CN209589895U - Semiconductor high temperature detector - Google Patents
Semiconductor high temperature detector Download PDFInfo
- Publication number
- CN209589895U CN209589895U CN201822090842.7U CN201822090842U CN209589895U CN 209589895 U CN209589895 U CN 209589895U CN 201822090842 U CN201822090842 U CN 201822090842U CN 209589895 U CN209589895 U CN 209589895U
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- China
- Prior art keywords
- heat
- high temperature
- insulating base
- slide plate
- screw rod
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Abstract
The utility model discloses semiconductor high temperature detectors, including shell, test chamber, placement rack, heat-insulating base, heater, heat conducting bar, generate heat slide plate, spring, screw rod, heat-insulated push plate, the semiconductor high temperature detector, it is easy to operate, it is powerful, it is designed first by built-in high temperature testing agency, it can reach to semiconductor product, the high temperature resistant of material is tested, effectively avoid defective material, product enters subsequent production, in use process, secondly by the fiting effect of rotation regulating mechanism, also the detection needs of multiple product difference high temperature resistant degree be can satisfy, practicability is expanded, it is finally reached and promotes and applies purpose well.
Description
Technical field
The utility model relates to semiconductor detection technical field more particularly to semiconductor high temperature detectors.
Background technique
Current semiconductor product, material are generally generally used in the fields such as electronics, electric appliance, and in such field, equipment, dress
It sets in use process, all can be more than room temperature, therefore require the high temperature resistant for having certain for semiconductor product and material
Performance.
According to above-mentioned, at present for semiconductor product, the high temperature resistant detection device of material, common configuration is complicated, volume is huge
Greatly, it involves great expense, some small enterprises, company powerlessly use, and at the same time, traditional equipment is also inconvenient according to a variety of semiconductors
The high temperature resistant examination criteria of product greatly constrains popularization and application, in view of above control is adjusted to device detection level
Defect, it is really necessary to design semiconductor high temperature detector.
Utility model content
Technical problem to be solved by the utility model is to provide semiconductor high temperature detectors, to solve background technique
The problem of proposition.
In order to solve the above technical problems, the technical solution of the utility model is: semiconductor high temperature detector, including shell,
Test chamber, placement rack, heat-insulating base, heater, heat conducting bar, fever slide plate, spring, screw rod, heat-insulated push plate, the test chamber position
In enclosure interior, the test chamber is hollow cavity, and the placement rack is located at test chamber bottom end, the placement rack and shell
Body sliding is connected, and the heat-insulating base is located on the right side of enclosure interior, and the heat-insulating base is connected with shell using bolt, described
Heater is located at middle-end inside heat-insulating base, and the heater is connected with heat-insulating base using bolt, the heat conducting bar through every
At left and right sides of hot seat inner upper end, the heat conducting bar is connected with heat-insulating base using screw thread, and the heat conducting bar and heater
It is connected using bolt, the fever slide plate runs through heat conducting bar outer wall, and the fever slide plate is connected with heat conducting bar sliding, described
Spring be located at middle-end at the top of fever slide plate, the spring bottom is weldingly connected with the slide plate that generates heat, and the spring top
With heat-insulating base using being weldingly connected, the screw rod runs through enclosure interior top, and the screw rod is connected with shell screw thread, described
Heat-insulated push plate be located at screw rod bottom, the heat-insulated push plate is weldingly connected with screw rod.
Further, access panel is additionally provided on the downside of the enclosure interior front end, the access panel surrounding and shell use
High-temperature plastic is connected.
Further, placing groove is additionally provided with inside the placement rack, the placing groove is groove.
Further, upper end is additionally provided with handle on the left of the placement rack, and the handle is connected with placement rack using screw thread.
Further, the screw tip is additionally provided with handle, and the handle is connected with screw rod using bolt.
