CN209356439U - A kind of intelligence conductance salt density tester - Google Patents
A kind of intelligence conductance salt density tester Download PDFInfo
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- CN209356439U CN209356439U CN201821726707.0U CN201821726707U CN209356439U CN 209356439 U CN209356439 U CN 209356439U CN 201821726707 U CN201821726707 U CN 201821726707U CN 209356439 U CN209356439 U CN 209356439U
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- at89c52
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Abstract
The utility model proposes a kind of intelligent conductance salt density testers to enhance the data-handling capacity of device by the way that dual processors are arranged, different CPU handles different data, different functions is completed, to improve the data processing speed of instrument and the measurement accuracy of ability and instrument；The relatively high dual port RAM of price is replaced by using cheap RAM6264, can reduce hardware cost, also, dual processors are respectively AT89C52 and AT89C55, the cost of AT89C52 and AT89C55 are low, can be reduced the cost of entire instrument；Whole device can test simultaneously its temperature and conductivity technical indicator while carrying out salt density measure, and measurement accuracy is high, and reflection speed is fast, and hardware cost is low.
Description
Technical field
The utility model relates to electric system external insulation technical field more particularly to a kind of intelligent conductance salt density measurements
Instrument.
Background technique
Pollution flashover, which occurs, for insulator surface causes power transmission and transforming equipment to trip, and is a kind of Common Accidents occurred in high-tension line,
Due to bad weather conditions such as mist, drizzle, ice-melt, snow melts, the solid, liquid, gas for being deposited on insulator surface for being are micro-
Grain reduces insulator electrical strength, leads to that flashover occurs under the normal abundant emerging voltage of transmission line of electricity, and cause power transmission and transformation line
It trips so as to cause large area blackout on road.The test method of traditional equivalent salt deposit density is measured using conductivity meter
The conductivity of the cleaning solution of clear porcelain vase, then goes out equivalent salt deposit density, the survey of this method by temperature-compensating computation of table lookup
Accuracy of measurement is influenced by various human factors, thus measurement accuracy is not high, therefore now needs that a kind of measurement accuracy is high, intelligence at low cost
It can conductance salt density tester.
Utility model content
In view of this, the utility model proposes a kind of measurement accuracy height, intelligent conductance salt density tester at low cost.
The technical solution of the utility model is achieved in that the utility model provides a kind of intelligent conductance salt density survey
Try instrument comprising temperature sensor, operational amplification circuit, conductivity test circuit and A/D conversion circuit, further include the first CPU,
2nd CPU and RAM；
Operational amplification circuit is electrically connected with temperature sensor and A/D conversion circuit respectively, A/D conversion circuit respectively with electricity
Conductance is tested circuit and the first CPU and is electrically connected, the first CPU and the 2nd CPU electric connection, RAM respectively with the first CPU and second
CPU is electrically connected.
On the basis of above technical scheme, it is preferred that conductivity test circuit includes: electrode, resistance R4, selection switch
J, operational amplifier, resistance R5 and feedback resistance Rf；
One end of electrode is electrically connected with one end of positive pole and resistance R4 respectively, and the other end of electrode and selection switch
The movable contact of J is electrically connected, and the other end of resistance R4 and another movable contact of selection switch J are electrically connected, and selects switch J's
One end of stationary contact and feedback resistance Rf respectively with the noninverting input of operational amplifier be electrically connected, operational amplifier it is reversed
One end of input terminal and resistance R5 are electrically connected, the other end ground connection of resistance R5, the output end of operational amplifier respectively with feedback
The other end and A/D conversion circuit of resistance Rf is electrically connected.
