CN208337511U - Silicon wafer battery fragment detection device - Google Patents
Silicon wafer battery fragment detection device Download PDFInfo
- Publication number
- CN208337511U CN208337511U CN201820474777.5U CN201820474777U CN208337511U CN 208337511 U CN208337511 U CN 208337511U CN 201820474777 U CN201820474777 U CN 201820474777U CN 208337511 U CN208337511 U CN 208337511U
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- China
- Prior art keywords
- silicon wafer
- wafer battery
- battery fragment
- camera
- detection device
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The utility model discloses a kind of silicon wafer battery fragment detection device, including pedestal, installation is equipped with column on the pedestal, and the lower part installation of the column is equipped with light source mounting base, and the light source mounting base is equipped with the light source for irradiating tested silicon wafer battery fragment;The top of the column is equipped with the camera for taking pictures to the detected silicon wafer battery fragment.The silicon wafer battery fragment detection device of the utility model, camera and light source mounting base is respectively set by the two sides up and down in column, light source mounting base irradiates tested silicon wafer battery fragment bottom, in order to camera imaging, the defects of tested silicon wafer battery fragment fragment can be accurately detected according to camera imaging, have the advantages that structure is simple and practicability is good, silicon wafer battery fragment can accurately be detected, improves the quality of silicon wafer battery fragment.
Description
Technical field
The utility model belongs to using optical instrument the technical field tested with analysis of material, is specifically a kind of silicon wafer
Battery fragment detection device.
Background technique
Solar battery is also known as " solar chip " or " photocell ", is a kind of photoelectricity using the sunlight direct generation of electricity
Wafer.As long as the illumination that it is satisfied certain illumination conditions is arrived, moment output voltage and can have the case where circuit
Lower generation electric current.With the continuous development of solar battery industry, interior industry competition is also constantly aggravating, large-sized solar battery enterprise
M&A integration and capital operation are increased between industry, and domestic outstanding manufacture of solar cells enterprise more and more payes attention to industry city
The research of field, the especially further investigation to industrial development environment and buyers.Just because of this, large quantities of country are outstanding
Solar battery brand emerge rapidly, the outstanding figure being increasingly becoming in solar battery industry.
The application of solar battery enters industry, business, agricultural, communication, household electrical appliance from military field, space industry
And the departments such as public utility, it is particularly possible to dispersedly use in outlying district, high mountain, desert, island and rural area, be made with saving
The expensive transmission line of electricity of valence.Especially crystal silicon solar cell sheet, equipment cost is relatively low, and photoelectric conversion efficiency is also high,
It generates electricity under outdoor solar light and is relatively suitable for.But silicon wafer battery can generate various fragments of different shapes in process of production, this
It just needs to detect its quality, the technique of artificial detection silicon wafer battery fragment has detection efficiency low at present, omission factor
It is higher, have the defects that very big hidden danger of quality.
Summary of the invention
In view of this, in view of the problems of the existing technology, the purpose of this utility model is to provide a kind of silicon wafer batteries
Fragment detection device.
In order to achieve the above objectives, the utility model provides the following technical solutions:
A kind of silicon wafer battery fragment detection device, including pedestal, installation is equipped with column on the pedestal, under the column
Portion's installation is equipped with light source mounting base, and the light source mounting base is equipped with the light source for irradiating tested silicon wafer battery fragment;It is described
The top of column is equipped with the camera for taking pictures to the detected silicon wafer battery fragment.
Further, the light source uses panel light.
Further, the column is equipped with the camera installation and adjustment mechanism for adjusting the camera position.
Further, camera installation and adjustment mechanism include the upright slide rail being arranged on the column and with it is described vertical
The camera mounting base that sliding rail is slidably matched, the camera mounting base are equipped with the levelling lever vertical with the upright slide rail,
It is fixedly mounted on the camera and is equipped with camera adjustment block, the camera adjustment block rotatable engagement is mounted on the levelling lever
On.
Further, the top of the light source mounting base is equipped with the transport platform for conveying the tested silicon wafer battery fragment.
Further, further include for detect the tested silicon wafer battery fragment whether testing agency in place.
Further, the testing agency includes the sensor installation seat I being arranged in above the tested silicon wafer battery fragment
With the sensor installation seat II being arranged in below the tested silicon wafer battery fragment, installs on the sensor installation seat I and be equipped with
Signal projector, installation is equipped with signal receiver on the sensor installation seat II;Or it installs and sets on the sensor installation seat I
There is signal receiver, installation is equipped with signal projector on the sensor installation seat II.
Further, the side wall of the column is equipped with the second sliding rail, and the sensor installation seat I is slidably installed in institute
It states on the second sliding rail, and the sensor installation seat I is equipped with and is located above the light source mounting base and for installing the letter
Number transmitter or signal receiver are horizontally mounted adjusting rod.
