CN208188218U - Charger aging test fixture - Google Patents
Charger aging test fixture Download PDFInfo
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- CN208188218U CN208188218U CN201820280089.5U CN201820280089U CN208188218U CN 208188218 U CN208188218 U CN 208188218U CN 201820280089 U CN201820280089 U CN 201820280089U CN 208188218 U CN208188218 U CN 208188218U
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- charger
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- aging test
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Abstract
The utility model discloses a kind of charger aging test fixtures, including rack and the rear cover being vertically arranged, machine frame inside is provided with the partition of multiple levels, the upper surface of partition is for placing charger to be tested, the plug that several groups socket is provided on the end face of partition for charger is inserted into, a vertical substrate is additionally provided in machine frame inside, cavity is formed between substrate and rear cover for being routed, several groups variable resistor assembly is provided on substrate, in variable resistor assembly access test circuit, variable resistor assembly is for adjusting the electric current for flowing through charger or charger both end voltage size, connecting terminal components are additionally provided on substrate in the terminals access test circuit by charger.By adjustable resistance component, can voltage to charger both ends and the electric current that flows through be adjusted, and regulating switch is disposed on the substrate, is conveniently stirred, each partition can place multiple chargers, and integration degree is high.
Description
Technical field
The present invention relates to charging degradation testing technique fields, and in particular to a kind of charger aging test fixture.
Background technique
Charger will carry out degradation as many electronic products before factory.This is because although enterprise has become
Function produces product, can supply market.But in a few houres of consumer after use to tens hours periods, often
It was found that product occur it is such or it is such there are problems, it is unreliable to be considered product quality.Therefore, charger or some electronics produce
The manufacturing enterprise of product can take analog equipment reality use state to make simulation test, after product is made to exist to product
Not perfect place, is disposed to the ill present in the simulation process of a few houres to tens hours, and by re-test, is preferably gone out
The product having good quality is introduced to the market, to improve consumer to the satisfaction of product quality.As it can be seen that being produced for electronics such as chargers
The degradation of product is of great significance.And existing ageing tester structure is simple, the corresponding charger of a device,
And charger only has a kind of test environment.
Utility model content
The technical problem to be solved by the present invention is to provide a kind of convenience to carry out burn-in test simultaneously to multiple chargers,
And the charger aging test fixture of changeable test environment.
In order to solve the above-mentioned technical problem, the technical solution adopted in the utility model are as follows: a kind of test of charger aging is controlled
Tool, including rack and the rear cover being vertically arranged, is provided with the partition of multiple levels in machine frame inside, the upper surface of partition is used for
Charger to be tested is placed, the plug that several groups socket is provided on the end face of partition for charger is inserted into, in machine frame inside
It is additionally provided with a vertical substrate, forms cavity between substrate and rear cover for being routed, several groups are provided on substrate can
Become resistor assembly, variable resistor assembly access test circuit in, variable resistor assembly for adjust the electric current for flowing through charger or
Person's charger both end voltage size is additionally provided with connecting terminal components for testing the terminals access of charger on substrate
In circuit, the variable resistor assembly, charger and connecting terminal components are corresponded.
Further, the variable resistor assembly includes a resistance VRS, opens for one between two end nodes of resistance VRS
K3 is closed, the middle section of resistance VRS is arranged a terminals, is arranged between the terminals and a wherein end node of resistance VRS
One switch K2, is arranged switch K1 between another end node, and the both ends of resistance VRS connect connecting terminal components.
Further, the terminals of the middle section the resistance VRS are also connect with connecting terminal components.
Further, the prevention of the resistance VRS is 4~6K ohm.
Further, the switch K1, switch K2 and switch K3 are disposed side by side on substrate surface.
Further, several metal clips are set on the connecting terminal components for connecting charger port.
Further, several thermovents are provided on the cavity formed between substrate and rear cover in the rack,
And fan is set at thermovent, a thermovent is at least set between two partitions.
Further, several single-chip microcontroller components are additionally provided on the substrate, the access of single-chip microcontroller component is tested in circuit, single
Piece thermomechanical components are corresponded with variable resistance and connecting terminal components, and single-chip microcontroller component is for showing the electricity for flowing through charger
Stream, charger both end voltage and ageing time.
It, can be right from above-mentioned technical proposal it can be seen that the utility model has the advantage that through adjustable resistance component
The voltage at charger both ends and the electric current flowed through are adjusted, and regulating switch is disposed on the substrate, and conveniently stir, each
Partition can place multiple chargers, and integration degree is high.
Detailed description of the invention
Fig. 1 is the front view of the utility model；
Fig. 2 is the side view of the utility model；
Fig. 3 is the schematic diagram of variable resistor assembly in the utility model.
Specific embodiment
It elaborates below in conjunction with attached drawing to specific embodiment of the present utility model.
As depicted in figs. 1 and 2, a kind of charger aging test fixture of the utility model, including rack 1 and set vertically
The rear cover 11 set is arranged distribution box 9 in the side of rack, is internally provided with the partition 3 of multiple levels, the number of partition 3 in rack 1
Amount is set according to the size of rack, and the upper surface of partition 3 is set on the end face of partition 3 for placing charger to be tested
The plug that several groups socket 5 is equipped with for charger is inserted into, and is additionally provided with a vertical substrate 2 inside rack 1, substrate 2 with
Cavity is formed between rear cover 11 for being routed, and is provided with several groups variable resistor assembly 4, variable resistor assembly 4 on a substrate 2
In access test circuit, variable resistor assembly 4 is used to adjust the electric current for flowing through charger or charger both end voltage size,
It is additionally provided with connecting terminal components 7 on substrate 2 to test in circuit for accessing the terminals of charger, the variable resistance group
Part, charger and connecting terminal components correspond.
As shown in figure 3, variable resistor assembly includes a resistance VRS, a switch between two end nodes of resistance VRS
A terminals are arranged in the middle section of K3, resistance VRS, are arranged one between the terminals and a wherein end node of resistance VRS
A switch K2, is arranged switch K1 between another end node, and the both ends of resistance VRS connect connecting terminal components.In resistance VRS
Between the terminals of part also connect with connecting terminal components.The resistance value of the resistance VRS is 4~6K ohm, the preferably Europe 5K
Nurse.B- is equivalent to total place, and B1, B2 are optional two positive terminals points.Normally to meet B1, B-, there are three types of resistance it is optional,.
1), K1, K2, K3 standard-sized sheet, prevention are 5K；It 2) is the resistance value of the upper half 5K when K1 closure, K2, K3 are opened；3) when K2 closure, K1,
K3 is opened, and is the resistance value of the lower half 5K；4) wiring is switched to B2, B-, K3 closure, and K1, K2 are opened, and is after the upper and lower part 5K is in parallel
Resistance value.Therefore, by switching switch come change access circuit in resistance value size, thus change burn-in test electric current and
Voltage, it is easy to operate.The switch K1, switch K2 and switch K3 are disposed side by side on substrate surface, conveniently switch over.
Several metal clips 8 are set on connecting terminal components and is conductive and can for connecting charger port, metal clip 8
To be quickly attached with charger terminals.
Several thermovents are provided on the cavity formed between substrate and rear cover in the rack, and in thermovent
Fan 10 is arranged in place, and a thermovent is at least arranged between two partitions.Several single-chip microcontroller components are additionally provided on the substrate
6, the access of single-chip microcontroller component 6 is tested in circuit, and single-chip microcontroller component 6 is corresponded with variable resistance and connecting terminal components,
Single-chip microcontroller component is for showing the electric current for flowing through charger, charger both end voltage and ageing time.
Claims (8)
1. a kind of charger aging test fixture, it is characterised in that: including rack and the rear cover being vertically arranged, in machine frame inside
It is provided with the partition of multiple levels, the upper surface of partition is for placing charger to be tested, if being provided on the end face of partition
Dry group socket is inserted into for the plug of charger, is additionally provided with a vertical substrate, shape between substrate and rear cover in machine frame inside
At cavity for being routed, several groups variable resistor assembly is provided on substrate, variable resistor assembly access is tested in circuit, can
Become resistor assembly for adjusting the electric current for flowing through charger or charger both end voltage size, wiring is additionally provided on substrate
Terminal assemblies are used in the terminals access test circuit by charger, the variable resistor assembly, charger and terminals
Sub-component corresponds.
2. charger aging test fixture according to claim 1, it is characterised in that: the variable resistor assembly includes one
A terminals are arranged in the middle section of a switch K3 between two end nodes of a resistance VRS, resistance VRS, resistance VRS, should
One switch K2 is set between terminals and a wherein end node of resistance VRS, switch K1, electricity are set between another end node
The both ends for hindering VRS connect connecting terminal components.
3. charger aging test fixture according to claim 2, it is characterised in that: the middle section the resistance VRS
Terminals are also connect with connecting terminal components.
4. charger aging test fixture according to claim 3, it is characterised in that: the prevention of the resistance VRS be 4~
6K ohm.
5. charger aging test fixture according to claim 3, it is characterised in that: the switch K1, switch K2 and
Switch K3 is disposed side by side on substrate surface.
6. charger aging test fixture according to claim 1, it is characterised in that: be arranged on the connecting terminal components
Several metal clips are for connecting charger port.
7. charger aging test fixture according to claim 1, it is characterised in that: be located at substrate in the rack with after
It is provided with several thermovents on the cavity formed between lid, and fan is set at thermovent, is at least set between two partitions
Set a thermovent.
8. charger aging test fixture according to claim 1, it is characterised in that: be additionally provided on the substrate several
Single-chip microcontroller component, the access of single-chip microcontroller component are tested in circuit, and single-chip microcontroller component and variable resistance and connecting terminal components are uniform
One is corresponding, and single-chip microcontroller component is for showing the electric current for flowing through charger, charger both end voltage and ageing time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820280089.5U CN208188218U (en) | 2018-02-27 | 2018-02-27 | Charger aging test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820280089.5U CN208188218U (en) | 2018-02-27 | 2018-02-27 | Charger aging test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208188218U true CN208188218U (en) | 2018-12-04 |
Family
ID=64440229
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820280089.5U Active CN208188218U (en) | 2018-02-27 | 2018-02-27 | Charger aging test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208188218U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110794244A (en) * | 2019-11-15 | 2020-02-14 | 武汉德泰纳新能源技术有限公司 | Multifunctional portable charger aging platform |
-
2018
- 2018-02-27 CN CN201820280089.5U patent/CN208188218U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110794244A (en) * | 2019-11-15 | 2020-02-14 | 武汉德泰纳新能源技术有限公司 | Multifunctional portable charger aging platform |
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