CN208738198U - A kind of optical defect check machine for patterned sapphire substrate - Google Patents
A kind of optical defect check machine for patterned sapphire substrate Download PDFInfo
- Publication number
- CN208738198U CN208738198U CN201821682118.7U CN201821682118U CN208738198U CN 208738198 U CN208738198 U CN 208738198U CN 201821682118 U CN201821682118 U CN 201821682118U CN 208738198 U CN208738198 U CN 208738198U
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- China
- Prior art keywords
- side wall
- hole
- groove
- check machine
- movable plate
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The utility model discloses a kind of optical defect check machines for patterned sapphire substrate, including check machine ontology, check machine ontology includes the first housing and the second housing, the side side wall of the first housing offers first through hole, the bottom end side wall of the second housing offers the first groove, and first is connected to inside groove and first through hole, the bottom end side wall of first through hole offers the second groove, second groove is internally provided with regulating mechanism, the bottom end side wall of first through hole is equipped with symmetrically arranged movable plate, movable plate side side wall both ends close to each other are welded with connecting rod, movable plate side side wall close to each other offers placing groove.The utility model can carry out placement inspection to different size of substrate, can improve practicability, and can adjust examined substrate position according to demands on examination according to the position of the size controllable register of substrate, have the effect of with adjusting with stopping, easy to operate.
Description
Technical field
The utility model relates to optical checking machine technical field more particularly to a kind of light for patterned sapphire substrate
Learn check machine.
Background technique
Optical checking machine is high-speed, high precision optical image detection system, with machine vision as examination criteria technology,
The shortcomings that traditionally using optical instrument to be detected with manpower as improvement, application includes grinding from high-tech industry
Hair, manufacture quality control, so that national defence, the people's livelihood, medical treatment, environmental protection, electric power ... wait fields.
Traditional optical checking machine is to place a substrate in check inside slot, then carries out defect using the camera of machine
And basic wireline inspection, but the inspection position of camera is limited, needs during the inspection process, artificially to move repeatedly base every time
The position of plate checks that this there is human error convenient for the different location to substrate, for this purpose, we have proposed one kind
Optical checking machine for patterned sapphire substrate.
Utility model content
Purpose of the utility model is to solve disadvantages existing in the prior art, and the one kind proposed is for patterning
The optical defect check machine of sapphire substrate.
To achieve the goals above, the utility model adopts the technical scheme that
A kind of optical defect check machine for patterned sapphire substrate, including check machine ontology, the check machine sheet
Body includes the first housing and the second housing, and the side side wall of the first housing offers first through hole, the bottom end of the second housing
Side wall offers the first groove, and is connected to inside the first groove and first through hole, and the bottom end side wall of the first through hole offers
Second groove, the second groove are internally provided with regulating mechanism, and the bottom end side wall of the first through hole is equipped with symmetrically arranged
Movable plate, movable plate side side wall both ends close to each other are welded with connecting rod, movable plate side side wall close to each other
Placing groove is offered, the side side wall of the movable plate offers multiple symmetrically arranged second through-holes, slides inside the second through-hole
Dynamic to be connected with slide plate, one end of slide plate, which extends to the second through-hole outside weldings, connecting plate, and the other end of connecting plate welds jointly
It is connected to baffle, one of them second through-hole is internally provided with apart from mechanism.
Preferably, described apart from mechanism includes the third through-hole for being provided with slide plate side wall, and the side side wall of third through-hole is opened
Equipped with the first rack gear, the side side wall of second through-hole is rotatably connected to shaft, and the other end of shaft prolongs across third through-hole
Extending to the second through-hole outside weldings has rotating plate, and the lateral wall of shaft is welded with first gear, and first gear is nibbled with the first rack gear
Close transmission.
Preferably, the regulating mechanism includes the driving shaft for being rotatably connected on the second groove side side wall, driving shaft it is another
One end, which extends to the second groove outside weldings, adjustable plate, and is vertically arranged between adjustable plate and driving shaft, the driving shaft
Lateral wall is welded with second gear.
Preferably, the bottom end side wall of one of them movable plate offers the second rack gear, and second along its length
It is connected by meshing transmission between gear and the second rack gear.
Preferably, the top of the baffle is concordant with the bottom end side wall of placing groove, and vertical between baffle and connecting plate sets
It sets.
Preferably, the movable plate, baffle are all made of transparent material and are made.
The utility model beneficial effect is:
1: by the movable plate of setting, baffle and apart from mechanism, placement inspection can be carried out to different size of substrate,
Practicability can be improved according to the position of the size controllable register of substrate；
2: by the regulating mechanism of setting, examined substrate position can be adjusted according to demands on examination, have with adjust with
The effect stopped, it is easy to operate；
The utility model can carry out placement inspection to different size of substrate, can be according to the size controllable register of substrate
Position, improve practicability, and examined substrate position can be adjusted according to demands on examination, have with adjusting with stopping
Effect, it is easy to operate.
Detailed description of the invention
Fig. 1 be the utility model proposes the structure of optical defect check machine for patterned sapphire substrate a kind of show
It is intended to；
Fig. 2 be the utility model proposes a kind of optical defect check machine for patterned sapphire substrate it is first logical
Pore structure side view；
Fig. 3 be the utility model proposes a kind of optical defect check machine for patterned sapphire substrate movable plate
Structure top view；
Fig. 4 be the utility model proposes a kind of optical defect check machine for patterned sapphire substrate part A
Structural schematic diagram；
Fig. 5 be the utility model proposes a kind of slide plate for the optical defect check machine of patterned sapphire substrate in
Portion's structural side view.
In figure: 1 check machine ontology, 101 first housings, 102 second housings, 2 first through hole, 3 first grooves, 4 movable plates,
5 second grooves, 6 placing grooves, 7 second through-holes, 8 slide plates, 9 connecting plates, 10 baffles, 11 shafts, 12 third through-holes, 13 first teeth
Wheel, 14 first rack gears, 15 rotating plates, 16 driving shafts, 17 adjustable plates, 18 second gears, 19 second rack gears, 20 connecting rods.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.
In the description of the present invention, it should be understood that term " center ", " longitudinal direction ", " transverse direction ", " length ", " width
Degree ", " thickness ", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside",
The orientation or positional relationship of the instructions such as " clockwise ", " counterclockwise " be based on the orientation or positional relationship shown in the drawings, be only for
Convenient for description the utility model and simplify description, rather than the equipment of indication or suggestion meaning or element must have specifically
Orientation is constructed and operated in a specific orientation, therefore should not be understood as limiting the present invention.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include one or more of the features.The meaning of " plurality " is two or two in the description of the present invention,
More than, unless otherwise specifically defined.
Referring to Fig.1-5, a kind of optical defect check machine for patterned sapphire substrate, including check machine ontology 1, inspection
Looking into machine ontology 1 includes the first housing 101 and the second housing 102, and the side side wall of the first housing 101 offers first through hole 2, the
The bottom end side wall of two bodies 102 offers the first groove 3, and is connected to inside the first groove 3 and first through hole 2, first through hole 2
Bottom end side wall offers the second groove 5, and the second groove 5 is internally provided with regulating mechanism, the bottom end side wall installation of first through hole 2
There is symmetrically arranged movable plate 4, the side side wall both ends close to each other of movable plate 4 are welded with connecting rod 20, and movable plate 4 mutually leans on
Close side side wall offers placing groove 6, and the side side wall of movable plate 4 offers multiple symmetrically arranged second through-holes 7, and second
7 internal slide of through-hole is connected with slide plate 8, and one end of slide plate 8, which extends to 7 outside weldings of the second through-hole, connecting plate 9, and connecting plate
9 other end is welded with baffle 10 jointly, one of them the second through-hole 7 is internally provided with apart from mechanism.
It include the third through-hole 12 for being provided with 8 side wall of slide plate apart from mechanism, the side side wall of third through-hole 12 offers
One rack gear 14, the side side wall of the second through-hole 7 are rotatably connected to shaft 11, and the other end of shaft 11 extends across third through-hole 12
There is rotating plate 15 to 7 outside weldings of the second through-hole, and the lateral wall of shaft 11 is welded with first gear 13, first gear 13 and first
The engaged transmission of rack gear 14, regulating mechanism include the driving shaft 16 for being rotatably connected on 5 side side wall of the second groove, driving shaft 16 it is another
One end, which extends to 5 outside weldings of the second groove, adjustable plate 17, and is vertically arranged between adjustable plate 17 and driving shaft 16, driving shaft
16 lateral wall is welded with second gear 18, and the bottom end side wall of one of movable plate 4 offers the second tooth along its length
Item 19, and be connected by meshing transmission between second gear 18 and the second rack gear 19, the top of baffle 10 and the bottom end side wall of placing groove
Concordantly, and between baffle 10 and connecting plate 9 it is vertically arranged, movable plate 4, baffle 10 are all made of transparent material and are made.
Working principle: substrate both ends to be checked are placed in the placing groove 6 that two movable plates 4 open up, then start VT-
The check machine ontology 1 of 688 models, to be located at the first groove 3 inside substrate progress defect inspection, when need to substrate position into
When row adjusts inspection, by rotating adjustable plate 17, adjustable plate 17 drives driving shaft 16, and driving shaft 16 drives second gear 18 to revolve
Turn, second gear 18 and the second rack gear 19 are engaged transmission, drive movable plate 4 mobile, movable plate 4 is driven by connecting rod 5
Another movable plate 4 is mobile, meanwhile, movable plate 4 drives substrate to carry out mobile adjusting jointly, convenient for carrying out to substrate different location
It checks, when checking lesser substrate, by rotating rotating plate 15, rotating plate 15 drives shaft 11, and shaft 11 drives first
14 engaged transmission of gear 13 and the first rack gear, to drive slide plate 8 mobile, slide plate 8 drives connecting plate 9, and connecting plate 9 drives baffle
10 is mobile, adjusts the distance between corresponding two baffles 10, so that lesser substrate both ends is placed on 10 surface of baffle, so
After checked, the design is simple and fast, can carry out placement inspection to different size of substrate, can be according to the size of substrate
The position of controllable register improves practicability, and can adjust examined substrate position according to demands on examination, have with
It adjusts with the effect stopped, it is easy to operate.
The preferable specific embodiment of the above, only the utility model, but the protection scope of the utility model is not
It is confined to this, anyone skilled in the art is within the technical scope disclosed by the utility model, practical according to this
Novel technical solution and its utility model design are subject to equivalent substitution or change, should all cover the protection model in the utility model
Within enclosing.
Claims (6)
1. a kind of optical defect check machine for patterned sapphire substrate, including check machine ontology (1), which is characterized in that
The check machine ontology (1) includes the first housing (101) and the second housing (102), and the side side wall of the first housing (101) opens up
Have first through hole (2), the bottom end side wall of the second housing (102) offers the first groove (3), and the first groove (3) and the
Connection, the bottom end side wall of the first through hole (2) offer the second groove (5) inside one through-hole (2), the second groove (5) it is interior
Portion is provided with regulating mechanism, and the bottom end side wall of the first through hole (2) is equipped with symmetrically arranged movable plate (4), movable plate (4)
Side side wall both ends close to each other are welded with connecting rod (20), and the movable plate (4) side side wall close to each other offers
Placing groove (6), the side side wall of the movable plate (4) offer multiple symmetrically arranged second through-holes (7), the second through-hole (7)
Internal slide is connected with slide plate (8), and one end of slide plate (8), which extends to the second through-hole (7) outside weldings, to be had connecting plate (9), and even
The other end of fishplate bar (9) is welded with baffle (10) jointly, one of them the second through-hole (7) are internally provided with apart from machine
Structure.
2. a kind of optical defect check machine for patterned sapphire substrate according to claim 1, which is characterized in that
The third through-hole (12) apart from mechanism including being provided with slide plate (8) side wall, the side side wall of third through-hole (12) offer
The side side wall of first rack gear (14), second through-hole (7) is rotatably connected to shaft (11), and the other end of shaft (11) passes through
Third through-hole (12), which extends to the second through-hole (7) outside weldings, to be had rotating plate (15), and the lateral wall of shaft (11) is welded with first
Gear (13), first gear (13) and the first rack gear (14) engaged transmission.
3. a kind of optical defect check machine for patterned sapphire substrate according to claim 1, which is characterized in that
The regulating mechanism includes the driving shaft (16) for being rotatably connected on the second groove (5) side side wall, the other end of driving shaft (16)
Extending to the second groove (5) outside weldings has adjustable plate (17), and is vertically arranged between adjustable plate (17) and driving shaft (16), institute
The lateral wall for stating driving shaft (16) is welded with second gear (18).
4. a kind of optical defect check machine for patterned sapphire substrate according to claim 1, which is characterized in that
The bottom end side wall of one of them movable plate (4) offers the second rack gear (19) along its length, and second gear (18)
It is connected by meshing transmission between the second rack gear (19).
5. a kind of optical defect check machine for patterned sapphire substrate according to claim 1, which is characterized in that
The top of the baffle (10) is concordant with the bottom end side wall of placing groove, and is vertically arranged between baffle (10) and connecting plate (9).
6. a kind of optical defect check machine for patterned sapphire substrate according to claim 1, which is characterized in that
The movable plate (4), baffle (10) are all made of transparent material and are made.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821682118.7U CN208738198U (en) | 2018-10-17 | 2018-10-17 | A kind of optical defect check machine for patterned sapphire substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821682118.7U CN208738198U (en) | 2018-10-17 | 2018-10-17 | A kind of optical defect check machine for patterned sapphire substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208738198U true CN208738198U (en) | 2019-04-12 |
Family
ID=66035848
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821682118.7U Expired - Fee Related CN208738198U (en) | 2018-10-17 | 2018-10-17 | A kind of optical defect check machine for patterned sapphire substrate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208738198U (en) |
-
2018
- 2018-10-17 CN CN201821682118.7U patent/CN208738198U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190412 Termination date: 20191017 |