CN207851231U - Photovoltaic diode Testing Platform - Google Patents
Photovoltaic diode Testing Platform Download PDFInfo
- Publication number
- CN207851231U CN207851231U CN201721818097.2U CN201721818097U CN207851231U CN 207851231 U CN207851231 U CN 207851231U CN 201721818097 U CN201721818097 U CN 201721818097U CN 207851231 U CN207851231 U CN 207851231U
- Authority
- CN
- China
- Prior art keywords
- photovoltaic diode
- testing platform
- module
- measurement plate
- microcontroller
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 64
- 238000005259 measurement Methods 0.000 claims abstract description 31
- 238000005070 sampling Methods 0.000 claims abstract description 21
- 230000009897 systematic effect Effects 0.000 claims abstract description 17
- 238000011056 performance test Methods 0.000 claims abstract description 4
- 238000004891 communication Methods 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 5
- 238000002955 isolation Methods 0.000 claims description 4
- 230000010354 integration Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000012854 evaluation process Methods 0.000 description 1
- 210000003608 fece Anatomy 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Photovoltaic Devices (AREA)
Abstract
The utility model provides a kind of photovoltaic diode Testing Platform, includes for placing the measurement plate of sample to be tested, the microcontroller being connect with the measurement plate, the host computer being connect with the microcontroller and the external power supply being connect with the measurement plate.Several test modules being connected in parallel are equipped in the measurement plate.Each described test module includes the sample cell, system diverter module and systematic sampling module for placing photovoltaic diode being connected in series with.So set, ensure that when a sample to be tested short circuit or open-circuit condition, the performance test of other samples to be tested will not be had an impact, ensure that being smoothed out for test.
Description
Technical field
The utility model is related to technical field of photovoltaic power generation more particularly to a kind of photovoltaic diode Testing Platforms.
Background technology
In photovoltaic module application, the influence of shade, dust, birds droppings or other factors can be encountered, is caused on photovoltaic module
Formation is blocked or hot spot.In most cases, photovoltaic diode will not start, and photovoltaic diode is under reverse biased,
Only when above-mentioned circumstance of occlusion occurs, the photovoltaic diode inside photovoltaic module can just start, and photovoltaic diode is by reversed inclined
Pressure state is converted into forward conduction state.So, before photovoltaic diode use, it would be desirable to the reversed property of photovoltaic diode
Whether can reliably and with long-term be assessed, in evaluation process, it would be desirable to ensure：The first, during one-shot measurement, the number of sample
Amount will have enough representativenesses；For example, the same test lot, participates in sample and is greater than equal to 200 diodes；The second, it surveys
Examination process cannot be because of the failure of individual diode, and leads to the termination entirely tested, and influences other surplus in entire test lot
The assessment of remaining diode.
In view of this, it is necessary to a kind of photovoltaic diode Testing Platform is designed, to solve the above problems.
Utility model content
The purpose of this utility model is to provide one kind can batch testing photovoltaic diode performance, and light in test process
The photovoltaic diode Testing Platform being independent of each other between volt diode.
To realize that above-mentioned purpose of utility model, the utility model provide a kind of photovoltaic diode Testing Platform, wrap
Include the measurement plate for placing sample to be tested, the microcontroller being connect with the measurement plate, the host computer being connect with the microcontroller
And the external power supply being connect with the measurement plate, the measurement plate is interior to be equipped with several test modules being connected in parallel, each
The test module includes the sample cell, system diverter module and systematic sampling for placing photovoltaic diode being connected in series with
Module.
The systematic sampling module is connected with the microcontroller as a further improvement of the utility model, and described
It is provided with light-coupled isolation module between systematic sampling module and the microcontroller.
The system diverter module has shunt resistance as a further improvement of the utility model,.
The systematic sampling module has sampling resistor as a further improvement of the utility model,.
The photovoltaic diode Testing Platform has 5 measurements as a further improvement of the utility model,
Plate is connected in parallel between the measurement plate.
Each described measurement plate has 100 test modules as a further improvement of the utility model,.
It is connected as a further improvement of the utility model, by golden finger between the measurement plate.
The voltage of the external power supply includes but not limited to the direct current for 500V as a further improvement of the utility model,
Power supply.
