment, the integrated circuit teaching test platform 10 further comprises: the resource box 26 is verified. The experimental resource box 26 is used to house experimental tools or materials. The two sides of the test resource box 26 are respectively connected with the two side plates 16 in a sliding way so as to facilitate the user to pull out the test resource box 26 when in use, thereby realizing the placement or the taking of articles.
Further, the experimental resource box 26 is also provided with a handle 29. The user can pull out the verification resource box 26 by holding the pull handle 29.
as a preferred embodiment, the integrated circuit teaching test platform 10 further comprises: a heat dissipation grid 27 and a heat dissipation fan 30. The heat dissipation grid 27 is used for dissipating heat of the industrial personal computer 19 and the test modules located below the industrial personal computer 19. The heat dissipation fan 30 is used for dissipating heat of the multi-path dedicated power supply 24 to ensure the normal operation of the integrated circuit teaching test platform 10. Specifically, a heat dissipation grill is provided at the upper end of the chassis 11. The heat radiation fan 30 is mounted to the multiple dedicated power supply 24.
Further, the multi-channel dedicated power supply 24 includes 4 power supply terminals 34, and can simultaneously supply power to a plurality of components. The multiple dedicated power supply 24 includes a power supply housing. A special power switch 35 is arranged on the power supply shell. The user can control whether the multiple dedicated power supplies 24 supply power or not through the power switch. The power supply housing is also provided with 4-way 220V output port 36 and 220V input port 37. The multi-channel dedicated power supply 24 supplies power to external components through the 4-channel 220V output port 36. The multiple dedicated power supplies 24 may also be charged through the 220V input port 37 to facilitate testing at any time. The heat dissipation fan 30 is mounted to the power supply housing.
As a preferred embodiment, the integrated circuit teaching test platform 10 further comprises: a plurality of universal wheels 28. A plurality of universal wheels 28 are mounted to the underside of the frame 11 to facilitate movement of the frame 11 by a user.
In this embodiment, the door panel 15 is further provided with an indicator lamp 38 and a test module power switch 39 for displaying the operation condition of the internal test module. The test module power switch 39 may be turned on when testing of the integrated circuit is required. The test module power switch 39 may be closed when testing of the integrated circuit is finished. In this way, the test module can be protected and electrical energy can be saved.
integrated circuit teaching test platform 10 also includes air switch 32 and filter 33.
The integrated circuit teaching test platform 10 is further provided with a second cooling fan 31. The second heat dissipation fan 31 can dissipate heat from the filter 33.
The lower part of the integrated circuit teaching test platform 10 is also provided with a switching interface 42 and a USB interface 43.
The side plate 16 of the integrated circuit teaching test platform 10 is also provided with a test box 46. The test cartridge 46 is provided with a slot 44.
When integrated circuit teaching test platform 10 carries out the integrated circuit test, heat dissipation grid, radiator fan 30 and second radiator fan 31 dispel the heat to industrial computer 19 and test module from the upper end respectively, dispel the heat to multichannel special power supply 24 from the middle part to and dispel the heat to filter 33 from the below, make industrial computer 19, test module and multichannel special power supply 24 in the frame 11 can steady operation, have guaranteed the stability of test.
The foregoing illustrates and describes the principles, general features, and advantages of the present invention. It should be understood by those skilled in the art that the above embodiments do not limit the present invention in any way, and all technical solutions obtained by adopting equivalent replacement or equivalent transformation fall within the protection scope of the present invention.

Claims (10)

1. An integrated circuit teaching test platform, comprising: the device comprises a rack, an industrial personal computer, a test module for testing an integrated circuit, a display for user input operation, and a multi-path special power supply for supplying power to the industrial personal computer, the test module and the display; the industrial personal computer, the test module and the multi-path special power supply are arranged inside the rack; the display is mounted to an outer side of the chassis; the industrial personal computer, the test module and the display are electrically connected to the multi-path special power supply; the frame includes: the device comprises two beam frames, a position-adjustable laminate and a mounting frame; the beam frame is provided with a plurality of mounting holes; the laminate is detachably mounted in the mounting hole; the mounting rack is rotatably connected to the outer side of the rack; the display is mounted to the mount; the test module comprises a test main board, a guide rail and a test machine experiment board; the guide rail and the test machine experiment plate are fixed to the laminate; the test main board is connected to the guide rail in a sliding mode; the test mainboard is electrically connected to the test machine experiment board.
2. The integrated circuit teaching test platform of claim 1 wherein;
The industrial personal computer, the test module and the multi-path special power supply are sequentially arranged in the rack from top to bottom in the vertical direction.
3. The integrated circuit teaching test platform of claim 1 wherein;
the two beam frames are arranged in parallel along the vertical direction.
4. the integrated circuit teaching test platform of claim 3 wherein;
A plurality of the mounting holes of the beam frame are arranged in a straight line in the vertical direction; the mounting holes of the two beam frames correspond to one another.
5. The integrated circuit teaching test platform of claim 1 wherein;
The frame further includes: the door comprises a door panel, two side plates and a back plate; the two side plates are respectively connected with the door plate and the back plate; the beam frames are respectively formed or installed on the two side plates.
6. The integrated circuit teaching test platform of claim 5 wherein;
The display is rotatably connected to the side plates through the mounting frame; the display has an operating position perpendicular to the side panels and a storage position parallel to the side panels.
7. the integrated circuit teaching test platform of claim 5 wherein;
The integrated circuit teaching test platform further comprises: a coded lock; the combination lock is mounted to the door panel.
8. The integrated circuit teaching test platform of claim 5 wherein;
The integrated circuit teaching test platform further comprises: an experiment resource box for accommodating experiment tools or materials; and two sides of the experiment resource box are respectively connected to the two side plates in a sliding manner.
9. The integrated circuit teaching test platform of claim 1 wherein;
the integrated circuit teaching test platform further comprises: the heat dissipation grid is used for dissipating heat of the industrial personal computer and the test module positioned below the industrial personal computer, and the heat dissipation fan is used for dissipating heat of the multi-path special power supply so as to ensure normal operation of the integrated circuit teaching test platform; the radiating grid is arranged at the upper end of the rack; the heat dissipation fan is mounted to the multi-path dedicated power supply.
10. The integrated circuit teaching test platform of claim 1 wherein;
The integrated circuit teaching test platform further comprises: a plurality of universal wheels for facilitating movement of the housing by a user; a plurality of the universal wheels are mounted to the underside of the frame.
CN201920112163.7U 2019-01-23 2019-01-23 Integrated circuit teaching test platform Active CN209746895U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920112163.7U CN209746895U (en) 2019-01-23 2019-01-23 Integrated circuit teaching test platform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920112163.7U CN209746895U (en) 2019-01-23 2019-01-23 Integrated circuit teaching test platform

Publications (1)

Publication Number Publication Date
CN209746895U true CN209746895U (en) 2019-12-06

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CN201920112163.7U Active CN209746895U (en) 2019-01-23 2019-01-23 Integrated circuit teaching test platform

Country Status (1)

Country Link
CN (1) CN209746895U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111583077A (en) * 2020-05-26 2020-08-25 河北工业职业技术学院 Integrated teaching system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111583077A (en) * 2020-05-26 2020-08-25 河北工业职业技术学院 Integrated teaching system

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Address after: 310059 room e5029, 5 / F, building 1 (South), No. 368, Liuhe Road, Binjiang District, Hangzhou, Zhejiang Province

Patentee after: Hangzhou Langxun Technology Co.,Ltd.

Address before: 5F, South Building, Haichuang Base, No. 368 Liuhe Road, Binjiang District, Hangzhou City, Zhejiang Province, 310000

Patentee before: HANGZHOU LUNTEK TECHNOLOGY Co.,Ltd.