CN208766051U - Digital speckle method Young's modulus measuring system - Google Patents
Digital speckle method Young's modulus measuring system Download PDFInfo
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- CN208766051U CN208766051U CN201821481109.1U CN201821481109U CN208766051U CN 208766051 U CN208766051 U CN 208766051U CN 201821481109 U CN201821481109 U CN 201821481109U CN 208766051 U CN208766051 U CN 208766051U
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Abstract
The utility model relates to a kind of digital speckle method Young's modulus measuring systems, system includes support device, testee in support device is set, the weight being connect with testee, the computer for acquiring the image information collecting device of the image information of testee and being connect with image information collecting device, preset algorithm in computer, the first image information and testee when image information collecting device acquisition testee does not hang weight hang the second image information after weight, and the first image information and the second image information are sent to computer, computer receives the first image information and the second image information and calculates the deformation results of testee by algorithm.The image information of testee is acquired by image information collecting device and the image information is sent to the deformation quantity that computer directly calculates testee, and quickly and easily, and utility model device structure is simple, easy to operate.
Description
Technical field
The utility model relates to a kind of digital speckle method Young's modulus measuring systems, belong to field of engineering technology.
Background technique
Currently, mostly using the Young's modulus of optical lever method measuring metallic materials in field of engineering technology, usually utilizing feed rod
The micro-displacement amount of bar and telescope ruler group measurement wire in a stretched state, but since the method has used approximate relation
Tan α ≈ α, so there are systematic errors, meanwhile, it will lead to counterweight and scale pan when increasing and decreasing counterweight and significantly swing and shake up and down
It is dynamic, it is therefore desirable to just to be measured after the long period is stable, waste many experiments time；In addition to this, optical path adjusting trouble,
Optical path is unintelligible, and operation difficulty is larger.In addition, many scholars have made a little changes on the basis of this again, for example utilize hall sensing
Device surveys Young's modulus and surveys Young's modulus etc. using covibration.Young's modulus, which is surveyed, using Hall sensor belongs to beam deflection
One kind of method, difficult point are to measure micro-displacement；Conventional method mostly uses reading microscope, but since there are the relaxation times
And shaking when increase and decrease counterweight, cause error relatively large.And with development in science and technology, micro-displacement measurement is also more and more first
Into, wherein hall position sensor measures small position using the change in location output signal between magnet and integrated hall element
It moves；But it is influenced by edge effect, accuracy is to be improved.In addition, there are also a kind of methods widely applied in practice to move
Mechanical resonance method, it uses exciting, pick-up and frequency measuring device, needs to measure the intrinsic frequency under fundamental vibration to measure metal bar
Young's modulus.Young's modulus is measured using dynamical resonance method, measurement result is stablized, and it is theoretical very identical with testing, but its
Disadvantage is that special instrument, higher cost, and experimental work amount is big, and Data Processing in Experiment is cumbersome, and when operation is not easy to sentence
Disconnected symmetric form fundamental resonance state out.The device of Young's modulus in the prior art for measuring metallic materials it is mostly many and diverse and
Precision is inadequate, inconvenient.
Utility model content
The purpose of this utility model is to provide a kind of numbers for improving measurement accuracy and capable of simplifying measuring device to dissipate
Spot method Young's modulus measuring system.
In order to achieve the above objectives, the utility model provides the following technical solutions: a kind of digital speckle method Young's modulus measurement
System the system comprises support device, the testee being arranged in the support device, is connect with the testee
It the image information collecting device of the image information of weight, the acquisition testee and is connect with described image information collecting device
Computer, preset algorithm in the computer, described image information collecting device acquires the testee and do not hang weight
When the first image information and testee suspension weight after the second image information, and by the first image information and
Second image information is sent to the computer, and the computer receives the first image information and the second image information and leads to
Algorithm is crossed to calculate the deformation results of the testee.
Further, described image information collecting device is ccd image sensor or cmos image sensor.
Further, angle is formed between the imaging primary optical axis and the testee of described image information collecting device,
The angular range is 30~120 °.
Further, the system also includes the light sources for irradiating the testee.
Further, the light source is natural light or artificial light.
Further, the system also includes the speckles being pasted on the measured object.
The utility model has the beneficial effects that: being filled by the preset algorithm in computer, and by image information collecting
It sets the image information of acquisition testee and the image information is sent to the deformation quantity that computer directly calculates testee, survey
It measures and calculates precisely, quickly and easily, and utility model device structure is simple, easy to operate.
The above description is merely an outline of the technical solution of the present invention, in order to better understand the skill of the utility model
Art means, and can be implemented in accordance with the contents of the specification, below on the preferred embodiment of the present invention and the accompanying drawings in detail
It describes in detail bright as after.
Detailed description of the invention
Fig. 1 is the constructional device schematic diagram of the digital speckle method Young's modulus measuring system of the utility model.
Specific embodiment
With reference to the accompanying drawings and examples, specific embodiment of the present utility model is described in further detail.Below
Embodiment is not intended to limit the scope of the present invention for illustrating the utility model.
Referring to Figure 1, the digital speckle method Young's modulus measuring system in a preferred embodiment of the utility model includes
Support device 3, the testee 1 being arranged in the support device 3, the weight 2 being connect with the testee 1, acquisition institute
The computer stating the image information collecting device 5 of the image information of testee 1 and being connect with described image information collecting device 5
6.The system also includes the light sources 4 for irradiating the testee 1, irradiate the testee 1 using the light source 4,
So as to the acquisition of image information.In the present embodiment, the light source 4 is natural light or artificial light.Described image information collection dress
5 are set as ccd image sensor or cmos image sensor, in the present embodiment, described image information collecting device 5 is CCD figure
As sensor, with self-scanning, experience spectral range is wide, distortion is small, small in size, light-weight, system noise is low, small power consumption,
Service life length, reliability height etc.-number of advantages, and ccd image sensor 5 converts the light intensity signal on 1 surface of testee
At electric signal, the electric signal is converted into digitized gray level image using its internal A/D chip.Described image information
Angle is formed between the imaging primary optical axis and the testee 1 of acquisition device 5, the angular range is 30~120 °.At this
In embodiment, the angle between the imaging primary optical axis and the testee 1 of described image information collecting device 5 is 90 °, herein
What the object lens that described image information collecting device 5 is adjusted under angle made the testee 1 is imaged on described image information collection
On the target surface of device 5 and make the testee 1 image size and described image information collecting device 5 target surface phase
Match.Really, in other embodiments, between the imaging primary optical axis and the testee 1 of described image information collecting device 5
Angle can also be other, according to the actual situation depending on.The testee 1 is metal material, such as wire 1, is not made herein
It limits.The system also includes the speckle (not shown) being pasted on the measured object 1, the number of the speckle is several,
It is distributed on the testee 1.Described image information collecting device 5 acquires the pictorial information of testee 1, the picture letter
Breath includes at least one speckle, and the small displacement of the speckle is the deformation quantity of the testee 1.
Preset algorithm in the computer 6, described image information collecting device 5 acquire the testee 1 and do not hang weight
The first image information when object 2 and the testee 1 hang the second image information after weight 2, and by the first image
Information and the second image information are sent to the computer 6, and the computer 6 receives the first image information and the second image
Information and the deformation results that the testee 1 is calculated by algorithm.
The algorithm specifically: shooting and recording the gray level image before the testee 1 deforms is the first image letter
It ceases, chooses one piece of region in the gray level image before testee 1 deforms and be used as with reference to sub-district, the reference sub-district includes at least
One speckle；
Shooting and recording the deformed gray level image of the testee 1 again is the second image information, chooses measured object
It is found in described search sub-district as search sub-district by searching algorithm in one piece of region in the deformed gray level image of body 1
Region including the speckle, the region are target sub-district；
The coordinate position of the coordinate position with reference to sub-district and target sub-district is recorded, and it is opposite to calculate the target sub-district
The displacement with reference to sub-district.
More specifically, the deformed gray level image of the testee is shot and recorded, the testee is chosen and becomes
One piece of region in gray level image after shape is as search sub-district, and confining a region in described search sub-district is test block
Then domain is with pixel using the top left corner apex of described search sub-district as the starting point of the top left corner apex of the Experimental Area
The movement of unit, until the bottom right angular vertex of the Experimental Area coincides with described search sub-district bottom right angular vertex, described
During Experimental Area is mobile, the every movement in Experimental Area once then calculates this time and the similarity with reference to sub-district
All similarity values, are then compared, the maximum region of similarity value is target sub-district by value.In the present embodiment
In, the area and the area equation with reference to sub-district of the area of the Experimental Area and target sub-district.
More specifically, described using pixel as the movement of unit specifically: the Experimental Area is using pixel as unit, to search
The top left corner apex in large rope area is starting point, and sequence from left to right, from top to bottom is mobile, until the lower right corner of the Experimental Area
Vertex is overlapped with the bottom right angular vertex of described search sub-district.
The sub-district I of a m × m is chosen in image i.e. first before being deformed centered on A point1(x, y), referred to as with reference to son
Then area takes out the region of a w × w (w > m) around the same position in image after deformation, referred to as search sub-district, i.e.,
The area of described search sub-district is greater than the area with reference sub-district.
Preceding and deformed gray level image is deformed due to shooting and recording the testee in advance, according to the grayscale image
As you can learn that gamma function.The gamma function with reference to sub-district is I1(xi,yj), the gamma function of the target sub-district is
I2(xi', yj'), the related coefficient with reference to sub-district and target sub-district is C (u, v), then the target sub-district and the reference
The formula of sub-district similarity is as follows:
Wherein,For I1(xi,yj) average value,For I2(xi', yj') average value, u be x-axis direction on displacement, v
For the displacement on y-axis direction.
As C (u, v)=1, two sub-districts are perfectly correlated；As C (u, v)=0, two sub-districts are completely uncorrelated.Then,
The position for search by internal algorithm routine change parameter u, v similar sub-district calculates corresponding related coefficient C (u, v), makes
V when C (u, v) acquirement maximum value is exactly the displacement α of speckle in the vertical direction, it may be assumed that
So, the formula of the Young's modulus of wire 1 then may be used are as follows:
Then directly the data measured are brought into Young's modulus that formula casing calculates the deformation of wire 1.
In summary: acquiring testee 1 by the preset algorithm in computer 6, and by image information collecting device 5
Image information and by the image information be sent to computer 6 directly calculate testee 1 deformation quantity, measurement and calculate essence
Standard, quickly and easily, and utility model device structure is simple, easy to operate.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
Above-described embodiments merely represent several embodiments of the utility model, the description thereof is more specific and detailed,
But it cannot be understood as the limitations to utility model patent range.It should be pointed out that for the common skill of this field
For art personnel, without departing from the concept of the premise utility, various modifications and improvements can be made, these are belonged to
The protection scope of the utility model.Therefore, the scope of protection shall be subject to the appended claims for the utility model patent.
Claims (6)
1. a kind of digital speckle method Young's modulus measuring system, which is characterized in that the system comprises support device, be arranged in institute
State the image information of the testee in support device, the weight connecting with the testee, the acquisition testee
Image information collecting device and the computer being connect with described image information collecting device, preset algorithm in the computer, institute
State that image information collecting device acquires the first image information when the testee does not hang weight and the testee is outstanding
The second image information after hanging weight, and the first image information and the second image information are sent to the computer, institute
State the deformation that computer receives the first image information and the second image information and calculates the testee by algorithm
As a result.
2. digital speckle method Young's modulus measuring system as described in claim 1, which is characterized in that described image information collection
Device is ccd image sensor or cmos image sensor.
3. digital speckle method Young's modulus measuring system as claimed in claim 2, which is characterized in that described image information collection
Angle is formed between the imaging primary optical axis and the testee of device, the angular range is 30~120 °.
4. digital speckle method Young's modulus measuring system as described in claim 1, which is characterized in that the system also includes with
In the light source for irradiating the testee.
5. digital speckle method Young's modulus measuring system as claimed in claim 4, which is characterized in that the light source is natural light
Or artificial light.
6. digital speckle method Young's modulus measuring system as described in claim 1, which is characterized in that the system also includes viscous
The speckle being attached on the measured object.
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| CN201821481109.1U CN208766051U (en) | 2018-09-11 | 2018-09-11 | Digital speckle method Young's modulus measuring system |
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| CN201821481109.1U CN208766051U (en) | 2018-09-11 | 2018-09-11 | Digital speckle method Young's modulus measuring system |
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| CN208766051U true CN208766051U (en) | 2019-04-19 |
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