CN208241634U - Solar battery light decay test box - Google Patents

Solar battery light decay test box Download PDF

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Publication number
CN208241634U
CN208241634U CN201820962369.4U CN201820962369U CN208241634U CN 208241634 U CN208241634 U CN 208241634U CN 201820962369 U CN201820962369 U CN 201820962369U CN 208241634 U CN208241634 U CN 208241634U
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CN
China
Prior art keywords
cabinet
silicon chip
cell silicon
xenon lamp
solar battery
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Application number
CN201820962369.4U
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Chinese (zh)
Inventor
张强
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Jiangsu Green Power PV Co Ltd
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Jiangsu Green Power PV Co Ltd
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Priority to CN201820962369.4U priority Critical patent/CN208241634U/en
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

The utility model relates to a kind of solar battery light decay test boxs, including cabinet, middle part is equipped with the loading plate for placing cell silicon chip in the cabinet, loading plate center is equipped with the solar radiation table of monitoring intensity of illumination, cabinet internal upper part is equipped with and is irradiated in xenon lamp of the cell silicon chip surface with reflector, xenon lamp side is equipped with the infrared temperature sensor of monitoring cell silicon chip temperature, two sides are located at xenon lamp periphery and are arranged with the water cooling plant that can effectively radiate in cabinet, and the humidity temperature pickup of temperature and humidity inside monitoring and test case is equipped on cabinet inside middle portion wall.Using the heat inside water cooling plant cooling box, the air blast for avoiding air cooling way causes the vibration of cell silicon chip and causes the phenomenon of cell silicon chip crack breakage the utility model, improves test environment;The xenon lamp for providing illumination can carry out wave band adjusting as required, to provide the intensity of illumination being more suitable for, so that test is more met reality, test effect is more preferable.

Description

Solar battery light decay test box
Technical field
The utility model relates to a kind of solar battery light decay test boxs.
Background technique
Solar battery will appear decline phenomenon, then tend towards stability again in the initial stage of using, output power, this phenomenon It is after cell silicon chip production, all to need to carry out photic decline to silicon wafer due to caused by the photo attenuation of silicon wafer mostly Subtract test.Test box used in existing attenuation test is radiated on silicon wafer there is certain deficiency in terms of testing environment Temperature is more difficult to control, and the heat dissipation effect of cabinet inner light source peripheral part is simultaneously non-ideal, some use wind-cooling heat dissipating, strong cross-ventilation It easily causes cell piece to shake and crack breakage occurs, thus be also just difficult to the decaying situation that real embodiment goes out silicon wafer.
Summary of the invention
Technical problem to be solved by the utility model is: the utility model provides in order to overcome the deficiencies in the existing technology A kind of solar battery light decay test box that can effectively improve test environment, improve test effect.
The technical scheme adopted by the utility model to solve the technical problem is as follows: a kind of solar battery light decay test box, Including cabinet, middle part is equipped with the loading plate for placing cell silicon chip in the cabinet, and loading plate center is equipped with monitoring intensity of illumination Solar radiation table, cabinet internal upper part is equipped with and is irradiated in xenon lamp of the cell silicon chip surface with reflector, and xenon lamp side is equipped with monitoring The infrared temperature sensor of cell silicon chip temperature, two sides are located at xenon lamp periphery and are arranged with the water cooling dress that can effectively radiate in cabinet It sets, the humidity temperature pickup of temperature and humidity inside monitoring and test case is installed on cabinet inside middle portion wall.
Lower part is equipped with the mute blower for realizing air effective convection current in cabinet in the cabinet.
Lower part arrangement is equipped with four mute blowers with strainer in the cabinet.
The lower box side wall is equipped with the dehumidification device of humidity in constant cabinet.
The beneficial effects of the utility model are: the utility model uses the heat inside water cooling plant cooling box, compared with Existing use air cooling way can be better protected from cell silicon chip and cause oxidative damage because temperature is excessively high, avoid air cooling way Air blast cause the vibration of cell silicon chip and cause the phenomenon of cell silicon chip crack breakage, improve test environment;Light is provided According to xenon lamp can carry out wave band adjusting as required, to provide the intensity of illumination that is more suitable for, test is made more to meet reality, test effect More preferably.
Detailed description of the invention
The present invention will be further described with embodiment with reference to the accompanying drawing.
Fig. 1 is the structural schematic diagram of the utility model.
In figure: 1. cabinet, 2. loading plate, 3. solar radiation table, 4. xenon lamp, 5. infrared temperature sensor, 6. water cooling plant 7. mute 9. dehumidification device of blower of humidity temperature pickup 8.
Specific embodiment
The utility model is described in further detail presently in connection with attached drawing.These attached drawings are simplified schematic diagram, Only illustrate the basic structure of the utility model in a schematic way, therefore it only shows composition related with the utility model.
A kind of solar battery light decay test box as shown in Figure 1, including cabinet 1, the interior middle part of the cabinet 1 are equipped with peace Put the loading plate 2 of cell silicon chip, the loading plate 2 highly can up and down adjustment, to meet different test requests.
1 internal upper part of cabinet is equipped with and is irradiated in three spaced xenon lamps 4 of the cell silicon chip surface with reflector, institute Optical filter can be chosen to install by use demand by stating xenon lamp 4, facilitated and adjusted nm wave band, to provide the intensity of illumination being more suitable for;Positioned at carrying 2 center of plate is equipped with the solar radiation table 3 of monitoring 4 intensity of illumination of xenon lamp, and 4 side of xenon lamp is transferred on cell silicon chip warm equipped with monitoring The infrared temperature sensor 5 of degree, two sides are located at 4 periphery of xenon lamp and are arranged with water cooling plant 6 in cabinet 1, pass through following for water cooling plant 6 Ring is separately installed with monitoring 1 inside temperature and humidity of cabinet effectively to disperse the heat in cabinet 1 on 1 middle part left and right inner sidewall of cabinet Humidity temperature pickup 7.
Lower part, which is arranged successively, in the cabinet 1 is provided with four mute blowers 8 with strainer, real by mute blower 8 Existing effective convection current of the air in cabinet 1.
1 lower sides of cabinet are equipped with the dehumidification device 9 of humidity in constant cabinet 1.
The above-mentioned intensity of illumination for cell silicon chip, in cabinet 1 detection of temperature and humidity, cell silicon chip surface temperature show with Control management is executed by the touch industry control screen of PLC.
The utility model uses air cooling way can be more using the heat inside 6 cooling box of water cooling plant, compared with existing Prevent cell silicon chip from causing oxidative damage because temperature is excessively high well, the air blast for avoiding air cooling way causes cell silicon chip The phenomenon of cell silicon chip crack breakage is shaken and caused, test environment is further improved;The xenon lamp 4 for providing illumination can be as required Wave band adjusting is carried out, to provide the intensity of illumination being more suitable for, so that test is more met reality, test effect is more preferable.
It is enlightenment, through the above description, related work people with the above-mentioned desirable embodiment according to the utility model Member can carry out various changes and amendments in the range of without departing from this item utility model technical idea completely.This item is real It is not limited to the contents of the specification with novel technical scope, it is necessary to its technology is determined according to scope of the claims Property range.

Claims (4)

1. a kind of solar battery light decay test box, including cabinet (1), it is characterized in that: middle part is equipped with peace in the cabinet (1) The loading plate (2) of cell silicon chip is put, loading plate (2) center is equipped with the solar radiation table (3) of monitoring intensity of illumination, and cabinet (1) is interior Top, which is equipped with, is irradiated in xenon lamp (4) of the cell silicon chip surface with reflector, and xenon lamp (4) side is equipped with monitoring cell silicon chip temperature Infrared temperature sensor (5), cabinet (1) interior two sides are located at xenon lamp (4) periphery and are arranged with the water cooling plant (6) that can effectively radiate, The humidity temperature pickup (7) of temperature and humidity inside monitoring and test case is installed on cabinet (1) inside middle portion wall.
2. solar battery light decay test box as described in claim 1, it is characterized in that: described cabinet (1) the interior lower part is equipped with Realize the mute blower (8) of air effective convection current in cabinet (1).
3. solar battery light decay test box as described in claim 1, it is characterized in that: the interior lower part arrangement of the cabinet (1) Mute blower (8) equipped with four with strainer.
4. solar battery light decay test box as described in claim 1, it is characterized in that: on described cabinet (1) lower sides Dehumidification device (9) equipped with constant cabinet (1) interior humidity.
CN201820962369.4U 2018-06-20 2018-06-20 Solar battery light decay test box Active CN208241634U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201820962369.4U CN208241634U (en) 2018-06-20 2018-06-20 Solar battery light decay test box

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201820962369.4U CN208241634U (en) 2018-06-20 2018-06-20 Solar battery light decay test box

Publications (1)

Publication Number Publication Date
CN208241634U true CN208241634U (en) 2018-12-14

Family

ID=64574455

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201820962369.4U Active CN208241634U (en) 2018-06-20 2018-06-20 Solar battery light decay test box

Country Status (1)

Country Link
CN (1) CN208241634U (en)

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