System communication collection is provided between the microcontroller and the host computer as a further improvement of the utility model,
At module.
Pass through RS485 communication lines between the microcontroller and the host computer as a further improvement of the utility model,
Or Ethernet carries out data transmission.
The utility model has the beneficial effects that：The photovoltaic diode Testing Platform of the utility model is equipped with several parallel connections
The test module of connection can not only ensure same batch test sample to realize to the batch testing of photovoltaic diode performance
Quantity, and ensure that the test voltage of each sample to be tested is consistent；By being arranged and sample to be tested string in test module
Join the system diverter module connected and systematic sampling module, ensure that when a sample to be tested short circuit or open-circuit condition,
The performance test of other samples to be tested will not be had an impact, ensure that being smoothed out for test.
Description of the drawings
Fig. 1 is the circuit connection diagram of the utility model photovoltaic diode Testing Platform.
Fig. 2 is the circuit connection diagram of single test module.
Specific implementation mode
In order to keep the purpose of this utility model, technical solution and advantage clearer, below in conjunction with the accompanying drawings and it is embodied
The utility model is described in detail in example.
It please refers to Fig.1 to shown in Fig. 2, a kind of photovoltaic diode Testing Platform 100, including is used to place sample to be tested
Measurement plate (not shown), the microcontroller 20 being connect with the measurement plate, the host computer 30 that is connect with the microcontroller 20 and
The external power supply being connect with the measurement plate.Several test modules 1 being connected in parallel are equipped in the measurement plate, described in each
Test module 1 includes that the sample cell 11, system diverter module 12 and system for placing photovoltaic diode being connected in series with are adopted
Egf block 13.
The system diverter module 12 has shunt resistance.During the test, when sample to be tested (photovoltaic diode) is sent out
When raw failure (short circuit), the shunt resistance plays the role of the circuit voltage support to the test module 1, avoids allowing entire
The test module 1 is all under short-circuit condition, ensure that being smoothed out for test.
The systematic sampling module 13 is connected with the microcontroller 20, and the systematic sampling module 13 and the monolithic
Light-coupled isolation module 40 is provided between machine 20, that is, the systematic sampling module 13 passes through the light-coupled isolation module 40 and institute
Microcontroller 20 is stated to be connected.The systematic sampling module 13 has sampling resistor, by measuring the voltage of the sampling resistor, from
And calculate the leakage current of entire test module 1.When short-circuit conditions occur for sample to be tested (photovoltaic diode), the leakage current of system
Increase；When sample to be tested is opened a way, leakage current is reduced.The systematic sampling module 13 is by the data transmission of acquisition to described
Microcontroller 20.
System communication integration module 50 is provided between the microcontroller 20 and the host computer 30.The microcontroller 20 with
Carried out data transmission by RS485 communication lines or Ethernet between the host computer 30, to realize the microcontroller 20 and institute
State the data transmission between host computer 30.The microcontroller 20 carries out the data that the systematic sampling module 13 acquires at calculating
The host computer 30 is transmitted to after reason, the host computer 30 records the test data of each sample (photovoltaic diode), to data
Carry out analyzing processing.
In the present embodiment, the photovoltaic diode Testing Platform 100 has 5 measurement plates, the measurement
It is connected in parallel between plate.Particularly, it is connected by golden finger between the measurement plate.Each described measurement plate has 100
The test module 1.That is, the photovoltaic diode Testing Platform 100 can measure 500 sample to be tested (photovoltaics simultaneously
Diode).Certainly, the quantity of the test module 1 can basis in the quantity of the measurement plate and the single measurement plate
Actual test needs arbitrary combination, only need to ensure to be connected in parallel between each test module 1.
The voltage of the external power supply includes but not limited to the DC power supply for 500V.According to sample to be tested (two pole of photovoltaic
Pipe) test need, set the external power supply, it is electric need to only to ensure that all samples to be tested (photovoltaic diode) be in same test
Pressure.
In conclusion the photovoltaic diode Testing Platform 100 of the utility model be equipped with it is several be connected in parallel it is described
Test module 1 can not only ensure the number of same batch test sample to realize to the batch testing of photovoltaic diode performance
Amount, and ensure that the test voltage of each sample to be tested is consistent；By being arranged and sample to be tested string in the test module 1
Join the system diverter module 12 of connection and the systematic sampling module 13, ensure that when the short circuit of sample to be tested or
When open-circuit condition, the performance test of other samples to be tested will not be had an impact, ensure that being smoothed out for test.
Above example is merely intended for describing the technical solutions of the present application, but not for limiting the present application, although with reference to preferred embodiment pair
The utility model is described in detail, it will be understood by those of ordinary skill in the art that, it can be to the technology of the utility model
Scheme is modified or replaced equivalently, without departing from the spirit and scope of technical solutions of the utility model.
Claims (10)
1. a kind of photovoltaic diode Testing Platform, it is characterised in that：Include the measurement plate for placing sample to be tested and institute
Microcontroller, the host computer being connect with the microcontroller and the external power supply being connect with the measurement plate of measurement plate connection are stated,
Several test modules being connected in parallel are equipped in the measurement plate, each described test module includes being connected in series with for putting
Set the sample cell, system diverter module and systematic sampling module of photovoltaic diode.
2. photovoltaic diode Testing Platform according to claim 1, it is characterised in that：The systematic sampling module with
The microcontroller is connected, and is provided with light-coupled isolation module between the systematic sampling module and the microcontroller.
3. photovoltaic diode Testing Platform according to claim 2, it is characterised in that：The system diverter module tool
There is shunt resistance.
4. photovoltaic diode Testing Platform according to claim 2, it is characterised in that：The systematic sampling module tool
There is sampling resistor.
5. photovoltaic diode Testing Platform according to claim 1, it is characterised in that：The photovoltaic diode performance
Test platform has 5 measurement plates, is connected in parallel between the measurement plate.
6. photovoltaic diode Testing Platform according to claim 5, it is characterised in that：Each described measurement plate tool
There are 100 test modules.
7. photovoltaic diode Testing Platform according to claim 5, it is characterised in that：Pass through between the measurement plate
Golden finger connects.
8. photovoltaic diode Testing Platform according to claim 1, it is characterised in that：The voltage of the external power supply
Including but not limited to it is the DC power supply of 500V.
9. photovoltaic diode Testing Platform according to claim 1, it is characterised in that：The microcontroller with it is described on
It is provided with system communication integration module between the machine of position.
10. photovoltaic diode Testing Platform according to claim 1, it is characterised in that：The microcontroller with it is described
Carried out data transmission by RS485 communication lines or Ethernet between host computer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721818097.2U CN207851231U (en) | 2017-12-22 | 2017-12-22 | Photovoltaic diode Testing Platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721818097.2U CN207851231U (en) | 2017-12-22 | 2017-12-22 | Photovoltaic diode Testing Platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207851231U true CN207851231U (en) | 2018-09-11 |
Family
ID=63422250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721818097.2U Expired - Fee Related CN207851231U (en) | 2017-12-22 | 2017-12-22 | Photovoltaic diode Testing Platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207851231U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116068359A (en) * | 2023-03-21 | 2023-05-05 | 常州九天新能源科技股份有限公司 | Full-automatic photovoltaic diode module testing equipment with linkage visual detection module |
-
2017
- 2017-12-22 CN CN201721818097.2U patent/CN207851231U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116068359A (en) * | 2023-03-21 | 2023-05-05 | 常州九天新能源科技股份有限公司 | Full-automatic photovoltaic diode module testing equipment with linkage visual detection module |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 215129 199 deer Road, Suzhou hi tech Development Zone, Jiangsu, Suzhou Patentee after: CSI CELLS Co.,Ltd. Patentee after: Atlas sunshine Power Group Co.,Ltd. Patentee after: CANADIAN SOLAR MANUFACTURING (CHANGSHU) Inc. Address before: 215129 199 deer Road, Suzhou hi tech Development Zone, Jiangsu, Suzhou Patentee before: CSI Cells Co.,Ltd. Patentee before: CSI SOLAR POWER GROUP Co.,Ltd. Patentee before: CANADIAN SOLAR MANUFACTURING (CHANGSHU) Inc. |
|
| CP01 | Change in the name or title of a patent holder | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180911 Termination date: 20211222 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |