CN208488675U - Probe - Google Patents
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- CN208488675U CN208488675U CN201821258378.1U CN201821258378U CN208488675U CN 208488675 U CN208488675 U CN 208488675U CN 201821258378 U CN201821258378 U CN 201821258378U CN 208488675 U CN208488675 U CN 208488675U
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Abstract
The utility model relates to a kind of probes.Probe includes coupling part and probe segment, the former can be connected with board, and the latter includes empty avoiding section, detects section and surface detection section in slot.The cross section of empty avoiding section is circle, and one end is affixed with coupling part, and the detection Duan Yuqi other end is affixed in slot.Detection section includes disk probe portion in slot, disk probe portion be it is cylindric, its axis is overlapped with the axis of empty avoiding section.Surface detect section be it is cylindric, the detection one end of section far from empty avoiding section is affixed in one end and slot, and the other end extends towards the direction far from disk probe portion, and surface detects the axis of section and is overlapped with the axis of disk probe portion.The diameter of disk probe portion is greater than the maximum gauge of empty avoiding section, and is greater than the diameter of surface detection section.This probe can simplify detection process in slot and being capable of a variety of contour surfaces of detection workpieces.
Description
Technical field
The utility model relates to be machined detection technology field, more particularly to a kind of probe.
Background technique
Probe is usually used cooperatively with detection board as a kind of tool applied to machining field of detecting.It is examining
It surveys under the drive of board, probe touches the profile of workpiece, and according to the position signal that probe is fed back, detection board calculates workpiece
Profile parameters, and be compared with the theoretical reference value being pre-recorded in detection board, obtain it of actual value and theoretical value
Between deviation, thus according to this deviation distinguish workpiece it is qualified or not.
The probe of conventional probe is predominantly cylindric, L-type or T-type structure.Cylindrical probe can not be in detection workpieces slot
Z datum level.Although L-type or T-type probe can detect the Z datum level in slot, due to needing the probe of rotating probe
It could go deep into being detected in slot to certain angle, and L-type or T-type probe are only capable of detection workpieces slot Internal periphery, can not visit
Survey workpiece surface profile.
Utility model content
Based on this, it is necessary to which detection process in slot can be simplified and being capable of a variety of contour surfaces of detection workpieces by providing one kind
Probe.
A kind of probe can be mounted on board, comprising:
Coupling part can be connected with the board；
Section is detected in probe segment, including empty avoiding section, slot and surface detects section, and the cross section of empty avoiding section is circle, empty avoiding
One end and coupling part of section are affixed, and the other end of detection section and empty avoiding section is affixed in slot, and detection section includes disk detection in slot
Portion, disk probe portion be it is cylindric, the axis of disk probe portion is overlapped with the axis of empty avoiding section, surface detection section be it is cylindric,
It is affixed that surface detects the detection one end of section far from empty avoiding section in one end and slot of section, and the other end is towards the direction of separate disk probe portion
Extend, and the axis of surface detection section is overlapped with the axis of disk probe portion, wherein the diameter of disk probe portion is greater than empty avoiding section
Maximum gauge, and be greater than surface detection section diameter.
It include a disk probe portion due to detecting section in the slot of above-mentioned probe, so when carrying out detect operation, disk detection
The column side in portion does not have to rotate to a certain special angle and can contradict to the slot lubrication groove profile surface of workpiece, by the side come
Touch workpiece slot lubrication groove profile surface, detect workpiece in the departure of X-direction, and be pre-recorded in detection board in theory
Reference value is compared, and detects process so as to simplify in slot；Above-mentioned probe further includes surface detection section, so not more
In the case where changing probe, the detection of workpiece surface profile can be also used for, achieve the purpose that a variety of detection purposes of probe.
Empty avoiding section includes empty avoiding bar and First Transition portion in one of the embodiments, and empty avoiding bar is cylindric, empty avoiding bar
One end and slot in detection section it is affixed, First Transition portion be formed in empty avoiding bar far from slot detect section one end on, First Transition
Portion be it is round table-like, the end face and coupling part of the stub end in First Transition portion are affixed, and the end face of small head end is with empty avoiding bar far from slot
The end face of one end of interior detection section is affixed, and the axis in First Transition portion is overlapped with the axis of empty avoiding bar, First Transition portion it is small
End face diameter of the end face diameter of head end with empty avoiding bar close to the one end in First Transition portion is equal.
