CN209071272U - Mass spectrometer and its optical system - Google Patents
Mass spectrometer and its optical system Download PDFInfo
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- CN209071272U CN209071272U CN201821558084.0U CN201821558084U CN209071272U CN 209071272 U CN209071272 U CN 209071272U CN 201821558084 U CN201821558084 U CN 201821558084U CN 209071272 U CN209071272 U CN 209071272U
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Abstract
The utility model relates to a kind of mass spectrometer and its optical systems.It is very small to be formed by angle for the axis direction of the incident direction of laser and ion source cavity in optical system, the initial velocity direction for the particle that laser ionization generates is substantially the central axis direction diverging along ion source cavity, therefore the initial kinetic energy diverging of ion is smaller, is conducive to the resolution ratio and sensitivity that improve mass spectrometer.And to be formed by angle also very small for the axis direction of illumination light and imaging optical path and ion source cavity that lighting unit issues, and illumination and imaging direction are full symmetric, thus lighting source can achieve maximization in the crossover range of the sample target plate surface irradiated area generated and the area of imaging unit imaging, it both can be to avoid the generation of evil shadow effect, the range of imaging can be greatly improved again, and then image quality greatly improves.
Description
Technical field
The utility model relates to Mass Spectrometer Method instrument fields, more particularly, to a kind of mass spectrometer and its optical system.
Background technique
The appearance of substance assistant laser desorpted (MALDI) ion source provides very important skill for macromolecular complete analysis
Art means.MALDI technology is very suitable to be combined with flight time mass spectrum (TOFMS) detection technique, this is also MALDI technology
Most successful technical combinations.In recent years, with laser technology, high-speed data acquisition, ion detection, matrix technology quick hair
Exhibition, the performance of MALDI ionization techniques have also obtained promotion at full speed, so that modern MALDI instrument has had been provided with high-resolution
The even quantitative ability of rate, high sensitivity, high quality range.In recent years, MALDI-TOFMS be increasingly becoming protein, polypeptide,
The important means of the large biological molecules such as nucleic acid analysis.It is composed using the protein Ion peak figure that MALDI-TOFMS draws microorganism, with
The mass spectrometric data of Clinical microorganism is compared with standard protein fingerprints database afterwards, so that it may reach microbial identification
Purpose.Compared to the microbial identifications technology such as traditional biochemical method, luminescence method, this method is either in identification speed, knot
Fruit accuracy rate or technical costs, personnel operate requirement etc. all with certain advantage.The height that MALDI-TOFMS has
Sensitivity, wide mass range and the technical characterstics such as moderate resolution ratio and Mass accuracy, it is in addition easy to operate, quick, economical
Etc. handling characteristics, become high-throughput, business and run most potential instrument.It is led in microbial identification and detection of nucleic acids
Domain, MALDI-TOFMS have moved towards the clinical application stage.
MALDI-TOFMS needs the sample material being analysed to mix titration on stainless steel target plate with matrix, mixes
It closes object to air-dry or generate co-crystal thereof after drying up, by the way that the laser point after focusing is irradiated to co-crystal thereof surface, base
Matter transfers energy to sample molecule to be analyzed after absorbing laser energy, so that sample molecule is ionized, it is then sharp
It is detected with time of-flight mass spectrometer, and the corresponding substance of each ion is identified according to the difference of different ions flight time.
In sample analysis, since distribution of the co-crystal thereof on target plate surface of generation is often uneven, the crystalline solid shape of some positions
State is preferable, and the crystalline material of formation is more, and some positions do not form crystalline material then.Therefore laser sample analysis is being carried out
During, operator is required to see the crystallization quality of sample at the crystalline state of sample and different target position in real time,
To select most suitable analysis site to be tested.Since laser light path system is often very long, slight vibration or displacement will
Lead to the center of laser point offset sample to be analysed, therefore the location of observation laser sample point being capable of effective monitor in real time
The working condition of device, to guarantee the performance of the performance of instrument.In addition, for different analysis samples, the color of crystalline solid,
Reflectance, shape etc. are all inconsistent, also inconsistent for the sensitivity of light, therefore imaging device must also be able to adapt to difference
The illumination and imaging demand of analyte.
However, the mass resolution and image quality of traditional most of Mass Spectrometer Method equipment are to be improved.
Utility model content
Based on this, it is necessary to provide a kind of mass spectrometer and its optics that can be improved mass resolution and image quality
System.
The technical solution that the utility model solves the technical problem is as follows.
A kind of optical system of mass spectrometer, including laser cell, lighting unit, imaging unit and optical reflection machine
Structure；The laser cell, the lighting unit and the imaging unit are set to the ion source cavity of the mass spectrometer
Outside, the optical reflection mechanism are set to the inside of the ion source cavity；
The laser that the laser cell issues is mapped to sample surfaces after optical reflection mechanism reflection and reflects sharp
The angle of light light and the axis perpendicular to sample target plate is greater than 0 ° and is not more than 10 °；The illumination light that the lighting unit issues
Sample surfaces and the illumination light light after optical reflection mechanism reflection are irradiated to after optical reflection mechanism reflection
It is greater than 0 ° with the angle of the axis perpendicular to sample target plate and is not more than 10 °；The imaging unit is for receiving by the sample
The illumination light of reflection for sample to be imaged.
The illumination light of the sample reflection is injected after reflecting via the optical reflection mechanism in one of the embodiments,
The imaging unit.
The laser cell, the lighting unit and the imaging unit are around described in one of the embodiments,
The setting of the ion source cavity of mass spectrometer.
The light source of the lighting unit is opposite with the optical lens of the imaging unit in one of the embodiments, sets
It sets.
The incident direction for the laser that the laser cell issues in one of the embodiments, is perpendicular to anti-through the optics
Illumination light light after penetrating mechanism reflection and plane determined by the illumination light light reflected as the sample.
The optical reflection mechanism tool is respectively used to there are three reflecting surface by incident institute in one of the embodiments,
It states laser reflection and reflexes to the sample and sample is anti-to the sample, by the illumination light that the lighting unit issues
The illumination light penetrated reflexes to the imaging unit.
The imaging unit includes optical lens and filming apparatus in one of the embodiments, by the optical reflection
The illumination light that mechanism reflects takes in the filming apparatus after capturing via the optical lens.
A kind of mass spectrometer, including optical system described in ion source component and any of the above-described embodiment；It is described from
Source components include ion source cavity, sample target plate and pole piece component, and the sample target plate and the pole piece component are set to institute
State in ion source chamber body and be located at the lower section of the optical reflection mechanism.
In one of the embodiments, the top of the ion source cavity be octahedral column structure, the lighting unit with
The imaging unit corresponds respectively to two opposite side walls of the octahedral cylinder structure division of the ion source cavity, described to swash
Light unit corresponds to another side wall and the side wall and the lighting unit of the octahedral cylinder structure division of the ion source cavity
One side wall is separated between corresponding side wall.
The optical reflection mechanism is located at the middle part of the ion source cavity in one of the embodiments, through the light
Illumination light light after learning reflecting mechanism reflection with by illumination light light that the sample reflects in the ion source cavity
Axisymmetrical.
The study found that influence of the initial characteristic for instrument overall performance for the ion that laser ionization process generates is to Guan Chong
It wants, direct inverse relationship is presented in the initial flight direction of the ion of generation and the direction of laser light incident.Therefore, for theoretically
The ion that laser vertical irradiation sample generates will be dissipated along the axis of instrument, most beneficial for raising resolution ratio.However, traditional
Angle between the laser incident angle and axial direction of most equipment is excessive, and the ion generated diverging direction is caused to deviate axis,
To influence mass resolution.Further study show that since traditional MALDI-TOFMS ion source structure is very compact, it is real
Now there is certain difficulty to the illumination of sample spot and imaging, entire optical system needs a series of groups across ion source system
Part, therefore, the large angle illumination and imaging that traditional mass spectroscopy device generally uses.On the one hand this method will lead to the figure of imaging
It as generating more serious oblique shadow effect, causes the deformation extent that obtained figure is imaged larger, generally requires that do figure whole
Shape processing, it is complex；On the other hand, since illumination and imaging optical path system are frequently not same optical path, the friendship of the two
The region area that converges is smaller, causes the areal extent being ultimately imaged limited.
Based on this, for laser incident angle, illumination and imaging angle present in traditional MALDI-TOFMS instrument
Excessive problem, the utility model provide the mass spectrometer and its light of a kind of low-angle laser light incident, illumination and imaging
System.Wherein, the laser that laser cell issues is mapped to the laser light of sample surfaces and reflection after the reflection of optical reflection mechanism
The angle of line and the axis perpendicular to sample target plate is greater than 0 ° and is not more than 10 °, in this way due to the incident direction of laser and ion
The axis direction of source chamber body is formed by that angle is very small, the initial velocity direction for the particle that laser ionization generates be substantially along from
The central axis direction of component cavity dissipates, therefore the initial kinetic energy diverging of ion is smaller, is conducive to the resolution for improving mass spectrometer
Rate and sensitivity.And lighting unit issue illumination light through optical reflection mechanism reflection after be irradiated to sample surfaces and through optics it is anti-
The angle of illumination light light after penetrating mechanism reflection and the axis perpendicular to sample target plate is greater than 0 ° and no more than 10 °, and imaging is single
For member for receiving the illumination light reflected by sample, the angle of such imaging optical path is also very small.And illumination and imaging direction are complete
Symmetrically, thus the crossover range of the lighting source irradiated area generated on sample target plate surface and the area of imaging unit imaging can
It is maximized with reaching, not only can be to avoid the generation of evil shadow effect, but also the range of imaging can be greatly improved, and then image quality is big
It is big to improve.
Further, in order to reduce the angle in laser light incident direction Yu mass spectrum tof tube axis, entire ion source group as far as possible
Other pole piece components of part etc. are all mounted on the lower section of optical reflection mechanism, and the design of pole piece component inner hole can guarantee to swash
Light and illumination light can smoothly reach sample surfaces without the influence by pole piece component.Therefore, the laser after reflecting
Sample surfaces can be reached with very small angle, by sample ionization, the area source for illuminating generation can be by pole piece component
Between hole array reach imaging unit.
Detailed description of the invention
Fig. 1 is the partial structure diagram of the mass spectrometer of an embodiment of the present invention；
Fig. 2 is the structural schematic diagram of Fig. 1 intermediate ion source component and optical system.
Specific embodiment
The utility model is more fully retouched below with reference to relevant drawings for the ease of understanding the utility model,
It states.The preferred embodiment of the utility model is given in attached drawing.But the utility model can come in many different forms in fact
It is existing, however it is not limited to embodiment described herein.On the contrary, purpose of providing these embodiments is makes public affairs to the utility model
The understanding for opening content is more thorough and comprehensive.
It should be noted that be referred to as " being set to " another element when element, it can directly on the other element or
There may also be elements placed in the middle by person.When an element is considered as " connection " another element, it can be directly to
Another element may be simultaneously present centering elements.
Unless otherwise defined, all technical and scientific terms used herein are led with the technology for belonging to the utility model
The normally understood meaning of the technical staff in domain is identical.Terminology used in the description of the utility model herein only be
The purpose of description specific embodiment, it is not intended that in limitation the utility model.Term as used herein "and/or" includes
Any and all combinations of one or more related listed items.
Incorporated by reference to Fig. 1 and Fig. 2, an embodiment of the present invention provides a kind of mass spectrometer 10 comprising ion source
Component 100 and optical system 200.Mass spectrometer 10 can be all kinds of mass spectrometers such as time of-flight mass spectrometer.
Ion source component 100 includes ion source cavity 110, sample target plate 120 and pole piece component 130.
Ion source cavity 110 has a vacuum chamber 112.In a specific example, the top of ion source cavity 110 is in
Octahedral column structure, be preferably positive octagon column body structure.
Sample target plate 120 and pole piece component 130 are located in the vacuum chamber 112 of ion source cavity 110.Sample target plate 120 is used
In the co-crystal thereof sample for placing sample material and matrix to be analyzed.Pole piece component 130 be used for by sample ionization generate from
Son imports mass analyzer and carries out quality analysis.The extraction pole piece 132 of pole piece component 130 is located at the top of sample target plate 120, and
Offer the pole piece inner hole 134 passed through for the light of optical system.
Optical system 200 includes laser cell 210, lighting unit 220, imaging unit 230 and optical reflection mechanism
240.Laser cell 210, lighting unit 220 and imaging unit 230 are set to the outside of ion source cavity 110, optical reflection machine
Structure 240 is set to the inside of ion source cavity 110.
In the present embodiment, the laser that laser cell 210 issues is mapped to sample surfaces after the reflection of optical reflection mechanism 240
And the angle of the laser beam of reflection and the axis perpendicular to sample target plate 120 is greater than 0 ° and is not more than 10 ° of (laser lights of reflection
Angle formed by line and sample target plate 120 is less than 90 ° and is not less than 80 °), namely incident laser is with very small angle incidence
Onto sample target plate 120.Preferably, the laser beam of reflection and the angle of the axis perpendicular to sample target plate 120 are not more than 6 °,
It such as can be 3 °, 4 °, 5 ° or 6 °, further preferably 4 °~5 °.
Further, the illumination light that the lighting unit 220 of the present embodiment issues is irradiated to after the reflection of optical reflection mechanism 240
The angle of sample surfaces and illumination light light and the axis perpendicular to sample target plate 120 after the reflection of optical reflection mechanism 240
Greater than 0 ° and no more than 10 °, (the illumination light light and angle formed by sample target plate 120 reflected through optical reflection mechanism 240 is small
In 90 ° and it is not less than 80 °), namely incident illumination light is in very small angular illumination to sample target plate 120.Preferably, it passes through
Illumination light light and the angle of the axis perpendicular to sample target plate 120 after the reflection of optical reflection mechanism 240 are not more than 6 °, such as may be used
To be 3 °, 4 °, 5 ° or 6 ° etc., further preferably 4 °~5 °.
Imaging unit 230 is used to receive the illumination light reflected by sample.Sample reflection illumination light light with it is anti-through optics
The illumination light light of the reflection of mechanism 240 is penetrated to be symmetrical arranged perpendicular to the vertical line of sample target plate 120.In a specific example
In, the illumination light of sample reflection injects imaging unit 230 after reflecting via optical reflection mechanism 240.
More specifically, imaging unit 230 includes optical lens 232 and filming apparatus 234.It is anti-by optical reflection mechanism 240
Intake filming apparatus 234 is imaged after the illumination light of injection is captured via optical lens 232.Filming apparatus 234 can be CCD
Imaging device, and can also be connect with external connection display apparatus, carry out the display of shooting image.
By taking specific example shown in Fig. 2 as an example, laser cell 210, lighting unit 220 and imaging unit 230 surround from
The setting of component cavity 110.Laser cell 210, lighting unit 220 and imaging unit 230 is corresponded on ion source cavity 110 to open
If there are three transparent windows.
Preferably, the light source of lighting unit 220 and the optical lens 232 of imaging unit 230 are oppositely arranged.
It is highly preferred that the incident direction for the laser that laser cell 210 issues is perpendicular to after the reflection of optical reflection mechanism 240
Illumination light light with as sample reflect illumination light light determined by plane.
In a specific example, the tool of optical reflection mechanism 240 is respectively used to there are three reflecting surface 242 by incidence
Laser reflection reflexes to sample to sample, by the illumination light that lighting unit 220 issues and reflects the illumination light of sample reflection
To imaging unit 230.As shown in Fig. 2, with the illumination light light and vertical sample target plate 120 that are reflected through optical reflection mechanism 240
Axis in for 5 ° of angles, being in 42.5 ° of angle for the reflecting surface 242 of indirect illumination light and incident illumination light light,
Similarly, also it is in the illuminating ray for being emitted to imaging unit 230 by the reflecting surface 242 of the illumination light of sample reflection for reflecting
42.5 ° of angle.Equally, when the laser beam reflected through optical reflection mechanism 240 and the axis perpendicular to sample target plate 120
It is also in 42.5 ° of angle for the reflecting surface 242 of reflection laser and incident laser beam when angle is also 5 °.
Further, by taking top is positive the ion source cavity 110 of octahedral column structure as an example, it is preferable that lighting unit 220 with
Imaging unit 230 corresponds respectively to two opposite side walls of the octahedral cylinder structure division of ion source cavity 110, laser cell
210 correspond to another side wall of the octahedral cylinder structure division of ion source cavity 110 and the side wall and lighting unit 220 or imaging
One side wall is separated between the corresponding side wall of unit 230.Laser optical path is not shown in the figure in signal shown in Fig. 2, and laser optical path hangs down
Directly in the illumination light light after the reflection of optical reflection mechanism 240 and plane determined by the illumination light light as sample reflection.
Further, in a specific example, optical reflection mechanism 240 is located at the middle part of ion source cavity 110, through light
The illumination light light after reflecting mechanism 240 reflects is learned with the illumination light light by sample reflection with the axis of ion source cavity 110
Line is symmetrical.
In order to reduce the angle in laser light incident direction Yu mass spectrum tof tube axis as far as possible, entire ion source component 100
Pole piece component 130 etc. is all mounted on the lower section of optical reflection mechanism 240, and draws the design of the pole piece inner hole 134 of pole piece 132
It can guarantee that laser and illumination light can smoothly reach sample surfaces without the influence by pole piece component 130.Therefore, through anti-
Laser after penetrating can reach sample surfaces with very small angle, and by sample ionization, the area source for illuminating generation can lead to
The hole array crossed among pole piece component 130 reaches imaging unit 230.
Above-mentioned mass spectrometer 10 can significantly improve mass spectral analysis with low-angle laser light incident, illumination and imaging
Resolution ratio and image quality.Specifically, the laser that laser cell 210 issues is mapped to sample after the reflection of optical reflection mechanism 240
Surface and reflection laser beam with perpendicular to sample target plate 120 axis angle be greater than 0 ° and be not more than 10 °, in this way due to
The axis direction of the incident direction of laser and ion source cavity 110 is formed by the particle that angle is very small, and laser ionization generates
Initial velocity direction be substantially along ion source cavity 110 central axis direction dissipate, therefore ion initial kinetic energy diverging it is smaller,
Be conducive to improve the resolution ratio and sensitivity of mass spectrometer 10.And the illumination light that lighting unit 220 issues is through optical reflection machine
Structure 240 reflect after be irradiated to sample surfaces and through optical reflection mechanism 240 reflection after illumination light light with perpendicular to sample target
The angle of the axis of plate 120 is greater than 0 ° and no more than 10 °, and imaging unit 230 is used to receive the illumination light reflected by sample, in this way
The angle of imaging optical path is also very small.And illumination and imaging direction are full symmetric, thus lighting source is on 120 surface of sample target plate
The crossover range for the area that the irradiated area and imaging unit 230 of generation are imaged can achieve maximization, both can be to avoid evil shadow
The generation of effect, and the range of imaging can be greatly improved, and then image quality greatly improves.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
Above-described embodiments merely represent several embodiments of the utility model, the description thereof is more specific and detailed,
But it cannot be understood as the limitations to utility model patent range.It should be pointed out that for the common skill of this field
For art personnel, without departing from the concept of the premise utility, various modifications and improvements can be made, these are belonged to
The protection scope of the utility model.Therefore, the scope of protection shall be subject to the appended claims for the utility model patent.
Claims (9)
1. a kind of optical system of mass spectrometer, which is characterized in that including laser cell, lighting unit, imaging unit and
Optical reflection mechanism；The laser cell, the lighting unit and the imaging unit be set to the mass spectrometer from
The outside of component cavity, the optical reflection mechanism are set to the inside of the ion source cavity；
The laser that the laser cell issues is mapped to the laser light of sample surfaces and reflection after optical reflection mechanism reflection
The angle of line and the axis perpendicular to sample target plate is greater than 0 ° and is not more than 10 °；The illumination light that the lighting unit issues is through institute
State optical reflection mechanism reflection after be irradiated to sample surfaces and through the optical reflection mechanism reflection after illumination light light and hang down
Directly it is greater than 0 ° in the angle of the axis of sample target plate and is not more than 10 °；The illumination light of the sample reflection is anti-via the optics
The imaging unit is injected after penetrating mechanism reflection, the imaging unit is for receiving the illumination light reflected by the sample to be used for
Sample imaging.
2. the optical system of mass spectrometer as described in claim 1, which is characterized in that the laser cell, the illumination
Unit and the imaging unit surround the setting of the ion source cavity of the mass spectrometer.
3. the optical system of mass spectrometer as claimed in claim 2, which is characterized in that the light source of the lighting unit and institute
The optical lens for stating imaging unit is oppositely arranged.
4. the optical system of mass spectrometer as claimed in claim 3, which is characterized in that the laser that the laser cell issues
Incident direction perpendicular to after optical reflection mechanism reflection illumination light light and the illumination light that is reflected by the sample
Plane determined by light.
5. the optical system of mass spectrometer as described in any one of claims 1 to 4, which is characterized in that the optics is anti-
Mechanism tool is penetrated there are three reflecting surface, is respectively used to send out the incident laser reflection to the sample, by the lighting unit
Illumination light out reflexes to the sample and the illumination light that the sample reflects is reflexed to the imaging unit.
6. the optical system of mass spectrometer as described in any one of claims 1 to 4, which is characterized in that the imaging is single
Member includes optical lens and filming apparatus, is captured by the illumination light that the optical reflection mechanism reflects via the optical lens
After take in the filming apparatus.
7. a kind of mass spectrometer, which is characterized in that including ion source component and as described in any one of claim 1~6
Optical system；The ion source component includes ion source cavity, sample target plate and pole piece component, the sample target plate and institute
Pole piece component is stated in the ion source chamber body and is located at the lower section of the optical reflection mechanism.
8. mass spectrometer as claimed in claim 7, which is characterized in that the top of the ion source cavity is octahedral cylinder knot
Structure, the lighting unit and the imaging unit correspond respectively to two of the octahedral cylinder structure division of the ion source cavity
Opposite side wall, the laser cell correspond to another side wall of the octahedral cylinder structure division of the ion source cavity and the side
One side wall is separated between wall side wall corresponding with the lighting unit.
9. mass spectrometer as claimed in claim 8, which is characterized in that the optical reflection mechanism is located at the ion source chamber
The middle part of body, illumination light light after optical reflection mechanism reflection is with the illumination light light that is reflected by the sample with institute
The central axes for stating ion source cavity are symmetrical.
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| CN201821558084.0U CN209071272U (en) | 2018-09-25 | 2018-09-25 | Mass spectrometer and its optical system |
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| CN201821558084.0U CN209071272U (en) | 2018-09-25 | 2018-09-25 | Mass spectrometer and its optical system |
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Address after: 510535 building 501, No. 1, No. 16, Xinrui Road, Huangpu District, Guangzhou, Guangdong Province (office only) Patentee after: GUANGZHOU HEXIN KANGYUAN MEDICAL TECHNOLOGY CO.,LTD. Address before: 510700 3 / F, building A3, science and technology enterprise accelerator, 11 Kaiyuan Avenue, Huangpu District, Guangzhou City, Guangdong Province Patentee before: GUANGZHOU HEXIN KANGYUAN MEDICAL TECHNOLOGY CO.,LTD. |