Compared with prior art, the semiconductor high temperature detector, before detection, which is placed on existing by staff first
Detection platform on, then heater is connected with inside plants power lead, then opens heater, i.e. realization heater will be electric
Thermal energy can be converted to, synchronous, required detection semiconductor product resistant to high temperature, material are put into inside placing groove by staff,
Handle is pushed again, i.e. handle drives placement rack to move from left to right, after placement rack is completely into test chamber inside is arrived, i.e., in fact
Existing semiconductor product is in fever slide plate bottom, and the effect to be heated up at this time by heater, then can be realized heat conducting bar will be hot
Amount is transferred to fever slide plate, thus realize that fever slide plate tests the high temperature resistant of lower semiconductor product, meanwhile, staff can
Required according to the high temperature resistant of different product, by rotating handle, i.e., realization handle drive the heat-insulated push plate of screw rod linkage it is synchronous make by
On move downward, when heat-insulated push plate push fever slide plate after, that is, realize fever slide plate overcome the screen resilience of spring along heat conducting bar
It moves from top to bottom, at this time by the downward of fever slide plate, can then shorten at a distance from lower semiconductor product, that is, reach
To increasing high temperature resistant detection level purpose, conversely, staff reversely rotates handle, i.e., realization screw rod drive heat-insulated push plate make by
Under move upwards, when heat-insulated push plate cancel to fever slide plate thrust after, i.e., under the action of spring tension, so as to realize
Fever slide plate moves upwards, and is finally reached and reduces high temperature resistant test intensity purpose, meets the detection needs of multiple product, should be partly
Conductor high temperature detector, it is easy to operate, powerful, it is designed first by built-in high temperature testing agency, can reach and half-and-half lead
The high temperature resistant test of body product, material, effectively avoids defective material, product enters subsequent production, in use process,
Secondly by the fiting effect of rotation regulating mechanism, it also can satisfy the detection needs of multiple product difference high temperature resistant degree, open up
Practicability has been opened up, has been finally reached and promotes and applies purpose well, meanwhile, access panel material is pyroceram, has transparent effect
Fruit, can facilitate testing staff to observe enclosure interior lower end placing groove situation, and heat-insulating base has good thermal resistance effect, improves
The safety used.
Detailed description of the invention
Fig. 1 is the main view of semiconductor high temperature detector；
Fig. 2 is the top view of semiconductor high temperature detector；
Fig. 3 is the cross-sectional view of semiconductor high temperature detector.
Shell 1, test chamber 2, placement rack 3, heat-insulating base 4, heater 5, heat conducting bar 6, fever slide plate 7, spring 8, screw rod 9,
Heat-insulated push plate 10, access panel 101, placing groove 301, handle 302, handle 901.
The following detailed description will be further explained with reference to the above drawings.
Specific embodiment
Hereinafter, a variety of specific details are elaborated, in order to provide to the saturating of the concept for constituting described embodiment basis
Thorough understanding, however, it will be apparent to those skilled in the art that described embodiment can be in these no specific details
In the practice of getting off of some or all situations do not specifically describe well-known processing step in other cases.
As shown in Figure 1, Figure 2, Figure 3 shows, semiconductor high temperature detector, including shell 1, test chamber 2, placement rack 3, heat-insulating base 4,
Heater 5, heat conducting bar 6, fever slide plate 7, spring 8, screw rod 9, heat-insulated push plate 10, the test chamber 2 are located inside shell 1,
The test chamber 2 is hollow cavity, and the placement rack 3 is located at 2 bottom end of test chamber, and the placement rack 3 and shell 1 slide
It is connected, the heat-insulating base 4 is located at 1 inner right side of shell, and the heat-insulating base 4 is connected with shell 1 using bolt, and described adds
Hot device 5 is located at 4 inside middle-end of heat-insulating base, and the heater 5 is connected with heat-insulating base 4 using bolt, and the heat conducting bar 6 runs through
At left and right sides of heat-insulating base 4 inner upper end, the heat conducting bar 6 is connected with heat-insulating base 4 using screw thread, and the heat conducting bar 6 and
Heater 5 is connected using bolt, and the fever slide plate 7 runs through 6 outer wall of heat conducting bar, the fever slide plate 7 and heat conducting bar 6
Sliding is connected, and the spring 8 is located at fever 7 top middle-end of slide plate, and 8 bottom of spring is weldingly connected with fever slide plate 7,
And 8 top of spring uses with heat-insulating base 4 and is weldingly connected, the screw rod 9 runs through 1 inner tip of shell, the spiral shell
Bar 9 is connected with 1 screw thread of shell, and the heat-insulated push plate 10 is located at 9 bottom of screw rod, and the heat-insulated push plate 10 and screw rod 9 weld
It is connected, access panel 101 is additionally provided on the downside of 1 interior forward end of shell, 101 surrounding of access panel is with shell 1 using resistance to
High-temp glue is connected, and placing groove 301 is additionally provided with inside the placement rack 3, and the placing groove 301 is groove, the placement
3 left side upper ends of seat are additionally provided with handle 302, and the handle 302 is connected with placement rack 3 using screw thread, 9 top of screw rod
It is additionally provided with handle 901, the handle 901 is connected with screw rod 9 using bolt.
