CN208421012U - A kind of semiconductor alloy material novel test probe - Google Patents
A kind of semiconductor alloy material novel test probe Download PDFInfo
- Publication number
- CN208421012U CN208421012U CN201821103507.XU CN201821103507U CN208421012U CN 208421012 U CN208421012 U CN 208421012U CN 201821103507 U CN201821103507 U CN 201821103507U CN 208421012 U CN208421012 U CN 208421012U
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- China
- Prior art keywords
- faller gill
- pedestal
- probe
- alloy material
- semiconductor alloy
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- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
The utility model is intended to provide that a kind of positioning accuracy is high, the accurate semiconductor alloy material novel test probe of test.The utility model includes pedestal (2), combination probe (3) and thermocouple (5), the combination probe (3) includes the first faller gill (32) and the second faller gill (33), first faller gill (32) is parallel with the second faller gill (33), thermocouple (5) adaptation is arranged between first faller gill (32) and second faller gill (33), notch (22) are provided on the pedestal (2), first faller gill (32), second faller gill (33) and the thermocouple (5) are adapted to respectively to be placed in the notch (22), the front end of first faller gill (32) and the second faller gill (33) is respectively arranged with the probe portion (31) of inside bending, two probe portions (31) are in contact connection.The utility model is applied to the technical field of test semiconductor alloy material.
Description
Technical field
The utility model relates to a kind of semiconductor alloy material novel test probes.
Background technique
Probe, additional gas are used as frequently with pole or round end combination to the test of semiconductor alloy material in industry at present
Cylinder, the power sources such as motor realize predetermined action, to reach test purpose.But pole or the contacting volume of round end combination are big,
Can not accurate movement to some point of measured object, be not able to satisfy test request；Meanwhile thermocouple and probe separate, galvanic couple distance
Tested object distance is remote, gained test result inaccuracy.
Utility model content
The technical problem to be solved by the present invention is to provide positioning accuracy height, the accurate semiconductor alloy material of test are new
Type test probe.
The technical scheme adopted by the utility model is including pedestal, combination probe and thermocouple, the combination probe packet
The first faller gill and the second faller gill are included, first faller gill is parallel with second faller gill, and the thermocouple adaptation is arranged in institute
State between the first faller gill and second faller gill, be provided with notch on the pedestal, first faller gill, second faller gill and
The thermocouple is adapted to is placed in the notch respectively, and the front end of first faller gill and the second faller gill is respectively arranged with spy
Survey portion, two probe portions respectively inwards bending and pass through laser welding connect.
Further, the contact area of the probe portion is 1.6mm × 1mm.
Further, the lower end of the pedestal is provided with crystal bar mounting head, and the front end of the crystal bar mounting head is provided with recessed
Slot.
Further, the bottom of the pedestal is provided with plush copper, and the plush copper is adapted with the groove.
Further, top cover compatible with the pedestal is provided at the top of the pedestal.
The utility model has the following beneficial effects: in the present invention, the first faller gill and the probe portion on the second faller gill
Contact area size is 1.6mm × 1mm, and when contacting with measured object, contact area is small, so that the precision of positioning is improved, it is full
Foot is tested the test of each point；Meanwhile thermocouple is placed between the first faller gill and the second faller gill, so that thermocouple is in test
Close to measured object, obtained test result is more acurrate.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the utility model.
Specific embodiment
As shown in Figure 1, specific embodiment of the present utility model is: the utility model includes pedestal 2,3 and of combination probe
Thermocouple 5, the combination probe 3 include the first faller gill 32 and the second faller gill 33, first faller gill 32 and second faller gill
33 is parallel, and the adaptation of thermocouple 5 is arranged between first faller gill 32 and second faller gill 33, on the pedestal 2
It is provided with notch 22, the combination probe 3 and the thermocouple 5 are adapted to respectively to be placed in the notch 22, first needle
The front end of piece 32 and the second faller gill 33 is respectively arranged with probe portion 31, the bending and by swashing respectively inwards of two probe portions 31
Photocoagulation links together.In the present embodiment, the contact area of probe portion 31 is 1.6mm × 1mm, and contact area is small, is guaranteed
Be accurately positioned, thermocouple 5 is arranged between the first faller gill 32 and the second faller gill 33, when test thermocouple 5 apart from measured object 4mm,
Measuring distance is small, and the test result obtained from is more acurrate.
In this embodiment, the lower end of the pedestal 2 is provided with crystal bar mounting head, the front end of the crystal bar mounting head
It is arranged fluted, the bottom of the pedestal 2 is provided with plush copper 21, and the plush copper 21 is adapted with the groove, the pedestal 2
Top is provided with top cover 4 compatible with the pedestal 2.In the present embodiment, pedestal 2 and top cover 4 distinguish two sets of establishing, are used for
It tests seebeck coefficient and avoids affecting parameters to meet cold and hot measurement demand.
The utility model is applied to the technical field of test semiconductor alloy material.
Claims (5)
1. a kind of semiconductor alloy material novel test probe, it is characterised in that: it includes pedestal (2), combination probe (3) and heat
Galvanic couple (5), the combination probe (3) include the first faller gill (32) and the second faller gill (33), first faller gill (32) with it is described
Second faller gill (33) is parallel, and thermocouple (5) adaptation is arranged in first faller gill (32) and second faller gill (33)
Between, it is provided with notch (22) on the pedestal (2), first faller gill (32), second faller gill (33) and the thermoelectricity
Even (5) adaptation is placed in the notch (22) respectively, and the front end of first faller gill (32) and the second faller gill (33) is set respectively
It is equipped with the probe portion (31) of inside bending, two probe portions (31) are in contact connection.
2. a kind of semiconductor alloy material novel test probe according to claim 1, it is characterised in that: the probe portion
(31) contact area is 1.6mm × 1mm.
3. a kind of semiconductor alloy material novel test probe according to claim 1, it is characterised in that: the pedestal
(2) lower end is provided with crystal bar mounting head, and the front end setting of the crystal bar mounting head is fluted.
4. a kind of semiconductor alloy material novel test probe according to claim 3, it is characterised in that: the pedestal
(2) bottom is provided with plush copper (21), and the plush copper (21) is adapted with the groove.
5. a kind of semiconductor alloy material novel test probe according to claim 4, it is characterised in that: the pedestal
(2) the compatible top cover (4) with the pedestal (2) is provided at the top of.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821103507.XU CN208421012U (en) | 2018-07-12 | 2018-07-12 | A kind of semiconductor alloy material novel test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821103507.XU CN208421012U (en) | 2018-07-12 | 2018-07-12 | A kind of semiconductor alloy material novel test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208421012U true CN208421012U (en) | 2019-01-22 |
Family
ID=65126633
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821103507.XU Active CN208421012U (en) | 2018-07-12 | 2018-07-12 | A kind of semiconductor alloy material novel test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208421012U (en) |
-
2018
- 2018-07-12 CN CN201821103507.XU patent/CN208421012U/en active Active
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