CN209215446U - It is a kind of for testing the probe and noise-measuring system of common-mode noise - Google Patents
It is a kind of for testing the probe and noise-measuring system of common-mode noise Download PDFInfo
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- CN209215446U CN209215446U CN201921011890.0U CN201921011890U CN209215446U CN 209215446 U CN209215446 U CN 209215446U CN 201921011890 U CN201921011890 U CN 201921011890U CN 209215446 U CN209215446 U CN 209215446U
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Abstract
The utility model is technical field of electromagnetic compatibility, provides a kind of for testing the probe and noise-measuring system in common-mode noise path, which includes: probe, is adapted to be coupled to test object;Printed circuit board, one end are connected to the probe, and the other end is connected to noise level monitor by coaxial cable, and the coaxial cable is externally provided with shielded layer, and the shielded layer is connected to the ground line of the noise level monitor;Capacitor is set on the printed circuit board, and the received common-mode noise of probe is transferred in the noise level monitor after the capacitor;Metallic screen sleeve is set in outside the printed circuit board, and the metallic screen sleeve is connected to the shielded layer.Compared with prior art, probe provided by the utility model can shield interference of the external noise to common-mode noise, realize the detection to common-mode noise path.
Description
Technical field
The utility model relates generally to field of electromagnetic compatibility more particularly to a kind of probe for testing common-mode noise and makes an uproar
Electroacoustic test device.
Background technique
In the field electromagnetic compatibility (Electromagnetic Compatibility, EMC), conducted noise can be divided into differential mode
Noise and common-mode noise.
The conducting path of common-mode noise is often extremely complex, causes the conducting path for testing common-mode noise extremely difficult.So
And the conducting path for testing common-mode noise is necessary again, because the path for determining common-mode noise is to be filtered, bypass to it
With the premise of elimination.
The prior art is attempted using probe come test noise conducting path, however popping one's head in can only be relatively simple for test path
Single differential mode noise, is unable to test the relative complex common-mode noise in path.It, will when testing differential mode noise conducting path using probe
Oscillograph is connected to test probe, and differential mode noise is transferred in oscillograph and is shown.However the bottom of oscillograph is made an uproar usually
1mV or so, the amplitude of differential mode noise are 0.01mV or so, and bottom is made an uproar larger to the interference of differential mode noise, lead to the road of differential mode noise
Diameter test is also inaccurate.In addition, differential mode noise can not be separated with common-mode noise, common-mode noise component is to differential mode noise point in noise
The path testing of amount can also have an impact.
Utility model content
The probe and noise testing that the technical problem to be solved by the present invention is to provide a kind of for testing common-mode noise
Device to realize the test to common mode interference path, while improving the accuracy and precision of test.
In order to solve the above technical problems, the one side of the utility model provide it is a kind of for testing the spy in common-mode noise path
Head, the probe include: probe, are adapted to be coupled to test object;Printed circuit board, one end are connected to the probe, and the other end is logical
It crosses coaxial cable and is connected to noise level monitor, the coaxial cable is externally provided with shielded layer, and the shielded layer is connected to the noise
The ground line of detector;Capacitor is set on the printed circuit board, and the received common-mode noise of probe passes after the capacitor
It is handed in the noise level monitor;Metallic screen sleeve is set in outside the printed circuit board, and the metallic screen sleeve connects
It is connected to the shielded layer.
In an embodiment of the utility model, the capacitor is welded on the printed circuit board, and the capacitor
One end is electrically connected to the probe by copper foil wiring, and the other end of the capacitor is electrically connected to described coaxial by copper foil wiring
Cable.
In an embodiment of the utility model, the capacitance of the capacitor is 1-10PF.
In an embodiment of the utility model, the printed circuit board is detachably connectable to the probe.
It is described to be detachably connected as threaded connection, pin connection or key connection in an embodiment of the utility model.
In an embodiment of the utility model, the capacitor is variable capacitance.
The another aspect of the utility model provides a kind of noise-measuring system comprising described in any item probes as above,
The test device further includes the noise level monitor for being connected to the probe.
In an embodiment of the utility model, the noise level monitor is to receive with spectrum analyzer or electromagnetic interference
Machine.
Compared with prior art, it is a kind of for testing common mode to have the advantage that the utility model provides for the utility model
The probe and noise-measuring system of noise, metallic screen sleeve is set in outside printed circuit board, and is connected to noise level monitor
Ground line can shield interference of the external noise to common-mode noise, realize the detection to common-mode noise path.
Detailed description of the invention
It is practical to this below in conjunction with attached drawing for the above objects, features, and advantages of the utility model can be clearer and more comprehensible
Novel specific embodiment elaborates, in which:
Fig. 1 is the schematic diagram of the test macro of an embodiment according to the present utility model.
Fig. 2 is the probe diagrammatic cross-section of an embodiment according to the present utility model.
Fig. 3 is the probe diagrammatic cross-section of another embodiment according to the present utility model.
Fig. 4 A is the schematic diagram of an embodiment according to the present utility model tested test point A.
Fig. 4 B is the common-mode noise strength test knot of an embodiment according to the present utility model tested test point A
The schematic diagram of fruit.
Fig. 5 A is the schematic diagram of an embodiment according to the present utility model tested test point B.
Fig. 5 B is the common-mode noise strength test knot of an embodiment according to the present utility model tested test point B
The schematic diagram of fruit.
Description of symbols
100 probes
101 probes
102 printed circuit boards
103 capacitors
104 metallic screen sleeves
105 coaxial cables
106 shielded layers
The wiring of 107 copper foils
108 connecting lines
200 noise level monitors
300 test objects
400 probes
401 probes
402 printed circuit boards
403 capacitors
404 metallic screen sleeves
405 coaxial cables
406 shielded layers
The wiring of 407 copper foils
408 connecting lines
Specific embodiment
It is practical to this below in conjunction with attached drawing for the above objects, features, and advantages of the utility model can be clearer and more comprehensible
Novel specific embodiment elaborates.
Many details are explained in the following description in order to fully understand the utility model, but this is practical new
Type can also be implemented using other different from other way described herein, therefore the utility model is not by following public tool
The limitation of body embodiment.
As shown in the application and claims, unless context clearly prompts exceptional situation, " one ", "one", " one
The words such as kind " and/or "the" not refer in particular to odd number, may also comprise plural number.It is, in general, that term " includes " only prompts to wrap with "comprising"
Include clearly identify the step of and element, and these steps and element do not constitute one it is exclusive enumerate, method or apparatus
The step of may also including other or element.
When the utility model embodiment is described in detail, for purposes of illustration only, indicating that the sectional view of device architecture can disobey general ratio
Example makees partial enlargement, and the schematic diagram is example, should not limit the range of the utility model protection herein.In addition,
The three-dimensional space of length, width and depth should be included in actual fabrication.
It is referred to as " on the other part " it should be appreciated that working as a component, " being connected to another component ", " is coupled in
When another component " or " contacting another component ", it can directly on another component, be connected or coupled to,
Or another component is contacted, or may exist insertion part.In contrast, when a component is referred to as " directly another
On a component ", " being directly connected in ", " being coupled directly to " or when " directly contact " another component, insertion part is not present.Together
Sample, when first component referred to as " is in electrical contact " or " being electrically coupled to " second component, in the first component and this second
There is the power path for allowing electric current flowing between part.The power path may include capacitor, the inductor of coupling and/or permission electricity
Other components of flowing, or even do not contacted directly between conductive component.
The utility model provides the probe and noise-measuring system for testing common-mode noise, to realize to common mode interference
The test in path, while improving the accuracy and precision of test.
Fig. 1 is the schematic diagram of the test macro of an embodiment according to the present utility model.As shown in Figure 1, test macro packet
Include probe 100, noise level monitor 200 and test object 300.The structure of probe 100 will be explained below.Noise level monitor 200
It is connected to probe 100, the common mode noise signal for analyzing and detection probe 100 passes over.Noise level monitor 200 can be
Spectrum analyzer, electromagnetic interference (EMI) receiver or other equipment that can measure electromagnetic noise signal.Preferably, noise
Detector 200 can be spectrum analyzer.The usually printed circuit board of test object 300 (Printed circuit board,
PCB).Probe 100 can receive the common-mode noise in test object 300, and received common-mode noise is transmitted to noise measuring
Instrument 200, noise level monitor 200 can be analyzed and be detected to the common-mode noise received.
Fig. 2 is 100 diagrammatic cross-section of probe of an embodiment according to the present utility model.Below with reference to Fig. 2 to probe 100
It is illustrated.As shown in Fig. 2, probe 100 may include probe 101, printed circuit board 102, capacitor 103 and metallic screen sleeve
104。
Probe 101 is adapted to be coupled to test object 300.In one embodiment, test object 300 can be printed circuit
Plate.It may include all kinds of electronic components (electronic component) or integrated circuit in printed circuit board
(integrated circuit, IC), electronic component and integrated circuit form electronic circuit.There are electromagnetism in the electronic circuit
Noise, electromagnetic noise generally include common-mode noise and differential mode noise.Probe 101 can connect to printed circuit board, for example, with print
Printed circuit board contact, electromagnetic noise can be transferred on probe 101, realize the acquisition to electromagnetic noise.The head of probe 101
It can be tip-like, the probe 101 on tip-like head can be used for acquiring the electromagnetic noise in miniature printed circuit board.Other realities
It applies in example, the head of probe 101 is also possible to obtuse.The material of probe 101 can select any conductive metallic material, such as silver
Or copper etc..The section of probe 101 can be circle, be also possible to rectangular.Probe 101 can be Solid probe, be also possible to sky
Heart probe.
