CN208477052U - The fine-tuning chip testing jig of probe socket receptacle - Google Patents
The fine-tuning chip testing jig of probe socket receptacle Download PDFInfo
- Publication number
- CN208477052U CN208477052U CN201821105845.7U CN201821105845U CN208477052U CN 208477052 U CN208477052 U CN 208477052U CN 201821105845 U CN201821105845 U CN 201821105845U CN 208477052 U CN208477052 U CN 208477052U
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- CN
- China
- Prior art keywords
- probe
- plate
- main body
- jig
- fixing seat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a kind of chip testing jigs that probe socket receptacle is fine-tuning comprising jig plate and probe socket receptacle are provided with the profiling positioning chamber of chip placement at the top of jig plate, and bottom is provided with the jack of connection profiling positioning chamber;Probe socket receptacle includes probe, fixing seat, socket main body, upper bed-plate and lower bottom base, fixing seat is bolted to the top of socket main body, probe is mounted in fixing seat, and the top of fixing seat is stretched at the top of probe, is electrically connected in the bottom insertion socket main body of probe pair with socket main body;Upper bed-plate is mounted on the X axis guide rail at the top of lower bottom base using sliding block, socket main body is mounted on the Y-axis guide rail at the top of lower bottom base using sliding block, the position of probe socket receptacle can be adjusted according to the shape of chip, on the basis of not increasing jig cost, make the 80% of jig effective value can reuse, significantly reduces jig cost.
Description
Technical field
The utility model belongs to chip module test equipment technical field.
Background technique
Chip testing is exactly whether its function of chip of being manufactured using dedicated test macro inspection and performance are met
Certain requirement.With the progress of chip technology, the function of integrating on chip piece becomes increasingly complex, and often chip piece can be with
Repertoire needed for realizing a previous system, therefore chip testing can include various contents.
Test macro includes the test fixture of test software and clamping position chip, and test macro is automatic by different instruction
Test the properties of chip.Test fixture includes the jig plate of positioning clamping chip, and realizes conducting with test macro
Probe socket receptacle, the size of different model chip is different, Wiring port position is different, corresponds to so each chip requires to be equipped with
Test fixture, jig is with high costs.
Utility model content
The purpose of the utility model is to provide the test fixtures that a kind of position of probe socket receptacle can be finely tuned according to chip model.
In order to achieve the above objectives, the technical solution of the utility model is as follows:
The fine-tuning chip testing jig of probe socket receptacle, including jig plate and probe socket receptacle are set at the top of the jig plate
It is equipped with the profiling positioning chamber of chip placement, bottom is provided with the jack for being connected to the profiling positioning chamber;The probe socket receptacle is located at
The lower section of the jig plate comprising probe, fixing seat, socket main body, upper bed-plate and lower bottom base, the fixing seat use bolt
It is fixed on the top of the socket main body, the probe is mounted in the fixing seat, is stretched at the top of the probe described solid
The top of reservation, the bottom of the probe are inserted into socket main body and are electrically connected with the socket main body;Pacify on the lower bottom base
Equipped with X axis guide rail, the upper bed-plate is mounted on the X axis guide rail using sliding block;Y-axis is installed on the lower bottom base to lead
Rail, the connecting plate for being connected to the socket main body side are mounted on the Y-axis guide rail using sliding block;The lower bottom base and upper
The bottom of lug with positioning pin there are two being respectively provided in pedestal, the bottom of the upper bed-plate and the connecting plate is provided with slotting
Enter the locating piece between corresponding two lugs, the location hole for holding the positioning pin insertion is provided in the locating piece.
Socket main body is finely tuned along X axis guide rail and Y-axis guide rail, being subject to can be inserted into the jack of positioning plate, then
With the corresponding corresponding positioning hole of positioning pin insertion.
Further, the top of the fixing seat is the guide pad of taper guide frame, the shape of the jack and institute
State guiding Block- matching.After probe socket receptacle fine tuning, guide pad is inserted into pre- directing in jack, to guarantee that probe is smoothly inserted into jig plate
In, prevent probe deformations.
Further, insert made of epoxy resin board is provided at the top of the jig plate, the profiling positioning chamber
In the insert.Epoxy resin board can not only insulate, but also panelling can be carried out according to the model of chip module to be measured
Replacement, improves the versatility of jig.
Compared with prior art, the utility model has the beneficial effects that the position of probe socket receptacle can be according to the shape of chip
Shape is adjusted, and the part of positioning chip also uses the mounting structure of mold insert form in jig plate, do not increase jig at
On the basis of this, it reuse the 80% of jig effective value can, significantly reduce the production cost of jig.
Detailed description of the invention
It, below will be to required in embodiment description in order to illustrate more clearly of the technical scheme in the embodiment of the utility model
Attached drawing to be used is briefly described.
Fig. 1 is the structural schematic diagram of test fixture disclosed in embodiment.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe.
