CN209486002U - A kind of defect detecting device of nonstandard high reflection curve surface work pieces - Google Patents
A kind of defect detecting device of nonstandard high reflection curve surface work pieces Download PDFInfo
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- CN209486002U CN209486002U CN201822244083.5U CN201822244083U CN209486002U CN 209486002 U CN209486002 U CN 209486002U CN 201822244083 U CN201822244083 U CN 201822244083U CN 209486002 U CN209486002 U CN 209486002U
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Abstract
The utility model provides a kind of defect detecting device of nonstandard high reflection curve surface work pieces, including the first optical path, second optical path, moire area source, semi-transparent semi-reflecting lens, industrial camera and computer, the moire fringes light beam that the moire area source issues reaches the semi-transparent semi-reflecting lens along first optical path, the moire fringes light beam is reflexed to a nonstandard high reflection curve surface work pieces surface to form signal light by the semi-transparent semi-reflecting lens, the signal light reaches the semi-transparent semi-reflecting lens along second optical path, the signal light is transmitted through on the industrial camera to form detection image by the semi-transparent semi-reflecting lens, the computer is handled the detection image to judge whether the surface of the nonstandard high reflection curve surface work pieces defective and position of defect, accurately to detect lacking for nonstandard high reflection curve surface work pieces surface It falls into, and solves the problems, such as that being easy to happen dazzle when Image Acquisition causes the resolution ratio of the image acquired supersaturation and detection uncontrollable.
Description
Technical field
The utility model relates to a kind of inspections of the defect of defect detecting technique field more particularly to nonstandard high reflection curve surface work pieces
Survey device.
Background technique
It is the key point detected automatically to Surface Flaw Detection, especially for the non-of polishing in manufacture field
Absolute altitude reflecting curved surface, since its surface has the characteristic of high reflection, the defect of current most of traditional manufacturing industry workpiece surface
Detection is all to use artificial detection, and since artificial detection is usually to be operated under strong light, light, testing staff subjectivity
Consciousness, the size of defect are bigger for the influence for detecting quality, and vision-based detection has contactless survey compared with human eye detection
The features such as amount, stringent consistency, smaller spatial resolution, higher temporal resolution and higher working efficiency.Cause
This design it is a kind of using machine vision replace human eye carry out polishing Surface Flaw Detection it is significant.
Under normal conditions, it needs to collect clearly picture using diffusing reflection light source, so that tested high reflection curved surface
The surface light of workpiece is evenly distributed, and usual this detection method uses dome light source, and such light source is due to high reflection curved surface
Specular properties, small defect is difficult to acquire, defect and the normal region contrast for also resulting in acquisition are too low, be easy
Cause missing inspection.And three-dimensional survey can be carried out to surface defect based on the detection method that phase deviation technology obtains surface defect
Amount, but due to being tested the nonideal mirror surface of high reflection face workpiece surface, it is fuzzy that there are reflection strips, and the attribute of curved surface makes item
There are phase change, phase deviation can occur line for curved surface, and same position is acquired there are the N frame picture of phase difference, increases image
Acquisition time, increase calculation amount, algorithm is difficult to handle, reduce the real-time of system.Therefore, the method is under this scene
It even needs to optimize.
Utility model content
The purpose of this utility model is to provide a kind of defect detecting devices of nonstandard high reflection curve surface work pieces, existing to solve
Have in technology can not accurate real-time detection nonstandard high reflection curve surface work pieces surface defect the problems such as.
In order to achieve the above object, the utility model provides a kind of defects detection dress of nonstandard high reflection curve surface work pieces
It sets, including the first optical path, the second optical path, moire area source, semi-transparent semi-reflecting lens, industrial camera and computer, the moire face
The moire fringes light beam that light source issues reaches the semi-transparent semi-reflecting lens along first optical path, and the semi-transparent semi-reflecting lens will
The moire fringes light beam reflexes to the surface of a nonstandard high reflection curve surface work pieces to form signal light, and the signal light is along institute
It states the second optical path and reaches the semi-transparent semi-reflecting lens, the signal light is transmitted through the industrial camera by the semi-transparent semi-reflecting lens
On to form detection image, the computer is handled the detection image to judge the nonstandard high reflection curved surface work
Whether the surface of part defective and position of defect.
Optionally, when the surface of the nonstandard high reflection curve surface work pieces does not have defect, if having in the detection image
Do parallel vertical bar line；It is corresponding in the detection image to lack when the surface of the nonstandard high reflection curve surface work pieces has defect
The striped of concave portion point generates bending deformation.
