CN209624725U - Intensive solder joint fixed point location probe contact function test fixture can be achieved in one kind - Google Patents
Intensive solder joint fixed point location probe contact function test fixture can be achieved in one kind Download PDFInfo
- Publication number
- CN209624725U CN209624725U CN201920050838.XU CN201920050838U CN209624725U CN 209624725 U CN209624725 U CN 209624725U CN 201920050838 U CN201920050838 U CN 201920050838U CN 209624725 U CN209624725 U CN 209624725U
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- China
- Prior art keywords
- plate
- testing needle
- pedestal
- solder joint
- upper plate
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Abstract
The utility model discloses one kind, and intensive solder joint fixed point location probe contact function test fixture can be achieved, including pedestal, backboard is connected on rear side of the pedestal, the bottom end of backboard passes through upper plate by guide rod and connect with pedestal, backboard is equipped with parallel vertical chute, vertical chute is connected with slide plate by height adjustment knob, hole location on slide plate is rotatably connected to manual handle by axis, bolt is stamped by fixed block and is fixedly connected with upper plate in the bottom of pressing push rod, the right side of upper plate is equipped with downward testing needle A, upper plate is arranged right below middle plate, middle plate is connect by sliding guide column with lower plate, the position of the testing needle A of face is equipped with the testing needle B set up on the right side of lower plate, lower plate is fixed on the surface of pedestal.Intensive solder joint fixed point location probe contact function test fixture can be achieved in this, due to avoiding the damage of artificial Rewelding bring terminal product by the way of the contact of solder joint probe, mitigates human body operation intensity and relieves fatigue damage, save human cost.
Description
Technical field
The utility model relates to test fixtures, and in particular to intensive solder joint fixed point location probe contact function can be achieved in one kind
It can test fixture.
Background technique
Especially there are more and more special connector connectors on mobile phone market at present, contains complicated chip goods PCB
Processing technology, function is complicated, and difficulty of processing is also relatively high, and test is the difficult point of many factories again.
Prior art problem point: product not can avoid in process of production will appear undesirable product, and this product is to need
Core wire is soldered to connector pcb board solder joint and is just able to achieve complete functional test.
It has the following deficiencies:
One, terminal needs human weld's core wire just and can be carried out functional test judgement.
Two, even if the good connector of function, secondary or multiple welding are easy to cause the damage of connector.
Three, test is completed to need hand disassembly terminal and connecting line, it is also possible to cause a certain proportion of damage.
Four, test request is high, and there is certain welding and the talent of test experience can complete this work.
Five, the time that welding test front and back needs is long, determines low efficiency, and need to dismantle core wire repeatedly, spends human and material resources！
Utility model content
The purpose of this utility model is to provide one kind, and intensive solder joint fixed point location probe contact functional test can be achieved
Jig, to solve the problems mentioned in the above background technology.
To achieve the above object, the utility model provides the following technical solutions: intensive solder joint fixed point location can be achieved in one kind
Probe contact function test fixture, including pedestal are connected with backboard on rear side of the pedestal, and the bottom end of backboard is worn by guide rod
Upper plate to be crossed to connect with pedestal, backboard is equipped with parallel vertical chute, and vertical chute is connected with slide plate by height adjustment knob,
Hole location on slide plate is rotatably connected to manual handle by axis, and the hole location of manual handle is connected by one end of pin shaft and connector
It connects, the other end of connector is connected with pressing push rod by pin shaft, and the bottom of pressing push rod is stamped bolt by fixed block and fixed
It is connected with upper plate, the right side of upper plate is equipped with downward testing needle A, and upper plate is arranged right below middle plate, and middle plate passes through sliding guide column
It is connect with lower plate, the position of the testing needle A of face is equipped with the testing needle B set up on the right side of lower plate, and lower plate is fixed on pedestal
Surface.
Preferably, the right part of the upper plate is equipped with testing needle cable-through hole close to the position of testing needle A.