It is the jig for testing chip shown in Fig. 1 comprising jig plate 1 and probe socket receptacle, jig plate solid lock are being tested
On the testing stand of board, probe socket receptacle is located at the lower section of jig plate.Probe socket receptacle includes probe 2a, fixing seat 2b, socket master
Body 2c, upper bed-plate 2d and lower bottom base 2e, fixing seat 2b are bolted to the top of socket main body 2c, and probe 2a is mounted on solid
In reservation 2b, the top of fixing seat 2b is stretched at the top of probe 2a, the bottom of probe 2a is inserted into socket main body 2c and socket master
Metal block electrical connection in body 2c.X axis guide rail 2f is installed, upper bed-plate 2d is mounted on X-axis using sliding block 2g on lower bottom base 2e
Direction guiding rail;Y-axis guide rail 2h is installed, the connecting plate 2k for being connected to socket main body side is mounted on using sliding block on lower bottom base 2e
On Y-axis guide rail;Lug 2p and 2u with positioning pin there are two being respectively provided in lower bottom base 2e and upper bed-plate 2d, the bottom of upper bed-plate 2d
Portion and the bottom of connecting plate are provided with the locating piece 2w and 2v being inserted between corresponding two lugs, are provided with appearance in locating piece
The location hole of positioning pin insertion.Socket main body is finely tuned along X axis guide rail and Y-axis guide rail, the jack of positioning plate can be inserted into
In subject to, then with the corresponding corresponding positioning hole of positioning pin insertion.
Insert 1a made of epoxy resin board is provided at the top of jig plate, the profiling positioning chamber 1b of chip placement is located at edge
In block.The bottom of jig plate is provided with the jack 1c of connection profiling positioning chamber.The top of fixing seat is leading for taper guide frame
To block 2r, the shape and guiding Block- matching of jack.After probe socket receptacle fine tuning, guide pad is inserted into pre- directing in jack, to guarantee to visit
Needle is smoothly inserted into jig plate, prevents probe deformations.
Various modifications to these embodiments will be readily apparent to those skilled in the art, herein
Defined General Principle can be real in other embodiments without departing from the spirit or scope of the present utility model
It is existing.Therefore, the present invention will not be limited to the embodiments shown herein, and be to fit to it is disclosed herein
Principle and the consistent widest scope of features of novelty.
Claims (3)
1. the fine-tuning chip testing jig of probe socket receptacle, which is characterized in that including jig plate and probe socket receptacle, the jig plate
Top be provided with the profiling positioning chamber of chip placement, bottom is provided with the jack for being connected to the profiling positioning chamber;The probe
Socket is located at the lower section of the jig plate comprising probe, fixing seat, socket main body, upper bed-plate and lower bottom base, the fixing seat
It is bolted to the top of the socket main body, the probe is mounted in the fixing seat, is stretched at the top of the probe
In the top of the fixing seat, it is electrically connected in the bottom insertion socket main body of the probe and with the socket main body;Under described
X axis guide rail is installed, the upper bed-plate is mounted on the X axis guide rail using sliding block on pedestal;It is installed on the lower bottom base
There is Y-axis guide rail, the connecting plate for being connected to the socket main body side is mounted on the Y-axis guide rail using sliding block;It is described
Lug with positioning pin there are two being respectively provided in lower bottom base and upper bed-plate, the bottom of the bottom of the upper bed-plate and the connecting plate
It is provided with the locating piece being inserted between corresponding two lugs, is provided in the locating piece and holds determining for the positioning pin insertion
Position hole.
2. the fine-tuning chip testing jig of probe socket receptacle according to claim 1, which is characterized in that the fixing seat
Top is the guide pad of taper guide frame, the shape of the jack and the guiding Block- matching.
3. the fine-tuning chip testing jig of probe socket receptacle according to claim 2, which is characterized in that the jig plate
Top is provided with panelling made of epoxy resin board, and the profiling positioning chamber is located in the panelling.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201821105845.7U CN208477052U (en) | 2018-07-12 | 2018-07-12 | The fine-tuning chip testing jig of probe socket receptacle |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201821105845.7U CN208477052U (en) | 2018-07-12 | 2018-07-12 | The fine-tuning chip testing jig of probe socket receptacle |
Publications (1)
Publication Number | Publication Date |
---|---|
CN208477052U true CN208477052U (en) | 2019-02-05 |
Family
ID=65210475
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201821105845.7U Expired - Fee Related CN208477052U (en) | 2018-07-12 | 2018-07-12 | The fine-tuning chip testing jig of probe socket receptacle |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN208477052U (en) |
-
2018
- 2018-07-12 CN CN201821105845.7U patent/CN208477052U/en not_active Expired - Fee Related
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190205 Termination date: 20210712 |
|
CF01 | Termination of patent right due to non-payment of annual fee |