Optionally, the moire fringes light beam is made of several light and dark stripeds, between two neighboring striped between
Away from equal, by adjusting the resolution ratio of the spacing adjustment detection of the striped.
Optionally, the resolution ratio is greater than or equal to twice of the spacing between two neighboring striped.
Optionally, the computer includes sequentially connected image pre-processing module, characteristics of image enhancing module, defect spy
Levy extraction module, false defect rejects module and labeling module.
A kind of defect inspection method of nonstandard high reflection curve surface work pieces provided by the utility model, comprising:
The defect detecting device of the nonstandard high reflection curve surface work pieces is provided；
The moire fringes light beam that moire area source issues reaches semi-transparent semi-reflecting lens along the first optical path, described semi-transparent semi-reflecting
The moire fringes light beam is reflexed to the surface of a nonstandard high reflection curve surface work pieces to form signal light by lens；
The signal light reaches the semi-transparent semi-reflecting lens along the second optical path, and the semi-transparent semi-reflecting lens are by the signal
To form detection image in light transmission a to industrial camera；
Computer the detection image is handled with judge the nonstandard high reflection curve surface work pieces surface whether
Defective and defect position.
Optionally, the computer is handled the detection image to judge the nonstandard high reflection curve surface work pieces
The whether defective step in surface include:
Image pre-processing module obtains the detection image, extracts ash of the detection image in RGB channel under channel B
Image is spent, and extracts the center line of striped in the gray level image to obtain the tilt angle of the center line, and by the ash
Degree image reversal rotates the tilt angle to correct the striped in the gray level image；
Characteristics of image enhances module and carries out gradient calculating to the gray level image after correction, while copying another correction
The greyscale image transitions afterwards are to the laggard line frequency domain gaussian filtering of frequency domain, gray level image and frequency domain after the gradient is calculated
After gaussian filtering and go back to time domain gray level image carry out Difference Calculation, with obtain enhancing image；
The enhancing image is carried out Gabor variation by defect characteristic extraction module, takes the angle parameter of the stripe direction
Maximum entropy segmentation is used to extract to obtain defect pattern defect afterwards；
False defect rejecting module rejects area and gradient in the defect pattern and is respectively less than the defect area of setting value to obtain
To real defect, the labeling module marks out the profile and area of the real defect in the defect pattern.
Optionally, it after the computer judges that the surface of the nonstandard high reflection curve surface work pieces is defective, also calculates
Position of the real defect in the defect pattern out, to obtain the real defect in the nonstandard high reflection curved surface work
The position on the surface of part.
In the defect detecting device of nonstandard high reflection curve surface work pieces provided by the utility model, including the first optical path,
Two optical paths, moire area source, semi-transparent semi-reflecting lens, industrial camera and computer, the moire fringes that the moire area source issues
Light beam reaches the semi-transparent semi-reflecting lens along first optical path, and the semi-transparent semi-reflecting lens are anti-by the moire fringes light beam
A nonstandard high reflection curve surface work pieces surface is incident upon to form signal light, the signal light reaches described half along second optical path
The signal light is transmitted through to form detection image on the industrial camera by saturating half anti-lens, the semi-transparent semi-reflecting lens, institute
State computer is handled the detection image to judge whether the surface of the nonstandard high reflection curve surface work pieces is defective
And the position of defect, accurately to detect the defect on nonstandard high reflection curve surface work pieces surface, and solve Image Acquisition when
Wait the uncontrollable problem of resolution ratio for being easy to happen the image supersaturation and detection that dazzle leads to acquisition.
Detailed description of the invention
Fig. 1 is the structural representation of the defect detecting device of nonstandard high reflection curve surface work pieces provided by the embodiment of the utility model
Figure；
Fig. 2 is the light path principle of the defect detecting device of nonstandard high reflection curve surface work pieces provided by the embodiment of the utility model
Figure.
Specific embodiment
Specific embodiment of the present utility model is described in more detail below in conjunction with schematic diagram.It is retouched according to following
It states and claims, will be become apparent from feature the advantages of the utility model.It should be noted that attached drawing is all made of very simplification
Form and use non-accurate ratio, only to it is convenient, lucidly aid in illustrating the purpose of the utility model embodiment.
