CN209471922U - A kind of sample platform of scanning electronic microscope - Google Patents

A kind of sample platform of scanning electronic microscope Download PDF

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Publication number
CN209471922U
CN209471922U CN201920486579.5U CN201920486579U CN209471922U CN 209471922 U CN209471922 U CN 209471922U CN 201920486579 U CN201920486579 U CN 201920486579U CN 209471922 U CN209471922 U CN 209471922U
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China
Prior art keywords
pedestal
objective table
screw rod
axis screw
axis
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CN201920486579.5U
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Chinese (zh)
Inventor
黄凇崧
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Affiliated Hospital of Guizhou Medical University
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Affiliated Hospital of Guizhou Medical University
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Abstract

The utility model belongs to Electronic Speculum fixture fields, discloses a kind of sample platform of scanning electronic microscope, including pedestal, and the base rotation is connected with X-axis screw rod, and X-axis nut is connected on the X-axis screw rod, and the X-axis nut is fixedly connected with pedestal;The pedestal is rotatably connected to Y-axis screw rod, and Y-axis nut is connected on the Y-axis screw rod, and the Y-axis nut is fixedly connected with support, and the support is connected with objective table;The upper surface of the objective table is evenly distributed with the fixed window of multiple samples, and the position that the lower surface of the objective table corresponds to the fixed window of each sample is equipped with locating piece;The pedestal is equipped with the part in place being located at below the objective table, and for the part in place for contacting with the locating piece, the pedestal is additionally provided with the bracket for installing scanning electron microscope, and the bracket is used to for scanning electron microscope to be fixed on the bracket right above the part in place.The utility model can prevent multiple samples to be observed, and improve efficiency.