102 one end of printed circuit board is connected to probe 101, and the other end is connected to noise level monitor by coaxial cable 105.
Coaxial cable 105 is externally provided with shielded layer 106, and shielded layer 106 is connected to the ground line of noise level monitor.Due to coaxial cable 105
It is provided with shielded layer 106 outside, the interference of external electromagnetic noise can be shielded by the shielded layer 106, improves common-mode noise detection
Accuracy.
In some embodiments, printed circuit board 102 can be detachably connectable to probe 101, for example, printed circuit board
102 can use threaded connection, pin connection or be connected to probe 101.In addition, coaxial cable 105 can be removably
It is connected to probe 100.For example, coaxial cable 105 can use threaded connection, pin connection or be connected to probe 100.
Capacitor 103 is set on printed circuit board 102, and for acquiring common-mode noise, the received common-mode noise of probe 101 is passed through
Capacitor 103 is transferred in noise level monitor 200 after acquiring.In some embodiments, capacitor 103 is welded on printed circuit board 102
On, one end of capacitor 103 is electrically connected to probe 101 by copper foil wiring 107, and the other end of capacitor 103 passes through copper foil wiring 107
It is electrically connected to coaxial cable 105.The capacitance of capacitor 103 can be 1-10PF.By the way that the capacitor of low capacitance is arranged, can drop
Low capacitor 103 is influenced caused by test object.
Metallic screen sleeve 104 is set in outside printed circuit board 102, and metallic screen sleeve 104 is connected to shielded layer
106.As shown in Fig. 2, metallic screen sleeve 104 is connected to shielded layer 106 by connecting line 108.Since shielded layer 106 is connected to
The ground line of noise level monitor, therefore metallic screen sleeve 104 is connected to the ground line of noise level monitor by shielded layer 106,
To shield the electromagnetic wave of external noise generation, differential mode noise and common-mode noise are separated.Common-mode noise is transferred to electricity by probe 101
Hold 103 acquisitions, the common-mode noise that capacitor 103 acquires is transferred to noise level monitor by coaxial cable 105 and is analyzed and detected,
By the multimetering to test object, the conducting path of common-mode noise in test object can be determined.
In some embodiments, metallic screen sleeve 104 can be integrally formed with probe 101, for example, by using Shooting Technique
It is integrally formed metallic screen sleeve 104 and probe 101.
Fig. 4 A is the schematic diagram of an embodiment according to the present utility model tested test point A.Fig. 4 B is basis
The schematic diagram of the common-mode noise strength test results that test point A is tested of one embodiment of the utility model.Fig. 5 A is
The schematic diagram that test point B is tested of an embodiment according to the present utility model.Fig. 5 B is according to the present utility model one
The schematic diagram of the common-mode noise strength test results that test point B is tested of embodiment.Wherein, the test of Fig. 4 B and Fig. 5 B
As a result in schematic diagram, abscissa is frequency, and unit is hertz (Hz), and ordinate is amplitude, and unit is decibel microvolts (dBuv).
The curve of lower section is instantaneous value, and the curve of top is the peak hold value that processing acquisition is carried out to instantaneous value, is made an uproar carrying out common mode
When acoustic path is tested, using peak hold value as standard.It is surveyed below with reference to common-mode noise path of Fig. 4 A-5B to the utility model
Examination process is illustrated.
Common-mode noise pretest is first carried out, determines exceeded frequency point.After determining exceeded frequency point, each test point is obtained exceeded
Amplitude at frequency point.Since the intensity of common-mode noise is maximum at noise source, and as conducting path successively weakens, therefore can be with
Amplitude of each test point at exceeded frequency point is ranked up from big to small, can determine the conducting pathway of common-mode noise by sorting
Diameter.
In the present embodiment, it carries out common-mode noise pretest and determines that exceeded frequency point is 50MHz.As shown in Figure 4 B, for surveying
Pilot A, at 50MHz, amplitude is about 45dBuv, and as shown in Figure 5 B, for test point B, at 50MHz, amplitude is about
43dBuv, since the amplitude at the exceeded frequency point of test point A is greater than the amplitude at test point B ultrasound mark frequency point, thus may determine that surveying
Pilot A is relative to test point B closer to common-mode noise source.It is then determined that amplitude of each test point at exceeded frequency point, each to test
Amplitude of the point at exceeded frequency point is ranked up from big to small, can determine the conducting path of common-mode noise by sorting.
The embodiment of the utility model provides a kind of for testing the probe of common-mode noise, and metallic screen sleeve is set in
Outside printed circuit board, and it is connected to the ground line of noise level monitor, interference of the external noise to common-mode noise can be shielded, realized
Detection to common-mode noise path.
Fig. 3 is the probe diagrammatic cross-section of another embodiment according to the present utility model.Below with reference to Fig. 3 to probe 400
It is illustrated.As shown in figure 3, probe 400 may include probe 401, printed circuit board 402, capacitor 403 and metallic screen sleeve
404。
Probe 401 is adapted to be coupled to test object 300.In one embodiment, test object 300 can be printed circuit
Plate.It may include all kinds of electronic components (electronic component) or integrated circuit in printed circuit board
(integrated circuit, IC), electronic component and integrated circuit form electronic circuit.There are electromagnetism in the electronic circuit
Noise, electromagnetic noise generally include common-mode noise and differential mode noise.Probe 401 can connect to printed circuit board, for example, with print
Printed circuit board contact, electromagnetic noise can be transferred on probe 401, realize the acquisition to electromagnetic noise.The head of probe 401
It can be tip-like, the probe 401 on tip-like head can be used for acquiring the electromagnetic noise in miniature printed circuit board.Other realities
It applies in example, the head of probe 401 is also possible to obtuse.The material of probe 401 can select any conductive metallic material, such as silver
Or copper etc..The section of probe 401 can be circle, be also possible to rectangular.Probe 401 can be Solid probe, be also possible to sky
Heart probe.
402 one end of printed circuit board is connected to probe 401, and the other end is connected to noise level monitor by coaxial cable 405.
Coaxial cable 405 is externally provided with shielded layer 406, and shielded layer 406 is connected to the ground line of noise level monitor.405 peripheral hardware of coaxial cable
It is equipped with shielded layer 406, the interference of external electromagnetic noise can be shielded by the shielded layer 406, improves the standard of common-mode noise detection
True property.
In some embodiments, printed circuit board 402 can be detachably connectable to probe 401, for example, printed circuit board
402 can use threaded connection, pin connection or be connected to probe 401.In addition, coaxial cable 405 can be removably
It is connected to probe 400.For example, coaxial cable 405 can use threaded connection, pin connection or be connected to probe 400.
Capacitor 403 is set on printed circuit board 402, and for acquiring common-mode noise, the received common-mode noise of probe 401 is passed through
Capacitor 403 is transferred in noise level monitor 200 after acquiring.In some embodiments, capacitor 403 is welded on printed circuit board 402
On, one end of capacitor 403 is electrically connected to probe 401 by copper foil wiring 407, and the other end of capacitor 403 passes through copper foil wiring 407
It is electrically connected to coaxial cable 405.The capacitance of capacitor 403 can be 1-10PF.By the way that the capacitor of low capacitance is arranged, can drop
Low capacitor 403 is influenced caused by test object.
Metallic screen sleeve 401 is set in outside printed circuit board 402, and metallic screen sleeve 401 is connected to shielded layer
406.As shown in Fig. 2, metallic screen sleeve 401 is connected to shielded layer 406 by connecting line 408.Since shielded layer 406 is connected to
The ground line of noise level monitor, therefore metallic screen sleeve 401 is connected to the ground line of noise level monitor by shielded layer 406,
To shield the electromagnetic wave of external noise generation, common-mode noise is acquired.Common-mode noise is transferred to capacitor 403 and acquired by probe 401,
The common-mode noise that capacitor 403 acquires is transferred to noise level monitor by coaxial cable 405 and is analyzed and detected, by test
The multimetering of object can determine the conducting path of common-mode noise in test object.
In some embodiments, metallic screen sleeve 401 can be integrally formed with probe 401, for example, by using Shooting Technique
It is integrally formed metallic screen sleeve 401 and probe 401.
Probe 400 and the difference of the probe 100 in a upper embodiment in the embodiment essentially consist in, in the present embodiment
Capacitor 403 is variable capacitance in probe 400.As shown in figure 3, including multiple capacitors 403 in metallic screen sleeve 404, pass through choosing
It selects and accesses different capacitors 403, the variation of capacitance may be implemented.For example, 3 can be arranged in metallic screen sleeve 404
Thus capacitor can produce 8 kinds of different capacitances.By the way that electronic switch is arranged on printed circuit board 405, each electricity can control
Hold 403 access and disconnection.Electronic switch can be metal-oxide-semiconductor or triode.
The embodiment of the utility model provides a kind of for testing the probe of common-mode noise, and metallic screen sleeve is set in
Outside printed circuit board, and it is connected to the ground line of noise level monitor, interference of the external noise to common-mode noise can be shielded, realized
Detection to common-mode noise path.
The application has used particular words to describe embodiments herein.As " one embodiment ", " embodiment ",
And/or " some embodiments " means a certain feature relevant at least one embodiment of the application, structure or feature.Therefore, it answers
Emphasize and it is noted that " embodiment " or " one embodiment " that is referred to twice or repeatedly in this specification in different location or
" alternate embodiment " is not necessarily meant to refer to the same embodiment.In addition, certain in one or more embodiments of the application
Feature, structure or feature can carry out combination appropriate.
Although the utility model is described with reference to current specific embodiment, ordinary skill in the art
Personnel it should be appreciated that more than embodiment be intended merely to illustrate the utility model, be detached from the spirit of the present invention no
In the case of can also make various equivalent change or replacement, therefore, as long as to upper in the spirit of the utility model
State the variation of embodiment, modification will all be fallen in the range of following claims.
Claims (8)
1. a kind of for testing the probe in common-mode noise path, which is characterized in that the probe includes:
Probe is adapted to be coupled to test object;
Printed circuit board, one end are connected to the probe, and the other end is connected to noise level monitor by coaxial cable, described coaxial
Cable is externally provided with shielded layer, and the shielded layer is connected to the ground line of the noise level monitor;
Capacitor is set on the printed circuit board, and the received common-mode noise of probe is transferred to described make an uproar after the capacitor
In sound detection instrument;
Metallic screen sleeve is set in outside the printed circuit board, and the metallic screen sleeve is connected to the shielded layer.
2. probe as described in claim 1, which is characterized in that the capacitor welds on the printed circuit board, and described
One end of capacitor is electrically connected to the probe by copper foil wiring, and the other end of the capacitor is electrically connected to institute by copper foil wiring
State coaxial cable.
3. probe as described in claim 1, which is characterized in that the capacitance of the capacitor is 1-10PF.
4. probe as described in claim 1, which is characterized in that the printed circuit board is detachably connectable to the probe.
5. probe as claimed in claim 4, which is characterized in that threaded connection, pin connection or the key of being detachably connected as connects
It connects.
6. probe as described in claim 1, which is characterized in that the capacitor is variable capacitance.
7. a kind of noise-measuring system comprising such as probe as claimed in any one of claims 1 to 6, the test device is also wrapped
Include the noise level monitor for being connected to the probe.
8. noise-measuring system as claimed in claim 7, which is characterized in that the noise level monitor is spectrum analyzer or electricity
Magnetic disturbance receiver.
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CN201921011890.0U CN209215446U (en) | 2019-07-02 | 2019-07-02 | It is a kind of for testing the probe and noise-measuring system of common-mode noise |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN111121949A (en) * | 2019-11-20 | 2020-05-08 | 中国电力科学研究院有限公司 | Anti-interference device for noise measurement probe in strong magnetic field |
CN112379185A (en) * | 2020-11-06 | 2021-02-19 | 海光信息技术股份有限公司 | Power noise test structure of bare chip |
CN113589058A (en) * | 2021-06-24 | 2021-11-02 | 苏州浪潮智能科技有限公司 | Ripple noise test system and method |
CN113640694A (en) * | 2020-04-26 | 2021-11-12 | 中移(成都)信息通信科技有限公司 | Ripple noise test probe and test device |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN111121949A (en) * | 2019-11-20 | 2020-05-08 | 中国电力科学研究院有限公司 | Anti-interference device for noise measurement probe in strong magnetic field |
CN113640694A (en) * | 2020-04-26 | 2021-11-12 | 中移(成都)信息通信科技有限公司 | Ripple noise test probe and test device |
CN113640694B (en) * | 2020-04-26 | 2023-10-27 | 中移(成都)信息通信科技有限公司 | Ripple noise test probe and test device |
CN112379185A (en) * | 2020-11-06 | 2021-02-19 | 海光信息技术股份有限公司 | Power noise test structure of bare chip |
CN112379185B (en) * | 2020-11-06 | 2023-03-21 | 海光信息技术股份有限公司 | Bare chip power supply noise test structure |
CN113589058A (en) * | 2021-06-24 | 2021-11-02 | 苏州浪潮智能科技有限公司 | Ripple noise test system and method |
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