It is further preferred that temperature sensor is AD590；
Operational amplification circuit includes: operational amplifier OP07, resistance R2, resistance R3, thermistor Rt and capacitor C；
The anode of AD590 is electrically connected with the power supply, the cathode of AD590 one end with one end of resistance R2 and temperature-sensitive Rt respectively
Be electrically connected, the other end of thermistor Rt ground connection, the other end of resistance R2 respectively with the anode and operational amplifier of capacitor C
The noninverting input of OP07 is electrically connected, and the reverse input end of operational amplifier OP07 is put with one end of resistance R3 and operation respectively
The output end of big device OP07 is electrically connected, the other end ground connection of resistance R3, output end and A/D the conversion electricity of operational amplifier OP07
Road is electrically connected.
It is further preferred that A/D conversion circuit includes A/D conversion chip ADC0832；
The CH0 pin of ADC0832 and the output end of operational amplifier are electrically connected, and CH1 pin and the operation of ADC0832 is put
The output end of big device OP07 is electrically connected, and the DO pin of ADC0832 and the DI pin of ADC0832 are electrically connected.
It is further preferred that the first CPU is AT89C52, the 2nd CPU is AT89C55；
P3.1 the and P3.5 pin of AT89C52 corresponds with P1.1 the and P1.0 pin of AT89C55 be electrically connected respectively；
P2.5, P2.6 and P2.7 pin of AT89C52 corresponds electrically with DI, CLK and CS pin of ADC0832 respectively
Connection.
It is further preferred that RAM is RAM6264；
The CS pin of RAM6264 is electrically connected with the P1.2 pin of the P3.0 pin of AT89C52 and AT89C55 respectively,
CE, WR and OE pin of RAM6264 corresponds with P2.7, P3.6 and P3.7 pin of AT89C52 be electrically connected respectively,
D0~D7 pin of RAM6264 corresponds with P0.0~P0.7 pin of AT89C52 be electrically connected respectively, the A8 of RAM6264
~A12 pin corresponds with P2.0~P2.4 pin be electrically connected respectively.
It is further preferred that further including clock chip, display and printer；
Clock chip and the first CPU are electrically connected, and display and printer are electrically connected with the 2nd CPU respectively.
Still more preferably, clock chip DS12887.
Still more preferably, display is HY-19248AI liquid crystal display.
A kind of intelligent conductance salt density tester of the utility model has the advantages that compared with the existing technology
(1) by setting dual processors, the data-handling capacity of device is enhanced, different CPU handles different data, complete
At different functions, to improve the data processing speed of instrument and the measurement accuracy of ability and instrument；
(2) dual port RAM for replacing price relatively high by using cheap RAM6264, can reduce hardware cost,
Also, dual processors are respectively AT89C52 and AT89C55, and the cost of AT89C52 and AT89C55 are low, can be reduced entire instrument
Cost；
(3) whole device can carry out simultaneously its temperature and conductivity technical indicator while carrying out salt density measure
Test, and measurement accuracy is high, and reflection speed is fast, and hardware cost is low.
Detailed description of the invention
In order to illustrate the embodiment of the utility model or the technical proposal in the existing technology more clearly, below will be to embodiment
Or attached drawing needed to be used in the description of the prior art is briefly described, it should be apparent that, the accompanying drawings in the following description is only
It is some embodiments of the utility model, for those of ordinary skill in the art, in the premise not made the creative labor
Under, it is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of intelligent conductance salt density tester structure chart of the utility model；
Fig. 2 is that conductivity tests circuit diagram in a kind of intelligent conductance salt density tester of the utility model；
Fig. 3 is operational amplification circuit figure in a kind of intelligent conductance salt density tester of the utility model；
Fig. 4 is A/D conversion circuit figure in a kind of intelligent conductance salt density tester of the utility model；
Fig. 5 is RAM circuit figure in a kind of intelligent conductance salt density tester of the utility model.
Specific embodiment
Below in conjunction with the utility model embodiment, the technical solution in the utility model embodiment is carried out clear
Chu is fully described by, it is clear that and described embodiment is only a part of embodiment of the utility model, rather than all
Embodiment.Based on the embodiment in the utility model, those of ordinary skill in the art are not making creative work
Under the premise of every other embodiment obtained, fall within the protection scope of the utility model.
As shown in Figure 1, a kind of intelligent conductance salt density tester of the utility model comprising temperature sensor, operation
Amplifying circuit, conductivity test circuit, A/D conversion circuit, the first CPU, the 2nd CPU, RAM, clock circuit, display and printing
Device.
First CPU is AT89C52, and the 2nd CPU is AT89C55.Wherein, AT89C52 is mainly responsible at signal input amplification
Reason, A/D conversion and clock adjust function, meanwhile, RAM is written into practice and measurement result digital quantity, is calculated for AT89C55, is aobvious
Show and print, AT89C52 is mainly responsible for very fast three, display output and printing function.In the present embodiment, AT89C52 and
The peripheral circuit of AT89C55 is consistent with the peripheral circuit on their chip handbook, no longer burdensome herein, illustrates in the present embodiment
Connection relationship between AT89C52 and AT89C55, wherein as shown in figure 5, P3.1 the and P3.5 pin of AT89C52 respectively with
P1.1 the and P1.0 pin of AT89C55, which corresponds, to be electrically connected.
RAM, storing data.RAM6264 is used in the present embodiment, is compared using cheap RAM6264 instead of price
High dual port RAM can reduce hardware cost.Wherein, as shown in figure 5, the CS pin of RAM6264 is respectively with AT89C52's
The P1.2 pin of P3.0 pin and AT89C55 are electrically connected, and CE, WR and OE pin of RAM6264 is respectively with AT89C52's
P2.7, P3.6 and P3.7 pin correspond be electrically connected, D0~D7 pin of RAM6264 respectively with the P0.0 of AT89C52~
P0.7 pin correspond be electrically connected, A8~A12 pin of RAM6264 respectively with P2.0~P2.4 pin one of AT89C52
A pair of of electrotropism connection.
Conductivity tests circuit, and the resistance R between detecting electrode obtains resistance according to the relationship of resistance R and electrode coefficient
Rate, the conductivity of solution are the inverse of resistivity.In addition, electrode coefficient is result of the interelectrode distance divided by motor area.Such as
Shown in Fig. 2, conductivity test circuit includes: electrode, resistance R4, selection switch J, operational amplifier, resistance R5 and feedback resistance
Rf；In the present embodiment, the material of electrode is platinum black；Resistance R4 is precision resistance, because resistance R4 is in parallel with electrode, the two both ends
Voltage it is equal, so using the voltage at the both ends resistance R4 as sampling input signal；Feedback resistance Rf sets closed-loop dynamic
Range makes the large signal bandwidth of device be in close proximity to small signal bandwidth, and due to the intrinsic linearity, when high frequency big signal can also
To obtain low distortion.Wherein, one end of electrode respectively with one end of positive pole and resistance R4 be electrically connected, electrode it is another
End and the movable contact of selection switch J are electrically connected, another movable contact of the other end and selection switch J of resistance R4 electrically connects
It connects, one end of the stationary contact and feedback resistance Rf that select switch J is electrically connected with the noninverting input of operational amplifier respectively, fortune
One end of the reverse input end and resistance R5 of calculating amplifier is electrically connected, the other end of resistance R5 ground connection, operational amplifier it is defeated
Outlet is electrically connected with the other end of feedback resistance Rf and A/D conversion circuit respectively.
Temperature sensor and operational amplification circuit, temperature sensor detect the temperature of solution, and will by operational amplifier
Testing result amplifies.In the present embodiment, temperature sensor AD590；As shown in figure 3, operational amplification circuit includes: fortune
Calculate Amplifier OP07, resistance R2, resistance R3, thermistor Rt and capacitor C；Wherein, operational amplifier OP07 input impedance is high, warm
Degree coefficient is good, precision is high.The anode of AD590 is electrically connected with the power supply, the cathode of AD590 respectively with one end of resistance R2 and temperature-sensitive
One end of Rt is electrically connected, the other end ground connection of thermistor Rt, the other end of resistance R2 respectively with the anode of capacitor C and operation
The noninverting input of Amplifier OP07 is electrically connected, the reverse input end of operational amplifier OP07 respectively with one end of resistance R3 and
The output end of operational amplifier OP07 is electrically connected, the other end ground connection of resistance R3, the output end and A/D of operational amplifier OP07
Conversion circuit is electrically connected.
