CN208547599U - A kind of TDS detection circuit and water purifier - Google Patents
A kind of TDS detection circuit and water purifier Download PDFInfo
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- CN208547599U CN208547599U CN201821276019.9U CN201821276019U CN208547599U CN 208547599 U CN208547599 U CN 208547599U CN 201821276019 U CN201821276019 U CN 201821276019U CN 208547599 U CN208547599 U CN 208547599U
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Abstract
The utility model is suitable for water treatment field, provide a kind of TDS detection circuit and water purifier, the TDS detection circuit includes: the first test probe, the second test probe, MCU, the first phase inverter, the second phase inverter and first capacitor, and the first inverter series are between the first test probe and the second test probe；The input terminal of second phase inverter is connected on the connecting line between the second test probe and the first inverter output, and the output end of the second phase inverter connects MCU；One end of first capacitor is connected to the first test probe on the connecting line of the first inverter input, and the other end of first capacitor is connected on the connecting line between second phase inverter and MCU.TDS detection circuit provided by the embodiment of the utility model does not need the TDS value that the resistance of fixed resistance value is detected as pull-up resistor using water as resistance, it will be able to detect the TDS value size of water outlet, detection range is big, and testing result is more accurate.
Description
Technical field
The utility model belongs to water treatment field more particularly to a kind of TDS detection circuit and water purifier.
Background technique
TDS (Total Dissolved Solids) is referred to as total dissolved solidss, also known as dissolvability solid amount, measurement
Unit is mg/L (mg/litre), indicates the soluble solid in 1 liter of water dissolved with how many milligrams, and under normal circumstances, TDS value is higher,
Indicate that the dissolved matter contained in water is more.For popular, TDS value represents dissolved matter impurity content in water, and TDS value is bigger, says
Impurity content in bright water is bigger, and water quality is poor；Conversely, the impurity content in specification water is small, water quality is preferable.
In general, the TDS value in water is detected using TDS detection circuit in the prior art, it is existing as shown in Fig. 1
One of technology TDS detection circuit, including connecting the partial pressure type formed electricity with capacitor C0 by a pull-up resistor R0, probe J0
Road, and the MCU being connect with the output point of partial pressure type circuit, MCU ADC channel be used for receiving transducer sampled data, thus
TDS value is calculated by MCU.Since water can generate the very wide resistance value of variation range at probe both ends, if necessary to detect model
Enclose it is smaller, as 1-100PPM TDS value when, then pull-up resistor needs to select the resistance of larger resistance value, conversely, pull-up resistor is just
Need to select the resistance of smaller resistance value.
However, since the resistance value of the pull-up resistor is usually a definite value, then being influenced by pull-up resistor, each pull-up
The range for the TDS value that the selection of resistance can be detected all is a narrow range, does not simply fail to detect difference simultaneously in this way
The TDS value of water quality, and because some smaller range TDS value can only be detected, so as to cause the TDS value for exceeding measurement range
Testing result is not accurate.
Utility model content
A kind of TDS detection circuit provided by the utility model and water purifier, it is intended to solve existing TDS detection circuit detection water
The small problem of TDS value range.
The utility model is realized in this way the utility model embodiment provides a kind of TDS detection circuit, comprising:
First test probe and the second test probe；
Microcontroller；
First phase inverter, first inverter series are between the first test probe and the second test probe；
Second phase inverter, the input terminal of second phase inverter are connected to the second test probe and first reverse phase
On connecting line between device output end, the output end of second phase inverter connects the MCU；
First capacitor, one end of the first capacitor are connected to the first test probe and input with first phase inverter
On the connecting line at end, the other end of the first capacitor is connected to the connecting line between second phase inverter and the MCU
On.
Further, the circuit further includes third phase inverter, wherein
The input terminal of the third phase inverter connects the output end of second phase inverter, the output of the third phase inverter
End connects the MCU；
The other end of the first capacitor is connected to the connecting line between second phase inverter and the third phase inverter
On.
Further, the circuit further includes the second capacitor, and it is anti-that one end of second capacitor is connected to the third
On connecting line between phase device and the MCU, the other end of second capacitor is grounded.
Further, the circuit further includes first resistor, wherein
The first resistor is connected between the first test probe and the input terminal of first phase inverter；
One end of the first capacitor is connected to the connection between first inverter input and the first resistor
On line.
Further, the circuit further includes second resistance, wherein
The second resistance is connected between the first resistor and the input terminal of first phase inverter；
One end of the first capacitor is connected on the connecting line between the first resistor and the second resistance.
Further, the circuit further includes 3rd resistor, wherein
One end connection of the 3rd resistor the second test probe, the other end of the 3rd resistor is connected to described
On connecting line between first phase inverter and second phase inverter.
Further, the circuit further includes the temperature sensor being connected with the MUC.
Further, the temperature sensor includes:
Temp probe；
4th resistance, one end of the 4th resistance connect the MCU, and the other end of the 4th resistance connects the temperature
Degree probe；
Third capacitor, one end of the third capacitor are connected to the connecting line between the 4th resistance and temp probe
On, the other end of the third capacitor is grounded；
5th resistance, the 5th resistance are arranged in parallel with third capacitor.
The utility model additionally provides a kind of water purifier, including above-mentioned TDS detection circuit.
Compared with the relevant technologies, TDS detection circuit provided by the utility model is had the following beneficial effects:
TDS detection circuit provided by the embodiment of the utility model, by first capacitor and first direction device and the second phase inverter
RC charging and discharging circuit is formed, the first test probe and the second test probe are connect with the RC charging and discharging circuit, and the first test is visited
It is formed into a loop in head and the second test probe insertion water, water is made to become the electricity of connection the first test probe and the second test probe
Resistance to receive the pulse generated by MCU, and then the TDS value of water can be obtained according to the pulse of generation, due to using water as electricity
Resistance, does not need the TDS value that the resistance of fixed resistance value is detected as pull-up resistor, it will be able to detect the TDS value size of water outlet, examine
Survey range is big, and testing result is more accurate.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram for TDS detection circuit that the prior art provides；
Fig. 2 is a kind of structural schematic diagram of TDS detection circuit provided by the embodiment of the utility model；
Fig. 3 is the structural schematic diagram of another kind TDS detection circuit provided by the embodiment of the utility model；
Fig. 4 is the structural schematic diagram of another TDS detection circuit provided by the embodiment of the utility model；
Fig. 5 is the structural schematic diagram of the TDS detection circuit provided by the embodiment of the utility model comprising temperature sensor.
Specific embodiment
In order to make the purpose of the utility model, technical solutions and advantages more clearly understood, below in conjunction with attached drawing and implementation
Example, the present invention will be further described in detail.It should be appreciated that specific embodiment described herein is only used to explain
The utility model is not used to limit the utility model.
The utility model embodiment provides a kind of TDS detection circuit, the detection circuit include two tests pop one's head in and
With the MCU of test probe connection, the charging and discharging circuit that two test probes are made up of phase inverter and capacitor, and then should
In two test probe insertion water, water is set to become the conductor of two test probes of connection, also known as water quality resistance, thus by MCU
The pulse generated is received, and then the TDS value of water can be obtained according to the pulse of generation, it is solid due to not needing using water as resistance
Determine the TDS value that the resistance of resistance value is detected as pull-up resistor, it will be able to detect the TDS value size of water outlet, detection range is big, inspection
It is more accurate to survey result.
Embodiment one
It referring to fig. 2, is a kind of TDS detection circuit provided by the embodiment of the utility model.As shown in Fig. 2, TDS detection electricity
Road includes: the 11, second test of the first test probe probe 12, MCU, the first phase inverter U1, the second phase inverter U2 and first capacitor
C1, wherein the first phase inverter U1 is connected between the first test probe 11 and the second test probe 12, the second phase inverter U2
Input terminal be connected to it is described second test probe 12 and first phase inverter U1 output end between connecting line on, the second reverse phase
The output end of device U2 is connected to the input terminal of MCU, and one end of first capacitor C1 is connected to the first test probe 11 and first instead
On the connecting line of the input terminal of phase device U1, the other end of first capacitor C1 be connected to the second phase inverter U2 and MCU input terminal it
Between connecting line on.
Wherein, in the embodiment of the present application, first phase inverter U1 also respectively with voltage source VCC and connect, first is anti-
The voltage source VCC of phase device U1 connection can be+5V voltage.The 11, first phase inverter U1 of the TDS detection circuit first test probe, the
Two test probe 12 and first capacitor C1 forming circuits can make the first test probe 11 by the effect of the first phase inverter U1
And second test probe 12 between water (can be described as resistance R) and first capacitor C1 between formation RC charging and discharging circuit, so as to
So that the first test probe 11 and the second test probe 12 can detecte the resistance of different resistance value sizes, i.e. different range TDS value
Detection, to effectively improve the detection range and detection accuracy of TDS detection circuit.