Referring to Fig. 1, present embodiments providing a kind of defect detecting device of nonstandard high reflection curve surface work pieces, including first
Optical path a, the second optical path b, moire area source 1, semi-transparent semi-reflecting lens 2, industrial camera 3 and computer 4, the moire area source 1
The moire fringes light beam of sending reaches the semi-transparent semi-reflecting lens 2 along the first optical path a, and the semi-transparent semi-reflecting lens 2 will
The moire fringes light beam reflexes to the surface of a nonstandard high reflection curve surface work pieces 5 to form signal light, the signal light along
The second optical path b reaches the semi-transparent semi-reflecting lens 2, and the signal light is transmitted through the work by the semi-transparent semi-reflecting lens 2
To form detection image on industry camera 3, the computer 4 is handled the detection image to judge that the non-absolute altitude is anti-
Penetrate curve surface work pieces 5 whether surface defective and position of defect.
Further, as shown in Fig. 2, the moire area source 1 issue moire fringes light beam 11, in the nonstandard high reflection
Mirror-reflection occurs for the surface of curve surface work pieces 5 be formed by the virtual image to be 1 ", the axis T and detection plane of the moire area source 11
It meets at microcosmic plane and meets at point O, establish rectangular coordinate system XYZ by the center of circle of O point, the moire area source 1 is, for example, a display
Shielding 1 ', M is arbitrary point on display screen 1 ', and the light issued herein is Is, incidence angle θ, reflection light Rs, when tested surface is
When index plane, M ' is point M in index plane S imaging, and F is the normal of index plane S, when determinand surface existing defects, by
It changes in the surface texture in fault location, the reflection angle of light will shift, it is assumed that the angle of offset is α, then normal
Deflection angle is α, since optical path is reversible, then:
It M primary image should be presented has been displaced to N originally at this time, so that standing striation bends deformation in fault location, work as mark
It is reversible by optical path it is found that the angular deflection that 2 α of reflection light will be brought when defect on quasi- face causes the angular deflection of α.Then when
When the surface of the nonstandard high reflection curve surface work pieces 5 does not have defect, there are several parallel vertical bar lines in the detection image；When
When the surface of the nonstandard high reflection curve surface work pieces 5 has defect, the striped that defect part is corresponded in the detection image is generated
Bending deformation can judge whether defective and defect position with this.
Based on this, the present embodiment additionally provides a kind of defect inspection method of nonstandard high reflection curve surface work pieces, comprising:
S1: the defect detecting device of the nonstandard high reflection curve surface work pieces is provided；
S2: the moire fringes light beam that moire area source issues reaches semi-transparent semi-reflecting lens along the first optical path, described semi-transparent
The moire fringes light beam is reflexed to the surface of a nonstandard high reflection curve surface work pieces to form signal light by half anti-lens；
S3: the signal light reaches the semi-transparent semi-reflecting lens along the second optical path, and the semi-transparent semi-reflecting lens will be described
Signal light is transmitted through on an industrial camera to form detection image；
S4: computer handles the detection image is with the surface for judging the nonstandard high reflection curve surface work pieces
No defective and defect position.
It is understood that the moire fringes light beam that the moire area source issues is made of several light and dark stripeds
(i.e. bright dark fringe is alternate), the spacing between two neighboring striped is equal, and the moire area source 1 has a light source controller,
The resolution ratio of the spacing adjustment detection of the striped is adjusted by the light source controller.Optionally, the gray scale of the striped point
For cloth at jump function, the spacing of striped is adjustable, and by adjusting two neighboring fringe spacing L, the detection of adjustable system is differentiated
Rate P, corresponding relationship are that P is greater than or equal to 2L.
It further,, can be with due to being the image taken the photograph against strong photo-beat after the industrial camera 3 obtains the detection image
It was found that this detection image is very easy to supersaturation, lead to not identify defect, so the computer 4 is needed to need to institute
It states detection image and carries out image procossing.Specifically, the computer 4 includes sequentially connected image pre-processing module, image spy
Sign enhancing module, defect characteristic extraction module, false defect reject module and labeling module, to carry out respectively to the detection image
Pretreatment, characteristics of image enhancing, defect characteristic extracts, false defect is rejected and standard.
Described image preprocessing module obtains the detection image, extracts the detection image in the channel B in RGB channel
Under gray level image, and extract the center line of striped in the gray level image to obtain the tilt angle of the center line, and will
The gray level image reversely rotates the tilt angle to correct the striped in the gray level image.Specifically, in actual work
In work, the detection image of acquisition may have the case where inclination, and due to scheming without good object of reference to detection
The tilt angle of picture is calculated, therefore the center line for choosing the striped in the detection image carries out skeletal extraction, example to it
Zhang skeletal extraction is such as used, and carries out hough straight line fitting, the tilt angle of the center line of striped is obtained by calculation, connects
Using the center line at detection image center as origin, reversely rotate the tilt angle, correct the detection image.
Next, described image feature enhancing module carries out gradient calculating to the gray level image after correction, copy simultaneously
The gray level image after another correction of shellfish carries out gaussian filtering, the gray level image and gaussian filtering after the gradient is calculated
Gray level image afterwards carries out Difference Calculation, to obtain enhancing image.Specifically, in fault location, the nonstandard high reflection curved surface work
The reflectivity of the fault location of part 5 and the variation of launch angle, in the gray level image after correction, the image grayscale ladder of fault location
Degree is distinct with remaining region, can carry out sobel to the gray level image after correction and carry out gradient calculating, in level
It is respectively as follows: with the detective operators in vertical direction
Gradient is calculated as follows:
Carrying out the transformed gray level image of gradient, there are difference with other regions in the coefficient of fault location gradient.
Image is transformed to frequency domain by FFT transform by the gray level image after copying another correction, and it is high to carry out frequency domain
This filtering, then pass through inverse FFT transform to time domain.The Fourier transformation of Gaussian function is still Gaussian function, but its standard deviation
Have occurred and that change, frequency domain criteria difference is bigger, and Gaussian function is wider, and Gaussian function is expressed as in airspace
After carrying out FFT transform to gray level image, image has been shifted to frequency domain, and Gaussian function at this time is in frequency domain representation
Are as follows:
The D in above formula0For by frequency, D (u, v) is the value of image frequency domain point (u, v), D (u, v)=u2+v2；When D (u,
V) when bigger, Gaussian function H (u, v) distance center is smaller, i.e., when frequency of distance space (0,0) is remoter, frequency is higher.By right
Gray level image does following convolution algorithm:
G (u, v)=F (u, v) H (u, v)；
High frequency can be filtered out, low frequency signal is retained, and for gray level image, the fringe gray level of background stripe pattern is 255
With 0, variation acutely, can make striped fog by this operation, thus enhancing of the realization to defect characteristic.The Gauss that will be obtained
Gray level image after filtered gray level image and gradient calculate carries out Difference Calculation, to obtain the increasing after progress image enhancement
Strong image.
Further, the enhancing image is carried out Gabor variation by the defect characteristic extraction module, takes the stripe direction
Angle parameter after use maximum entropy segmentation defect is extracted to obtain defect pattern.Specifically, two-dimensional Gabor filters letter
Number g (x, y), impulse response function h (x, y) and its Fourier transformation H (u, v) are respectively as follows:
H (x, y)=g (x, y) exp (2 π jf0x)；
Two-dimensional Gabor impulse Response Function h (x, y) is the sinusoidal plane of gaussian kernel function modulation from the point of view of airspace
Wave, δx、δyIts standard variance of oval Gaussian function on x, y-coordinate axis, determine filter in x, the shrinkage degree of y-axis,
f0For the central modulation frequency of multiple SIN function.
Gabor function can be decomposed into real part hR(x, y) and imaginary part hI(x, y) two components, respectively to enhancing image M filter
Wave is then available:
Wherein (hR* M) and hI* M, which is respectively indicated, carries out convolution, S to enhancing image M with the real and imaginary parts of Gabor filter
(x, y) is the characteristics of image that Gabor filter is extracted.
Next, carrying out change of scale appropriate and rotation using h (x, y) as mother wavelet function to h (x, y), can obtaining
To the Gabor wavelet of one group of self similarity:
hmn(x, y)=a-mH (x ', y ')；
Wherein,a-mFor scale factor, a > 1, m, n ∈ Z, 0 < < m < < S-1,0 < < n < < K-1, S, K
The respectively number of scale and direction.In the present embodiment, enhancing image is converted by using Gabor transformation real part,
Defect can preferably be extracted after introducing maximum entropy segmentation, to obtain defect pattern.
It, can be by institute since there are the noises of some dusts and sensor itself after getting the defect pattern
It states the defect area that area and gradient are respectively less than respective setting value in defect pattern and regards as noise drawbacks.The false defect picks
Except module rejects the noise drawbacks to obtain corresponding to the real defect of the surface defect of the nonstandard high reflection curve surface work pieces 5,
The labeling module marks out the profile and area of the real defect in the defect pattern, and exports the real defect
Information.
Further, the computer also calculates position of the real defect in the defect pattern, passes through foundation
Position of the available real defect of coordinate system on the surface of the nonstandard high reflection curve surface work pieces.
