CN209524879U - A kind of pin height - Google Patents

A kind of pin height Download PDF

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Publication number
CN209524879U
CN209524879U CN201920439746.0U CN201920439746U CN209524879U CN 209524879 U CN209524879 U CN 209524879U CN 201920439746 U CN201920439746 U CN 201920439746U CN 209524879 U CN209524879 U CN 209524879U
Authority
CN
China
Prior art keywords
test
testing needle
contact pin
benchmark block
block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201920439746.0U
Other languages
Chinese (zh)
Inventor
吴亚月
邓联文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Mingqing Automation Equipment Co Ltd
Original Assignee
Suzhou Mingqing Automation Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Mingqing Automation Equipment Co Ltd filed Critical Suzhou Mingqing Automation Equipment Co Ltd
Priority to CN201920439746.0U priority Critical patent/CN209524879U/en
Application granted granted Critical
Publication of CN209524879U publication Critical patent/CN209524879U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model discloses a kind of pin heights, including test benchmark block, testing needle, probe and laser micrometer, test benchmark block has contact pin collection terminal and test test side, it is equipped with the through-hole passed through for the testing needle between contact pin collection terminal and test test side, is interspersed with testing needle in each through-hole;The tip that testing needle is located at test benchmark block contact pin collection terminal is directed at the contact pin position of product to be measured, and the tip that testing needle is located at test benchmark block test test side connects the probe;Laser micrometer is set to the side of test benchmark block, side relief hole is equipped on test benchmark block and testing needle, and whether the light of the sending acquired by laser micrometer passes through side relief hole and judge contact pin height.Contact pin state can be monitored in real time in the device, filters out defective products, and detection sensitivity is high.

Description

A kind of pin height
Technical field
The utility model relates to auto parts and components manufacture field, specially a kind of pin height.
Background technique
Bonder terminal used in auto-parts, main function are the interfaces as electrical connection or transmission signal, In automotive connector production process, one of technique is terminal needle inserting, i.e., connecting terminal is inserted into connector shell.Terminal Including two parts of plastic part and contact pin, contact pin it is different, when assembling, needs for be inserted into plastic part contact pin, and requires modeling Materials and parts and contact pin do not damage indeformable, and to the normotopia degree of contact pin, height, compression distance etc. has higher requirement.It is existing High speed contact pin equipment in process of production occasional generate leakage contact pin and insert bad plastic cement defective products the problems such as.
Utility model content
Problem to be solved in the utility model is, the shortcomings that for the above prior art, proposes a kind of contact pin height detection Device anti-leak-stopping contact pin and can insert bad needle with real-time detection contact pin state.
To solve the above problems, the utility model provides following scheme: a kind of pin height, including test Reference block, testing needle, probe and laser micrometer, test benchmark block have contact pin collection terminal and test test side, and contact pin is adopted It is equipped with the through-hole passed through for the testing needle between collection end and test test side, is interspersed with testing needle in each through-hole;Test The tip that needle is located at test benchmark block contact pin collection terminal is directed at the contact pin position of product to be measured, and testing needle is located at the survey of test benchmark block The tip for trying test side connects the probe;Laser micrometer is set to the side of test benchmark block, test benchmark block and survey Side relief hole is equipped on test point, and whether the light of the sending acquired by laser micrometer passes through side relief hole and judge contact pin Highly.
Further, the contact pin collection terminal of test benchmark block has the inserted terminal with product port match, in the grafting Limiting groove is set on end, guarantees that collection terminal and product stablize grafting, improves detection accuracy.
Further, test benchmark block bottom is equipped with support base, and support base is convex support base, for fixing test benchmark Block keeps the stability of detection.
Further, the cross section of through-hole is in rectangle, and the shape of the testing needle is matched with the via hole profile;The survey Test point quantity is consistent with the number of openings on the reference block.
Further, probe is equipped with probe set, for protecting probe, improves detection sensitivity.
Further, laser micrometer includes signal issuing side and receiving end, and issuing side and receiving end are respectively arranged on test The two sides of reference block, issuing side issue the side relief hole that signal penetrates test benchmark block and testing needle, and receiving terminal receives signal, read Access value, judges product fine.
The beneficial effects of the utility model are: the device issues signal beams in real time by laser micrometer and receive can be with Real-time monitoring contact pin state judges whether terminal is inserted into plastic cement or whether insertion depth accords with by reading the numerical value of sensor It closes, defective products is filtered out with this, test benchmark block is equipped with limiting slot, and bottom is equipped with the probe on support base and probe Set all greatly improves detection sensitivity and detection stability, improves work efficiency.
Detailed description of the invention
FIG. 1 is a schematic structural view of the utility model.
Fig. 2 is the utility model application schematic diagram.
In the figure, it is marked as 1, product, 2, test benchmark block, 3, testing needle, 4, probe, 5, laser micrometer.
Specific embodiment
The utility model is further described below in conjunction with the drawings and specific embodiments.
Referring to Fig. 1, a kind of pin height, including test benchmark block 2, testing needle 3, probe 4 and Laser Measuring Micro- instrument 5, test benchmark block 2 have contact pin collection terminal and test test side, are equipped with and supply between contact pin collection terminal and test test side The through-hole that the testing needle 3 passes through, is interspersed with testing needle 3 in each through-hole;Testing needle 3 is located at 2 contact pin of test benchmark block and adopts The tip at collection end is directed at the contact pin position of product to be measured, and testing needle 3 is located at the tip connection institute that test benchmark block 2 tests test side Probe 4 is stated, probe 4 is equipped with probe set;Laser micrometer 5 includes signal issuing side and receiving end, issuing side and reception End is respectively arranged on the two sides of test benchmark block 2, is equipped with side relief hole on test benchmark block 2 and testing needle 3, and pass through Laser Measuring Whether the light for the sending that micro- instrument 5 acquires, which passes through side relief hole, judges contact pin height.
When work, 5 signal beams of laser micrometer penetrate 2 side relief hole of test benchmark block, 3 side relief hole of testing needle, this When base position read sensor numerical value, the numerical value of optical fiber then illustrates that terminal has been inserted into modeling in the range of setting when such Glue, and contact pin depth meets the requirements;If the numerical value of optical fiber is other than the range of setting, then illustrate terminal be not inserted into plastic cement or Insertion depth is undesirable, and control system determines that contact pin is bad.
Although the utility model is described in detail with reference to the foregoing embodiments, come for those skilled in the art Say, it is still possible to modify the technical solutions described in the foregoing embodiments, or to part of technical characteristic into Row equivalent replacement, within the spirit and principle of the utility model, any modification, equivalent replacement, improvement and so on should all It is included within the scope of protection of this utility model.