Coupling part includes columned probe linkage section in one of the embodiments, the one end for linkage section of popping one's head in
Coupling part is affixed, and the end face of the other end for linkage section of popping one's head in and the end face of the stub end in the First Transition portion are affixed, and visits
End face diameter of the head linkage section close to the one end in First Transition portion is equal to the end face diameter of the stub end in First Transition portion, and probe connects
Connect section setting coaxial with First Transition portion.
Coupling part further includes connecting column and connection ontology in one of the embodiments, and connecting column and connection ontology are equal
To be cylindric, and the diameter of connecting column is less than the diameter of connection ontology, and connecting column is detachably connected by connection screw thread and board,
The other end for connecting ontology and connecting column is affixed, connect ontology the other end and probe linkage section it is affixed, connection ontology, connection
Column and the probe coaxial setting of linkage section three.
It is connected on ontology in one of the embodiments, and is provided with a columned through-hole, and the axis of through-hole is vertically and even
Connect the axis of ontology.
Detection section further includes the second transition part in slot in one of the embodiments, the second transition part be it is round table-like, second
The end face of the stub end of transition part is affixed close to a surface of empty avoiding section with disk probe portion, the small head end of the second transition part
The end face that end face detects one end of section with empty avoiding section in slot is affixed, and the end face diameter of the stub end of the second transition part is less than circle
The diameter of disk probe portion, and the axis of the second transition part is overlapped with the axis of disk probe portion, the small head end of the second transition part
It is equal that end face diameter detects the end face diameter of one end of section with empty avoiding section in slot, and the axis of the second transition part and empty avoiding section
Axis be overlapped.
Detection section further includes third transition part in slot in one of the embodiments, and third transition part is round table-like, third
A surface of the end face of the stub end of transition part with disk probe portion far from empty avoiding section is affixed, the small head end of third transition part
The end face of end face and one end that surface detection section detects section in slot is affixed, and the end face diameter of the stub end of third transition part is small
In the diameter of disk probe portion, and the axis of third transition part is overlapped with the axis of disk probe portion, the microcephaly of third transition part
The end face diameter at end is equal with the surface detection diameter of end face of section, and the axis of the axis of third transition part and surface detection section
It is overlapped.
In one of the embodiments, disk probe portion with a thickness of 0.59mm~0.61mm.
Probe is white steel part in one of the embodiments,.
Probe is an integral molding structure in one of the embodiments,.
Detailed description of the invention
Fig. 1 is the probe structure schematic diagram of an embodiment；
Fig. 2 is the partial enlargement diagram of probe coupling part shown in Fig. 1；
Fig. 3 is the partial enlargement diagram of probe part shown in Fig. 1；
Sectional view when Fig. 4 is probe detection workpieces slot Internal periphery shown in FIG. 1；
Sectional view when Fig. 5 is probe detection workpieces surface profile shown in FIG. 1.
Specific embodiment
The utility model is more fully retouched below with reference to relevant drawings for the ease of understanding the utility model,
It states.The preferred embodiment of the utility model is given in attached drawing.But the utility model can come in many different forms
It realizes, however it is not limited to embodiment described herein.On the contrary, purpose of providing these embodiments is makes to the utility model
The understanding of disclosure is more thorough and comprehensive.
It should be noted that it can directly on the other element when element is referred to as " being fixed on " another element
Or there may also be elements placed in the middle.When an element is considered as " connection " another element, it, which can be, is directly connected to
To another element or it may be simultaneously present centering elements.Term as used herein " vertical ", " horizontal ", " left side ",
" right side " and similar statement are for illustrative purposes only.
Unless otherwise defined, all technical and scientific terms used herein are led with the technology for belonging to the utility model
The normally understood meaning of the technical staff in domain is identical.Terminology used in the description of the utility model herein only be
The purpose of description specific embodiment, it is not intended that in limitation the utility model.