Description

A kind of sample platform of scanning electronic microscope
Technical field
The utility model belongs to Electronic Speculum fixture fields more particularly to a kind of sample platform of scanning electronic microscope.
Background technique
Sample platform of scanning electronic microscope is the utensil being commonly used in medicine, with the development of electronic imaging technology, medicine Electronic Speculum Sample platform of scanning electronic microscope matched with its uses more and more extensive.Currently, most of sample platform of scanning electronic microscope used all can only It places a sample to be observed, when needing to be observed multiple samples, must gradually be observed one by one, i.e., one After sample has been observed, which is taken away from sample platform of scanning electronic microscope, then place next sample and be observed, causes to operate Cumbersome, low efficiency.
Utility model content
In view of the problems of the existing technology, the utility model provides a kind of sample platform of scanning electronic microscope, can prevent more A sample is observed, and improves efficiency.
The base case of the utility model: a kind of sample platform of scanning electronic microscope, including pedestal, the base rotation are connected with X Axis screw rod, the X-axis screw rod are arranged along the length direction of the pedestal, are connected with X-axis nut, the X-axis on the X-axis screw rod Nut is fixedly connected with pedestal;The pedestal is rotatably connected to Y-axis screw rod, width direction of the Y-axis screw rod along the pedestal It is arranged, is connected with Y-axis nut on the Y-axis screw rod, the Y-axis nut is fixedly connected with support, and the support is connected with loading Platform;The upper surface of the objective table is evenly distributed with the fixed window of multiple samples, and the lower surface of the objective table is corresponding each described The position of the fixed window of sample is equipped with locating piece;The pedestal be equipped be located at the objective table below part in place, it is described in place Part with the locating piece for contacting, and the pedestal is additionally provided with the bracket for installing scanning electron microscope, and the bracket will be for that will sweep Retouch the bracket that Electronic Speculum is fixed on right above the part in place.
The working principle of this base case and the utility model has the advantages that
In use, medical sample is placed in one by one on the fixed window of sample in advance, by rotating X-axis screw rod or Y-axis respectively Screw rod realizes that objective table is moved along the length or width direction of pedestal.When to the medical sample in the fixed window of multiple samples one by one When being observed, by moving stage, contact the corresponding locating piece of the fixed window of one of sample with part in place, then it represents that The fixed window of the sample is just directed at scanning electron microscope, just can be observed to the sample in the fixed window of the sample by scanning electron microscope. When observation, which finishes, carries out the sample observation in the fixed window of next sample, and moving stage, so that next sample is fixed The corresponding locating piece of window is contacted with part in place, indicates that the fixed window of next sample in place, can accurately be completed by scanning electron microscope The observation of sample.After the sample in the fixed window of sample is all observed, i.e., replaceable next group sample is seen one by one again It surveys.
The utility model structure is simple, easy to operate, can be realized the primary observation of multiple medical samples, improves effect Rate;And come moving stage in the form of bolt and nut, and locating piece and in place part are combined, can be realized objective table Accurately in place, so that medical sample to be observed can be directed at scanning electron microscope, to complete to observe.
Further, the locating piece includes the first conductive contact, and the part in place includes the second conductive contact, light source and electricity Source, be electrically connected to form closed circuit between second conductive contact, the light source and the power supply, second conductive contact It is shinny that the light source is triggered after contacting with first conductive contact.
First conductive contact is contacted with the second conductive contact, and the conducting of the second conductive contact keeps power supply shinny, then it represents that sample Fixed window is directed at scanning electron microscope, just can be observed to sample by scanning electron microscope, the structure is simple, at low cost.
It further, is to be detachably connected between the support and the objective table.
Objective table can be removed from support, be conveniently replaceable objective table, and save after cleaning conducive to objective table.
Further, the support be equipped with first through hole, the objective table be equipped with the second through-hole, the first through hole with it is described Second through-hole is fixedly connected by bolt.
Objective table is placed on the upper surface of support, and first through hole is directed at the second through-hole, then runs through first through hole with bolt With the second through-hole, so that objective table is fixed on the support, which facilitates the disassembly and connection of objective table and support.
Further, one end that the X-axis screw rod is connect with the base rotation is fixed with the first swing handle, the Y-axis One end of screw rod and pedestal rotation connection is fixed with the second swing handle.
X-axis screw rod and Y-axis screw rod are rotated respectively by the first swing handle and the second swing handle, convenient for operation.
Further, the lower part of the objective table is removably connected with bottom case.
When objective table storage, bottom case is used to protect the first conductive contact of objective table bottom.
Further, the lower surface of the objective table is equipped with tapped blind hole, and the bottom case is equipped with for being fitted in the loading The flange of platform lower surface, the flange are equipped with tapped through hole, and the tapped blind hole and the tapped through hole are bolted company It connects.
The lip fits of bottom case are directed at tapped blind hole, then successively screw in bolt in objective table lower surface, tapped through hole In tapped through hole and tapped blind hole, to realize that pedestal is fixed on the lower part of objective table, the structure operation is simple, easy to accomplish.
Detailed description of the invention
Fig. 1 is the main view that a kind of sample platform of scanning electronic microscope embodiment of the utility model provides;
Fig. 2 is the left view that a kind of sample platform of scanning electronic microscope embodiment of the utility model provides;
Fig. 3 is the top view of objective table in the present embodiment;
Fig. 4 is the structural schematic diagram that objective table is equipped with bottom case in the present embodiment.