To sum up, in the defect detecting device of nonstandard high reflection curve surface work pieces provided by the embodiment of the utility model, including
First optical path, the second optical path, moire area source, semi-transparent semi-reflecting lens, industrial camera and computer, the moire area source issue
Moire fringes light beam reach the semi-transparent semi-reflecting lens along first optical path, the semi-transparent semi-reflecting lens are by the moire
Striped light beam reflexes to a nonstandard high reflection curve surface work pieces surface to form signal light, and the signal light is along second optical path
The semi-transparent semi-reflecting lens are reached, the signal light is transmitted through on the industrial camera to form inspection by the semi-transparent semi-reflecting lens
Altimetric image, the computer handles the detection image is with the surface for judging the nonstandard high reflection curve surface work pieces
No defective and defect position accurately to detect the defect on nonstandard high reflection curve surface work pieces surface, and is solved in image
Dazzle is easy to happen when acquisition leads to the uncontrollable problem of resolution ratio of image supersaturation and detection of acquisition.
The preferred embodiment that above are only the utility model, does not play the role of any restrictions to the utility model.
Any person of ordinary skill in the field, in the range of not departing from the technical solution of the utility model, to the utility model
The technical solution and technology contents of exposure make the variation such as any type of equivalent replacement or modification, belong to without departing from the utility model
Technical solution content, still fall within the protection scope of the utility model.
Claims (5)
1. a kind of defect detecting device of nonstandard high reflection curve surface work pieces, which is characterized in that including the first optical path, the second optical path,
Moire area source, semi-transparent semi-reflecting lens, industrial camera and computer, the moire fringes light beam that the moire area source issues along
First optical path reaches the semi-transparent semi-reflecting lens, and it is non-that the moire fringes light beam is reflexed to one by the semi-transparent semi-reflecting lens
To form signal light, the signal light reaches described semi-transparent semi-reflecting along second optical path on the surface of absolute altitude reflecting curved surface workpiece
The signal light is transmitted through on the industrial camera to form detection image, the calculating by lens, the semi-transparent semi-reflecting lens
Machine is handled the detection image to judge whether the surface of the nonstandard high reflection curve surface work pieces defective and defect
Position.
2. the defect detecting device of nonstandard high reflection curve surface work pieces as described in claim 1, which is characterized in that when described nonstandard
When the surface of high reflection curve surface work pieces does not have defect, there are several parallel vertical bar lines in the detection image；When described nonstandard
When the surface of high reflection curve surface work pieces has defect, the striped that defect part is corresponded in the detection image generates bending deformation.
3. the defect detecting device of nonstandard high reflection curve surface work pieces as described in claim 1, which is characterized in that the moire item
Line light beam is made of several light and dark stripeds, and the spacing between two neighboring striped is equal, by adjusting the striped
The resolution ratio of spacing adjustment detection.
4. the defect detecting device of nonstandard high reflection curve surface work pieces as claimed in claim 3, which is characterized in that the resolution ratio
More than or equal to twice of the spacing between two neighboring striped.
5. the defect detecting device of nonstandard high reflection curve surface work pieces as described in claim 1, which is characterized in that the computer
Module is rejected including sequentially connected image pre-processing module, characteristics of image enhancing module, defect characteristic extraction module, false defect
And labeling module.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109557101A (en) * | 2018-12-29 | 2019-04-02 | 桂林电子科技大学 | A kind of defect detecting device and method of nonstandard high reflection curve surface work pieces |
| CN113231480A (en) * | 2021-06-04 | 2021-08-10 | 河南明晟新材料科技有限公司 | Method for rapidly detecting black wire and black line on surface of aluminum coil on line |
-
2018
- 2018-12-29 CN CN201822244083.5U patent/CN209486002U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109557101A (en) * | 2018-12-29 | 2019-04-02 | 桂林电子科技大学 | A kind of defect detecting device and method of nonstandard high reflection curve surface work pieces |
| CN109557101B (en) * | 2018-12-29 | 2023-11-17 | 桂林电子科技大学 | Defect detection device and method for non-elevation reflective curved surface workpiece |
| CN113231480A (en) * | 2021-06-04 | 2021-08-10 | 河南明晟新材料科技有限公司 | Method for rapidly detecting black wire and black line on surface of aluminum coil on line |
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Effective date of registration: 20220525 Address after: 530201 Beitou building, No. 8, Feiyun Road, Nanning area, China (Guangxi) pilot Free Trade Zone, Nanning, Guangxi Zhuang Autonomous Region Patentee after: Guangxi Beitou Xinchuang Technology Investment Group Co.,Ltd. Address before: 541004 1 Jinji Road, Qixing District, Guilin, the Guangxi Zhuang Autonomous Region Patentee before: GUILIN University OF ELECTRONIC TECHNOLOGY |