The utility model has the beneficial effects that:
The silicon wafer battery fragment detection device of the utility model, is respectively set camera and light by the two sides up and down in column
Source mounting base, light source mounting base irradiate tested silicon wafer battery fragment bottom, can be quasi- according to camera imaging in order to camera imaging
It really detects the defects of tested silicon wafer battery fragment fragment, has the advantages that structure is simple and practicability is good, it can be to silicon wafer
Battery fragment is accurately detected, and the quality of silicon wafer battery fragment is improved.
By the way that testing agency is arranged, when tested silicon wafer battery fragment is transported to above light source, signal projector is sent
Optical signal by tested silicon wafer battery tile occlusion, the transmission of signal between signal projector and signal receiver is interrupted;Phase
Machine can be shot according to the detection signal.
Detailed description of the invention
In order to keep the purpose of this utility model, technical scheme and beneficial effects clearer, the utility model provides as follows
Attached drawing is illustrated:
Fig. 1 is the structural schematic diagram of the utility model silicon wafer battery fragment detection device embodiment;
Fig. 2 is the left view of Fig. 1.
Description of symbols: 1- pedestal;2- light source;2a- light source mounting base;3- sensor installation seat I;3a- is horizontally mounted
Adjusting rod;4- column;4a- upright slide rail;The second sliding rail of 4b-;5- camera;6- camera mounting base;6a- levelling lever;7- phase
Machine adjustment block;8- sensor installation seat II;9- transport platform;10- transducer receivers.
Specific embodiment
The utility model is described in further detail in the following with reference to the drawings and specific embodiments, so that those skilled in the art
The utility model can be better understood and can be practiced, but illustrated embodiment is not as the restriction to the utility model.
As shown in Figure 1, being the structural schematic diagram of the utility model silicon wafer battery fragment detection device embodiment.The present embodiment
Silicon wafer battery fragment detection device, including pedestal 1, installation is equipped with column 4 on pedestal 1, and the lower part installation of column 4 is equipped with light source
Mounting base 2a, light source mounting base 2a are equipped with the light source 2 for irradiating tested silicon wafer battery fragment;The top of column 4, which is equipped with, to be used
In the camera 5 taken pictures to detected silicon wafer battery fragment.The camera 5 of the present embodiment uses industrial camera, the display of industrial camera
Image is black white image, and camera lens interface is C mouthfuls, resolution ratio 656*494.The interface of camera lens is C mouthfuls, focal length 16mm.
The light source 2 of the present embodiment uses panel light, is red backlight source, because camera chip is relatively high to red sensitivity, use is red
Color backlight can make camera shoot clearer image.The top of the light source mounting base 2a of the present embodiment is equipped with for conveying
The transport platform 9 of tested silicon wafer battery fragment.
Further, the column 4 of the present embodiment is equipped with the camera installation and adjustment mechanism for adjusting 5 position of camera.This reality
The camera installation and adjustment mechanism for applying example includes the upright slide rail 4a being arranged on column 4 and the phase being slidably matched with upright slide rail 4a
Machine mounting base 6, camera mounting base 6 are equipped with the levelling lever 6a vertical with upright slide rail 4a, Heibei provincial opera pole 6a and transport platform 9
Conveying direction it is vertical, be fixedly mounted on camera 5 and be equipped with camera adjustment block 7,7 rotatable engagement of camera adjustment block is mounted on horizontal tune
On pole 6a.In this way, camera 5 can adjust the position of vertical direction along upright slide rail 4a, it can also be along levelling lever 6a
The position of horizontal direction is adjusted, while can also rotate and adjust around levelling lever 6a.The distance of camera 5 to transport platform 9 is
840-860mm, the present embodiment 850mm.The distance of camera distance column axis is 105-115mm, the present embodiment 110mm.
Further, the silicon wafer battery fragment detection device of the present embodiment further includes being for detecting tested silicon wafer battery fragment
No testing agency in place.The testing agency of the present embodiment includes the sensor installation being arranged in above tested silicon wafer battery fragment
Seat I 3 and the sensor installation seat II 8 being arranged in below tested silicon wafer battery fragment, installation is equipped with letter on sensor installation seat I 3
Number transmitter, installation is equipped with signal receiver on sensor installation seat II;Or installation connects equipped with signal on sensor installation seat I 3
Device 10 is received, installation is equipped with signal projector on sensor installation seat II 8.The signal receiver 10 of the present embodiment is mounted on sensor
Mounting base I 3, signal projector are mounted on sensor installation seat II 8.Specifically, the side wall of column 4 is equipped with the second sliding rail
4b, sensor installation seat I 3 are slidably installed on the second sliding rail 4b, and sensor installation seat I 3 is equipped with and is located at light source peace
It is horizontally mounted adjusting rod 3a above dress seat 2a and for install signal projector or signal receiver, in this way, can be along the
Two sliding rail 4b adjust the position of sensor installation seat I 3 in the vertical direction, while can also adjust sensor installation seat I 3 in water
Installation site on safety adjustment pole 3a.The distance of axis of the transmitter 11 of the present embodiment apart from column 4 is 130-
140mm, the present embodiment 135mm, receiver are mounted on light source mounting base in the middle part of the side of transmitter 11.
By the way that testing agency is arranged, when tested silicon wafer battery fragment is transported to above light source, signal projector is sent
Optical signal by tested silicon wafer battery tile occlusion, the transmission of signal between signal projector and signal receiver is interrupted;Phase
Machine can be shot according to the detection signal.
The silicon wafer battery fragment detection device of the present embodiment, is respectively set camera and light source by the two sides up and down in column
Mounting base, light source mounting base irradiates tested silicon wafer battery fragment bottom can be accurate according to camera imaging in order to camera imaging
It detects the defects of tested silicon wafer battery fragment fragment, has the advantages that structure is simple and practicability is good, it can be to silicon wafer electricity
Pond fragment is accurately detected, and the quality of silicon wafer battery fragment is improved.
Embodiment described above is only preferred embodiments for fully illustrating the utility model, the utility model
Protection scope it is without being limited thereto.Those skilled in the art made equivalent substitute or change on the basis of the utility model
It changes, both is within the protection scope of the present invention.The protection scope of the utility model is subject to claims.
Claims (8)
1. a kind of silicon wafer battery fragment detection device, it is characterised in that: including pedestal (1), installation is equipped with vertical on the pedestal (1)
The lower part installation of column (4), the column (4) is equipped with light source mounting base (2a), and the light source mounting base (2a) is equipped with for shining
Penetrate the light source (2) of tested silicon wafer battery fragment;The top of the column (4) is equipped with for the detected silicon wafer battery fragment
The camera (5) taken pictures.
2. silicon wafer battery fragment detection device according to claim 1, it is characterised in that: the light source (2) uses panel
Lamp.
3. silicon wafer battery fragment detection device according to claim 1, it is characterised in that: the column (4), which is equipped with, to be used
In the camera installation and adjustment mechanism for adjusting camera (5) position.
4. silicon wafer battery fragment detection device according to claim 3, it is characterised in that: camera installation and adjustment mechanism
Including the upright slide rail (4a) being arranged on the column (4) and the camera mounting base being slidably matched with the upright slide rail (4a)
(6), the camera mounting base (6) is equipped with the levelling lever (6a) vertical with the upright slide rail (4a), the camera (5)
Upper be fixedly mounted is equipped with camera adjustment block (7), and camera adjustment block (7) rotatable engagement is mounted on the levelling lever (6a)
On.
5. silicon wafer battery fragment detection device according to claim 1, it is characterised in that: the light source mounting base (2a)
Top is equipped with the transport platform (9) for conveying the tested silicon wafer battery fragment.
6. silicon wafer battery fragment detection device according to claim 1-5, it is characterised in that: further include for examining
Survey the tested silicon wafer battery fragment whether testing agency in place.
7. silicon wafer battery fragment detection device according to claim 6, it is characterised in that: the testing agency includes setting
Sensor installation seat I (3) and setting above the tested silicon wafer battery fragment is below the tested silicon wafer battery fragment
Sensor installation seat II (8), installation is equipped with signal projector, the sensor installation seat on the sensor installation seat I (3)
Installation is equipped with signal receiver on II;Or installation is equipped with signal receiver (10) on the sensor installation seat I (3), the biography
Installation is equipped with signal projector in sensor mounting base II (8).
8. silicon wafer battery fragment detection device according to claim 7, it is characterised in that: on the side wall of the column (4)
Equipped with the second sliding rail (4b), the sensor installation seat I (3) is slidably installed on second sliding rail (4b), and described
Sensor installation seat I (3), which is equipped with, to be located above the light source mounting base (2a) and for installing the signal projector or letter
Number receiver is horizontally mounted adjusting rod (3a).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201820474777.5U CN208337511U (en) | 2018-04-04 | 2018-04-04 | Silicon wafer battery fragment detection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201820474777.5U CN208337511U (en) | 2018-04-04 | 2018-04-04 | Silicon wafer battery fragment detection device |
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CN208337511U true CN208337511U (en) | 2019-01-04 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111431481A (en) * | 2020-03-04 | 2020-07-17 | 上海空间电源研究所 | Solar cell circuit space debris simulation and online test system |
-
2018
- 2018-04-04 CN CN201820474777.5U patent/CN208337511U/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111431481A (en) * | 2020-03-04 | 2020-07-17 | 上海空间电源研究所 | Solar cell circuit space debris simulation and online test system |
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