CN208373738U - A kind of dust-extraction unit for high-flux sequence chip - Google Patents
A kind of dust-extraction unit for high-flux sequence chip Download PDFInfo
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- CN208373738U CN208373738U CN201820417596.9U CN201820417596U CN208373738U CN 208373738 U CN208373738 U CN 208373738U CN 201820417596 U CN201820417596 U CN 201820417596U CN 208373738 U CN208373738 U CN 208373738U
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- extraction unit
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- flux sequence
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Abstract
The utility model discloses a kind of dust-extraction units for high-flux sequence chip, and equipped with the dedusting chamber for accommodating sequence testing chip, the lower end of dedusting chamber is negative pole end, and upper end is positive terminal, the intracavitary formation electrostatic field of dedusting.Due to being equipped with the dedusting chamber of static electrification field, sequence testing chip is placed in that dedusting is intracavitary, on the dust on sequence testing chip and air and anion junction belt after negative electricity, tends to positive terminal deposition, to which the dust on sequence testing chip will be adsorbed to positive terminal, the cleaning to sequence testing chip is realized.This dust-extraction unit is contactless dedusting, avoids scuffing sequence testing chip, and dust removing effects are more preferable by electrostatic precipitation, more efficient.
Description
Technical field
The utility model relates to chip dust control technology fields, and in particular to a kind of dedusting dress for high-flux sequence chip
It sets.
Background technique
In use, the dust in air can more or less be adhered to high-flux sequence chip to high-flux sequence chip
On, it influences that precision is sequenced.
In the prior art, mainly chip surface is cleaned by clear water wiping or compressed air purging, but clear water
Wiping and compressed air purging may scratch chip surface, and, low efficiency longer to cleaning time.
Summary of the invention
The application, which provides, a kind of lossless injures the high dust-extraction unit for high-flux sequence chip of cleaning efficiency.
A kind of dust-extraction unit for high-flux sequence chip is provided in a kind of embodiment, equipped with for accommodating sequence testing chip
Dedusting chamber, the lower end of dedusting chamber is negative pole end, and upper end is positive terminal, the intracavitary formation electrostatic field of dedusting.
Further, positive plate, negative plate and power supply, positive plate are supported on the top of negative plate by insulated column, anode
Plate and negative plate are connected to power supply by power supply line respectively, and positive plate, negative plate and insulated column enclose dedusting chamber.
Further, insulated column is height-adjustable telescopic rod.
Further, insulated column includes upper boom and lower beam, and upper boom and lower beam are by the adjustable connection of screw thread, and upper boom is under
At least one of bar and positive plate or the rotatable connection of negative plate.
Further, insulated column has four, is distributed on four angles between positive plate and negative plate.
Further, positive plate and negative plate are copper metal plate.
Further, positive plate and negative plate are square plate of the same size, and the area of positive plate and negative plate is big
In the area of sequence testing chip.
Further, power supply is the adjustable DC power supply of 24-64V.
In other embodiments, power supply is the DC power supply of 36V.
Further, dust-extraction unit further includes insulating support, and negative plate is placed on insulating support.
According to the dust-extraction unit for high-flux sequence chip of above-described embodiment, due to being equipped with the dedusting of static electrification field
Chamber, sequence testing chip are placed in that dedusting is intracavitary, on the dust on sequence testing chip and air and anion junction belt after negative electricity, tend to
Positive terminal deposition realizes the cleaning to sequence testing chip so that the dust on sequence testing chip will be adsorbed to positive terminal.This dedusting dress
It sets through electrostatic precipitation, is contactless dedusting, avoids scuffing sequence testing chip, and dust removing effects are more preferable, it is more efficient.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of dust-extraction unit in embodiment；
Fig. 2 is a kind of another structural schematic diagram of dust-extraction unit in embodiment.
Specific embodiment
Below by specific embodiment combination attached drawing, invention is further described in detail.
A kind of dust-extraction unit for high-flux sequence chip is present embodiments provided, this dust-extraction unit is mainly used for height
Flux sequence testing chip carries out contactless electrostatic precipitation, such as the sequencing core to BGISEQ500, Hiseq4000, NovaSeq
Piece surface dust, this dust-extraction unit are also dusted other sequence testing chips or other products, guarantee the cleaning of product surface.
As shown in Figure 1, the dust-extraction unit for high-flux sequence chip of the present embodiment mainly includes positive plate 1, cathode
Plate 2 and power supply 3, positive plate 1 and negative plate 2 are copper metal plate, and the two is square plate in the same size, and positive plate 1 passes through insulation
Column 4 is mounted on the top of negative plate 2, and there are four insulated column tools, is distributed on four angles between positive plate 1 and negative plate 2.Just
Pole plate 1, negative plate 2 and four insulated columns 4 enclose a dedusting chamber, and the area of positive plate 1 and negative plate 2 is greater than sequence testing chip
7 area, so that sequence testing chip 7 is whole can be placed in the intracavitary dedusting of dedusting, i.e. sequence testing chip 7 can be integrally located on negative plate 2.
Positive plate 1 and negative plate 2 are connect by power supply line 5 with the positive and negative anodes of power supply 3 respectively so that positive plate 1 for band just
The positive terminal of electricity, negative plate 2 are electronegative negative pole end, and electrostatic field, i.e. dedusting chamber are formed between positive plate 1 and negative plate 2
Interior static electrification field.
In the present embodiment, insulated column 4 is height-adjustable telescopic rod, specifically, insulated column 4 includes upper boom 41 and lower beam
42, upper boom 41 and lower beam 42 are respectively equipped with the internal and external threads of adaptation, and the two is connected through a screw thread, and in order to realize that height is adjusted
It saves, at least one in upper boom 41 and lower beam 42 is connect with positive plate 1 or negative plate 2.In the present embodiment, it is preferred that upper boom 41
Upper end is rotatably connected by shaft with positive plate 1, and the lower end of lower beam 42 is rotatably connected by shaft with negative plate 2, thus
Upper boom 41 and lower beam 42 are movable part, convenient for the adjusting of height between positive plate 1 and negative plate 2.Positive plate 1 and negative plate 2
Between height-adjustable setting, it can be achieved that different working efficiency and applicable different height sequence testing chip 7, have wider
Use scope.
In other embodiments, insulated column 4 can also be the telescopic rod of other structures, such as set between upper boom 41 and lower beam 42
There are multiple clamping gears, to form different clamping height；Or insulated column is replaced using with the intersection crane centainly damped
4, realize the adjusting of height between positive plate 1 and negative plate 2.
Insulated column 4 is plastic material in the present embodiment, in other embodiments, can also have the gold of insulated terminal for both ends
Belong to bar.
In the present embodiment, power supply 3 is the adjustable DC power supply of 24-64V, is adjusted to 36V or so in use
Voltage it is the most suitable so that the direct current of positive plate 1 and negative plate 2 with 36V or so.In other embodiments, it also can be selected
For 36V DC power supply as power supply 3.
As shown in Fig. 2, dust-extraction unit further includes insulating support 6 in the present embodiment, insulating support 6 is plastic material or wood
Matter structure, negative plate 2 can be fixedly mounted or are placed on insulating support 6, and insulating support 6 is used to support negative plate 2, avoid cathode
Plate 2 is placed on electric conductor.
Dust-extraction unit provided in this embodiment for high-flux sequence chip, due to being equipped with the dedusting chamber of static electrification field,
Sequence testing chip 7 is placed in that dedusting is intracavitary, on dust on sequence testing chip 7 and in air and anion junction belt after negative electricity, tends to
Positive terminal deposition is realized so that the dust on sequence testing chip 7 will be adsorbed on the positive plate 1 of positive terminal to sequence testing chip 7
Cleaning.This dust-extraction unit is contactless dedusting, avoids scuffing sequence testing chip, and dust removing effects are more by electrostatic precipitation
It is good, it is more efficient.
Use above specific case is illustrated the present invention, is merely used to help understand the present invention, not to limit
The system present invention.For those skilled in the art, according to the thought of the present invention, can also make several simple
It deduces, deform or replaces.
Claims (9)
1. a kind of dust-extraction unit for high-flux sequence chip, which is characterized in that including positive plate, negative plate and power supply, institute
The top that positive plate is supported on the negative plate by insulated column is stated, the positive plate and negative plate pass through power supply line and institute respectively
Power supply connection is stated, the positive plate, negative plate and insulated column enclose the dedusting chamber for accommodating sequence testing chip.
2. being used for the dust-extraction unit of high-flux sequence chip as described in claim 1, which is characterized in that the insulated column is can
Adjust the telescopic rod of height.
3. being used for the dust-extraction unit of high-flux sequence chip as claimed in claim 2, which is characterized in that the insulated column includes
Upper boom and lower beam, the upper boom and lower beam by the adjustable connection of screw thread, at least one of the upper boom and lower beam with just
Pole plate or the rotatable connection of negative plate.
4. being used for the dust-extraction unit of high-flux sequence chip as claimed in claim 3, which is characterized in that insulated column has four
Root is distributed on four angles between the positive plate and negative plate.
5. being used for the dust-extraction unit of high-flux sequence chip as described in claim 1, which is characterized in that the positive plate and negative
Pole plate is copper metal plate.
6. being used for the dust-extraction unit of high-flux sequence chip as claimed in claim 5, which is characterized in that the positive plate and negative
Pole plate is square plate of the same size, and the area of the positive plate and negative plate is greater than the area of sequence testing chip.
7. being used for the dust-extraction unit of high-flux sequence chip as described in claim 1, which is characterized in that the power supply is 24-
The adjustable DC power supply of 64V.
8. being used for the dust-extraction unit of high-flux sequence chip as described in claim 1, which is characterized in that the power supply is 36V
DC power supply.
9. such as the dust-extraction unit described in any item of the claim 1 to 8 for high-flux sequence chip, which is characterized in that also
Including insulating support, the negative plate is placed on the insulating support.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820417596.9U CN208373738U (en) | 2018-03-26 | 2018-03-26 | A kind of dust-extraction unit for high-flux sequence chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820417596.9U CN208373738U (en) | 2018-03-26 | 2018-03-26 | A kind of dust-extraction unit for high-flux sequence chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208373738U true CN208373738U (en) | 2019-01-15 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820417596.9U Active CN208373738U (en) | 2018-03-26 | 2018-03-26 | A kind of dust-extraction unit for high-flux sequence chip |
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| CN (1) | CN208373738U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110907900A (en) * | 2019-11-29 | 2020-03-24 | 安徽天兵电子科技股份有限公司 | Self-cleaning radar device |
-
2018
- 2018-03-26 CN CN201820417596.9U patent/CN208373738U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110907900A (en) * | 2019-11-29 | 2020-03-24 | 安徽天兵电子科技股份有限公司 | Self-cleaning radar device |
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