CN208326615U - A kind of semiconducter device testing feed device - Google Patents
A kind of semiconducter device testing feed device Download PDFInfo
- Publication number
- CN208326615U CN208326615U CN201820968095.XU CN201820968095U CN208326615U CN 208326615 U CN208326615 U CN 208326615U CN 201820968095 U CN201820968095 U CN 201820968095U CN 208326615 U CN208326615 U CN 208326615U
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- China
- Prior art keywords
- feeding
- case body
- fixed
- machine case
- mounting base
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a kind of semiconducter device testing feed devices, including machine case body and chamber door, the chamber door is provided with before the machine case body, the machine case body inner bottom surface is fixedly installed with ejection cylinder, the machine case body inside top surface is fixed with top plate, limit hole is offered at the top plate end face center, sliding slot is offered in the top plate, and the machine case body exterior top surface is provided with feeding material component；The feeding material component includes feeding cylinder and feeding push rod, and the feeding cylinder end is provided with the feeding push rod, and feeding push rod end is fixed with mounting base.Beneficial effect is: the utility model drives the traversing carry out feeding of workbench by feeding cylinder, and it is caught under the elastic force of pressure spring by locating piece and self-locking after limit hole reaches accurate feeding position, it avoids the randomness in artificial reaction time and the influence to feeding position accuracy, has adapted to the use needs of mass detection semiconductor devices.
Description
Technical field
The utility model relates to semiconductor production equipment fields, and in particular to a kind of semiconducter device testing feed device.
Background technique
Semiconductor devices is electric conductivity between good conductor of electricity and insulator, using semiconductor material specific electrical properties come
The electronic device for completing specific function can be used to generate, control, receive, convert, amplified signal and carrying out energy conversion.Partly lead
The semiconductor material of body device is silicon, germanium or GaAs, can be used as rectifier, oscillator, photophore, amplifier, Photometer etc.
Equipment, semiconductor devices need to carry out it continuity test usually during production to verify the qualification of product, test
It is usually needed in the process using to feeding material component.
Applicants have discovered that at least there is following technical problem in the prior art: test process needs artificial participation control to send
Stroke is expected, but due to the randomness of manual operation the reaction time, to can not accurately will in the case where mass detection
Product is sent to accurate location.
Utility model content
The purpose of this utility model is that solve the above-mentioned problems and provides a kind of semiconducter device testing feeding dress
It sets, it, can not be quasi- in the case where mass detection to solve in the prior art due to the randomness of manual operation the reaction time
True send product to technical problems such as accurate locations.Preferred technical solution in many technical solutions provided by the utility model
It includes and the traversing carry out feeding of workbench is driven by feeding cylinder, and limit hole is caught under the elastic force of pressure spring by locating piece
It is self-locking afterwards to reach accurate feeding position, avoid the randomness in artificial reaction time and the influence to feeding position accuracy
Etc. technical effects, elaboration as detailed below.
To achieve the above object, the utility model provides following technical scheme:
A kind of semiconducter device testing feed device provided by the utility model, including machine case body and chamber door, the machine
The chamber door is provided with before case ontology, the machine case body inner bottom surface is fixedly installed with ejection cylinder, the machine case body
Inside top surface is fixed with top plate, and limit hole is offered at the top plate end face center, and sliding slot, the machine are offered in the top plate
Case body exterior top surface is provided with feeding material component；
The feeding material component includes feeding cylinder and feeding push rod, and the feeding cylinder end is provided with the feeding and pushes away
Bar, feeding push rod end are fixed with mounting base, and the mounting base side is provided with workbench, and the mounting base bottom surface is fixed
There is sliding block, dashpot is offered in the mounting base, is provided with locating piece below the dashpot, the locating piece top is fixed
There is connecting rod, outside is provided with ring set in the middle part of the connecting rod, and the ring set top surface is fixed with pressure spring.
Using a kind of above-mentioned semiconducter device testing feed device, when in use, semiconductor devices is placed and the work
Make on platform, operates the feeding cylinder work afterwards and drive the mounting base traversing by the air-leg, the mounting base is logical
Cross that the sliding block of bottom surface is traversing in the sliding slot to drive the workbench Forward to carry out feeding, in initial position, institute
It states locating piece and the top surface that the pressure spring is in the top plate is compressed by the ring set, the mounting base is in the process of moving
It will drive the locating piece to slide in the top surface of the top plate, when the locating piece slides into the surface of the limit hole,
The compression travel that the pressure spring discharges itself drives the locating piece of the connecting rod bottom end to decline by the ring set, described fixed
It is traversing that position block stops the mounting base due to being snapped into the limit hole, at this time then just by half on the workbench
Conductor is sent to specified feeding position, after can carry out subsequent test job, when needing return, pass through the ejection cylinder drive
The locating piece, which rises, ejects the limit hole for the locating piece, controls the feeding cylinder afterwards and the mounting base is driven to be back to
Initial position can carry out next feeding operation.
Preferably, the chamber door is fixed with the machine case body by hinge, the class of insulation of the ejection cylinder is F
Grade.
Preferably, the sliding slot is dovetail groove, lubricating grease, the class of insulation of the feeding cylinder are coated in the sliding slot
It is consistent with the class of insulation of the ejection cylinder.
Preferably, the workbench is fixed with the mounting base by screw, the quantity of the sliding block and the sliding slot
Quantity match, the sliding block is slidably connected with the sliding slot.
Preferably, the cross sectional shape of the cross sectional shape of the dashpot and the ring set and the locating piece keeps one
It causes, the locating piece is threadably secured with the connecting rod.
Preferably, the ring set is solid annular structure, the ring set and the connecting rod transition fit.
Preferably, the compression travel of the pressure spring is not less than the groove depth of the dashpot, the pressure spring and the ring set
It is fixed by grab.
Beneficial effect is: the utility model drives the traversing carry out feeding of workbench by feeding cylinder, and passes through positioning
Block be caught under the elastic force of pressure spring it is self-locking after limit hole reach accurate feeding position, avoid the random of artificial reaction time
Property and the influence to feeding position accuracy, adapted to mass detection semiconductor devices use needs.
Detailed description of the invention
In order to illustrate the embodiment of the utility model or the technical proposal in the existing technology more clearly, below will be to embodiment
Or attached drawing needed to be used in the description of the prior art is briefly described, it should be apparent that, the accompanying drawings in the following description is only
It is some embodiments of the utility model, for those of ordinary skill in the art, in the premise not made the creative labor
Under, it is also possible to obtain other drawings based on these drawings.
Fig. 1 is that the utility model faces exterior view；
Fig. 2 is the elevational cross-sectional view of the utility model；
Fig. 3 is the left view cross-sectional view of the utility model.
The reference numerals are as follows:
1, machine case body；101, chamber door；102, top plate；103, limit hole；104, cylinder is ejected；105, sliding slot；2, feeding
Component；201, feeding cylinder；202, feeding push rod；203, connecting rod；204, mounting base；205, workbench；206, pressure spring；207, ring
Set；208, dashpot；209, locating piece；2010, sliding block.
Specific embodiment
To keep the purpose of this utility model, technical solution and advantage clearer, below by the technology to the utility model
Scheme is described in detail.Obviously, the described embodiments are only a part of the embodiments of the utility model, rather than all
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are not before making creative work
Obtained all other embodiment is put, the range that the utility model is protected is belonged to.
Shown in referring to figures 1-3, the utility model provides a kind of semiconducter device testing feed device, including cabinet sheet
Body 1 and chamber door 101 are provided with chamber door 101 before machine case body 1, and 1 inner bottom surface of machine case body is fixedly installed with ejection cylinder
104,1 inside top surface of machine case body is fixed with top plate 102, offers limit hole 103 at 102 end face center of top plate, in top plate 102
Sliding slot 105 is offered, 1 exterior top surface of machine case body is provided with feeding material component 2；
Feeding material component 2 includes feeding cylinder 201 and feeding push rod 202, and 201 end of feeding cylinder is provided with feeding push rod
202,202 end of feeding push rod is fixed with mounting base 204, and 204 side of mounting base is provided with workbench 205,204 bottom surface of mounting base
It is fixed with sliding block 2010, dashpot 208 is offered in mounting base 204, locating piece 209, locating piece are provided with below dashpot 208
209 tops are fixed with connecting rod 203, and 203 middle part outside of connecting rod is provided with ring set 207, and 207 top surface of ring set is fixed with pressure spring 206.
Preferably, chamber door 101 is fixed with machine case body 1 by hinge, so set, overhauling convenient for opening chamber door 101
Safeguard internal component, the class of insulation of ejection cylinder 104 is F grades, so set, convenient for the work for keeping ejection cylinder 104 stable
Make state.
Sliding slot 105 is dovetail groove, coats lubricating grease in sliding slot 105, so set, convenient for sliding block 2010 in sliding slot 105
Traversing, the class of insulation of feeding cylinder 201 and the class of insulation of ejection cylinder 104 are consistent, so set, convenient for keeping sending
Expect the stable working condition of cylinder 201.
Workbench 205 is fixed with mounting base 204 by screw, so set, replacement workbench 205 easy to disassemble, sliding block
2010 quantity and the quantity of sliding slot 105 match, and sliding block 2010 is slidably connected with sliding slot 105, so set, being convenient for sliding block
2010 slide in sliding slot 105.
The cross sectional shape of dashpot 208 and the cross sectional shape of ring set 207 and locating piece 209 are consistent, so set, just
It can be taken in dashpot 208 in locating piece 209, locating piece 209 is threadably secured with connecting rod 203.
Ring set 207 is solid annular structure, ring set 207 and 203 transition fit of connecting rod, so set, logical convenient for connecting rod 203
It crosses 207 compression press spring 206 of ring set and takes in locating piece 209 in dashpot 208.
The compression travel of pressure spring 206 is not less than the groove depth of dashpot 208, and pressure spring 206 is fixed with ring set 207 by grab,
So set, having enough compression travels will be in locating piece 209 completely income dashpot 208 convenient for pressure spring 206.
Using the above structure, when in use, semiconductor devices is placed on workbench 205, operates feeding cylinder 201 afterwards
Work drives mounting base 204 traversing by air-leg, and mounting base 204 is traversing in sliding slot 105 by the sliding block 2010 of bottom surface
Come drive workbench 205 Forward carry out feeding, in initial position, locating piece 209 by 207 compression press spring 206 of ring set at
In the top surface of top plate 102, mounting base 204 will drive locating piece 209 in the process of moving and slide in the top surface of top plate 102, when
When locating piece 209 slides into the surface of limit hole 103, the compression travel that pressure spring 206 discharges itself is driven by ring set 207 to be connected
The locating piece 209 of 203 bottom end of bar declines, and it is traversing that locating piece 209 due to being snapped into limit hole 103 stops mounting base 204,
Then the semiconductor on workbench 205 is sent to specified feeding position just at this time, after can carry out subsequent test job, need
When return, drives locating piece 209 to rise by ejection cylinder 104 and locating piece 209 is ejected into limit hole 103, it is rear to control feeding gas
Cylinder 201, which drives mounting base 204 to be back to initial position, can carry out next feeding operation.
Above description is only a specific implementation of the present invention, but the protection scope of the utility model is not limited to
In this, anyone skilled in the art within the technical scope disclosed by the utility model, can readily occur in variation
Or replacement, it should be covered within the scope of the utility model.Therefore, the protection scope of the utility model should be with the power
Subject to the protection scope that benefit requires.
Claims (7)
1. a kind of semiconducter device testing feed device, including machine case body (1) and chamber door (101), it is characterised in that: the machine
It is provided with the chamber door (101) before case ontology (1), machine case body (1) inner bottom surface is fixedly installed with ejection cylinder
(104), machine case body (1) inside top surface is fixed with top plate (102), is opened up at top plate (102) end face center limited
Position hole (103), the top plate (102) is interior to be offered sliding slot (105), and machine case body (1) exterior top surface is provided with feeding group
Part (2)；
The feeding material component (2) includes feeding cylinder (201) and feeding push rod (202), feeding cylinder (201) the end setting
There is the feeding push rod (202), feeding push rod (202) end is fixed with mounting base (204), mounting base (204) side
Face is provided with workbench (205), and mounting base (204) bottom surface is fixed with sliding block (2010), is opened up in the mounting base (204)
Have dashpot (208), is provided with locating piece (209) below the dashpot (208), locating piece (209) top is fixed with
Connecting rod (203), connecting rod (203) middle part outside are provided with ring set (207), and ring set (207) top surface is fixed with pressure spring
(206)。
2. a kind of semiconducter device testing feed device according to claim 1, it is characterised in that: the chamber door (101) with
The machine case body (1) is fixed by hinge, and the class of insulation of ejection cylinder (104) is F grades.
3. a kind of semiconducter device testing feed device according to claim 1, it is characterised in that: the sliding slot (105) is
Dovetail groove, the sliding slot (105) is interior to coat lubricating grease, the class of insulation of the feeding cylinder (201) and the ejection cylinder
(104) the class of insulation is consistent.
4. a kind of semiconducter device testing feed device according to claim 1, it is characterised in that: the workbench (205)
It is fixed with the mounting base (204) by screw, the quantity and the quantity phase of the sliding slot (105) of the sliding block (2010)
Match, the sliding block (2010) is slidably connected with the sliding slot (105).
5. a kind of semiconducter device testing feed device according to claim 1, it is characterised in that: the dashpot (208)
The cross sectional shape of cross sectional shape and the ring set (207) and the locating piece (209) be consistent, the locating piece (209)
It is threadably secured with the connecting rod (203).
6. a kind of semiconducter device testing feed device according to claim 1, it is characterised in that: the ring set (207) is
Solid annular structure, the ring set (207) and the connecting rod (203) transition fit.
7. a kind of semiconducter device testing feed device according to claim 1, it is characterised in that: the pressure spring (206)
Compression travel is not less than the groove depth of the dashpot (208), and the pressure spring (206) is fixed with the ring set (207) by grab.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820968095.XU CN208326615U (en) | 2018-06-22 | 2018-06-22 | A kind of semiconducter device testing feed device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820968095.XU CN208326615U (en) | 2018-06-22 | 2018-06-22 | A kind of semiconducter device testing feed device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208326615U true CN208326615U (en) | 2019-01-04 |
Family
ID=64768464
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820968095.XU Expired - Fee Related CN208326615U (en) | 2018-06-22 | 2018-06-22 | A kind of semiconducter device testing feed device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208326615U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112763835A (en) * | 2021-01-07 | 2021-05-07 | 广州高慧网络科技有限公司 | Transistor PN junction forward resistance detection device |
-
2018
- 2018-06-22 CN CN201820968095.XU patent/CN208326615U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112763835A (en) * | 2021-01-07 | 2021-05-07 | 广州高慧网络科技有限公司 | Transistor PN junction forward resistance detection device |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190104 Termination date: 20190622 |
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| CF01 | Termination of patent right due to non-payment of annual fee |