Specific embodiment
In order to make the purpose of the utility model, technical solutions and advantages more clearly understood, with reference to embodiments, to this Utility model is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain that this is practical It is novel, it is not used to limit the utility model.
With reference to the accompanying drawing and specific embodiment is further described the application principle of the utility model:
Appended drawing reference in Figure of description includes: pedestal 1, support base 2, X-axis screw rod 3, X-axis nut 4, mounting base 5, electricity Source 6, the second conductive contact 7, light source 8, bracket 9, scanning electron microscope 10, objective table 11, the first conductive contact 12, bolt 13, support 14, the fixed window 20, second of pedestal 15, the second swing handle 16, the first swing handle 17, Y-axis screw rod 18, Y-axis nut 19, sample Through-hole 21, bottom case 22, flange 23, tapped through hole 24.
Embodiment is based on as shown in Figure 1 and Figure 2: a kind of sample platform of scanning electronic microscope, including pedestal 1, and the left side of pedestal 1 is solid Surely there is support base 2, support base 2 is rotatably connected to X-axis screw rod 3 by bearing, and one end that X-axis screw rod 3 and pedestal 1 are rotatablely connected is solid Surely there is the first swing handle 17, X-axis screw rod 3 is arranged along the length direction of pedestal 1, is connected with X-axis nut 4 on X-axis screw rod 3, works as X When axis screw rod 3 rotates, X-axis nut 4 can be moved along X-axis screw rod 3.X-axis nut 4 is fixedly connected with pedestal 15, and pedestal 15 passes through axis It holds and is rotatably connected to Y-axis screw rod 18, one end that Y-axis screw rod 18 and pedestal 15 are rotatablely connected is fixed with the second swing handle 16, Y-axis Screw rod 18 is arranged along the width direction of pedestal 1, is connected with Y-axis nut 19 on Y-axis screw rod 18, when Y-axis screw rod 18 rotates, Y-axis Nut 19 can be moved along Y-axis screw rod 18.Y-axis nut 19 is fixedly connected with support 14, and support 14 is removably connected with objective table 11. Specifically, support 14 is from top to bottom through there is first through hole, the left side of objective table 11 is run through from top to bottom the second through-hole 21, the One through-hole is fixedly connected with the second through-hole 21 by bolt 13.Objective table 11 can be removed from support 14, be conveniently replaceable objective table 11, and saved after being cleaned conducive to objective table 11.
As shown in figure 3, the upper surface of objective table 11 is evenly distributed with the fixed window 20 of multiple samples, the lower surface of objective table 11 The position of the corresponding fixed window 20 of each sample is equipped with locating piece, and locating piece includes the first conductive contact 12.Pedestal 1, which is equipped with, to be located at The part in place of 11 lower section of objective table, part with locating piece for contacting in place.In place part include mounting base 5, the second conductive contact 7, Light source 8 and power supply 6, the second conductive contact 7, light source 8 and power supply 6 are separately positioned in mounting base 5, the second conductive contact 7, light source Be electrically connected to form closed circuit between 8 and power supply 6, and the second conductive contact 7 triggers light source 8 after contacting with the first conductive contact 12 It is shinny.The right side of pedestal 1 is additionally provided with the bracket 9 for installing scanning electron microscope 10, and bracket 9 is for scanning electron microscope 10 to be fixed on Bracket 9 right above the part of position.When one of them first conductive contact 12 of 11 bottom of objective table is contacted with the second conductive contact 7 When, then it represents that the fixed window 20 of sample corresponding with first conductive contact 12 is aligned in the underface of scanning electron microscope 10, so as to It is enough to realize observation.
As shown in figure 4, the lower part of objective table 11 is removably connected with bottom case 22, when objective table 11 is stored, bottom case 22 is used The first conductive contact 12 in protection 11 bottom of objective table.Specifically, the lower surface of objective table 11 is equipped with tapped blind hole, bottom case 22 Equipped with the flange 23 for being fitted in 11 lower surface of objective table, flange 23 is equipped with tapped through hole 24, tapped blind hole and tapped through hole 24 are bolted to connection.
Specific implementation process is as follows: in use, medical sample is placed in one by one on the fixed window 20 of sample in advance, by the One swing handle 17 and the second swing handle 16 rotate X-axis screw rod 3 and Y-axis screw rod 18 respectively.When rotating X-axis screw rod 3, X Length direction of the axis nut 4 with moving base 15 along pedestal 1 moves, and passes through Y-axis screw rod 18, Y-axis nut 19 and support 14, pedestal 15 The mobile length direction to dynamic object stage 11 along pedestal 1 moves;When rotating Y-axis screw rod 18, Y-axis nut 19 passes through support 14 width direction with dynamic object stage 11 along pedestal 1 moves, i.e., is just able to achieve by rotation X-axis screw rod 3 and Y-axis screw rod 18 respectively The movement of objective table 11.
When being observed one by one to the medical sample in the fixed window 20 of multiple samples, by moving stage 11, make it In fixed corresponding first conductive contact 12 of window 20 of sample contacted with the second conductive contact 7, the second conductive contact 7 is connected, Keep power supply 6 shinny, then the fixed window 20 of the sample is just directed at scanning electron microscope 10, just can see to sample by scanning electron microscope 10 It surveys.When observation, which finishes, carries out the sample observation in the fixed window 20 of next sample, and moving stage 11, so that next sample Corresponding first conductive contact 12 of this fixation window 20 is contacted with the second conductive contact 7, and power supply 6 is shinny, then it represents that next sample Fixed window 20 is completed to be accurately positioned, then the observation of sample is completed by scanning electron microscope 10.When sample fixes the sample in window 20 all After observation, i.e., replaceable next group sample is observed one by one again, and the utility model structure is simple, easy to operate, energy It enough realizes the primary observation of multiple medical samples, and come moving stage 11 in the form of bolt and nut, and combines and determine Position part and part in place, can be realized objective table 11 accurately in place so that medical sample to be observed can be directed at scanning electron microscope 10, To complete to observe.
The above is only the preferred embodiment of the utility model only, is not intended to limit the utility model, all at this Made any modifications, equivalent replacements, and improvements etc., should be included in the utility model within the spirit and principle of utility model Protection scope within.

Claims (7)

1. a kind of sample platform of scanning electronic microscope, including pedestal (1), which is characterized in that the pedestal (1) is rotatably connected to X-axis screw rod (3), the X-axis screw rod (3) is arranged along the length direction of the pedestal (1), is connected with X-axis nut on the X-axis screw rod (3) (4), the X-axis nut (4) is fixedly connected with pedestal (15);The pedestal (15) is rotatably connected to Y-axis screw rod (18), the Y Axis screw rod (18) is arranged along the width direction of the pedestal (1), is connected with Y-axis nut (19) on the Y-axis screw rod (18), described Y-axis nut (19) is fixedly connected with support (14), and the support (14) is connected with objective table (11);The objective table (11) it is upper Surface is evenly distributed with multiple samples and fixes window (20), and the lower surface of the objective table (11) corresponds to the fixed window of each sample (20) position is equipped with locating piece;The pedestal (1) be equipped be located at the objective table (11) below part in place, it is described in place For part for contacting with the locating piece, the pedestal (1) is additionally provided with the bracket (9) for installing scanning electron microscope (10), the branch Frame (9) is used to for scanning electron microscope (10) to be fixed on the bracket (9) right above the part in place.
2. sample platform of scanning electronic microscope according to claim 1, which is characterized in that the locating piece includes the first conductive contact (12), the part in place includes the second conductive contact (7), light source (8) and power supply (6), second conductive contact (7), described Be electrically connected to form closed circuit between light source (8) and the power supply (6), and second conductive contact (7) is led with described first It is shinny that the light source (8) is triggered after electric contact (12) contact.
3. sample platform of scanning electronic microscope according to claim 1, which is characterized in that the support (14) and the objective table It (11) is to be detachably connected between.
4. sample platform of scanning electronic microscope according to claim 3, which is characterized in that the support (14) is equipped with first through hole, The objective table (11) is equipped with the second through-hole (21), and the first through hole and second through-hole (21) are fixed by bolt (13) Connection.
5. sample platform of scanning electronic microscope according to claim 1, which is characterized in that the X-axis screw rod (3) and the pedestal (1) one end being rotatablely connected is fixed with the first swing handle (17), and the Y-axis screw rod (18) and the pedestal (15) are rotatablely connected One end be fixed with the second swing handle (16).
6. sample platform of scanning electronic microscope according to claim 1, which is characterized in that the lower part of the objective table (11) is detachable It is connected with bottom case (22).
7. sample platform of scanning electronic microscope according to claim 6, which is characterized in that the lower surface of the objective table (11) is equipped with Tapped blind hole, the bottom case (22) are equipped with the flange (23) for being fitted in the objective table (11) lower surface, the flange (23) tapped through hole (24) are equipped with, the tapped blind hole is bolted to connection with the tapped through hole (24).
CN201920486579.5U 2019-04-11 2019-04-11 A kind of sample platform of scanning electronic microscope Active CN209471922U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920486579.5U CN209471922U (en) 2019-04-11 2019-04-11 A kind of sample platform of scanning electronic microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920486579.5U CN209471922U (en) 2019-04-11 2019-04-11 A kind of sample platform of scanning electronic microscope

Publications (1)

Publication Number Publication Date
CN209471922U true CN209471922U (en) 2019-10-08

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CN201920486579.5U Active CN209471922U (en) 2019-04-11 2019-04-11 A kind of sample platform of scanning electronic microscope

Country Status (1)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111610208A (en) * 2020-06-05 2020-09-01 郑州轻工业大学 Micro-nano chip high-throughput testing robot with visual coupling piezoelectric positioning function

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111610208A (en) * 2020-06-05 2020-09-01 郑州轻工业大学 Micro-nano chip high-throughput testing robot with visual coupling piezoelectric positioning function
CN111610208B (en) * 2020-06-05 2023-02-03 郑州轻工业大学 Micro-nano chip high-throughput testing robot with visual coupling piezoelectric positioning function

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