CN208043702U - A kind of semiconductor high magnified glass detection device - Google Patents
A kind of semiconductor high magnified glass detection device Download PDFInfo
- Publication number
- CN208043702U CN208043702U CN201820387191.5U CN201820387191U CN208043702U CN 208043702 U CN208043702 U CN 208043702U CN 201820387191 U CN201820387191 U CN 201820387191U CN 208043702 U CN208043702 U CN 208043702U
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- China
- Prior art keywords
- monitor station
- supporting rod
- high magnified
- magnified glass
- detection device
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Abstract
The utility model discloses a kind of semiconductor high magnified glass detection devices, include the monitor station of pedestal and setting on the base, it is provided with clamping device on the monitor station, adjacent monitor station is provided with telescoping mechanism on the pedestal, the telescoping mechanism is arranged along stretching above and below perpendicular to the direction of pedestal, the end damping of the telescoping mechanism is hingedly provided with supporting rod, the supporting rod stretches to monitor station, the end set of the supporting rod has high magnified glass, the high magnified glass to be located at the top of monitor station；The bottom of the telescoping mechanism is provided with slide displacement mechanism, and the telescoping mechanism is arranged by slide displacement mechanism to monitor station slide displacement.The utility model provides a kind of semiconductor high magnified glass detection device, facilitates observation and finds the defect on semiconductor device, simple in structure, easy to use.
Description
Technical field
The utility model belongs to semiconductor detection field, more particularly to a kind of semiconductor high magnified glass detection device.
Background technology
Semiconductor, which refers to a kind of electric conductivity, to be controlled, and range can be from insulator to the material between conductor.No matter from section
From the perspective of skill or economic development, the importance of semiconductor is all very huge.Today most electronic product, such as
Core cell in computer, mobile phone or digital audio tape all has extremely close connection with semiconductor.But
After the completion of semiconductor machining, the series connection between some burrs or metal pins or semiconductor device part can be generally remained
On cracking etc., these factors will all have adverse effect on the performance of semiconductor, but due to the volume of semiconductor generally compared with
Small, defect is not easy to find, needs to be amplified observation by magnifying glass.
Invention content
Goal of the invention：In order to overcome the deficiencies in the prior art, a kind of semiconductor high power of the utility model offer to put
Big microscopy measurement equipment facilitates observation and finds the defect on semiconductor device, simple in structure, easy to use.
Technical solution：To achieve the above object, the technical solution of the utility model is as follows：
A kind of semiconductor high magnified glass detection device includes the monitor station of pedestal and setting on the base, described
Clamping device is provided on monitor station, adjacent monitor station is provided with telescoping mechanism on the pedestal, and the telescoping mechanism is along vertical
It stretches and is arranged above and below in the direction of pedestal, the end damping of the telescoping mechanism is hingedly provided with supporting rod, and the supporting rod is stretched
To monitor station, the end set of the supporting rod has high magnified glass, the high magnified glass to be located at the top of monitor station；It is described
The bottom of telescoping mechanism is provided with slide displacement mechanism, and the telescoping mechanism is by slide displacement mechanism to monitor station slide displacement
Setting.
Further, the clamping device includes fixed link and supporting rod, and the fixed link passes through spherical hinge structure Damping pivot
It connects and is arranged on monitor station, the supporting rod is pincer-like structure, and the interconnecting piece damping of the supporting rod is hinged to be arranged in fixation
The top of bar, the supporting rod swing setting around fixed link above and below.
Further, two clamping limbs of the supporting rod are arcuate structure, and the inner concave of two clamping limbs is set relatively
It sets, the clamping end of two clamping limbs is flat structure, and two clamping ends are bonded to each other contact setting；Two
It is provided with ripple glaze groove structure on the opposite face of a clamping end.
Further, the monitor station upper surface is recessed with blast chamber, and the open side of the blast chamber is provided with transparent material
The support board of matter, the blast chamber offer lamp installation slot along surrounding side wall annular, if being provided in the lamp installation slot
The surrounding in blast chamber is arranged in dry LED light, several LED light equidistant interval distributions.
Further, the depth of the lamp installation slot horizontal direction is more than the length of LED lamp bead.
Further, the blast intracavitary is provided with several anti-dazzling screens, and the anti-dazzling screen is erected at the lower section of support board, if
It does and is respectively arranged with axis pin on the anti-dazzling screen, and several anti-dazzling screens are rotatably arranged on blast intracavitary by axis pin respectively,
One end of the axis pin is rotatably arranged on the side wall of blast chamber, and the other end passes through the wall body of monitor station to reach outside monitor station
Portion offers pin hole corresponding with axis pin on the monitor station.
Advantageous effect：The utility model by gripping apparatus grips semiconductor device, by adjust magnifying glass angle and
Semiconductor device is observed in position, and to find defect, and clamp structure is simple and convenient, can adjust the clip position of part at any time
And claming angle etc., meanwhile, by the way that blast chamber is arranged on monitor station, semiconductor to be detected is made to be located at brighter position area
Domain promotes the visual performance of observation detection.
Description of the drawings
Attached drawing 1 is the overall structure diagram of the utility model；
Attached drawing 2 is the vertical view of the monitor station structure of the utility model；
Attached drawing 3 is the half-section diagram of the monitor station structure of the utility model.
Specific implementation mode
The utility model is further described below in conjunction with the accompanying drawings.
As shown in Fig. 1, a kind of semiconductor high magnified glass detection device, including pedestal 1 and setting are in the pedestal 1
On monitor station 6, be provided with clamping device 5 on the monitor station 6, by gripping apparatus grips semiconductor device, pass through adjusting
Semiconductor device is observed in the angle of magnifying glass and position, and to find defect, and clamp structure is simple and convenient, can adjust at any time
The clip position of part and claming angle etc., adjacent monitor station 6 is provided with telescoping mechanism 2, the telescopic machine on the pedestal 1
Structure 2 is arranged along stretching above and below perpendicular to the direction of pedestal 1, and the telescoping mechanism is telescopic rod, easy to adjust, the telescopic machine
The end of structure 2 is hingedly provided with supporting rod 3 by flexural pivot damping, and the supporting rod 3 stretches to monitor station, and supporting rod can be made to carry out week
To rotation, be easy to use when angle and position adjust, the end set of the supporting rod 3 has high magnified glass 4, described
High magnified glass 4 is located at the top of monitor station 6；The high magnified glass 4 and the end of supporting rod 3 are carried out also by articulated shaft
Damping is hinged, in order to adjust the elevation angle of magnifying glass, allows operator's semiconductor workpiece from each angle, the telescopic machine
The bottom of structure 2 is provided with slide displacement mechanism, and the telescoping mechanism 2 is set by slide displacement mechanism to 6 slide displacement of monitor station
It sets.Slide displacement mechanism includes T-type sliding block 7 and the recessed T-type sliding slot 8 in 1 upper surface of pedestal being arranged in telescopic rod bottom, institute
The sliding of sliding block 7 is stated in sliding slot 8, makes the adjustable extent bigger of magnifying glass, the convenience of bigger is provided.
As shown in Figure 1 and Figure 2, the clamping device 5 includes fixed link 14 and supporting rod 12, the fixed link 14
Hinged setting is damped on monitor station 6 by spherical hinge structure, and the supporting rod 12 is pincer-like structure, the company of the supporting rod 12
Socket part damping is hingedly arranged on the top of fixed link 14, and the supporting rod 12 swings setting around fixed link above and below.Pass through pincer-like
Supporting rod semiconductor workpiece is clamped, clamping is convenient, simple in structure, and dynamics is little, will not crush semiconductor workpiece.
Two clamping limbs 20 of the supporting rod 12 are arcuate structure, and the inner concave of two clamping limbs 20 is oppositely arranged,
Ensure the clamping force of two clamping limbs by arcuate structure, the clamping end 21 of two clamping limbs 20 is flat knot
Structure, and two clamping ends 21 are bonded to each other contact setting；Ensured between clamping limb and semiconductor by flat structure
Contact area, keep the stabilization of semiconductive pieces, ripple glaze groove knot be provided on the opposite face of two clamping ends 21
Structure.It prevents semiconductor workpiece from skidding by damascene trench structure, its clamping is made to stablize.
As shown in Fig. 3,6 upper surface of the monitor station is recessed with blast chamber 15, the open side setting of the blast chamber 15
There is the support board 10 of transparent material, semiconductor device can be placed on support board, the blast chamber 15 is opened up along surrounding side wall annular
There is lamp installation slot 16, several LED light 17, several 17 equidistant intervals of LED lamps point are provided in the lamp installation slot 16
The surrounding in blast chamber 15 is arranged in cloth.It is shone by several LED light and illuminates increment chamber, promote semiconductive pieces bottom and semiconductor
The brightness of part ambient enviroment, is observed convenient for observer, improves visual performance.
The depth of 16 horizontal direction of lamp installation slot is more than the length of 17 lamp bead of LED light, so that the lamp of LED light 17
Pearl avoids observer from being immediately seen LED light in observation, prevents eyes from being interfered by strong light completely in lamp installation slot 16.
Several anti-dazzling screens 11 are provided in the blast chamber 15, the anti-dazzling screen 11 is erected at the lower section of support board 10, if
It does and is respectively arranged with axis pin 13 on the anti-dazzling screen 11, and several anti-dazzling screens 11 are rotatably arranged on increasing by axis pin 13 respectively
In bright chamber 15, one end of the axis pin 13 is rotatably arranged on the side wall of blast chamber 15, and the other end passes through the wall body of monitor station 6
It reaches outside monitor station 6, pin hole corresponding with axis pin 13 is offered on the monitor station.Monitor station 6 is stretched out by axis pin
Part carries out rotation adjusting, makes anti-dazzling screen that can be rotated in blast intracavitary and adjusts, by being blocked to light, adjustment semiconductive pieces bottom
The bright intensity in portion, meanwhile, multiple anti-dazzling screens can be adjusted respectively, can be directed to a direction and side carries out light intensity adjustment,
To provide larger facility when observation.
The above is only the preferred embodiment of the utility model, it should be pointed out that：For the common skill of the art
For art personnel, without departing from the principle of this utility model, several improvements and modifications can also be made, these improve and
Retouching also should be regarded as the scope of protection of the utility model.
Claims (6)
1. a kind of semiconductor high magnified glass detection device, it is characterised in that：Including pedestal (1) and it is arranged in the pedestal (1)
On monitor station (6), be provided with clamping device (5) on the monitor station (6), adjacent monitor station (6) setting on the pedestal (1)
There are telescoping mechanism (2), the telescoping mechanism (2) to be arranged along stretching above and below perpendicular to the direction of pedestal (1), the telescoping mechanism
(2) end damping is hingedly provided with supporting rod (3), and the supporting rod (3) stretches to monitor station, the end of the supporting rod (3)
It is provided with high magnified glass (4), the high magnified glass (4) is located at the top of monitor station (6)；The bottom of the telescoping mechanism (2)
Portion is provided with slide displacement mechanism, and the telescoping mechanism (2) is arranged by slide displacement mechanism to monitor station (6) slide displacement.
2. a kind of semiconductor high magnified glass detection device according to claim 1, it is characterised in that：The clamping device
(5) include fixed link (14) and supporting rod (12), the fixed link (14) is damped by spherical hinge structure to be hingedly arranged in monitor station
(6) on, the supporting rod (12) is pincer-like structure, and the interconnecting piece damping of the supporting rod (12) is hinged to be arranged in fixed link
(14) top, the supporting rod (12) swing setting around fixed link above and below.
3. a kind of semiconductor high magnified glass detection device according to claim 2, it is characterised in that：The supporting rod
(12) two clamping limbs (20) are arcuate structure, and the inner concave of two clamping limbs (20) is oppositely arranged, two clampings
The clamping end (21) of arm (20) is flat structure, and two clamping ends (21) are bonded to each other contact setting；Two
It is provided with ripple glaze groove structure on the opposite face of the clamping end (21).
4. a kind of semiconductor high magnified glass detection device according to claim 1, it is characterised in that：The monitor station
(6) upper surface is recessed with blast chamber (15), and the open side of the blast chamber (15) is provided with the support board (10) of transparent material, institute
It states blast chamber (15) and offers lamp installation slot (16) along surrounding side wall annular, be provided in the lamp installation slot (16) several
LED light (17), surrounding of several LED light (17) equidistant interval distribution settings in blast chamber (15).
5. a kind of semiconductor high magnified glass detection device according to claim 4, it is characterised in that：The lamp installation
The depth of slot (16) horizontal direction is more than the length of LED light (17) lamp bead.
6. a kind of semiconductor high magnified glass detection device according to claim 4, it is characterised in that：The blast chamber
(15) several anti-dazzling screens (11) are provided in, the anti-dazzling screen (11) is erected at the lower section of support board (10), several shadings
Axis pin (13) is respectively arranged on piece (11), and several anti-dazzling screens (11) are rotatably arranged on blast by axis pin (13) respectively
In chamber (15), one end of the axis pin (13) is rotatably arranged on the side wall of blast chamber (15), and the other end passes through monitor station (6)
Wall body to reach monitor station (6) external, offer pin hole corresponding with axis pin (13) on the monitor station.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820387191.5U CN208043702U (en) | 2018-03-21 | 2018-03-21 | A kind of semiconductor high magnified glass detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820387191.5U CN208043702U (en) | 2018-03-21 | 2018-03-21 | A kind of semiconductor high magnified glass detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208043702U true CN208043702U (en) | 2018-11-02 |
Family
ID=63948963
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820387191.5U Active CN208043702U (en) | 2018-03-21 | 2018-03-21 | A kind of semiconductor high magnified glass detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208043702U (en) |
-
2018
- 2018-03-21 CN CN201820387191.5U patent/CN208043702U/en active Active
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