CN209167367U - A kind of plug-in test plate structure - Google Patents

A kind of plug-in test plate structure Download PDF

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Publication number
CN209167367U
CN209167367U CN201821872267.XU CN201821872267U CN209167367U CN 209167367 U CN209167367 U CN 209167367U CN 201821872267 U CN201821872267 U CN 201821872267U CN 209167367 U CN209167367 U CN 209167367U
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CN
China
Prior art keywords
fixed
test board
cutting ferrule
board ontology
plug
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201821872267.XU
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Chinese (zh)
Inventor
曹杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing (shanghai) Electronic Technology Co Ltd
Original Assignee
Beijing (shanghai) Electronic Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing (shanghai) Electronic Technology Co Ltd filed Critical Beijing (shanghai) Electronic Technology Co Ltd
Priority to CN201821872267.XU priority Critical patent/CN209167367U/en
Application granted granted Critical
Publication of CN209167367U publication Critical patent/CN209167367U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model discloses a kind of plug-in test plate structures, including test board ontology, the bottom of the test board ontology is fixed with connecting rod, the bottom of the connecting rod is fixed with cutting ferrule, the bottom of the cutting ferrule is fixed with shaft, the inner upper of the cutting ferrule is fixed with baffle, fixed plate is fixed at the bosom position of the cutting ferrule, the bottom middle position of the test board ontology is fixed with metal plate, the bottom of the metal plate is fixed with conducting block, one end of the conducting block is fixed with conducting wire, the conducting wire is fixed with resistance unit far from one end of the conducting block;By being equipped with cutting ferrule, connecting rod and shaft, the disassembly of test board ontology can be made more convenient, avoid the trouble in test board ontology aperture, the utility model is by being equipped with resistance unit, preferably test board ontology can be protected when in use, the service life for increasing test board ontology, avoids bringing unnecessary economic loss to user.

Description

A kind of plug-in test plate structure
Technical field
The utility model belongs to test board technical field, and in particular to a kind of plug-in test plate structure.
Background technique
Test board is a kind of means of testing to C-band chip device performance evaluation, after chip package completion, usually Corresponding performance test can be carried out to chip.
Existing test board is by then being consolidated with bolt and shell in internal notches mostly when being installed Fixed, use for a long time in this way is likely to result in test board and is broken from fluting, influences the normal use of test board.
Utility model content
To solve the problems mentioned above in the background art.The utility model provides a kind of plug-in test plate structure, With convenient disassembly, the characteristics of protecting electrostatic.
To achieve the above object, the utility model provides the following technical solutions: a kind of plug-in test plate structure, including surveys Test plate (panel) ontology, the bottom of the test board ontology are fixed with connecting rod, and the bottom of the connecting rod is fixed with cutting ferrule, the cutting ferrule Bottom be fixed with shaft, the inner upper of the cutting ferrule is fixed with baffle, is fixed at the bosom position of the cutting ferrule Fixed plate, the bottom middle position of the test board ontology are fixed with metal plate, and the bottom of the metal plate is fixed with conduction Block, one end of the conducting block are fixed with conducting wire, and the conducting wire is fixed with resistance unit far from one end of the conducting block.
In order to which test board ontology is fixed, as the optimal technical scheme of the utility model, the bottom of the shaft It is fixed with shell.
It is stronger in order to connect connecting rod in cutting ferrule, it is described as the optimal technical scheme of the utility model Connecting rod lateral wall is fixed with card column.
In order to guarantee that the card column of connecting rod can be embedded into cutting ferrule, as the optimal technical scheme of the utility model, institute The inside for stating baffle is fixed with card slot.
In order to avoid connecting rod falls off in cutting ferrule, as the optimal technical scheme of the utility model, the fixed plate It is fixedly arranged above compressed spring pad.
In order to guarantee the normal use of resistance unit, as the optimal technical scheme of the utility model, the quantity of the conducting wire It is two.
Compared with prior art, the utility model has the beneficial effects that when novel test board ontology is installed, first Card column passes through card slot, contacts the bottom of connecting rod with compressed spring pad, then presses and rotate cutting ferrule again, cooperates compressed spring Pad, makes card column far from card slot and is fixed on baffle inner sidewall, as long as rotating cutting ferrule when disassembled, take off card column can with card slot From that test board ontology can be made to plug is more convenient by above-mentioned, the trouble of test board ontology fluting is avoided, when there is electrostatic to connect When contacting test board ontology, the intrinsic electrostatic of test board can be conducted to conducting block, then in conducting wire by metal plate Under cooperation, electrostatic can be eliminated in the inside of resistance unit, avoid when in use electrostatic can puncture test board body interior Electronic component, cause the damage of device.
Detailed description of the invention
Attached drawing is used to provide a further understanding of the present invention, and constitutes part of specification, practical with this Novel embodiment is used to explain the utility model together, does not constitute limitations of the present invention.In the accompanying drawings:
Fig. 1 is the structural schematic diagram of the utility model;
Fig. 2 is the connecting rod structural schematic diagram of the utility model;
Fig. 3 is the ferrule structure schematic diagram of the utility model;
Fig. 4 is the cutting ferrule schematic diagram of internal structure of the utility model;
In figure: 1, test board ontology;2, connecting rod;3, cutting ferrule;4, shaft;5, shell;6, metal plate;7, conducting block;8, Conducting wire;9, resistance unit;10, card column;11, baffle;12, card slot;13, fixed plate;14, compressed spring pad.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work Every other embodiment obtained, fall within the protection scope of the utility model.
Embodiment
Fig. 1-4 is please referred to, the utility model is the following technical schemes are provided: a kind of plug-in test plate structure, including test Plate ontology 1, the bottom of test board ontology 1 are bonded with connecting rod 2, and the bottom of connecting rod 2 is removably connected with cutting ferrule 3, cutting ferrule 3 Lower rotation is connected with shaft 4, and the inner upper of cutting ferrule 3 is bonded with baffle 11, is bonded at the bosom position of cutting ferrule 3 solid Fixed board 13, and the quantity of connecting rod 2, cutting ferrule 3 and shaft 4 is four, the bottom middle position of test board ontology 1 is bonded with Metal plate 6, the bottom of metal plate 6 are welded with conducting block 7, and one end of conducting block 7 is welded with conducting wire 8, and conducting wire 8 is far from conducting block 7 One end be welded with resistance unit 9.
Further, the bottom of shaft 4 is bonded with shell 5.
Further, 2 lateral wall of connecting rod is bonded with card column 10, and the quantity of card column 10 is two.
Further, the inside of baffle 11 is integrally formed with card slot 12, and the quantity of card slot 12 is two.
Further, the top of fixed plate 13 is bonded with compressed spring pad 14.
Further, the quantity of conducting wire 8 is two, and two conducting wires 8 are respectively welded at the both ends of resistance unit 9.
The application need by test board ontology 1 and the extensive utilization daily life of resistance unit 9 in known technology, And it is not belonging to content to be protected needed for the application, wherein test board ontology 1 is disclosed in application number CN201520100193.8 It is had disclosed in test panel assembly (notification number CN204389644U, on 06 10th, 2015 day for announcing), resistance unit 9 is in application number A kind of PLC control mainboard (notification number CN206413250U, the day for announcing of safe antistatic disclosed in CN201720072482.0 On 08 15th, 2017) in have disclosed.
The working principle and process for using of the utility model: the test board ontology 1 of the utility model is to C-band chip device A kind of means of testing of part performance evaluation, after chip package completion, it will usually corresponding performance test be carried out to chip, surveyed When test plate (panel) ontology 1 is installed, card column 10 is first passed through card slot 12, contacts the bottom of connecting rod 2 with compressed spring pad 14, so It presses and rotates cutting ferrule 3 again afterwards, cooperate compressed spring pad 14, make card column 10 far from card slot 12 and be fixed on 11 inner sidewall of baffle, It as long as rotating cutting ferrule 3 when disassembled, be detached from card column 10 can with card slot 12, test board ontology 1 can be made to plug by above-mentioned It is more convenient, the trouble of the fluting of test board ontology 1 is avoided, when there is electrostatic contact to test board ontology 1, passes through metal plate 6 Electrostatic in test board ontology 1 can be conducted can be electrostatic in resistance unit 9 then under the cooperation of conducting wire to conducting block 7 Inside eliminated, avoid electrostatic when in use that from puncturing the electronic component inside test board ontology 1, cause the damage of device It ruins.
Finally, it should be noted that the above descriptions are merely preferred embodiments of the present invention, it is not limited to this Utility model, although the utility model is described in detail with reference to the foregoing embodiments, for those skilled in the art For, it is still possible to modify the technical solutions described in the foregoing embodiments, or to part of technical characteristic It is equivalently replaced.Within the spirit and principle of the utility model, any modification, equivalent replacement, improvement and so on, It should be included within the scope of protection of this utility model.

Claims (6)

1. a kind of plug-in test plate structure, including test board ontology (1), it is characterised in that: the bottom of the test board ontology (1) Portion is fixed with connecting rod (2), and the bottom of the connecting rod (2) is fixed with cutting ferrule (3), and the bottom of the cutting ferrule (3), which is fixed with, to be turned The inner upper of axis (4), the cutting ferrule (3) is fixed with baffle (11), is fixed at the bosom position of the cutting ferrule (3) The bottom middle position of fixed board (13), the test board ontology (1) is fixed with metal plate (6), the bottom of the metal plate (6) It is fixed with conducting block (7), one end of the conducting block (7) is fixed with conducting wire (8), and the conducting wire (8) is far from the conducting block (7) One end be fixed with resistance unit (9).
2. a kind of plug-in test plate structure according to claim 1, it is characterised in that: the bottom of the shaft (4) is solid Surely there are shell (5).
3. a kind of plug-in test plate structure according to claim 1, it is characterised in that: connecting rod (2) lateral wall It is fixed with card column (10).
4. a kind of plug-in test plate structure according to claim 1, it is characterised in that: the inside of the baffle (11) is solid Surely there are card slot (12).
5. a kind of plug-in test plate structure according to claim 1, it is characterised in that: the top of the fixed plate (13) It is fixed with compressed spring pad (14).
6. a kind of plug-in test plate structure according to claim 1, it is characterised in that: the quantity of the conducting wire (8) is Two.
CN201821872267.XU 2018-11-14 2018-11-14 A kind of plug-in test plate structure Expired - Fee Related CN209167367U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201821872267.XU CN209167367U (en) 2018-11-14 2018-11-14 A kind of plug-in test plate structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201821872267.XU CN209167367U (en) 2018-11-14 2018-11-14 A kind of plug-in test plate structure

Publications (1)

Publication Number Publication Date
CN209167367U true CN209167367U (en) 2019-07-26

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201821872267.XU Expired - Fee Related CN209167367U (en) 2018-11-14 2018-11-14 A kind of plug-in test plate structure

Country Status (1)

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CN (1) CN209167367U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115932550A (en) * 2022-12-29 2023-04-07 佛山市蓝箭电子股份有限公司 Semiconductor testing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115932550A (en) * 2022-12-29 2023-04-07 佛山市蓝箭电子股份有限公司 Semiconductor testing device
CN115932550B (en) * 2022-12-29 2023-08-29 佛山市蓝箭电子股份有限公司 Semiconductor testing device

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GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190726

Termination date: 20201114

CF01 Termination of patent right due to non-payment of annual fee