As shown in Figure 1, being the probe 10 of an embodiment, for connecting with detection board (not shown) to complete CNC and add
Work detect operation, the probe 10 include coupling part 20 and probe segment 30.
Referring to Figure 2 together, coupling part 20 can be connected with detection board (not shown).Specifically, board interconnecting piece
Dividing 20 includes board linkage section 21 and probe linkage section 22, and by board linkage section 21, (figure is not with detection board for coupling part 20
Show) connection, it is connected by probe linkage section 22 with probe segment 30.
Board linkage section 21 include columned connecting column 212 and columned connection ontology 214, connecting column 212 it is straight
Diameter is less than the diameter of connection ontology 214.One end of connecting column 212 is affixed with the one end for connecting ontology 214, and the two is coaxial.Even
It connects column 212 and detachable connection is realized by connection screw thread 212a and detection board (not shown).One is provided on connection ontology 214
It is a to assist probe 10 to be installed to detection board (not shown) or probe 10 is assisted into disassembly from detection board (not shown)
Through-hole 214a.Through-hole 214a runs through connection ontology 214, and the axis of the two is vertical.
It should be noted that board linkage section 21 is not limited to above structure, in other embodiments, connecting column 212 may be used also
It is matched with being a regular prism with the regular prism probe hole (not shown) on detection board, realizes detachable connection.
Linkage section 22 of popping one's head in be it is cylindric, pop one's head in linkage section 22 and the other end for connecting ontology 214 it is affixed, and the axis of the two
Line is overlapped.It should be noted that probe linkage section 22 is not limited to cylindrical body, in other embodiments, probe linkage section 22 may be used also
To be regular prism.
Also referring to Fig. 3, probe segment 30 is affixed far from the one end for connecting ontology 214 with probe linkage section 22.Probe
Part 30 includes that empty avoiding section 31, the interior detection section 32 of slot and surface detect section 33.
Referring to Figure 4 together or Fig. 5, empty avoiding section 31 include First Transition portion 312 and empty avoiding bar 314.First Transition portion 312
It is round table-like.The end face of the stub end in First Transition portion 312 is solid far from the end face for connecting 214 one end of ontology with probe linkage section 22
It connects, and the two diameter is equal.The axis in First Transition portion 312 is overlapped with the axis of probe linkage section 22.Empty avoiding bar 314 is cylinder
Shape.The end face of the small head end of the end face and First Transition portion 312 of 314 one end of empty avoiding bar is affixed, and the two diameter is equal.Empty avoiding bar
314 axis is overlapped with the axis in First Transition portion 312.
It should be noted that First Transition portion 312 can be omitted.After omitting First Transition portion 312, the one of empty avoiding bar 314
End is directly affixed far from the one end for connecting ontology 214 with probe linkage section 22, and the other end is directly affixed with empty avoiding bar 314, and
The axis of empty avoiding bar 314 is overlapped with the axis of probe linkage section 22.It should be noted that empty avoiding bar 314 is also not limited to cylinder
Shape, in other embodiments, empty avoiding bar 314 can also be round table-like.
Detection section 32 is used for the slot Internal periphery 41 of detection workpieces 40 in slot.In slot detection section 32 include the second transition part 322,
Disk probe portion 324 and third transition part 326.
Second transition part 322 be it is round table-like, the end face of small head end and empty avoiding bar 314 far from First Transition portion 312 one
The end face at end is affixed, and the two diameter is equal.The axis of second transition part 322 is overlapped with the axis of empty avoiding bar 314.
Disk probe portion 324 is the cylinder of an a height of 0.59mm~0.61mm.One surface of disk probe portion 324 with
The end face of the stub end of second transition part 322 is affixed, and the former diameter is greater than the diameter of the latter.The axis of disk probe portion 324
Line is overlapped with the axis of the second transition part 322.
It should be noted that the second transition part 322 also can be omitted.After omitting the second transition part 322, disk probe portion
The end face of the one end of 324 surface with empty avoiding bar 314 far from First Transition portion 312 is directly affixed, and disk probe portion
324 axis is overlapped with the axis of empty avoiding bar 314.
Third transition part 326 be it is round table-like, the end face of the stub end of third transition part 326 and disk probe portion 324 are separate
One surface of the second transition part 322 is affixed, and the former diameter is less than the diameter of the latter.The axis of third transition part 326 with
The axis of disk probe portion 324 is overlapped.
It is cylindric, the surface profile 42 for detection workpieces 40 that surface, which detects section 33,.The end of surface detection 33 one end of section
Face and the end face of the small head end of third transition part 326 are affixed, and the two diameter is equal, and the other end is towards far from third transition part 326
Direction extend, and surface detection section 33 axis be overlapped with the axis of third transition part 326.
It should be noted that third transition part 326 also can be omitted.After omitting third transition part 326, surface detects section 33
The surface of one end with disk probe portion 324 far from the second transition part 322 is directly affixed, and surface detection section 33 axis with
The axis of disk probe portion 324 is overlapped.
Entire probe 10 is white steel part, and is an integral molding structure, so that probe 10 has enough intensity.
It is as shown in Figure 4 and Figure 5 that detect operation process is carried out using above-mentioned probe 10:
When probe 10 detection workpieces, 40 slot Internal periphery 41, the disk probe portion 311 of probe 10 is deep into the slot of workpiece 40
Slot Internal periphery 41 is detected, is touched by the surface of disk probe portion 311 with 41 phase of slot Internal periphery, to give detection board
The position signal of (not shown) feedback slot Internal periphery 41.
When 10 40 surface profile 42 of detection workpieces of probe, side and the workpiece 40 of section 33 are detected by the surface of probe 10
42 phase of surface profile is touched, to the position signal of detection board (not shown) feedback surface profile 42.
Above-mentioned probe 10 has at least the following advantages:
(1) detection section 32 includes a disk probe portion 326 in the slot of probe 10, so probe 10 is at work, disk is visited
The column side in survey portion 326 can be contradicted without rotating to a certain special angle to the slot Internal periphery 41 of workpiece 40, thus simple
Change and detects process in slot.
(2) for probe 10 other than detecting section 32 in slot, there are one surfaces to detect section 33, so the probe 10 both can be with
Detect operation in slot is completed, surface detect operation can also be completed, achieve the purpose that a variety of detection purposes of probe.
(3) the white steel part that entire probe 10 is an integral molding structure, intensity is high, is not susceptible to be broken.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
Above-described embodiments merely represent several embodiments of the utility model, the description thereof is more specific and detailed,
But it cannot be understood as the limitations to utility model patent range.It should be pointed out that for the common skill of this field
For art personnel, without departing from the concept of the premise utility, various modifications and improvements can be made, these are belonged to
The protection scope of the utility model.Therefore, the scope of protection shall be subject to the appended claims for the utility model patent.
Claims (10)
1. a kind of probe can be mounted on board characterized by comprising
Coupling part can be connected with the board；
Section is detected in probe segment, including empty avoiding section, slot and surface detects section, and the cross section of the empty avoiding section is circle, described
One end of empty avoiding section and the coupling part are affixed, and the other end of detection section and the empty avoiding section is affixed in the slot, the slot
Interior detection section includes disk probe portion, and the disk probe portion is cylindric, the axis of the disk probe portion and the empty avoiding
The axis of section is overlapped, surface detection section be it is cylindric, it is separate to detect section in one end of the surface detection section and the slot
One end of the empty avoiding section is affixed, and the other end extends towards the direction far from the disk probe portion, and surface detection section
Axis is overlapped with the axis of the disk probe portion, wherein the diameter of the disk probe portion is greater than the maximum of the empty avoiding section
Diameter, and it is greater than the diameter of surface detection section.
2. probe according to claim 1, which is characterized in that the empty avoiding section includes empty avoiding bar and First Transition portion, institute
State empty avoiding bar be it is cylindric, detect that section is affixed, and the First Transition portion is formed in institute in one end of the empty avoiding bar and the slot
State empty avoiding bar far from the slot detect section one end on, the First Transition portion be it is round table-like, the First Transition portion it is big
The end face of head end and the coupling part are affixed, and the end face of small head end and the empty avoiding bar are far from the one end for detecting section in the slot
End face it is affixed, and the axis in the First Transition portion is overlapped with the axis of the empty avoiding bar, the microcephaly in the First Transition portion
The end face diameter of one end of the end face diameter at end with the empty avoiding bar close to the First Transition portion is equal.
3. probe according to claim 2, which is characterized in that the coupling part includes columned probe linkage section,
One end and the coupling part of the probe linkage section are affixed, the end face and described first of the other end of the probe linkage section
The end face of the stub end of transition part is affixed, and the end face diameter etc. of the one end of the probe linkage section close to the First Transition portion
In the end face diameter of the stub end in the First Transition portion, probe linkage section setting coaxial with the First Transition portion.
4. probe according to claim 3, which is characterized in that the coupling part further include connecting column and connection ontology,
The connecting column and the connection ontology are cylindric, and the diameter of the connecting column is less than the diameter of the connection ontology,
The connecting column is detachably connected by connection screw thread and the board, and the other end of the connection ontology and the connecting column is solid
It connects, the other end and the probe linkage section of the connection ontology are affixed, the connection ontology, the connecting column and described
The probe coaxial setting of linkage section three.
5. probe according to claim 4, which is characterized in that it is provided with through-hole on the connection ontology, and the through-hole
Axis vertically with it is described connection ontology axis.
6. probe according to claim 1, which is characterized in that detection section further includes the second transition part in the slot, described
Second transition part be it is round table-like, the end face of the stub end of second transition part and the disk probe portion are close to the empty avoiding section
A surface it is affixed, the end face of the small head end of second transition part and the empty avoiding section detect the one of section in the slot
The end face at end is affixed, and the end face diameter of the stub end of second transition part is less than the diameter of the disk probe portion, and described
The axis of second transition part is overlapped with the axis of the disk probe portion, the end face diameter of the small head end of second transition part with
The end face diameter that the empty avoiding section detects one end of section in the slot is equal, and the axis of second transition part with it is described
The axis of empty avoiding section is overlapped.
7. probe according to claim 1, which is characterized in that detection section further includes third transition part in the slot, described
Third transition part be it is round table-like, the end face of the stub end of the third transition part and the disk probe portion are far from the empty avoiding section
A surface it is affixed, the end face of the small head end of the third transition part and surface detection section detect section in the slot
One end end face it is affixed, the end face diameter of the stub end of the third transition part is less than the diameter of the disk probe portion, institute
The axis for stating third transition part is overlapped with the axis of the disk probe portion, the end face diameter of the small head end of the third transition part
It is equal with the surface detection diameter of end face of section, and the axis weight of the axis of the third transition part and surface detection section
It closes.
8. probe according to claim 1, which is characterized in that the disk probe portion with a thickness of 0.59mm~
0.61mm。
9. probe according to claim 1, which is characterized in that the probe is white steel part.
10. probe according to claim 1, which is characterized in that the probe is an integral molding structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821258378.1U CN208488675U (en) | 2018-08-06 | 2018-08-06 | Probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821258378.1U CN208488675U (en) | 2018-08-06 | 2018-08-06 | Probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208488675U true CN208488675U (en) | 2019-02-12 |
Family
ID=65246785
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821258378.1U Active CN208488675U (en) | 2018-08-06 | 2018-08-06 | Probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208488675U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110170885A (en) * | 2019-05-31 | 2019-08-27 | 广东长盈精密技术有限公司 | Probe |
-
2018
- 2018-08-06 CN CN201821258378.1U patent/CN208488675U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110170885A (en) * | 2019-05-31 | 2019-08-27 | 广东长盈精密技术有限公司 | Probe |
| CN110170885B (en) * | 2019-05-31 | 2020-12-08 | 广东长盈精密技术有限公司 | Probe needle |
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