Moreover, in the application, by the way that the second phase inverter U2 is arranged, make the second phase inverter U2 be serially connected with the output end of MCU with
On connecting line between second test probe 12 and the output end of the first phase inverter U1, so as to form RC oscillating circuit, by
MCU receives the pulse that RC oscillating circuit generates, to calculate the TDS value of water.
TDS detection circuit provided by the embodiment of the utility model, by first capacitor and first direction device and the second phase inverter
RC charging and discharging circuit is formed, the first test probe and the second test probe are connect with the RC charging and discharging circuit, and the first test is visited
It is formed into a loop in head and the second test probe insertion water, water is made to become the electricity of connection the first test probe and the second test probe
Resistance to receive the pulse generated by MCU, and then the TDS value of water can be obtained according to the pulse of generation, due to using water as electricity
Resistance, does not need the TDS value that the resistance of fixed resistance value is detected as pull-up resistor, it will be able to detect the TDS value size of water outlet, examine
Survey range is big, and testing result is more accurate.
Embodiment two
On the basis of embodiment 1, as shown in Figure 3 another kind TDS detection circuit provided by the embodiments of the present application
Schematic diagram in structure, TDS detection circuit include: the first test probe 11, second test probe 12, MCU, the first phase inverter U1,
Second phase inverter U2, first capacitor C1, third phase inverter U3.Wherein, the first phase inverter U1 is connected on the first test probe
11 and second test between probe 12, and the input terminal of the second phase inverter U2 is connected to the second test probe 12 and the first phase inverter U1
Output end between connecting line on, the output end of the second phase inverter U2 is connected to the input terminal of the third phase inverter U3,
The output end of three phase inverter U3 connects the input terminal of the MCU, one end of first capacitor C1 be connected to the first test probe 11 with
On the connecting line of the input terminal of the first phase inverter U1, the other end of first capacitor C1 is connected to the second phase inverter U2 and third
On connecting line between phase inverter U3.
In the specific implementation process, third phase inverter U3 also could alternatively be triode, and the base stage of triode is connected to
On connecting line between two test probes 12 and the first phase inverter U1 output end, the collector of triode is connected to MCU.
The utility model embodiment turns the sawtooth wave that RC oscillating circuit in embodiment one is formed by third phase inverter U3
It is changed to rectangular wave, so that rectangular wave is sent to MCU, realized conversion to rectangular wave by MCU and is calculated.
Embodiment three
On the basis of embodiment two, another kind TDS detection circuit provided by the embodiments of the present application as shown in Figure 3
Schematic diagram in structure, TDS detection circuit include: the first test probe 11, second test probe 12, MCU, the first phase inverter U1,
Second phase inverter U2, first capacitor C1, third phase inverter U3 and the second capacitor C2, wherein the first phase inverter U1 is connected on described
First test probe 11 and second test probe 12 between, the input terminal of the second phase inverter U2 be connected to the second test probe 12 with
On connecting line between the output end of first phase inverter U1, the output end of the second phase inverter U2 is connected to third phase inverter U3's
Input terminal, the input terminal of the output end connection MCU of third phase inverter U3, one end of first capacitor C1 is connected to the first test probe
11 on the connecting line of the input terminal of the first phase inverter U1, and the other end of first capacitor C1 is connected to the second phase inverter U2
On connecting line between third phase inverter U3.
In the specific implementation process, one end of the second capacitor C2 is connected to the connecting line between third phase inverter U3 and MCU
On, the other end of the second capacitor C2 is grounded.
By the way that the second capacitor C2 is arranged between the output end and MCU of third phase inverter U3, filter circuit is formed it into, is led to
It crosses the second capacitor C2 and operation is filtered to rectangular wave, MCU is received to stable direct current signal.
Example IV
The embodiment of the present application also provides another detection circuits, as shown in figure 4, the TDS detection circuit includes: first
Test probe the 11, second test probe 12, MCU, the first phase inverter U1, the second phase inverter U2, first capacitor C1, first resistor
R1.Wherein, the first phase inverter U1 is connected between the first test probe 11 and the second test probe 12, first resistor R1 string
It is coupled between the first test probe 11 and the input terminal of the first phase inverter U1, it is defeated that one end of first capacitor is connected to the first phase inverter
Enter on the connecting line between end and the first resistor.
In the embodiment of the present application, first resistor R1 is series in circuit, is avoided because of the first test probe 11 in circuit
And second test probe 12 between short circuit, so that RC charging and discharging circuit can not be formed.
Embodiment five
In addition on the basis of example IV, the embodiment of the present application also provides another detection circuits, such as Fig. 4 institute
Show, which includes: 12, MCU, the first phase inverter U1, the second reverse phase of the first test probe the 11, second test probe
Device U2, first capacitor C1, first resistor R1, second resistance R2.Wherein, the first phase inverter U1 is connected on the first test probe
11 and second test between probe 12, and first resistor R1 and second resistance R2 are series at the first test probe 11 and the first phase inverter
Between the input terminal of U1, one end of first capacitor C1 is connected on the connecting line between first resistor R1 and second resistance R2.
In the embodiment of the present application, allow to effectively increase first instead using first resistor R1 and second resistance R2 at the same time
The input impedance of phase device U1, to further avoid the risk that short circuit occurs for first capacitor C1.
Embodiment six
The embodiment of the present application also provides another detection circuits, as shown in figure 4, the TDS detection circuit includes: first
Test probe the 11, second test probe 12, MCU, the first phase inverter U1, the second phase inverter U2, first capacitor C1,3rd resistor
One end connection the second test probe of R3,3rd resistor R3, the other end of 3rd resistor are connected to the first phase inverter and second instead
On connecting line between phase device.Wherein, the first phase inverter U1 is connected between the first test probe 11 and the second test probe 12,
Connect 3rd resistor R3 between the output end of first phase inverter U1 and the second test probe 12, the input terminal of the second phase inverter U2
It is connected on the connecting line between 3rd resistor R3 and the output end of the first phase inverter U1.
In the embodiment of the present application, the concatenation third electricity between the second test probe 12 and the output end of the first phase inverter U1
R3 is hindered, to further increase the impedance in circuit, the risk that short circuit occurs for first capacitor C1 is further decreased, thus can not shape
At RC charging and discharging circuit.
Embodiment seven
In the specific implementation process, on the basis of above-described embodiment, the embodiment of the present application also provide another
TDS detection circuit.The TDS detection circuit further includes temperature sensor, temperature in addition to specific structure provided by the above embodiment
Sensor is connect with MCU, by MCU receive temperature sensor send temperature information, and then based on the received pulse signal and
Temperature information calculates the TDS value of water, since the temperature of water may will affect the variation of TDS value, in the application embodiment
Make the detection to TDS value more accurate by increasing temperature sensor.Specifically, how MCU is according to temperature information and pulse
The size that signal calculates TDS value can refer to associated description in the prior art, in the embodiment of the present application and be not set forth in detail.
Specifically, as shown in figure 5, the temperature sensor includes temp probe D1, the 4th resistance R4, third capacitor C3 and
Five resistance R5, wherein one end of the 4th resistance R4 connects the MCU, and the other end of the 4th resistance R4 connects temp probe D1；The
One end of three capacitor C3 is connected on the connecting line between the 4th resistance R4 and temp probe D1, another termination of third capacitor C3
Ground；And the 5th resistance R5 and third capacitor C3 be arranged in parallel.To by by temp probe D1, the 5th resistance R5 and third capacitor
C3 forms RC charging and discharging circuit, so that the temperature signal acquired by temp probe D1 is sent to MCU by the 4th resistance R4.
Identical place is to be described in detail between the above various embodiments, can be mutually referring to not elaborating herein.
Embodiment eight
A kind of water purifier is additionally provided in the embodiment of the present application, and the water purifier includes above-mentioned TDS detection circuit.Specifically
The structure of the TDS detection circuit can not be elaborated herein referring to above embodiment.
TDS detection circuit provided by the embodiment of the utility model, by first capacitor and first direction device and the second phase inverter
RC charging and discharging circuit is formed, the first test probe and the second test probe are connect with the RC charging and discharging circuit, and the first test is visited
It is formed into a loop in head and the second test probe insertion water, water is made to become the electricity of connection the first test probe and the second test probe
Resistance to receive the pulse generated by MCU, and then the TDS value of water can be obtained according to the pulse of generation, due to using water as electricity
Resistance, does not need the TDS value that the resistance of fixed resistance value is detected as pull-up resistor, it will be able to detect the TDS value size of water outlet, examine
Survey range is big, and testing result is more accurate.What the utility model embodiment was formed RC oscillating circuit by third phase inverter U3
Sawtooth wave is converted to rectangular wave, so that rectangular wave is sent to MCU, realized conversion to rectangular wave by MCU and is calculated.By
Second capacitor C2 is set between the output end and MCU of three phase inverter U3, forms it into filter circuit, by the second capacitor C2 to square
Shape wave is filtered operation, and MCU is received to stable direct current signal.First resistor R1 is series in circuit, is avoided because of first
Between test probe 11 and the second test probe 12 when short circuit, so that RC charging and discharging circuit can not be formed.First is used at the same time
Resistance R1 and second resistance R2 allows to effectively increase the input impedance of the first phase inverter U1 in circuit, to further avoid
The risk of short circuit occurs for first capacitor C1.Third is concatenated between the second test probe 12 and the output end of the first phase inverter U1
Resistance R3 further decreases the risk that short circuit occurs for first capacitor C1 to further increase the impedance in circuit.Pass through increase
Temperature sensor makes the detection to TDS value more accurate.
The above is only the preferred embodiment of the utility model only, is not intended to limit the utility model, all at this
Made any modifications, equivalent replacements, and improvements etc., should be included in the utility model within the spirit and principle of utility model
Protection scope within.
Claims (9)
1. a kind of TDS detection circuit characterized by comprising
First test probe and the second test probe；
Microcontroller；
First phase inverter, first inverter series are between the first test probe and the second test probe；
Second phase inverter, it is defeated with first phase inverter that the input terminal of second phase inverter is connected to the second test probe
On connecting line between outlet, the output end of second phase inverter connects the MCU；
First capacitor, one end of the first capacitor are connected to the first test probe and first inverter input
On connecting line, the other end of the first capacitor is connected on the connecting line between second phase inverter and the MCU.
2. TDS detection circuit as described in claim 1, which is characterized in that the circuit further includes third phase inverter, wherein
The input terminal of the third phase inverter connects the output end of second phase inverter, and the output end of the third phase inverter connects
Meet the MCU；
The other end of the first capacitor is connected on the connecting line between second phase inverter and the third phase inverter.
3. TDS detection circuit as claimed in claim 2, which is characterized in that the circuit further includes the second capacitor, and described second
One end of capacitor is connected on the connecting line between the third phase inverter and the MCU, another termination of second capacitor
Ground.
4. TDS detection circuit as described in claim 1, which is characterized in that the circuit further includes first resistor, wherein
The first resistor is connected between the first test probe and the input terminal of first phase inverter；
One end of the first capacitor is connected on the connecting line between first inverter input and the first resistor.
5. TDS detection circuit as claimed in claim 4, which is characterized in that the circuit further includes second resistance, wherein
The second resistance is connected between the first resistor and the input terminal of first phase inverter；
One end of the first capacitor is connected on the connecting line between the first resistor and the second resistance.
6. TDS detection circuit as described in claim 1, which is characterized in that the circuit further includes 3rd resistor, wherein
One end connection of the 3rd resistor the second test probe, the other end of the 3rd resistor are connected to described first
On connecting line between phase inverter and second phase inverter.
7. TDS detection circuit as described in claim 1, which is characterized in that the circuit further includes the temperature being connected with the MUC
Spend sensor.
8. TDS detection circuit as claimed in claim 7, which is characterized in that the temperature sensor includes:
Temp probe；
4th resistance, one end of the 4th resistance connect the MCU, and the other end of the 4th resistance connects the temperature and visits
Head；
Third capacitor, one end of the third capacitor are connected on the connecting line between the 4th resistance and temp probe, institute
State the other end ground connection of third capacitor；
5th resistance, the 5th resistance are arranged in parallel with third capacitor.
9. a kind of water purifier, which is characterized in that the water purifier includes the described in any item TDS detection circuits of claim 1-8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821276019.9U CN208547599U (en) | 2018-08-08 | 2018-08-08 | A kind of TDS detection circuit and water purifier |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821276019.9U CN208547599U (en) | 2018-08-08 | 2018-08-08 | A kind of TDS detection circuit and water purifier |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208547599U true CN208547599U (en) | 2019-02-26 |
Family
ID=65426078
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821276019.9U Active CN208547599U (en) | 2018-08-08 | 2018-08-08 | A kind of TDS detection circuit and water purifier |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208547599U (en) |
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2018
- 2018-08-08 CN CN201821276019.9U patent/CN208547599U/en active Active
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