The analog-signal transitions that conductivity tests circuit and temperature sensor detection are that CPU can know by A/D conversion circuit
Other digital signal.A/D conversion circuit includes: the peripheral circuit of ADC0832 chip and ADC0832 chip, because of ADC0832 core
The peripheral circuit of piece is consistent with the circuit of periphery on chip handbook, no longer burdensome herein, in the present embodiment, only illustrates
The relationship that ADC0832 chip is connect with operational amplification circuit, conductivity test circuit and the first CPU；In the present embodiment, such as
Shown in Fig. 4, the CH0 pin of ADC0832 and the output end of operational amplifier are electrically connected, and CH1 pin and the operation of ADC0832 is put
The output end of big device OP07 is electrically connected, and the DO pin of ADC0832 and the DI pin of ADC0832 are electrically connected, ADC0832's
DI, CLK and CS pin correspond with P2.5, P2.6 and P2.7 pin of AT89C52 be electrically connected respectively.
Clock circuit provides clock signal for AT89C52.Clock chip uses DS12887 chip in the present embodiment.
Display shows the result and conductivity of sampling.In the present embodiment, display is HY-19248AI liquid crystal display
Screen.
Printer needs to print result according to user.
The working principle of the utility model is: in test by the resistance value between measuring electrode and according to electrode system
Number, acquires resistivity, the inverse of resistivity is the conductivity of solution.Because circuit is linear system, so by precision resistance R4
The voltage at both ends is transported to A/D conversion circuit after amplification and carries out analog-to-digital conversion, temperature as input signal, the input signal
The temperature of sensor detection solution is simultaneously converted into current signal, and current signal is output to A/D after operational amplification circuit amplifies and turns
It changes circuit and carries out analog-to-digital conversion, A/D conversion circuit converts analog signals into the digital signal that AT89C52 can be identified, and will
Digital signal after conversion exports to AT89C52, AT89C52 and data-signal is stored in RAM, and when providing for entire circuit
Clock signal, and clock information is stored in RAM, AT89C55 extracts the digital information stored in RAM and clock information, so
Multiplication and division operation is carried out afterwards, obtains conductivity, and will be incited somebody to action the results show that connect printer according to the needs of users by display
The result of test prints.
The foregoing is merely the better embodiments of the utility model, are not intended to limit the utility model, it is all
Within the spirit and principles of the utility model, it is practical new to should be included in this for any modification, equivalent replacement, improvement and so on
Within the protection scope of type.
Claims (9)
1. a kind of intelligence conductance salt density tester comprising temperature sensor, operational amplification circuit, conductivity test circuit and
A/D conversion circuit, it is characterised in that: further include the first CPU, the 2nd CPU and RAM；
The operational amplification circuit is electrically connected with temperature sensor and A/D conversion circuit respectively, A/D conversion circuit respectively with electricity
Conductance is tested circuit and the first CPU and is electrically connected, the first CPU and the 2nd CPU electric connection, RAM respectively with the first CPU and second
CPU is electrically connected.
2. a kind of intelligent conductance salt density tester as described in claim 1, it is characterised in that: the conductivity tests circuit
It include: electrode, resistance R4, selection switch J, operational amplifier, resistance R5 and feedback resistance Rf；
One end of the electrode is electrically connected with one end of positive pole and resistance R4 respectively, and the other end of electrode and selection switch
The movable contact of J is electrically connected, and the other end of resistance R4 and another movable contact of selection switch J are electrically connected, and selects switch J's
One end of stationary contact and feedback resistance Rf respectively with the noninverting input of operational amplifier be electrically connected, operational amplifier it is reversed
One end of input terminal and resistance R5 are electrically connected, the other end ground connection of resistance R5, the output end of operational amplifier respectively with feedback
The other end and A/D conversion circuit of resistance Rf is electrically connected.
3. a kind of intelligent conductance salt density tester as claimed in claim 2, it is characterised in that: the temperature sensor is
AD590；
The operational amplification circuit includes: operational amplifier OP07, resistance R2, resistance R3, thermistor Rt and capacitor C；
The anode of the AD590 is electrically connected with the power supply, the cathode of AD590 one end with one end of resistance R2 and temperature-sensitive Rt respectively
Be electrically connected, the other end of thermistor Rt ground connection, the other end of resistance R2 respectively with the anode and operational amplifier of capacitor C
The noninverting input of OP07 is electrically connected, and the reverse input end of operational amplifier OP07 is put with one end of resistance R3 and operation respectively
The output end of big device OP07 is electrically connected, the other end ground connection of resistance R3, output end and A/D the conversion electricity of operational amplifier OP07
Road is electrically connected.
4. a kind of intelligent conductance salt density tester as claimed in claim 3, it is characterised in that: the A/D conversion circuit packet
Include A/D conversion chip ADC0832；
The CH0 pin of the ADC0832 and the output end of operational amplifier are electrically connected, and CH1 pin and the operation of ADC0832 is put
The output end of big device OP07 is electrically connected, and the DO pin of ADC0832 and the DI pin of ADC0832 are electrically connected.
5. a kind of intelligent conductance salt density tester as claimed in claim 4, it is characterised in that: the first CPU is
AT89C52, the 2nd CPU are AT89C55；
P3.1 the and P3.5 pin of the AT89C52 corresponds with P1.1 the and P1.0 pin of AT89C55 be electrically connected respectively；
P2.5, P2.6 and P2.7 pin of the AT89C52 corresponds electrically with DI, CLK and CS pin of ADC0832 respectively
Connection.
6. a kind of intelligent conductance salt density tester as claimed in claim 5, it is characterised in that: the RAM is RAM6264；
The CS pin of the RAM6264 is electrically connected with the P1.2 pin of the P3.0 pin of AT89C52 and AT89C55 respectively,
CE, WR and OE pin of RAM6264 corresponds with P2.7, P3.6 and P3.7 pin of AT89C52 be electrically connected respectively,
D0~D7 pin of RAM6264 corresponds with P0.0~P0.7 pin of AT89C52 be electrically connected respectively, the A8 of RAM6264
~A12 pin corresponds with P2.0~P2.4 pin be electrically connected respectively.
7. a kind of intelligent conductance salt density tester as described in claim 1, it is characterised in that: further include clock chip, aobvious
Show device and printer；
The clock chip and the first CPU are electrically connected, and display and printer are electrically connected with the 2nd CPU respectively.
8. a kind of intelligent conductance salt density tester as claimed in claim 7, it is characterised in that: the clock chip is
DS12887。
9. a kind of intelligent conductance salt density tester as claimed in claim 7, it is characterised in that: the display is HY-
19248AI liquid crystal display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821726707.0U CN209356439U (en) | 2018-10-24 | 2018-10-24 | A kind of intelligence conductance salt density tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821726707.0U CN209356439U (en) | 2018-10-24 | 2018-10-24 | A kind of intelligence conductance salt density tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209356439U true CN209356439U (en) | 2019-09-06 |
Family
ID=67782081
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821726707.0U Expired - Fee Related CN209356439U (en) | 2018-10-24 | 2018-10-24 | A kind of intelligence conductance salt density tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209356439U (en) |
-
2018
- 2018-10-24 CN CN201821726707.0U patent/CN209356439U/en not_active Expired - Fee Related
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| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190906 Termination date: 20201024 |