The semiconductor high temperature detector, before detection, which is placed in existing detection platform by staff first, then
Heater 5 is connected with inside plants power lead, then opens heater 5, is i.e. realization heater 5 converts electrical energy into heat
Can, synchronous, required detection semiconductor product resistant to high temperature, material are put into inside placing groove 301, then push handle by staff
Hand 302, i.e. handle 302 drive placement rack 3 to move from left to right, after placement rack 3 is completely into 2 inside of test chamber is arrived, i.e.,
Realize that semiconductor product is in fever 7 bottom of slide plate, the effect to heat up at this time by heater 5 then can be realized heat conducting bar 6
Fever slide plate 7 is transferred heat to, thus realize that fever slide plate 7 tests the high temperature resistant of lower semiconductor product, meanwhile, work
Personnel can require according to the high temperature resistant of different product, and by rotating handle 901, i.e. realization handle 901 drives screw rod 9 to link heat-insulated
The synchronization of push plate 10 moves from top to bottom, after heat-insulated push plate 10 pushes fever slide plate 7, that is, realizes that fever slide plate 7 overcomes spring
8 screen resilience moves from top to bottom along heat conducting bar 6, at this time by the downward of fever slide plate 7, can then shorten and lower section
The distance of semiconductor product reaches and increases high temperature resistant detection level purpose, conversely, staff reversely rotates handle 901, i.e.,
Realize that screw rod 9 drives heat-insulated push plate 10 to move from bottom to top, after the thrust to fever slide plate 7 is cancelled in heat-insulated push plate 10, i.e.,
Under the action of 8 pulling force of spring, so as to realize that fever slide plate 7 moves upwards, it is finally reached and reduces high temperature resistant test intensity
Purpose meets the detection needs of multiple product, meanwhile, 101 material of access panel is pyroceram, has transparent effect, energy
Testing staff is enough facilitated to observe 1 interior lower end placing groove of shell, 301 situation, heat-insulating base 4 has good thermal resistance effect, improves
The safety that uses.
The utility model is not limited to above-mentioned specific embodiment, and those skilled in the art visualize from above-mentioned
Hair, without creative labor, the various transformation made are all fallen within the protection scope of the utility model.
Claims (5)
1. semiconductor high temperature detector, it is characterised in that including shell, test chamber, placement rack, heat-insulating base, heater, heat conducting bar,
Generate heat slide plate, spring, screw rod, heat-insulated push plate, and the test chamber is located at enclosure interior, and the test chamber is hollow cavity,
The placement rack is located at test chamber bottom end, and the placement rack is connected with shell sliding, and the heat-insulating base is located in shell
On the right side of portion, the heat-insulating base is connected with shell using bolt, and the heater is located at middle-end inside heat-insulating base, and described adds
Hot device is connected with heat-insulating base using bolt, and the heat conducting bar is at left and right sides of heat-insulating base inner upper end, the heat conducting bar
It is connected with heat-insulating base using screw thread, and the heat conducting bar is connected with heater using bolt, the fever slide plate, which runs through, leads
Hot rod outer wall, the fever slide plate are connected with heat conducting bar sliding, and the spring is located at middle-end at the top of fever slide plate, described
Spring bottom is weldingly connected with fever slide plate, and the spring top is used with heat-insulating base and is weldingly connected, and the screw rod passes through
Enclosure interior top is worn, the screw rod is connected with shell screw thread, and the heat-insulated push plate is located at screw rod bottom, and described is heat-insulated
Push plate is weldingly connected with screw rod.
2. semiconductor high temperature detector as described in claim 1, it is characterised in that also set on the downside of the enclosure interior front end
There is access panel, the access panel surrounding is connected with shell using high-temperature plastic.
3. semiconductor high temperature detector as claimed in claim 2, it is characterised in that be additionally provided with placement inside the placement rack
Slot, the placing groove are groove.
4. semiconductor high temperature detector as claimed in claim 3, it is characterised in that upper end is additionally provided on the left of the placement rack
Handle, the handle are connected with placement rack using screw thread.
5. semiconductor high temperature detector as claimed in claim 4, it is characterised in that the screw tip is additionally provided with handle, institute
The handle stated is connected with screw rod using bolt.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822090842.7U CN209589895U (en) | 2018-12-13 | 2018-12-13 | Semiconductor high temperature detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822090842.7U CN209589895U (en) | 2018-12-13 | 2018-12-13 | Semiconductor high temperature detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209589895U true CN209589895U (en) | 2019-11-05 |
Family
ID=68349035
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822090842.7U Expired - Fee Related CN209589895U (en) | 2018-12-13 | 2018-12-13 | Semiconductor high temperature detector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209589895U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111398771A (en) * | 2020-04-14 | 2020-07-10 | 西安易恩电气科技有限公司 | Push-pull power semiconductor device test fixture |
| CN111398770A (en) * | 2020-04-14 | 2020-07-10 | 西安易恩电气科技有限公司 | Power semiconductor device testing tool with protection structure |
-
2018
- 2018-12-13 CN CN201822090842.7U patent/CN209589895U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111398771A (en) * | 2020-04-14 | 2020-07-10 | 西安易恩电气科技有限公司 | Push-pull power semiconductor device test fixture |
| CN111398770A (en) * | 2020-04-14 | 2020-07-10 | 西安易恩电气科技有限公司 | Power semiconductor device testing tool with protection structure |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20191105 Termination date: 20211213 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |