CN209231396U - A kind of semiconductor test probe - Google Patents
A kind of semiconductor test probe Download PDFInfo
- Publication number
- CN209231396U CN209231396U CN201821347837.3U CN201821347837U CN209231396U CN 209231396 U CN209231396 U CN 209231396U CN 201821347837 U CN201821347837 U CN 201821347837U CN 209231396 U CN209231396 U CN 209231396U
- Authority
- CN
- China
- Prior art keywords
- shell
- fixedly installed
- movably installed
- double threaded
- test probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 title claims abstract description 42
- 238000012360 testing method Methods 0.000 title claims abstract description 42
- 239000004065 semiconductor Substances 0.000 title claims abstract description 15
- 238000009434 installation Methods 0.000 claims abstract description 10
- 230000000694 effects Effects 0.000 claims description 8
- 230000002742 anti-folding effect Effects 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 4
- 238000011017 operating method Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 5
- 239000000428 dust Substances 0.000 description 3
- 238000004321 preservation Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 206010044565 Tremor Diseases 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model discloses a kind of semiconductor test probes, including shell, two test probes are movably installed on the inside of the shell, two test probe pin upper ends are movably installed with installation part by screw thread, the first spring is fixedly installed between the upper end and shell inner top side of the installation part, double threaded screw is movably installed in the middle part of the shell, two test probes pass through screw thread respectively and are flexibly connected with double threaded screw, the two sides of the shell are movably installed with fixing piece respectively, two fixing pieces are flexibly connected by bearing with double threaded screw, one end of the double threaded screw is fixedly installed turntable, the lower end of two fixing pieces is movably installed with locating part by screw thread, the locating part is fixedly installed rubber pad close to one end end of shell.The utility model is connect accurately convenient for syringe needle with the pin of component to be measured, while guaranteeing that stable connection is not easily disconnected from by setting magnet, guarantees the stability and accuracy in test operating procedure.
Description
Technical field
The utility model relates to test probe device technical field, specially a kind of semiconductor test probe.
Background technique
With the development of science and technology, constantly small and exquisite towards electronic product, the frivolous direction of consumer is developed, therewith for electricity
The performance detection requirement of sub- product is also higher and higher, and it is accurate measurement that probe, which has been widely used in instrument and test industry,
Resistance or the most common sampling means of other electric signals, probe main Types: cantilever probe and Vertrical probe, but it is existing
Probe brings certain difficulty in receiving management and preservation after use, preservation is improper will be straight since volume itself is too small
Connecing influences secondary use, and existing device must be operated with the hands, while syringe needle connect inaccuracy and shakiness with component's feet
It is fixed, it is easy to fall off.
Utility model content
The purpose of this utility model is to provide a kind of semiconductor test probes, mentioned above in the background art to solve
Problem.
To achieve the above object, the utility model provides the following technical solutions: a kind of semiconductor test probe, including outer
Shell is movably installed with two test probes on the inside of the shell, and two test probe pin upper ends are installed by screw thread activity
There is installation part, the first spring is fixedly installed between the upper end and shell inner top side of the installation part, is lived in the middle part of the shell
Dynamic to be equipped with double threaded screw, two test probes pass through screw thread respectively and are flexibly connected with double threaded screw, and the two of the shell
Side is movably installed with fixing piece respectively, and two fixing pieces are flexibly connected by bearing with double threaded screw, the double threaded screw
One end be fixedly installed turntable, the lower end of two fixing pieces is movably installed with locating part, the locating part by screw thread
It is fixedly installed rubber pad close to one end end of shell, the lower end of two test probes is movably installed with by screw thread respectively
The inside lower end of syringe needle, two syringe needles is fixedly installed magnet.
Preferably, the upper end of the shell is fixedly installed anti-folding piece, and the upper end of the anti-folding piece is fixedly installed wall hanging
Part.
Preferably, loose slot, the inside both ends of the loose slot are offered on the outside of the surface double-head screw rod of the shell
It is fixedly installed second spring, dustcloth, the opposite one end of the second spring are fixedly installed on the outside of the second spring
It is fixedly installed mounting ring, the mounting ring is set in the outside of double threaded screw.
Preferably, the side of the outer surface loose slot of the shell is fixedly installed Non-slip material.
Preferably, the lower end outside of the shell is movably installed with protection cap by screw thread.
Compared with prior art, the utility model has the beneficial effects that
1, the utility model is by setting magnet, double threaded screw, by protection cap by screwing, by adjusting as needed
The length for saving two test probes, after regulating length, by rotary stopper part secure the fix to the outside of shell to
Test probe is fixed, drives two test probes to adjust it according to demand by rotation driven by rotary disc double threaded screw rotation
Between distance, convenient for operation, by be arranged magnet, connect accurately convenient for syringe needle with the pin of component to be measured, while guaranteeing to connect
It connects stabilization to be not easily disconnected from, guarantees the stability and accuracy in test operating procedure；
2, the utility model has certain protection and dust-proof work to loose slot by setting second spring and dustcloth
With avoiding extraneous foreign matter or dust from entering the inside of shell, influence the operation of device and the accuracy of test result, pass through
Rubber pad is set, convenient for protecting shell not to be extruded damage and increasing friction force, convenient for the fixation of fixing piece.
Detailed description of the invention
Fig. 1 is a kind of semiconductor test probe overall structure diagram of the utility model；
Fig. 2 is a kind of semiconductor test probe main view of the utility model；
Fig. 3 is the installation view of a kind of semiconductor test probe second spring of the utility model, mounting ring.
In figure: 1, shell；2, probe is tested；3, installation part；4, the first spring；5, double threaded screw；6, fixing piece；7, turn
Disk；8, locating part；81, rubber pad；9, syringe needle；10, magnet；11, anti-folding piece；111, wall hanging piece；12, loose slot；121, second
Spring；122, dustcloth；123, mounting ring；13, Non-slip material；14, protection cap.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
Every other embodiment obtained, fall within the protection scope of the utility model.
Fig. 1-3 is please referred to, the utility model provides a kind of technical solution: a kind of semiconductor test probe, including shell 1,
The inside of the shell 1 is movably installed with two test probes 2, and two 2 upper ends of test probe are installed by screw thread activity
There is installation part 3, be fixedly installed the first spring 4 between 1 inner top side of upper end and shell of the installation part 3, in the shell 1
Portion is movably installed with double threaded screw 5, and two test probes 2 are flexibly connected by screw thread with double threaded screw 5 respectively, described outer
The two sides of shell 1 are movably installed with fixing piece 6 respectively, and two fixing pieces 6 are flexibly connected by bearing with double threaded screw 5, institute
The one end for stating double threaded screw 5 is fixedly installed turntable 7, and the lower end of two fixing pieces 6 is movably installed with limit by screw thread
Part 8, the locating part 8 are fixedly installed rubber pad 81, the lower end point of two test probes 2 close to one end end of shell 1
Syringe needle 9 is not movably installed with by screw thread, the inside lower end of two syringe needles 9 is fixedly installed magnet 10.
The upper end of the shell 1 is fixedly installed anti-folding piece 11, and the upper end of the anti-folding piece 11 is fixedly installed wall hanging piece
111, bending damage when rear wiring being avoided to use, while it is convenient to take extension；The outside of the surface double-head screw rod 5 of the shell 1 opens up
There is loose slot 12, the inside both ends of the loose slot 12 are fixedly installed second spring 121, the outside of the second spring 121
It is fixedly installed dustcloth 122, the opposite one end of the second spring 121 is fixedly installed mounting ring 123, the mounting ring
123 are set in the outside of double threaded screw 5, have certain protection and dustproof effect, and extraneous foreign matter or dust is avoided to enter
The inside of shell 1 influences the operation of device and the accuracy of test result；The one of the outer surface loose slot 12 of the shell 1
Side is fixedly installed Non-slip material 13, with certain anti-skidding effect when use；The lower end outside of the shell 1 passes through screw thread activity
Protection cap 14 is installed, there is certain protective effect not use or in transit.
Working principle: by protection cap 14 by screwing, by adjusting the length of two test probes 2 as needed,
After regulating length, fixing piece 6 is fixed on by the outside of shell 1 by rotary stopper part 8 and is fixed to which probe 2 will be tested, is led to
It crosses rotation turntable 7 and drives the distance between double threaded screw 5 rotates and then two test probes 2 of drive are adjusted according to demand, be convenient for
Operation is connect accurately convenient for syringe needle 9 with the pin of component to be measured, while guaranteeing that stable connection is not easy by the way that magnet 10 is arranged
It is detached from, guarantees the stability and accuracy in test operating procedure, by setting second spring 121 and dustcloth 122, to activity
Slot 12 has certain protection and dustproof effect, avoids extraneous foreign matter or dust from entering the inside of shell 1, influences device
The accuracy of operation and test result, by the way that rubber pad 81 is arranged, convenient for protecting shell 1 not to be extruded damage and increasing friction
Power, convenient for the fixation of fixing piece 6.
It should be noted that, in this document, relational terms such as first and second and the like are used merely to a reality
Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation
In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to
Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those
Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment
Intrinsic element.
While there has been shown and described that the embodiments of the present invention, for the ordinary skill in the art,
It is understood that these embodiments can be carried out with a variety of variations in the case where not departing from the principles of the present invention and spirit, repaired
Change, replacement and variant, the scope of the utility model is defined by the appended claims and the equivalents thereof.
Claims (5)
1. a kind of semiconductor test probe, including shell (1), it is characterised in that: be movably installed with two on the inside of the shell (1)
A test probe (2), the two test probe (2) upper ends are movably installed with installation part (3), the installation part by screw thread
(3) it is fixedly installed the first spring (4) between upper end and shell (1) inner top side, is movably installed in the middle part of the shell (1)
Double threaded screw (5), two test probes (2) are flexibly connected by screw thread with double threaded screw (5) respectively, the shell (1)
Two sides be movably installed with respectively fixing piece (6), two fixing pieces (6) are flexibly connected by bearing with double threaded screw (5),
One end of the double threaded screw (5) is fixedly installed turntable (7), and the lower end of two fixing pieces (6) is pacified by screw thread activity
Equipped with locating part (8), the locating part (8) is fixedly installed rubber pad (81) close to one end end of shell (1), two surveys
The lower end for souning out needle (2) passes through screw thread respectively and is movably installed with syringe needle (9), and the inside lower end fixation of two syringe needles (9) is set
It is equipped with magnet (10).
2. a kind of semiconductor test probe according to claim 1, it is characterised in that: the upper end of the shell (1) is fixed
It is provided with anti-folding piece (11), the upper end of the anti-folding piece (11) is fixedly installed wall hanging piece (111).
3. a kind of semiconductor test probe according to claim 1, it is characterised in that: the surface double-head of the shell (1)
It is offered on the outside of screw rod (5) loose slot (12), the inside both ends of the loose slot (12) are fixedly installed second spring
(121), be fixedly installed dustcloth (122) on the outside of the second spring (121), the second spring (121) it is opposite one
End is fixedly installed mounting ring (123), and the mounting ring (123) is set in the outside of double threaded screw (5).
4. a kind of semiconductor test probe according to claim 1, it is characterised in that: the outer surface of the shell (1)
The side of loose slot (12) is fixedly installed Non-slip material (13).
5. a kind of semiconductor test probe according to claim 1, it is characterised in that: the lower end outside of the shell (1)
Protection cap (14) are movably installed with by screw thread.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821347837.3U CN209231396U (en) | 2018-08-21 | 2018-08-21 | A kind of semiconductor test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821347837.3U CN209231396U (en) | 2018-08-21 | 2018-08-21 | A kind of semiconductor test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209231396U true CN209231396U (en) | 2019-08-09 |
Family
ID=67497871
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821347837.3U Expired - Fee Related CN209231396U (en) | 2018-08-21 | 2018-08-21 | A kind of semiconductor test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209231396U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112230116A (en) * | 2020-10-13 | 2021-01-15 | 宁波丞达精机股份有限公司 | Intelligent test unit of semiconductor test equipment |
| CN114076890A (en) * | 2021-11-18 | 2022-02-22 | 上达电子（深圳）股份有限公司 | Needle plate structure of universal electrical measurement jig wire with variable needle pitch |
| CN114354992A (en) * | 2021-12-13 | 2022-04-15 | 渭南高新区木王科技有限公司 | One-way parallel double-head test probe |
-
2018
- 2018-08-21 CN CN201821347837.3U patent/CN209231396U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112230116A (en) * | 2020-10-13 | 2021-01-15 | 宁波丞达精机股份有限公司 | Intelligent test unit of semiconductor test equipment |
| CN114076890A (en) * | 2021-11-18 | 2022-02-22 | 上达电子（深圳）股份有限公司 | Needle plate structure of universal electrical measurement jig wire with variable needle pitch |
| CN114354992A (en) * | 2021-12-13 | 2022-04-15 | 渭南高新区木王科技有限公司 | One-way parallel double-head test probe |
| CN114354992B (en) * | 2021-12-13 | 2024-03-22 | 木王芯(苏州)半导体科技有限公司 | Unidirectional parallel double-head test probe |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN209231396U (en) | A kind of semiconductor test probe | |
| CN107877148B (en) | A kind of screw detecting mechanism, detection method and automatic production line | |
| CN201780094U (en) | Grinding disc flatness measurement instrument | |
| CN105300246A (en) | Rolling bearing radial clearance detection method and device | |
| CN201548191U (en) | Displacement measurement device for building structure | |
| CN201514229U (en) | Vortex flow sensor check table | |
| CN205157198U (en) | Bearing friction torque measuring apparatu | |
| CN201672893U (en) | Apparatus for detecting the position degree of motor casing thread hole and output shaft | |
| CN209043237U (en) | A kind of strain-type roughness sensor | |
| CN202109851U (en) | Blind hole impeller bounce detector | |
| CN208297277U (en) | A kind of portable hardometer | |
| CN200944039Y (en) | Fast checkout device for measuring workpiece | |
| CN109458926A (en) | A kind of strain-type roughness sensor | |
| CN206177162U (en) | Short -term test frock | |
| CN102109311A (en) | Device for measuring pitch diameter | |
| CN204988867U (en) | Metal material fatigue damage test system | |
| CN208313190U (en) | It is a kind of for measuring the tool of motor installation dimension C value | |
| CN208155279U (en) | Realize the detection device of internal hole reference measurement of comparison circular runout | |
| CN214224031U (en) | Physical tester with clamping function for precision part machining | |
| CN206057445U (en) | A kind of rolling contact type synchronization probe unit | |
| CN201522255U (en) | Digital display caliper | |
| CN201637525U (en) | Induction device pre-tightening and tension bearing test device | |
| CN206177981U (en) | High -efficient antivibration high -precision degree rotational speed measuring device | |
| CN209043276U (en) | A kind of bearing detecting device for precision bearing production | |
| CN208704596U (en) | A kind of inspection rule |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190809 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |