CN208313226U - A kind of high-precision control thin liquid film thickness formation device overcoming capillary phenomenon - Google Patents
A kind of high-precision control thin liquid film thickness formation device overcoming capillary phenomenon Download PDFInfo
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- CN208313226U CN208313226U CN201821060227.5U CN201821060227U CN208313226U CN 208313226 U CN208313226 U CN 208313226U CN 201821060227 U CN201821060227 U CN 201821060227U CN 208313226 U CN208313226 U CN 208313226U
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Abstract
The utility model relates to one kind, and the high-precision control thin liquid film thickness of capillary phenomenon can be overcome to form device, belong to atmospheric corrosion field.Device includes computer, portable microscope, iron stand, the electron helical mircrometer gauge with needle point, height-adjustable test chamber, specimen holder and sample.Electron helical mircrometer gauge with needle point is in the surface of specimen holder；Sample is assemblied in specimen holder；Sample is folded in height-adjustable sample container；Test chamber is placed on iron stand, and portable microscope is placed in the side of test chamber.The utility model joined portable microscope, which has the function of scale, it may be convenient to the length of test target distance.The device to test precision is high, operates convenient, the thin liquid film of offer required thickness that can be more accurate, can overcome capillary phenomenon and liberation of hydrogen in multimeter use process is avoided to influence.
Description
Technical field:
The utility model belongs to material atmospheric corrosion studying technological domain, can overcome capillary phenomenon more particularly to one kind,
The device of the precise measurement thin liquid film thickness of the defects of liberation of hydrogen process.
Background technique:
Metal atmospheric corrosion is the generally existing corrosion phenomenon of nature, and resulting loss accounts for about metal year loss amount
50% or more.The atmospheric corrosion failure procedure of metal or alloy material is substantially the electrochemical corrosion in thin liquid film environment
Journey.Such as it is exposed to the metal component in atmospheric environment, when atmospheric humidity is more than a certain critical value, can be formed in adsorption
One layer of thin liquid film, and the contaminant particles dissolution in atmosphere wherein just forms conducting electrolyte, and then accelerates corrosion of metal process.
It is worth noting that condensation or liquid film forming can be significantly reduced when metal surface is deposited with dust granule or other pollutants
Critical humidity.Furthermore the thickness of liquid film of metal component surface can produce bigger effect dissolved oxygen content in liquid film, and then influence
Corrosion of metal process.When metal component surface liquid film is relatively thin, oxygen is easy to reach saturation state in liquid film, golden at this time
The process of depolarization of oxygen mainly occurs for metal surface；But when metal component surface liquid film is thicker, oxygen diffusion process is hindered
Hinder, the metal ion diffusion that anodic solution generates at this time is very fast, therefore anode reaction rate increases.Therefore thin liquid film is accurately controlled
Thickness is of great significance to Atmospheric Corrosion process.
Currently in order to study the inefficacy mechanism of metal material, research method is also gradually from outdoor exposure test to laboratory mould
Quasi- test transfer.In laboratory, traditional thin liquid film thickness testing method mainly uses following two: (1) accessing multimeter
Circuit, then slowly rotation micrometer caliper keeps its front end probe mobile, and when micrometer caliper front end, probe has just been connect with liquid level
When touching, current path is formed, the variation of multimeter registration records micrometer caliper registration at this time, then rotates spiral micrometer again
Device, when probe and test button surface contact, it will happen again the mutation of multimeter registration records spiral micrometer at this time again
The difference of the registration of device, this registration twice is the thickness of liquid film.(2) multimeter is accessed into circuit, then rotates spiral micrometer
Device contacts its needle point with specimen surface, records registration at this time；Micrometer caliper is rotated again, and rotary distance is required thin liquid
The thickness of film, is finally slowly added electrolyte solution, when multimeter registration just changes, stops addition solution, at this time
The thin liquid film of required thickness is formed.
Traditional thin liquid film method for measuring thickness error is larger, and it is close with water surface distance to be moved to needle point in micrometer caliper
When, capillary phenomenon inevitably occurs, needle point meeting adsorbent solution forms small water droplet, seriously affects measurement accuracy.Another party
In essence, multimeter, which is equivalent to, constitutes circuit for test button and micrometer caliper needle point in face, when circuit is just connected,
If needle point, as cathode, evolving hydrogen reaction may occur for needle point, resulting bubble will be enriched near needle point, influence spiral
Mircrometer gauge rotary distance；If sample, as cathode, liberation of hydrogen process may occur for specimen surface, the bubble hydrogen of generation may to
Test afterwards has an impact.
Therefore developing one kind can overcome capillary phenomenon and the high-precision thin liquid film thickness testing device of liberation of hydrogen process to material
Atmospheric corrosion Mechanism Study and enrichment and development electrochemical corrosion correlation theory have important theory significance.Furthermore the device
For researching and developing atmospheric corrosion safeguard procedures, extends component service life in atmospheric environment and be of great practical significance.
Summary of the invention:
For the above-mentioned deficiency of existing thin liquid film thickness measuring technology, the purpose of this utility model is to provide one kind can be real
The method of existing thin liquid film thickness high-acruracy survey.This method can overcome conventional method can not in thin liquid film thickness test process
The capillary phenomenon defect of the micrometer caliper needle point avoided；The negative effect of liberation of hydrogen process bring can be also eliminated simultaneously.In high precision
Control thin liquid film thickness for corrosion electrochemistry data acquire and illustrate atmospheric corrosion of metal materials mechanism be highly beneficial.
A kind of high-precision control thin liquid film thickness formation device overcoming capillary phenomenon, it is characterised in that: including computer
(1), portable microscope, iron stand, the electron helical mircrometer gauge with needle point, height-adjustable test chamber, specimen holder
And sample；Electron helical mircrometer gauge with needle point is in the surface of specimen holder；Sample is assemblied in specimen holder；Sample is folded in
In height-adjustable sample container；Test chamber is placed on iron stand, and portable microscope is placed in the side of test chamber
Face.
Further, the portable microscope has and takes pictures and camera function, furthermore the microscope in use
Included scale function, can measure the length of target range in picture.
Further, the specimen holder side is equipped with the bolt that size matches, and primarily serves the effect of fixed sample.
Further, sample is made of by epoxy resin by test button encapsulating, is equipped with to have around test button and inhale
Aqueous filter paper；The filter paper mainly for allow solution preferably specimen surface drawout come.
Further, sample container contains there are three the leveling support for being in angular distribution, during test, puts in specimen surface
Level meter is set, so that sample is in horizontality by adjusting the leveling support.
Further, during the test, directly tested by portable microscope electron helical mircrometer gauge needle point with it is molten
The distance on liquid surface, and then determine the thickness of the solution thin liquid film.
The technical solution of the utility model is achieved in that
During the test first by sample assembly on specimen holder, the specimen holder is then placed in test chamber together
In.Then level meter is placed in right above sample, three adjustable columns of test chamber is adjusted, sample is made to be in horizontality.It beats
Computer and portable digital microscopes are opened, and focuses on specimen surface, slowly rotates micrometer caliper, is observed by microscope
It when needle point and specimen surface just contact, stops rotating, records the registration a of micrometer caliper at this time.If pre-formed 100 μ m thick
Thin liquid film, micrometer caliper is rotated to a+200 μm of height for making needle point test coupon surface upwards at this time.Then gradually to
Solution is added in test chamber, the water surface constantly rises, and can obviously see the inverted image of needle point in the solution at this time.According to plane at
As knowledge is apparent from it is initial when needle point at a distance from inverted image needle point be 400 μm.In being slowly added solution processes, liquid level rises, needle
Point will constantly reduce at a distance from inverted image needle point, stop addition solution when the distance is decreased to 200 μm.Needle point is apart from water at this time
The distance in face is 100 μm, and liquid level can be obtained at a distance from the water surface by subtracting needle point at this time at a distance from initial needle point and specimen surface
With a thickness of 100 μm.In fact needle point is not contacted with liquid level in this process, remains interval relatively large distance, therefore very well
Avoid capillary phenomenon, while also avoiding using the liberation of hydrogen problem during multimeter.
The utility model joined portable microscope, which has the function of scale, it may be convenient to test target
The length of distance.Device to test precision is high, operates convenient, the thin liquid film of offer required thickness that can be more accurate, can be with
Overcome capillary phenomenon and liberation of hydrogen in multimeter use process is avoided to influence.
Detailed description of the invention:
Fig. 1 is the utility model thin liquid film corrosion testing apparatus three dimensional structure diagram.
Fig. 2 is the enlarged diagram of specimen holder in Fig. 1.
Fig. 3 is the enlarged diagram of sample in Fig. 1.
Fig. 4 is needle point imaging schematic diagram.During the test, in order to preferably focus the microscope at needle point,
Microscopical direction of observation, i.e. angle of light may be adjusted.In Fig. 4, no matter light is with assorted known to similar triangles knowledge
Incidence angle enters, and does not influence the distance between needle point and inverted image needle point, i.e. the distance between needle point and inverted image needle point is
Twice of distance between needle point and the water surface.
Specific embodiment:
The utility model is described in further detail combined with specific embodiments below.
For the utility model thin liquid film thickness device for accurately measuring referring to Fig. 1, which includes computer 1, portable microscope
2, iron stand 3, the electron helical mircrometer gauge 4 with needle point, height-adjustable test chamber 5, specimen holder 6 and sample 7.This is aobvious
Micro mirror 2, which has, takes pictures and camera function, and furthermore the microscope carries scale function in use, and mesh can be measured in picture
The length of subject distance.Micrometer caliper can adjust height on iron stand.6 side of specimen holder is equipped with the spiral shell that size thinks cooperation
Bolt primarily serves the effect of fixed sample, as shown in Figure 2.Sample 7 is made of by epoxy resin by test button encapsulating, such as
Shown in Fig. 3.8 be test button, and 9 be the spongy filter paper of tool.The filter paper is mainly for allowing solution preferably in specimen surface
Drawout comes.The present embodiment is illustrated with the thin liquid film for forming 100 μ m thicks.
First then the specimen holder 6 is placed in test chamber 5 by the assembly of sample 7 together on specimen holder 6.Then
Level meter is placed in right above sample 7, three leveling supports of test chamber 5 is adjusted, sample 7 is made to be in horizontality.
Computer 1 and portable digital microscopes 2 are opened, 7 surface of sample is focused at an appropriate angle, slowly rotates spiral
Mircrometer gauge 4 stops rotating when observing that needle point and 7 surface of sample just contact by microscope 2, records spiral micrometer at this time
The registration a of device 4.
Micrometer caliper 4 is rotated to a+200 μm of height for making needle point test coupon surface upwards.
Solution is added into test chamber 5, the water surface constantly rises, can obviously see at this time needle point in the solution fall
Shadow.Needle point is 400 μm at a distance from inverted image needle point when being apparent from initial according to planar imaging knowledge.It is being slowly added solution processes
In, liquid level rises, and needle point will constantly reduce at a distance from inverted image needle point, stops addition solution when the distance is decreased to 200 μm.
Actual range of the needle point apart from liquid level is 100 μm at this time, that is to say, that liquid level thickness is 100 μm.
Claims (5)
1. one kind can overcome the high-precision control thin liquid film thickness of capillary phenomenon to form device, it is characterised in that: including computer
(1), portable microscope (2), iron stand (3), the electron helical mircrometer gauge (4) with needle point, height-adjustable test are held
Device (5), specimen holder (6) and sample (7)；Electron helical mircrometer gauge with needle point is in the surface of specimen holder；Sample is assemblied in
In specimen holder；Sample is folded in height-adjustable sample container；Test chamber is placed on iron stand, portable microscope
It is placed in the side of test chamber.
2. the high-precision control thin liquid film thickness according to claim 1 for overcoming capillary phenomenon forms device, feature
Be: the portable microscope has the function of to take pictures and camera function and included scale.
3. the high-precision control thin liquid film thickness according to claim 1 for overcoming capillary phenomenon forms device, feature
Be: the specimen holder side is equipped with the bolt that size matches.
4. the high-precision control thin liquid film thickness according to claim 1 for overcoming capillary phenomenon forms device, feature
Be: sample is made of by epoxy resin by test button encapsulating, is equipped with around test button and has spongy filter paper.
5. the high-precision control thin liquid film thickness according to claim 1 for overcoming capillary phenomenon forms device, feature
Be: sample container is in the leveling support of angular distribution containing there are three, during test, places level meter in specimen surface, leads to
Overregulating the leveling support makes sample be in horizontality.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821060227.5U CN208313226U (en) | 2018-07-05 | 2018-07-05 | A kind of high-precision control thin liquid film thickness formation device overcoming capillary phenomenon |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821060227.5U CN208313226U (en) | 2018-07-05 | 2018-07-05 | A kind of high-precision control thin liquid film thickness formation device overcoming capillary phenomenon |
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| CN208313226U true CN208313226U (en) | 2019-01-01 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108895971A (en) * | 2018-07-05 | 2018-11-27 | 北京科技大学 | A kind of high-precision control thin liquid film thickness forms device and application method |
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2018
- 2018-07-05 CN CN201821060227.5U patent/CN208313226U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108895971A (en) * | 2018-07-05 | 2018-11-27 | 北京科技大学 | A kind of high-precision control thin liquid film thickness forms device and application method |
| CN108895971B (en) * | 2018-07-05 | 2024-01-23 | 北京科技大学 | High-precision thin liquid film thickness control forming device and using method |
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