Claims (6)

1. a kind of pin height, it is characterised in that: including test benchmark block, testing needle, probe and laser micrometer Instrument, the test benchmark block have contact pin collection terminal and test test side, set between the contact pin collection terminal and test test side There is the through-hole passed through for the testing needle, the testing needle is interspersed in each through-hole;The testing needle is located at the test The tip of reference block contact pin collection terminal is directed at the contact pin position of product to be measured, and the testing needle is located at the test detection of test benchmark block The tip at end connects the probe;The laser micrometer is set to the side of the test benchmark block, the test benchmark Side relief hole is equipped on block and testing needle, and whether the light of the sending acquired by the laser micrometer passes through the side Relief hole judges contact pin height.
2. a kind of pin height according to claim 1, it is characterised in that: the contact pin of the test benchmark block Collection terminal has the inserted terminal with product port match, and limiting groove is arranged on the inserted terminal.
3. a kind of pin height according to claim 1, it is characterised in that: test benchmark block bottom is set There is support base, the support base is convex support base.
4. a kind of pin height according to claim 1, it is characterised in that: the cross section of the through-hole is in square Shape, the shape of the testing needle are matched with the via hole profile;Number of openings in the testing needle quantity and the reference block Unanimously.
5. a kind of pin height according to claim 1, it is characterised in that: the probe is equipped with probe Set.
6. a kind of pin height according to claim 1, it is characterised in that: the laser micrometer includes letter Number issuing side and receiving end, the issuing side and the receiving end are respectively arranged on the two sides of test benchmark block.
CN201920439746.0U 2019-04-02 2019-04-02 A kind of pin height Expired - Fee Related CN209524879U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920439746.0U CN209524879U (en) 2019-04-02 2019-04-02 A kind of pin height

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920439746.0U CN209524879U (en) 2019-04-02 2019-04-02 A kind of pin height

Publications (1)

Publication Number Publication Date
CN209524879U true CN209524879U (en) 2019-10-22

Family

ID=68232219

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920439746.0U Expired - Fee Related CN209524879U (en) 2019-04-02 2019-04-02 A kind of pin height

Country Status (1)

Country Link
CN (1) CN209524879U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114251994A (en) * 2021-12-24 2022-03-29 宁波艾思科汽车音响通讯有限公司 Automatic test device for depth of contact pin of automobile wire harness terminal

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114251994A (en) * 2021-12-24 2022-03-29 宁波艾思科汽车音响通讯有限公司 Automatic test device for depth of contact pin of automobile wire harness terminal

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GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20191022

Termination date: 20210402

CF01 Termination of patent right due to non-payment of annual fee