Preferably, the position of right side the face testing needle A and testing needle B of the middle plate are equipped with clearance position, and table on middle plate
Face is equipped with fixing groove.
Preferably, the front of the pedestal is equipped with external apparatus interface.
The technical effect and advantage of the utility model: intensive solder joint fixed point location probe contact functional test can be achieved in this
Jig, using brand-new design fixed point location contact type probe test device, easy to operate, tested terminal product can be placed directly in
On jig locating slot, wind under light press makes the top and bottom probe of fixed point location while contacting to survey needed for pcb board upper and lower surface
The function solder joint of examination；Due to avoiding the damage of artificial Rewelding bring terminal product by the way of the contact of solder joint probe,
Mitigate human body operation intensity and relieve fatigue damage, secondly, function when probe contact functional test efficiency is much higher than human weld
Test realizes that efficiency and quality are all promoted, to reach saving human cost.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the utility model；
Fig. 2 is the right view of the utility model.
In figure: 1 pedestal, 2 backboards, 3 manual handles, 4 vertical chutes, 5 height adjustment knobs, 6 connectors, 7 guide rods, 8 pressures
Close push rod, 9 upper plates, 10 fixing grooves, 11 sliding guide columns, plate in 12,13 lower plates, 14 testing needle cable-through holes, 15 clearance positions, outside 16
Equipment interface, 17 testing needle A, 18 testing needle B, 19 slide plates, 20 fixed blocks.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
Every other embodiment obtained, fall within the protection scope of the utility model.
The utility model, which provides one kind as shown in Figs. 1-2, can be achieved intensive solder joint fixed point location probe contact function
Test fixture, including pedestal 1, the rear side of the pedestal 1 are connected with backboard 2, the bottom end of backboard 2 by guide rod 7 pass through upper plate 9 with
Pedestal 1 connects, and backboard 2 is equipped with parallel vertical chute 4, and vertical chute 4 is connected with slide plate 19 by height adjustment knob 5,
Hole location on slide plate 19 is rotatably connected to manual handle 3 by axis, and the hole location of manual handle 3 passes through pin shaft and the one of connector 6
The other end of end connection, connector 6 is connected with pressing push rod 8 by pin shaft, and the bottom of pressing push rod 8 is stamped by fixed block 20
Bolt is fixedly connected with upper plate 9, and the right side of upper plate 9 is equipped with downward testing needle A 17, and upper plate 9 is arranged right below middle plate 12,
Middle plate 12 is connect by sliding guide column 11 with lower plate 13, and the position of the testing needle A 17 of 13 right side face of lower plate, which is equipped with, to be set up
Testing needle B 18, lower plate 13 is fixed on the surface of pedestal 1.
The right part of the upper plate 9 is equipped with testing needle cable-through hole 14, the right side of the middle plate 12 close to the position of testing needle A 17
The position of side face testing needle A 17 and testing needle B 18 is equipped with clearance position 15, and 12 upper surface of middle plate is equipped with fixing groove 10, institute
The front for stating pedestal 1 is equipped with external apparatus interface 16, including but not limited to loudspeaker earphone, display etc..
Working principle: the equipment for being intended to connection is fixed in the fixing groove 10 of middle plate 12, reconnects what device insertion to be connected
The interface of equipment pulls manual handle 3 to positive direction, and when pushing, pressing push rod 8 drives upper plate 9 to move down, downward test
Test point above 17 contrectation test connector of needle A, then push in plate 12 moved down along sliding guide column 11 and make to be intended to survey
Try the upward testing needle B18 of test point contact lower plate 13 below connector.
The equipment to be connected at this time will pass through the connector to be tested and external apparatus interface 16 is connected with external equipment, lead to
Corresponding feature operation is crossed, can determine to be intended to test the quality for connecting it.
Finally, it should be noted that the above descriptions are merely preferred embodiments of the present invention, it is not limited to this
Utility model, although the utility model is described in detail with reference to the foregoing embodiments, for those skilled in the art
For, it is still possible to modify the technical solutions described in the foregoing embodiments, or to part of technical characteristic
It is equivalently replaced, within the spirit and principle of the utility model, any modification, equivalent replacement, improvement and so on,
It should be included within the scope of protection of this utility model.
Claims (4)
1. intensive solder joint fixed point location probe contact function test fixture, including pedestal (1) can be achieved in one kind, feature exists
In: it is connected with backboard (2) on rear side of the pedestal (1), the bottom end of backboard (2) passes through upper plate (9) and pedestal by guide rod (7)
(1) it connects, backboard (2) is equipped with parallel vertical chute (4), and vertical chute (4) is connected with cunning by height adjustment knob (5)
Plate (19), the hole location on slide plate (19) are rotatably connected to manual handle (3) by axis, and the hole location of manual handle (3) passes through pin shaft
It is connect with one end of connector (6), the other end of connector (6) is connected with pressing push rod (8) by pin shaft, pressing push rod (8)
Bottom stamp bolt by fixed block (20) and be fixedly connected with upper plate (9), the right side of upper plate (9) is equipped with downward testing needle A
(17), upper plate (9) is arranged right below middle plate (12), and middle plate (12) is connect by sliding guide column (11) with lower plate (13), lower plate
(13) position of the testing needle A (17) of right side face is equipped with the testing needle B (18) set up, and lower plate (13) is fixed on pedestal
(1) surface.
2. intensive solder joint fixed point location probe contact function test fixture can be achieved in one kind according to claim 1,
Be characterized in that: the right part of the upper plate (9) is equipped with testing needle cable-through hole (14) close to the position of testing needle A (17).
3. intensive solder joint fixed point location probe contact function test fixture can be achieved in one kind according to claim 1,
Be characterized in that: the position of the right side face testing needle A (17) and testing needle B (18) of the middle plate (12) are equipped with clearance position (15),
And middle plate (12) upper surface is equipped with fixing groove (10).
4. intensive solder joint fixed point location probe contact function test fixture can be achieved in one kind according to claim 1,
Be characterized in that: the front of the pedestal (1) is equipped with external apparatus interface (16).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920050838.XU CN209624725U (en) | 2019-01-10 | 2019-01-10 | Intensive solder joint fixed point location probe contact function test fixture can be achieved in one kind |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920050838.XU CN209624725U (en) | 2019-01-10 | 2019-01-10 | Intensive solder joint fixed point location probe contact function test fixture can be achieved in one kind |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209624725U true CN209624725U (en) | 2019-11-12 |
Family
ID=68449589
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920050838.XU Expired - Fee Related CN209624725U (en) | 2019-01-10 | 2019-01-10 | Intensive solder joint fixed point location probe contact function test fixture can be achieved in one kind |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209624725U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112327136A (en) * | 2020-11-02 | 2021-02-05 | 南方电网科学研究院有限责任公司 | Detection mechanism for chip |
| CN112528588A (en) * | 2021-02-08 | 2021-03-19 | 深圳市微特精密科技股份有限公司 | Hole site design method, device and system for jig for detecting printed circuit board |
-
2019
- 2019-01-10 CN CN201920050838.XU patent/CN209624725U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112327136A (en) * | 2020-11-02 | 2021-02-05 | 南方电网科学研究院有限责任公司 | Detection mechanism for chip |
| CN112528588A (en) * | 2021-02-08 | 2021-03-19 | 深圳市微特精密科技股份有限公司 | Hole site design method, device and system for jig for detecting printed circuit board |
| CN112528588B (en) * | 2021-02-08 | 2021-05-28 | 深圳市微特精密科技股份有限公司 | Hole site design method, device and system for jig for detecting printed circuit board |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20191112 Termination date: 20210110 |